Wavelength Dispersive XRF Spectrometer Dynamic Slit Background Correction
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Solution Overview
Problem
Conventional wavelength dispersive X-ray fluorescence spectrometers with focusing optical systems face challenges in accurately correcting background intensities due to lower sensitivity in peak areas compared to adjacent areas, leading to incomplete net intensity measurement, and have complex structures that increase costs and assembly time.
Innovation Solution
A wavelength dispersive X-ray fluorescence spectrometer with a focusing optical system incorporating a position sensitive detector and a measured spectrum display unit, which allows for the setting of peak and background areas, and calculates net intensities using background correction coefficients, enabling accurate and quick background correction with a simple structure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a fixed focusing optical system with a single spectroscopic device and a receiving slit with multiple openings is used, then the structure is simple, but the sensitivity in peak areas is lower than in adjacent areas, leading to inaccurate background correction
Solution Approach 1:
The invention makes the receiving slit dynamic by enabling selective opening/closing of individual openings based on measurement mode. In peak area measurement, only the opening corresponding to the peak wavelength is opened. In background measurement, openings corresponding to background areas are opened. This dynamic configuration allows the fixed optical system to achieve variable sensitivity matching different measurement requirements, resolving the contradiction between structural simplicity and measurement accuracy.
Solution Approach 2:
The invention changes the operational parameters of the receiving slit by controlling which openings are active during different measurement phases. By selectively activating specific openings for peak measurement versus background measurement, the system adjusts its sensitivity characteristics without physical modification to the optical components, thereby achieving accurate background correction while maintaining structural simplicity.
2Measurement precision
If multiple spectroscopic devices are used to measure peak and background intensities with equal sensitivity, then measurement accuracy improves, but the structure becomes complicated and costs increase
Solution Approach 1:
The invention segments the receiving slit into multiple independent openings, each corresponding to different wavelength regions (peak area and background areas). By controlling individual openings rather than using a single receiving slit or multiple spectroscopic devices, the system achieves the capability to separately measure peak and background intensities with equal sensitivity while using only one spectroscopic device, thus avoiding the complexity and cost of multiple devices.
Solution Approach 2:
The single spectroscopic device performs multiple functions by combining it with the segmented receiving slit system. The same spectroscopic device measures both peak intensities and background intensities, with the receiving slit configuration determining the measurement target. This multi-functional approach eliminates the need for separate spectroscopic devices for peak and background measurements, reducing structural complexity and cost.
3Productivity
If a position sensitive detector is used to simultaneously measure peak and background intensities, then measurement speed improves, but the cost and complexity increase
Solution Approach 1:
The invention uses periodic action by sequentially measuring peak intensities and background intensities in rapid succession. The receiving slit is configured to measure peak area first, then configured to measure background areas. This sequential measurement approach achieves fast measurement results comparable to simultaneous measurement while using a simpler single-element detector system, avoiding the cost and complexity of position sensitive detectors.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for accurate and high-precision quantitative analysis by effectively correcting background intensities and maintaining detector performance over a long period, reducing the complexity and cost of the spectrometer.
Implementation Method 1
a spectroscopic device (6) that monochromates and focuses the secondary X-rays (4) that have passed through the divergence slit (5)
Implementation Method 2
a position sensitive detector (10) that has a plurality of detection elements (7) that are disposed in a spectral angle direction of the spectroscopic device (6)
Data Source
Figure 1
Figure 2~3
Figure 4~5
AI summary
A wavelength dispersive X-ray fluorescence spectrometer of the present invention includes: a position sensitive detector (10) configured to detect intensities of secondary X-rays (41) at different spectral angles, by using detection elements (7) corresponding to the secondary X-rays (41) at different spectral angles; a measured spectrum display unit (14) configured to display a relationship between a position, in an arrangement direction, of each detection element (7), and a detected intensity by the detection element (7), as a measured spectrum, on a display (15); a detection area setting unit (16) configured to be set a peak area and a background area; and a quantification unit (17) configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity in the peak area, a background intensity in the background area, and a background correction coefficient, and to perform quantitative analysis.