Yarn Line Inspection Using Dual Illumination and Imaging
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Solution Overview
Problem
Current methods for inspecting multiple yarns running in parallel are costly and inefficient, as they require multiple light receiving sections or struggle to detect defects in yarns with low lightness or those that spread over the surface, limiting the ability to identify defects in each yarn simultaneously.
Innovation Solution
A running yarn inspection method using a line sensor with dual illumination sources and data processing techniques to differentiate yarn and background luminance, allowing for the identification of defects and their states in multiple yarns running in parallel, including the use of reflection plates to enhance light measurement and data processing procedures to specify defect positions and types.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple light receiving sections are used to inspect each yarn individually, then defect detection accuracy for each yarn is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent combines multiple light receiving sections into a single integrated imaging device (camera) that captures images of multiple yarns simultaneously. This merging approach maintains the ability to detect defects in each individual yarn while significantly reducing the number of separate detection components needed, thereby lowering device complexity and cost.
Solution Approach 2:
The imaging device serves as a universal detection tool that can inspect multiple yarns running in parallel simultaneously. Instead of requiring dedicated light receiving sections for each yarn, the single imaging device performs the detection function for all yarns, demonstrating multi-functionality that resolves the contradiction between detection accuracy and device complexity.
2Device complexity
If a single light receiving section is used to inspect multiple yarns simultaneously, then device complexity is reduced, but the ability to identify which specific yarn has a defect is lost
Solution Approach 1:
The patent segments the inspection field into multiple detection regions, each corresponding to a specific yarn. The imaging device captures images that can be divided into these segments, allowing the system to identify which specific yarn has a defect by analyzing the corresponding segment of the captured image, thus preserving defect location information while using a single detection device.
Solution Approach 2:
The patent transitions from one-dimensional point detection (single light receiving section) to two-dimensional image detection. The imaging device captures spatial information across multiple yarns simultaneously, adding a spatial dimension that enables identification of defect locations while reducing the number of detection components required.
3Device complexity
If traditional light interception method is used to detect yarn defects, then device structure is simple, but detection precision for flat defects spreading over yarn surface is insufficient
Solution Approach 1:
The patent replaces the traditional mechanical light interception detection method with an optical imaging system. Instead of measuring light intensity changes from a single point, the imaging device captures visual information of the yarn surface, enabling detection of flat defects that spread across the yarn surface while maintaining relatively simple system structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and accurate online detection of defects in multiple yarns, improving quality control and reducing the need for multiple light receiving sections, allowing for simultaneous inspection of a larger number of yarns while identifying defect states effectively.
Implementation Method 1
an imaging means for imaging multiple yarns running in parallel to each other
Implementation Method 2
a first illumination means for illuminating, from a first face side of the yarn running plane, the multiple yarns
Implementation Method 3
a second illumination means for illuminating, from a second face side of the yarn running plane, the multiple yarns
Data Source
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AI summary
A running yarn line inspection method inspects yarn lines running in parallel in the same surface. The running yarn line inspection method is provided with a first illumination means and a line sensor for imaging the yarn lines on the side of the first surface of the running surface of the yarn lines and a second illumination means on the side of the second surface, and comprises a data processing means which processes data obtained by the line sensor and a recording means which records data processed by the data processing means with time.