Splice Quality Monitoring in Textile Yarn Using Multi-Parameter Cleaning Curves
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Solution Overview
Problem
Existing methods for monitoring textile yarn quality, particularly in splicing, lack differentiated criteria for evaluating and eliminating splices, often relying solely on diameter or mass, which does not effectively assess visual appearance or functionality.
Innovation Solution
A method and device that use an electronic measuring head to define and apply distinct cleaning limits for splices based on multiple parameters, allowing for the differentiation between permissible and impermissible splices, with graphical representation and adjustable limits to optimize splice quality and minimize unnecessary removal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single cleaning limit based on diameter or mass is used for splice monitoring, then the device complexity is reduced and operation is simplified, but the measurement precision and manufacturing precision of splice quality assessment deteriorates
Solution Approach 1:
The patent transitions from single-parameter (diameter or mass) splice assessment to multi-parameter assessment by introducing a diagram with multiple axes (e.g., diameter deviation, mass deviation, splice length). This dimensional expansion enables comprehensive quality evaluation while maintaining device simplicity through integrated electronic measurement and automated diagram generation.
Solution Approach 2:
The patent segments the splice quality assessment into multiple independent parameters (diameter, mass, length, etc.) that are measured separately and then integrated in a diagram. This segmentation allows precise measurement of each parameter while keeping the measurement system modular and manageable.
2Manufacturing precision
If differentiated cleaning limits for splices are implemented based on multiple parameters, then the manufacturing precision and quality assessment improve, but the device complexity and operational complexity increase
Solution Approach 1:
The patent creates a universal monitoring system that handles multiple splice parameters (diameter, mass, length) and defect types through a single integrated diagram and cleaning limit framework. This multi-functional approach achieves precise quality control without proportionally increasing device complexity, as the same electronic measurement head and control unit handle all parameters.
Solution Approach 2:
The patent uses diagrammatic representations that copy and visualize the complex multi-parameter relationships in an accessible format. The cleaning limits are represented as curves in the diagram, providing an intuitive visual copy of the complex quality criteria that simplifies operational decision-making.
3Productivity
If automated calculation of cleaning limits is implemented, then the productivity and measurement precision improve, but the device complexity increases
Solution Approach 1:
The system performs automated calculation of cleaning limits and generation of diagrams without requiring manual intervention. The control unit automatically processes measurement data, calculates appropriate cleaning limits based on predefined criteria, and generates visual diagrams, enabling self-service operation that boosts productivity while keeping control complexity manageable through algorithmic automation.
Solution Approach 2:
The automated system continuously monitors splice parameters, compares measurements against calculated cleaning limits, and provides immediate feedback through the diagram and alarm systems. This closed-loop feedback mechanism enhances productivity by enabling real-time quality decisions while the automated calculation reduces the feedback processing burden on operators.
Data Source
Figure 1(a)~7
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Figure 3(a)~3(c)
AI summary
In the method for setting a cleaning threshold for an elongated textile test material, such as yarn, on an electronic measuring head, a first cleaning threshold, which is dependent on at least two parameters of the test material, between admissible and inadmissible imperfections is established in the test material, represented in a diagram as a first cleaning curve (14) and transmitted to the measuring head. A second cleaning threshold, which is dependent on the at least two parameters of the test material and differs from the first cleaning threshold, between admissible and inadmissible splices in the test material is automatically calculated from the first cleaning curve, represented in a diagram as a second cleaning curve (16) and transmitted to the measuring head. In this way, a cleaning threshold for splices is determined in a simple manner, which provides differentiated criteria for the elimination of splices.