X-ray Fluorescence Analyzer Sample Retract Mechanism
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Solution Overview
Problem
X-ray fluorescence spectrometers face issues where samples can be damaged or contaminated due to continuous X-ray irradiation during abnormalities, such as power failures, leading to potential sample deterioration and apparatus contamination.
Innovation Solution
An X-ray fluorescence spectrometer with a moving mechanism to retract samples to a standby position and a control unit that interrupts X-ray emission when communication is lost, including cut-off and atmosphere control to prevent damage and contamination.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the X-ray source continues to irradiate the sample during an abnormality (such as communication interruption), then the analysis operation can be maintained without interruption, but the sample may be damaged (burnt or cracked) and the apparatus may be contaminated
Solution Approach 1:
The patent applies preliminary anti-action by implementing a safety mechanism that proactively stops the harmful X-ray irradiation when an abnormality is detected. The first control unit monitors communication status and automatically interrupts the X-ray source upon detecting communication interruption, preventing sample damage and apparatus contamination before they can occur. This preemptive safety response resolves the contradiction by prioritizing sample and apparatus protection while maintaining operational continuity through automated abnormality handling.
2Duration of action of stationary object
If the sample is continuously irradiated with X-rays during abnormality, then the measurement process can proceed uninterrupted, but the thin resin film covering liquid or powder samples may be damaged causing sample scattering
Solution Approach 1:
The patent implements feedback control by continuously monitoring the communication status between control units and using this information to control the X-ray source operation. When communication interruption is detected, the system automatically stops the X-ray source, preventing damage to the thin resin film and sample scattering. This feedback mechanism resolves the contradiction by dynamically adjusting the measurement process based on system status, ensuring both measurement continuity and sample protection.
3Reliability
If automatic retreat control is implemented to move the sample to standby position when communication is interrupted, then sample and apparatus protection is improved, but the device complexity increases due to additional control mechanisms
Solution Approach 1:
The patent applies self-service by implementing an automated control system where the first control unit independently monitors communication status and automatically executes protective actions (stopping the X-ray source and moving the sample to standby position) without requiring external intervention. This self-service mechanism resolves the contradiction by providing reliable sample and apparatus protection through automation, reducing the need for complex manual control procedures while maintaining system reliability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents sample deterioration and apparatus contamination by ensuring safe sample handling and maintaining a clean environment during abnormalities, ensuring quick recovery and efficient analysis.
Implementation Method 1
an X-ray fluorescence spectrometer for performing qualitative and quantitative analysis of an element included in a sample by detecting fluorescent X-rays generated from the sample irradiated with primary X-rays
Data Source
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AI summary
Provided are an X-ray fluorescence spectrometer and a control method for an X-ray fluorescence spectrometer which are capable of preventing deterioration and breakage of a sample, and contamination of the inside of an apparatus even when an abnormality occurs in the X-ray fluorescence spectrometer. The X-ray fluorescence spectrometer includes: a measuring unit including: a moving mechanism configured to move a sample between a standby position and a measurement position; an X-ray source configured to irradiate the sample with primary X-rays; a detector configured to measure an intensity of entering fluorescent X-rays; and a first control unit configured to control operations of the moving mechanism and the X-ray source; and an information processing unit including: an analysis unit configured to analyze the sample based on the intensity of the fluorescent X-rays measured by the detector; and a second control unit configured to control the measuring unit by communicating with the first control unit, the first control unit including retreating means for performing retreat control for causing the moving mechanism to retreat the sample present at the measurement position to the standby position when communication between the first control unit and the second control unit is interrupted.