X-ray Fluorescence Detector for Biological Analyte Analysis
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Solution Overview
Problem
Current X-ray fluorescence (XRF) techniques face challenges in efficiently analyzing biological samples by distinguishing characteristic X-rays from the analyte and background X-rays, particularly when using total external reflection configurations.
Innovation Solution
The apparatus and method involve directing an X-ray beam at a glancing angle onto a surface with immobilized biological analytes, where the X-ray beam undergoes total external reflection, allowing for the emission and detection of characteristic X-rays from attached elements while rejecting reflected X-ray beams.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If total external reflection configuration is used to enhance surface sensitivity, then detection precision of surface-bound analytes is improved, but interference from reflected X-ray beam increases
Solution Approach 1:
The patent extracts and removes the harmful reflected X-ray beam from the detection path by positioning the detector to detect only fluorescence emitted at angles away from the reflected beam direction. This separates the useful fluorescence signal from the harmful reflected beam interference, allowing surface-sensitive detection without contamination from the intense reflected primary beam.
Solution Approach 2:
The patent applies local quality by creating spatially differentiated detection zones: one region captures the useful fluorescence emission from the sample surface, while another region (where the reflected beam travels) is excluded from detection. The detector is positioned to selectively receive photons from specific angular regions, giving different spatial locations different functional roles in the measurement process.
2Measurement precision
If glancing angle incidence is used to increase path length for surface analysis, then surface sensitivity is improved, but complexity of beam geometry control increases
Solution Approach 1:
The patent utilizes parameter changes by varying the glancing angle of incidence to optimize the penetration depth and interaction path length of X-rays with the sample. By adjusting this angular parameter, the system enhances surface sensitivity without requiring complex mechanical configurations, as the angle itself controls the effective sampling depth and beam-sample interaction geometry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the detection of characteristic X-rays from biological analytes, improving the accuracy and efficiency of elemental analysis in biological samples by minimizing interference from reflected X-rays.
Implementation Method 1
the X-ray source is configured to direct an X-ray beam toward a surface at a glancing angle at which the X-ray beam undergoes total external reflection by the surface
Implementation Method 2
An electron on an inner orbital of an atom may be ejected, leaving a vacancy on the inner orbital, if the atom is exposed to X-rays or gamma rays with photon energy greater than the ionization potential of the electron
Implementation Method 3
When an electron on an outer orbital of the atom relaxes to fill the vacancy on the inner orbital, an X-ray (fluorescent X-ray or secondary X-ray) is emitted
Data Source
AI summary
Disclosed herein is an apparatus, comprising: an X-ray source; an X-ray detector; wherein the X-ray source is configured to direct an X-ray beam toward a surface at a glancing angle at which the X-ray beam undergoes total external reflection by the surface; wherein a first biological analyte is immobilized to the surface and a first element is attached to the first biological analyte; wherein the X-ray beam is capable of causing emission of characteristic X-rays of the first element; wherein the X-ray detector is configured to receive the characteristic X-rays of the first element but not the X-ray beam reflected by the surface.