X-ray Fluorescence Analysis Internal Standard Method

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Solution Overview

Problem

Existing X-ray fluorescence analysis methods fail to accurately determine the concentration of elements with atomic numbers ranging from 9 to 20 in liquid samples containing hydrogen, carbon, oxygen, and nitrogen, due to non-measurable elements affecting the internal standard line's accuracy.

Innovation Solution

The method employs scattered X-rays caused by continuous X-rays as an internal standard line, with a wavelength shorter than the fluorescent X-rays emitted from the elements, ensuring the measured intensity of scattered X-rays is inversely proportional to the mass absorption coefficient, allowing accurate calculation of element concentrations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If Compton scattering X-rays of characteristic X-rays of primary X-rays are used as internal standard lines, then the method can minimize inter-element effect on absorption of fluorescent X-rays, but the internal standard line fails to reflect the composition of the sample accurately when determining sulfur concentration in liquid samples containing hydrogen, carbon, oxygen, and nitrogen

Engineering Contradiction:
Improveaccuracy of concentration determinationVSAvoidaccuracy of internal standard line reflection
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The invention changes the parameter of the internal standard line from Compton scattering X-rays to scattered X-rays caused by continuous X-rays, with specifically controlled wavelength shorter than the fluorescent X-rays. This parameter change enables the internal standard line to accurately reflect sample composition even in the presence of non-measurable elements like hydrogen, carbon, oxygen, and nitrogen, thereby resolving the contradiction between reliability and measurement precision.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If scattered X-rays caused by continuous X-rays are used as internal standard line with wavelength shorter than fluorescent X-rays, then the internal standard line accurately reflects sample composition, but requires precise control of wavelength and inverse proportionality between intensity and mass absorption coefficient

Engineering Contradiction:
Improveaccuracy of internal standard line reflectionVSAvoidcomplexity of wavelength control and measurement
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention replaces complex mechanical wavelength control mechanisms with a method based on physical principles. By selecting scattered X-rays from continuous X-rays with wavelengths shorter than fluorescent X-rays, the system naturally satisfies the inverse proportionality condition between intensity and mass absorption coefficient. This substitution reduces device complexity while maintaining high measurement precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach accurately reflects the composition of liquid samples, enabling precise concentration calculation of elements with atomic numbers 9 to 20, even in the presence of non-measurable elements like hydrogen, carbon, and nitrogen.

Implementation Method 1

intensity of fluorescent X-rays, emitted from the element to be analyzed

Methodology Applied
Scientific EffectX-ray fluorescence: Fluorescence

Implementation Method 2

intensity of Compton scattering X-rays of characteristic X-rays of primary X-rays

Methodology Applied
Scientific EffectCompton scattering: Compton Scattering

Data Source

PatentEP2333529B1X-ray fluorescence analyzing method
Publication Date: 2013.10.16 RIGAKU CORP
  • EP2333529B1 patent drawingFigure 1
  • EP2333529B1 patent drawingFigure 2~3
  • EP2333529B1 patent drawingFigure 4

AI summary

An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).