X-Ray Fluorescence Analyzer Layout for Stable Irradiation Range
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Solution Overview
Problem
Conventional X-ray fluorescence analyzers face issues with reproducibility and sensitivity due to the need for a margin between the irradiation surface and the opening surface, which limits the X-ray irradiation range and affects analysis consistency.
Innovation Solution
The X-ray fluorescence analyzer is designed with an optical axis that intersects the pass-through surface obliquely, closer to the X-ray source than the midpoint of the pass-through surface, and uses an adjustment member with an aperture that is larger in one direction than the other, allowing for an expanded X-ray irradiation range without significant misalignment effects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a collimator with a circular aperture is used to provide a margin between the irradiation surface and the opening surface edge, then analytical reproducibility is improved, but the irradiation range of primary X-rays to the sample becomes narrower
Solution Approach 1:
The patent replaces the conventional circular aperture with an elliptical aperture in the collimator. The elliptical shape is specifically oriented so that its major axis is parallel to the opening surface, allowing the aperture to extend further in the direction parallel to the surface while maintaining appropriate margins in the perpendicular direction. This asymmetric geometry enables the irradiation range to be expanded without compromising analytical reproducibility, as the elliptical shape provides different clearance characteristics along different axes.
2Area of stationary object
If the optical axis passes through the center of the pass-through surface, then the irradiation range is maximized, but sample positional displacement causes significant changes in the irradiation range
Solution Approach 1:
The patent intentionally offsets the optical axis from the center of the pass-through surface. Specifically, the optical axis is positioned closer to the X-ray source side than the midpoint of the pass-through surface. This asymmetric positioning creates a geometric configuration where the irradiation range is determined by the collimator aperture rather than the pass-through surface boundaries, making the system less sensitive to sample positional variations and thereby improving analytical reproducibility.
Solution Approach 2:
The patent pre-configures the optical axis position and collimator aperture size to establish a fixed irradiation range before sample placement. By determining the irradiation boundaries through the collimator geometry rather than allowing them to be dictated by sample position or pass-through surface edges, the system proactively prevents variability caused by sample misalignment, ensuring consistent irradiation conditions across multiple analyses.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enhances analytical reproducibility and sensitivity by enlarging the X-ray irradiation range, ensuring consistent analysis results despite sample misalignment, and expanding the effective measurement area both along and perpendicular to the opening surface.
Implementation Method 1
an X-ray source configured to emit the primary X-rays
Implementation Method 2
a detector configured to detect fluorescent X-rays emitted from the sample when the sample arranged to cover the pass-through surface is irradiated with the primary X-rays
Data Source
AI summary
An X-ray fluorescence analyzer has a sample stage with a pass-through surface, an X-ray source for emitting primary X-rays so that the optical axis of the primary X-rays intersects with the pass-through surface obliquely, and a detector for detecting fluorescent X-rays emitted from the sample as a result of irradiation of the primary X-rays to the sample. The optical axis passes through the pass-through surface at a position closer to the X-ray source than the midpoint of the line segment connecting both ends of the pass-through surface along the optical axis.