X-ray Fluorescence Analyzer Vacuum Control for Liquid Samples
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current X-ray fluorescence analyzers face challenges in analyzing light elements without using helium, which is scarce and expensive, and in preventing liquid samples from vaporizing when the atmospheric pressure is reduced.
Innovation Solution
An X-ray fluorescence analyzer with a vacuum adjustment mechanism that sets a lower degree of vacuum in the sample chamber for liquid samples, allowing for light element analysis without helium and preventing vaporization, while maintaining sufficient X-ray transmittance and intensity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If the atmospheric pressure is reduced to analyze light elements, then the X-ray transmittance is improved, but the liquid sample vaporizes
Solution Approach 1:
The patent applies parameter changes by dynamically adjusting the vacuum degree (pressure parameter) according to the sample type. For liquid samples, a lower vacuum degree is maintained to prevent vaporization, while for solid samples, a higher vacuum degree is used to maximize X-ray transmittance for light element analysis. This conditional parameter adjustment resolves the contradiction between X-ray transmittance and sample phase stability.
2Illumination intensity
If helium atmosphere is used to improve light element analysis, then the X-ray transmittance is improved, but the cost and availability worsen
Solution Approach 1:
The patent replaces expensive and scarce helium gas with ordinary air or nitrogen atmosphere, using a disposable/replaceable vacuum control mechanism instead. By utilizing readily available gases and controlling the vacuum degree dynamically, the system achieves light element analysis without relying on costly helium, thus resolving the contradiction between analysis performance and resource availability.
3Measurement precision
If the vacuum degree is increased for solid samples, then the light element analysis intensity is improved, but the liquid sample stability deteriorates
Solution Approach 1:
The patent implements dynamic control of the vacuum degree based on real-time detection of sample type (liquid or solid). The vacuum adjustment mechanism dynamically modifies the pressure conditions during analysis, transitioning from a static vacuum system to a dynamic one that adapts to sample characteristics, thereby maintaining both measurement precision and sample integrity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables light element analysis with sufficient intensity and prevents liquid sample vaporization, using a controlled vacuum and cooling mechanism to maintain the sample in a stable phase, thus overcoming the limitations of helium-based systems.
Implementation Method 1
the atmospheric pressure around the liquid sample is reduced to be lower than the vapor pressure of the liquid sample
Implementation Method 2
a cooling mechanism configured to cool the sample
Implementation Method 3
primary X-rays emitted from an X-ray tube
Implementation Method 4
fluorescence X-rays generated from the sample
Data Source
AI summary
The X-ray fluorescence analyzer is equipped with a sample stage, a first housing, an X-ray tube, a detector, and a vacuum adjustment mechanism. The sample stage is configured to place a sample thereon. The first housing is mounted on a first face of the sample stage, the sample being placed on the first face, the first housing forming a sample chamber together with the sample stage. The detector is configured to detect fluorescent X-rays emitted from the sample when the sample in the sample chamber is irradiated with primary X-rays emitted from the X-ray tube. The vacuum adjustment mechanism sets the degree of vacuum in the sample chamber. In a case where the sample is liquid, the vacuum adjustment mechanism sets the degree of vacuum in the sample chamber during the analysis of the sample to be lower than in a case where the sample is a solid sample.


