X-ray Fluorescence Spectrometer Geometry Simulation
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Solution Overview
Problem
Conventional X-ray fluorescence spectrometers using the fundamental parameter method struggle to accurately analyze sample composition due to the geometry effect, requiring multiple sensitivity curves that are impractical to determine beforehand, leading to inaccurate results.
Innovation Solution
An X-ray fluorescence spectrometer with a calculating device that simulates the theoretical intensity of secondary X-rays for each optical path using the sample size and incident angle of primary X-rays, eliminating the need for pre-determined sensitivity curves and allowing for accurate analysis of various samples.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sensitivity curves are determined by systematically changing sample thickness to account for geometry effect, then measurement precision is improved, but device complexity and preparation time increase due to requiring multiple sensitivity curves for various samples
Solution Approach 1:
The patent changes the approach from using multiple pre-determined sensitivity curves for different sample types to a single simulation-based calculation that dynamically adapts to any sample composition by varying parameters such as sample thickness, element concentration, and optical path geometry. This eliminates the need to prepare multiple sensitivity curves while maintaining measurement precision across various sample types.
Solution Approach 2:
The patent creates a virtual model (simulation) of the optical paths and X-ray interactions that replicates the physical measurement process. This simulated sensitivity curve can be universally applied to different samples by adjusting input parameters, replacing the need for multiple physical sensitivity curves determined through systematic thickness changes.
2Measurement precision
If simulation is performed for each optical path using sample size and incident angle parameters, then measurement precision is improved by accurately considering geometry effect, but calculation time increases
Solution Approach 1:
The patent performs preliminary simulation calculations to generate sensitivity curves for various optical paths, sample thicknesses, and element concentrations before actual measurement. These pre-calculated simulated sensitivity curves are stored and can be rapidly applied during actual analysis, reducing real-time calculation time while maintaining the accuracy benefits of geometry effect consideration.
Solution Approach 2:
The patent implements a dynamic calculation approach where the simulation adapts to the specific sample being analyzed by adjusting parameters such as sample thickness and element concentration. This allows the system to perform accurate geometry-corrected calculations for each sample while optimizing calculation time by only computing what is necessary for the specific measurement conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate and efficient quantitative analysis of sample composition by considering the geometry effect, reducing calculation time and eliminating the need for pre-determined sensitivity curves, while maintaining practical calculation times.
Implementation Method 1
X-ray fluorescence spectrometer for analyzing the composition of and the area density of a sample based on the FP method
Implementation Method 2
a detecting device for measuring the intensity of secondary X-rays emanating from the sample
Data Source
AI summary
An X-ray fluorescence spectrometer which includes a calculating device (10) operable to calculate the theoretical intensity of secondary X-rays (6), emanated from each of elements contained in a sample (13), based on the assumed composition and then to successively approximately modify and calculate the assumed composition so that the theoretical intensity and the converted and measured intensity, which have been detected by a detecting device (9) and then converted in a theoretical intensity scale, can match with each other, to thereby calculate the composition of the sample (13). The calculating device (10), when calculating the theoretical intensity, performs a simulation to determine the theoretical intensity of the secondary X-rays (6) for each of optical paths, using the size of the sample (13), and the intensity and the incident angle (φ) of primary X-rays (2) impinged upon various areas of the sample surface (13a) as parameters.