Yield Map Correction Using Crop Edge Time-Delay Detection

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Solution Overview

Problem

Existing yield mapping systems in agricultural harvesting machines suffer from time delays between crop pickup and sensing, leading to inaccuracies in yield maps due to varying factors like crop characteristics, machine configuration, and field topography, which current methods fail to accurately account for.

Innovation Solution

A method and arrangement that georeferences sensor signals with associated time data by identifying crop edges and spatial offsets in the yield map, allowing for correction of time delays without additional sensors, using the yield map and sensor signals to determine and compensate for the time delay between crop pickup and sensing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If additional sensors are added to measure throughput time, then measurement precision improves, but device complexity increases

Engineering Contradiction:
Improveyield map accuracyVSAvoidsensor system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system uses existing sensors and yield map data to calculate time delays automatically, without requiring additional measurement devices. The processing unit analyzes the yield map itself to determine spatial offsets and correct temporal misalignments, making the system self-sufficient.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent introduces a processing unit that acts as an intermediary between existing sensors and the yield map output. This processing unit calculates spatial offsets and applies temporal corrections without adding physical sensors, serving as a computational mediator that resolves the timing discrepancy.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If time delay is assumed constant, then processing simplicity is maintained, but measurement precision deteriorates

Engineering Contradiction:
Improveprocessing simplicityVSAvoidyield map accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The system dynamically calculates spatial offsets for different locations in the field rather than assuming a constant time delay. The processing unit determines location-specific offsets based on the yield map data, allowing the correction parameter to adapt to varying conditions across the field.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameter from a fixed constant time delay to a variable spatial offset that depends on location. By deriving offsets from the yield map itself and allowing them to vary across different field locations, the system adapts to changing conditions while maintaining processing feasibility.

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If retrospective determination of time delays is used, then device complexity is avoided, but measurement precision deteriorates due to uncertainties

Engineering Contradiction:
Improvesensor system complexityVSAvoidyield map accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The system extracts timing information directly from the yield map data itself, making the data self-descriptive. By analyzing the spatial pattern of yield measurements, the system determines the temporal offset without external inputs or additional sensors, achieving high precision through self-analysis.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The processing unit uses the yield map output as feedback to calculate and refine the spatial offset values. This creates a closed-loop system where the measured data informs the correction parameters, which are then applied to improve the accuracy of subsequent yield map generations.

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP4442102B1Method and arrangement for the computer-assisted processing of an electronic yield map
Publication Date: 2026.02.25 DEERE & CO
  • EP4442102B1 patent drawingFigure 1
  • EP4442102B1 patent drawingFigure 2
  • EP4442102B1 patent drawingFigure 3

AI summary

A method and arrangement for the computer-aided processing of an electronic yield map, in which signals generated by one or more sensors (56, 62) interacting with crop during the harvesting of a field (100) in a harvesting machine are georeferenced and entered with associated time data, comprises the following steps or a computer system (58) configured for this purpose: (a) identifying the location of one or more headlands (110, 112) or another location with a crop edge on the field (100) using the yield map, (b) identifying the location of one or more crop edges (118, 120) that separate the headland (110, 112) or the other location of the field from a part (114) of the field (100) on which the harvesting machine has traveled at least one track (116) and picked up crop, using the yield map, (c) identifying the time or position of the crossing the existing edge (118,120) while driving along the track (116) using the yield map, (d) identifying the time or position of the start and/or end of crop pickup while driving along the track (116) using the sensor signals (56, 62) recorded in the yield map, (e) identifying a time delay or spatial offset between the identified time or position of crossing the stand edge (118, 120) and the identified time or position of the start and/or end of crop pickup, and (f) correcting the yield map using the identified time delay or spatial offset.