X-Ray Fluorescence Spectrometer Counting Loss Precision Correction
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Solution Overview
Problem
Conventional X-ray fluorescence spectrometers underestimate the fluctuation in counting loss correction, leading to overestimation of counting precision at high fluorescent X-ray intensities, resulting in inaccurate quantitative analysis.
Innovation Solution
An X-ray fluorescence spectrometer that calculates and displays the theoretical standard deviation of corrected differential intensity using equation (1), reflecting fluctuations in counting loss correction, and determines an optimal tube current value for precise analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional counting precision estimation methods are used, then calculation simplicity is maintained, but measurement precision deteriorates due to overestimation of counting precision at high intensities
Solution Approach 1:
The patent changes the parameters used in counting precision estimation from simple uncorrected intensity values to corrected intensity values that account for counting loss. Specifically, it uses corrected differential intensity (Iw) and corrected integrated intensity (It) along with their respective counting loss correction coefficients (τw and τd) to calculate theoretical standard deviation, thereby improving measurement precision while managing calculation complexity through systematic parameter transformation.
2Productivity
If high-intensity fluorescent X-rays are measured, then productivity increases, but measurement precision deteriorates due to significant counting loss
Solution Approach 1:
The patent implements a feedback mechanism where the measured uncorrected intensities (Iw0 and It0) are used to calculate the counting loss correction coefficients (τw and τd), which then feed back into the corrected intensity calculation. This closed-loop approach allows the system to automatically compensate for counting loss effects, enabling high-intensity measurements to maintain precision while improving productivity through faster counting rates.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate quantitative analysis with appropriate counting precision by accounting for counting loss fluctuations, reducing the standard deviation by 11% compared to conventional methods.
Implementation Method 1
an X-ray fluorescence spectrometer which irradiates a sample with primary X-rays from an X-ray tube and which performs, based on intensities of generated fluorescent X-rays
Data Source
Figure 1
AI summary
In an X-ray fluorescence spectrometer of the present invention, a quantification unit calculates a theoretical standard deviation of a corrected differential intensity as counting precision, based on an uncorrected integrated intensity and an uncorrected differential intensity, by equation (1), and displays the theoretical standard deviation. σWIt0,IW0=∂IW/∂It02⋅σIt02+∂IW/∂IW02⋅σIW021/2 where, σW: theoretical standard deviation of corrected differential intensity, It0: uncorrected integrated intensity, Iw0: uncorrected differential intensity, IW: corrected differential intensity, σIt0: theoretical standard deviation of uncorrected integrated intensity, and σIW0: theoretical standard deviation of uncorrected differential intensity.