X-ray Fluorescence Spectrometer Circumvent Angle Selection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing X-ray fluorescence analysis methods fail to provide precise analysis for samples with non-rotationally symmetric crystalline structures, as they rely on angles that minimize secondary X-rays intensity, which may not be optimal and can lead to interference issues, limiting analysis accuracy.
Innovation Solution
A compact X-ray fluorescence spectrometer that displays diffraction profiles and allows selection of circumvent angles with intervals less than 180 degrees, enabling precise analysis of both rotationally symmetric and non-rotationally symmetric samples by controlling the sample's rotation and translation to avoid diffracted X-rays interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If the sample is rotated to the position where secondary X-rays intensity attains minimum value, then interference from diffracted X-rays is reduced, but analysis precision deteriorates for samples with non-rotationally symmetric crystalline structures
Solution Approach 1:
The invention changes the rotational angle parameter from the conventional minimum intensity position to a circumvent angle position. By selecting a rotational angle that circumvents the diffracted X-rays based on the diffraction profile rather than simply minimizing secondary X-rays intensity, the system achieves both interference reduction and maintained analysis precision for non-rotationally symmetric samples
Solution Approach 2:
The invention performs preliminary measurement of the diffraction profile before the actual fluorescence analysis. This preliminary action allows the system to identify suitable circumvent angles in advance, ensuring that the main measurement can be conducted at an angle that avoids diffracted X-rays interference while maintaining analysis precision
2Measurement precision
If multiple circumvent angles are selected with intervals smaller than 180 degrees, then analysis accuracy for non-rotationally symmetric samples is improved, but device complexity increases
Solution Approach 1:
The invention implements dynamic angle selection where the system can choose from multiple predetermined circumvent angles based on the specific sample characteristics and measurement requirements. The control unit dynamically selects the most appropriate angle from the set of circumvent angles, providing flexibility without requiring complex mechanical adjustments during measurement
3Object-affected harmful factors
If the sample table, rotating unit and parallel translating unit are designed to accommodate multiple circumvent angles, then interference from diffracted X-rays is avoided, but spatial requirements and device complexity increase
Solution Approach 1:
The invention segments the angular measurement space into multiple discrete circumvent angles rather than requiring continuous angular adjustment capability. By pre-determining specific circumvent angles and designing the mechanical system to accommodate these discrete positions, the system avoids diffracted X-rays interference while minimizing spatial requirements compared to a fully continuous adjustment system
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient analysis of samples with non-rotationally symmetric structures by optimizing the selection and display of circumvent angles, improving signal-to-noise ratio and allowing for simultaneous multi-element measurement with reduced spatial requirements.
Implementation Method 1
X-ray fluorescence analysis of a sample
Implementation Method 2
intensity of the diffracted X-rays incident on the detector
Data Source
Figure 1~2
Figure 3
Figure 4
AI summary
The X-ray fluorescence spectrometer of the present invention includes a sample table (8) for a sample (S) having a crystalline structure, an X-ray source (1), a detecting unit (7) for detecting secondary X-rays (4) from the sample (S), a rotating unit (11) for rotating the sample table (8), a parallel translating unit (12) for causing the sample table (8) to undergo a parallel translational movement, a selecting unit (17) for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (4), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit (15) for controlling the rotating unit (11) so as to set the sample (S) at the circumvent angle at which the sample table (8) will not interfere with any other structures.