X-Ray Sensor Unit Diagnostics During Time Delay Integration
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Solution Overview
Problem
Existing X-ray inspection apparatuses fail to adequately determine the state of X-ray sensor units during time delay integration driving, as defects may be overlooked when the sensor output decreases, leading to potential defects in inspection results.
Innovation Solution
An X-ray inspection apparatus and method that includes a control unit capable of comparing images generated from normal driving with those from time delay integration driving, allowing for determination of sensor unit state through image luminance analysis and sensitivity correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the sensor unit is driven by time delay integration method, then the inspection speed is improved, but the output decreases and defects are overlooked
Solution Approach 1:
The patent applies preliminary action by performing a diagnostic inspection before normal TDI inspection. The control unit executes a preliminary inspection mode that captures images at specific time points (t1 and t2) to establish baseline sensor output characteristics. This preliminary action allows the system to detect sensor defects before they affect normal inspection operations, ensuring reliable detection while maintaining high inspection speed through TDI method.
2Ease of operation
If the sensor unit outputs normally at the time of normal driving, then the ease of operation is improved, but the defect detection capability deteriorates
Solution Approach 1:
The patent applies copying by creating a reference image (copy) during preliminary inspection that represents normal sensor output characteristics. The control unit captures an image at time t1 as a reference, then compares subsequent images against this reference. This copying approach allows the system to maintain simple normal operation while effectively detecting defects by comparing current output against the stored reference, solving the problem of overlooking defects during normal TDI driving.
3Measurement precision
If the control unit compares images at different time points, then the defect determination capability is improved, but the loss of time increases
Solution Approach 1:
The patent applies partial action by performing defect determination only on specific critical time points (t1 and t2) rather than continuously monitoring. The control unit captures images at these predetermined time points during preliminary inspection and compares them to determine sensor status. This selective sampling approach provides sufficient defect determination accuracy while minimizing the time overhead, avoiding excessive continuous monitoring that would significantly increase inspection time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of defects in X-ray sensor units during time delay integration driving, ensuring reliable inspection results by comparing output images and performing sensitivity correction.
Implementation Method 1
an X-ray sensor unit including a sensor unit configured to detect the X-rays by photon counting
Data Source
AI summary
An X-ray inspection apparatus includes an irradiation unit configured to irradiate a conveyed article with X-rays, an X-ray sensor unit including a sensor unit configured to detect the X-rays by photon counting and an image generation unit configured to generate an image based on a detection result output from the sensor unit, and a control unit having a first mode for inspecting the article based on the image and a second mode for determining a state of the X-ray sensor unit at a time of time delay integration driving, in which the control unit is configured to compare a first image generated based on a detection result output from the sensor unit at a time t1 with a second image generated by integrating detection results output from the sensor unit until a time t2 after the time t1 to determine the state of the X-ray sensor unit.