X-ray Fluorescence Analyzer Slurry Detection

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Solution Overview

Problem

X-ray fluorescence analysis in the mining industry faces challenges in accurately detecting small concentrations of elements in slurries due to low intensity fluorescent radiation and significant background radiation, especially when dealing with continuous flow samples where measurement times are limited and sample handling requires turbulent flow to prevent phase separation.

Innovation Solution

An X-ray fluorescence analyzer is designed with a high-power X-ray tube (at least 400 watts) and a direct optical path to a slurry handling unit, using a pyrolytic graphite crystal to collect fluorescent radiation, maintaining constant measurement geometry, and employing multiple detection channels with different crystal diffractors to separate specific wavelength ranges, enhancing detection efficiency and accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If measurement time is extended to improve detection accuracy of low concentration elements, then measurement precision improves, but productivity deteriorates because the slurry is a continuous flow and cannot be held for extended periods

Engineering Contradiction:
Improvedetection accuracyVSAvoidmeasurement speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent implements rapid sequential measurement of multiple elements by quickly switching between different crystal diffractors and detection channels, allowing the system to capture sufficient fluorescent radiation signals from low concentration elements in the continuous slurry flow without extending the overall measurement time, thus resolving the contradiction between measurement precision and productivity

Inventive Principle:
Principle #21Skipping (Rushing through)

Solution Approach 2:

The patent pre-configures multiple crystal diffractors and detection channels for different wavelength ranges before measurement begins, allowing immediate detection of target elements as they pass through the measurement zone, eliminating the need for extended measurement times and maintaining both accuracy and throughput in continuous slurry analysis

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If X-ray tube power is increased to improve fluorescent radiation intensity for low concentration detection, then measurement precision improves, but energy consumption increases

Engineering Contradiction:
Improvedetection accuracyVSAvoidenergy consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent uses multiple detection channels with different crystal diffractors optimized for specific wavelength ranges, allowing selective detection of fluorescent radiation from different elements. This enables the system to achieve high measurement precision for low concentration elements by focusing detection resources on relevant signals rather than requiring uniformly high X-ray power across all wavelengths, thus reducing overall energy consumption while maintaining detection accuracy

Inventive Principle:
Principle #3Local quality

3Adaptability or versatility

If multiple crystal diffractors and detection channels are added to detect multiple elements simultaneously, then adaptability improves, but device complexity increases

Engineering Contradiction:
Improvemulti-element detection capabilityVSAvoidsystem complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent combines multiple crystal diffractors and detection channels into a single integrated measurement system where all components operate simultaneously on the continuous slurry flow. This merging approach enables multi-element detection with enhanced adaptability while managing device complexity through unified system architecture and coordinated operation of all detection channels

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This setup allows for accurate and reliable detection of small element concentrations in real-time, even with short measurement times, by maximizing the utilization of incident radiation and improving the collection and separation of fluorescent signals, thus overcoming the limitations of low signal intensity and background interference.

Implementation Method 1

X-ray fluorescence analysis can be used to detect the presence and measure the concentration of elements of interest in a matrix of other elements

Methodology Applied
Scientific EffectX-ray fluorescence: Fluorescence

Implementation Method 2

Said first crystal diffractor is configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into said first direction

Methodology Applied
Scientific EffectDiffraction: Diffraction

Data Source

PatentUS11815480B2X-ray fluorescence analyzer and a method for performing an x-ray fluorescence analysis
Publication Date: 2023.11.14 METSO OUTOTEC FINLAND OY
  • US11815480B2 patent drawing
  • US11815480B2 patent drawing
  • US11815480B2 patent drawing

AI summary

An X-ray fluorescence analyzer comprises an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit, and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The input power rating of said X-ray tube is at least 400 watts. The first crystal diffractor comprises a pyrolytic graphite crystal. The optical path between said X-ray tube and the slurry handling unit is direct with no diffractor therebetween.