X-Ray Detector Array Substrate Layout for Static Charge Diversion

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Solution Overview

Problem

Digital X-ray detectors face defects such as line defects and block luminance deviation due to static electricity generated during manufacturing, which can lead to reduced yield and operational issues.

Innovation Solution

An array substrate design with dummy pixel areas and branching of data and gate lines to redirect static electricity away from active areas, minimizing its impact on the detector's operation by creating paths with lower capacitance and narrower widths for static electricity to flow into non-operative areas.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If static electricity is generated during manufacturing, then manufacturing process is completed, but line defects and block luminance deviation occur reducing yield

Engineering Contradiction:
Improvemanufacturing yieldVSAvoiddetector operation reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent extracts the harmful static electricity from the active pixel areas by introducing dummy pixel areas that serve as dedicated discharge paths. The dummy pixels are specifically designed to attract and accommodate static electricity charges, effectively removing the threat from critical detection areas and preventing line defects and block luminance deviations.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The dummy pixel areas act as intermediary zones between the manufacturing process and the active detection areas. These intermediary regions absorb the static electricity impact, serving as a buffer that protects the functional pixels from electrical discharge damage during manufacturing operations.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Area of moving object

If data line and gate line overlap area is minimized, then pixel area is increased, but static electricity concentration occurs causing short circuits

Engineering Contradiction:
Improvepixel areaVSAvoidstatic electricity concentration
Core Design Contradiction:
Area of moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent converts the potentially harmful static electricity concentration into a beneficial feature by designing dummy pixel areas with minimal overlap between data and gate lines. These areas are intentionally created with low capacitance to attract static electricity, transforming what would be a harmful concentration point into a controlled discharge zone that protects the larger active pixel areas.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Reliability

If dummy pixel areas are added, then static electricity is redirected away from active areas, but device complexity increases

Engineering Contradiction:
Improvedefect resistanceVSAvoidsubstrate structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The dummy pixel areas serve multiple functions simultaneously: they act as static electricity discharge paths, maintain the regular matrix structure of the detector array, and provide edge protection for the active detection regions. This multi-functionality reduces the need for additional separate components, thereby limiting the increase in overall device complexity while achieving improved reliability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS12133015B2Array substrate for digital X-ray detector, and digital X-ray detector including the same
Publication Date: 2024.10.29 LG DISPLAY CO LTD
  • US12133015B2 patent drawing
  • US12133015B2 patent drawing
  • US12133015B2 patent drawing

AI summary

A digital X-ray detector includes a width of a data line or a gate line extending across a dummy pixel area is smaller than a width of the data line or the gate line extending across an active area, a width of a dummy gate line or a dummy data line extending across the dummy pixel area is smaller than a width of the gate line or the data line extending across the active area, so that static electricity generated during a manufacturing process does not randomly flow into the active area, but rather flows into the dummy pixel area having the lowest capacitance, and the static electricity may be guided not to the active area but to the dummy gate line or dummy data line in the dummy pixel area, thereby minimizing line defects or block luminance deviation defects caused by the static electricity generated during the manufacturing process.