X-ray Fluorescence System Particle Size Correction
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Solution Overview
Problem
Existing X-ray fluorescence systems face challenges in accurately characterizing samples with varying particle sizes, as the particle size effect significantly affects measurement results, and existing technologies are limited by size, complexity, performance, accuracy, and cost, especially when processing dry powders and slurries.
Innovation Solution
An X-ray fluorescence system that varies the energy of incident X-ray radiation between a first and a second energy, detecting corresponding fluorescence radiation intensities to determine a particle size correction factor, allowing for accurate determination of material composition by minimizing the particle size effect through multiple measurements at different energies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single incident radiation energy is used for X-ray fluorescence measurement, then the measurement process is simple and fast, but the particle size effect cannot be corrected and measurement accuracy is reduced
Solution Approach 1:
The patent applies parameter changes by varying the incident radiation energy across multiple measurements. The system performs X-ray fluorescence measurements at least at two different incident energies (e.g., first and second incident radiation energies), allowing the particle size effect to be quantified and corrected. This multi-energy approach transforms a single-parameter measurement into a multi-parameter analysis, enabling accurate composition determination despite particle size variations.
2Measurement precision
If multiple incident radiation energies are used to correct for particle size effects, then measurement accuracy is improved, but measurement time and system complexity increase
Solution Approach 1:
The system implements continuous measurement by performing multiple fluorescence intensity measurements at different incident energies in a sequential manner without interrupting the analysis process. The controller automatically varies the incident radiation energy and continues measuring fluorescence intensities until sufficient data is collected to calculate the particle size correction factor, maintaining continuous productive action throughout the measurement process.
Solution Approach 2:
The patent employs feedback mechanisms where the measured fluorescence intensities at different energies are used to calculate a particle size correction factor, which then feeds back into the final composition determination. The system uses the ratio of fluorescence intensities from different energy measurements to determine correction factors that are applied to subsequent analysis, creating a closed-loop feedback system that improves accuracy.
3Measurement precision
If existing X-ray fluorescence systems are used without energy variation, then the system is simple and cost-effective, but it cannot accurately characterize samples with varying particle sizes
Solution Approach 1:
The patent makes the X-ray source multi-functional by enabling it to operate at multiple incident radiation energies. The same X-ray source and detector system performs both the primary fluorescence measurement and the particle size effect characterization by varying the incident energy. This multi-functionality allows a single system to handle both standard composition analysis and particle size-corrected analysis without requiring separate specialized equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively corrects for particle size effects, enhancing the accuracy of material composition analysis in samples with diverse particle sizes, improving the reliability and precision of XRF spectrometry, particularly for dry powders and slurries, by using a processor to calculate a particle size correction factor based on fluorescence radiation responses at different energies.
Implementation Method 1
X-ray fluorescence spectrometry is a technique that uses incident X-ray radiation to excite a target (e.g. sample to be characterised) so that a resulting fluorescence radiation is measured to determine an elemental composition of the sample
Data Source
AI summary
The application discloses an X-ray fluorescence system comprising an X-ray source to emit X-ray radiation incident on the sample and a controller to vary an energy of the X-ray radiation incident on the sample between at least a first incident radiation energy and a second incident radiation energy. The system further comprises an X-ray fluorescence detector to detect X-ray radiation fluoresced by the sample in response to the incident X-ray radiation and determine at least: a first fluorescence radiation intensity of X-ray radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the first incident energy and a second fluorescence radiation intensity of X-ray fluorescence radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the second incident energy. A method of X-ray fluorescence is also disclosed.