X-Ray Fluorescence Quantification for Corrected Detection Limits
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Solution Overview
Problem
Existing X-ray fluorescence spectrometers do not adequately consider the influence of coexisting elements on background intensity and do not provide a method to calculate the lower limit of detection accurately, especially when absorption/excitation and overlap corrections are involved.
Innovation Solution
An X-ray fluorescence spectrometer that calculates the lower limit of detection using equations (1) and (2), incorporating absorption/excitation and overlap corrections, allowing for precise determination of detection limits through a quantification unit and displaying unit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If absorption/excitation correction and overlap correction are performed in the calibration curve method, then measurement precision is improved, but the ability to accurately calculate the lower limit of detection deteriorates due to lack of consideration for correction influences
Solution Approach 1:
The patent applies preliminary action by calculating the lower limit of detection before final quantification, using predicted values from the calibration curve that incorporate absorption/excitation correction and overlap correction. The system predicts what the measured intensity would be at zero concentration (IBG') and uses this to calculate the lower limit of detection, ensuring that the detection limit reflects the actual correction procedures applied during analysis.
Solution Approach 2:
The patent implements feedback by using the calculated lower limit of detection to validate and adjust the calibration curve parameters. The system continuously refines the calibration curve constants (A, B, C) and correction coefficients by comparing predicted values with actual measurements, ensuring that both the quantification accuracy and detection limit calculations are mutually consistent and improved through iterative optimization.
2Measurement precision
If standard samples with known component contents are used to create calibration curves, then quantification capability is improved, but the complexity of the analysis process increases due to multiple correction requirements
Solution Approach 1:
The patent applies universality by creating a multi-functional calibration curve that simultaneously performs multiple correction functions. The calibration curve constants (A, B, C) and the lower limit of detection calculation work together to handle absorption/excitation correction, overlap correction, and detection limit determination in a unified mathematical framework, reducing the need for separate correction procedures and simplifying the overall analysis process.
Solution Approach 2:
The patent uses parameter changes by transforming the complex correction problems into manageable mathematical parameters. The system changes the parameters from raw measured intensities to corrected values using the calibration curve equation, where the constants A, B, and C encapsulate the correction factors. This parameter transformation approach converts complex physical correction processes into straightforward mathematical operations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate calculation of the lower limit of detection by reflecting the influences of absorption/excitation and overlap corrections, providing criteria for selecting appropriate standard samples and correction components.
Implementation Method 1
irradiate a sample with primary X-rays and obtain a content of each component in the sample on the basis of measured intensities of fluorescent X-rays generated through the irradiation
Data Source
AI summary
In an X-ray fluorescence spectrometer of the present invention, a quantification unit calculates a lower limit of detection on the basis of a calibration curve equation including an absorption/excitation correction term and an overlap correction term.