X-ray Inspection Sensor Segmentation for Foreign Matter Detection

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Solution Overview

Problem

Existing X-ray inspection apparatuses using detection elements arranged in a lattice pattern may omit detection of foreign matters if they pass between adjacent detection elements, and increasing the integration degree of detection elements to prevent this raises manufacturing costs.

Innovation Solution

The X-ray inspection apparatus includes detection elements arranged in a planar configuration with first detection elements in a crossing direction and second detection elements in a parallel column, where the number of second detection elements is greater than the first, allowing for effective detection of foreign matters without significantly increasing manufacturing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the integration degree of detection elements is increased to prevent detection omission, then detection reliability is improved, but manufacturing cost is excessively increased

Engineering Contradiction:
Improveforeign matter detection reliabilityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The detection element group is segmented into two distinct columns: a first column with detection elements arranged in the crossing direction, and a second column with detection elements arranged in the transport direction. This segmentation allows each column to serve different detection purposes, improving overall detection reliability without requiring a uniform increase in the number of all detection elements.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the detection element group are assigned different functions and configurations. The first column detection elements are optimized for detecting foreign matters in the crossing direction, while the second column detection elements are optimized for detecting foreign matters in the transport direction. This local differentiation allows for cost-effective detection coverage.

Inventive Principle:
Principle #3Local quality

2Device complexity

If detection elements are arranged in a lattice pattern, then device complexity is reduced, but detection precision is compromised due to gaps between elements

Engineering Contradiction:
Improvedetection element arrangement complexityVSAvoidforeign matter detection precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The invention transitions from a single-dimensional or simple two-dimensional lattice arrangement to a more sophisticated two-dimensional planar configuration with distinct columns oriented in different directions. The first column arranges detection elements in the crossing direction while the second column arranges them in the transport direction, creating enhanced coverage without excessive complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration ensures that foreign matters are less likely to be undetected, while keeping manufacturing costs in check by not requiring a higher integration degree of detection elements.

Implementation Method 1

an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays; a sensor unit configured to detect the X-rays and including a plurality of detection elements arranged in a planar configuration

Methodology Applied
Scientific EffectX-ray detection: X-Ray

Data Source

PatentUS20250172510A1X-ray inspection apparatus
Publication Date: 2025.05.29 ISHIDA CO LTD
  • US20250172510A1 patent drawing
  • US20250172510A1 patent drawing
  • US20250172510A1 patent drawing

AI summary

An X-ray inspection apparatus includes a conveying unit configured to convey an article along a transport direction, an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays, a sensor unit configured to detect the X-rays and including detection elements arranged in a planar configuration; an image generation unit configured to generate an image based on a detection result output from the sensor unit, and an inspection unit configured to inspect the article based on the image. The detection elements include first detection elements arranged in a first column in a crossing direction intersecting the transport direction; and second detection elements arranged in a second column parallel to the first column. The number of the second detection elements arranged in the second column is greater than the number of the first detection elements arranged in the first column.