Zigzag Pattern Shape Measuring Device for Thin Glass
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Solution Overview
Problem
Conventional shape measuring devices for transparent objects, such as glass plates, face accuracy issues when measuring thin objects as the reflected images from the front and back faces overlap, leading to low calculation accuracy in the thickness direction.
Innovation Solution
A shape measuring device with a pattern display member that projects a predetermined pattern on the object, an image pick-up section to capture separated reflected images, and a calculating section to determine the shape based on inclination angles, using a zigzag or sine wave pattern to prevent image overlap, allowing accurate measurement of front or back face positions even in thin objects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional linear pattern is used for shape measurement, then the measurement device can obtain reflected images from the measurement object, but when the object thickness is thin, the reflected images from the front and back faces overlap, resulting in low calculation accuracy
Solution Approach 1:
The patent applies asymmetry by using a zigzag pattern instead of a conventional linear pattern. The zigzag pattern creates asymmetric reflected image positions that are separated in the thickness direction, preventing overlap between front and back face reflections even in thin objects. This asymmetric geometry allows the reflected images to be distinguished and measured accurately.
Solution Approach 2:
The patent uses the zigzag pattern to utilize another dimension (the extension direction of the pattern) to separate the reflected images in the thickness direction. By introducing the extension direction as a new dimension for pattern arrangement, the reflected images from front and back faces are spatially separated, enabling accurate measurement without image overlap.
2Length of moving object
If the thickness of the measurement object is reduced, then the object becomes thinner and easier to handle, but the reflected images from front and back faces overlap, reducing measurement accuracy
Solution Approach 1:
The zigzag pattern creates asymmetric reflected image paths that maintain separation in the thickness direction regardless of object thickness. This asymmetric design ensures that even when the object is thin, the reflected images from front and back faces do not overlap, maintaining measurement accuracy across different thickness ranges.
Solution Approach 2:
The patent introduces the extension direction of the zigzag pattern as an additional dimension to separate reflected images in the thickness direction. This dimensional approach allows thin objects to be measured accurately by utilizing the pattern's extension direction to create sufficient spatial separation between front and back face reflections.
3Measurement precision
If a zigzag or sine wave pattern is used instead of a linear pattern, then reflected images are separated in the thickness direction preventing overlap, but the pattern complexity increases
Solution Approach 1:
The patent applies curvature by using sine wave patterns in addition to zigzag patterns. The curved sine wave pattern creates reflected images that are separated in the thickness direction, preventing overlap. The curvature of the sine wave provides a smooth alternative to the angular zigzag pattern while achieving the same image separation objective.
Solution Approach 2:
Both zigzag and sine wave patterns create asymmetric geometries that separate reflected images in the thickness direction. This asymmetric design, whether angular (zigzag) or curved (sine wave), prevents the reflected images from front and back faces from overlapping, maintaining measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate calculation of the position of the front or back face in the thickness direction, preventing image overlap and enhancing measurement accuracy for thin objects.
Implementation Method 1
a pattern display member having a predetermined pattern disposed on one side or the other side facing a measurement object which is a transparent flat plate, the pattern display member being configured to form an image of the predetermined pattern on a from face and back face of the measurement object
Implementation Method 2
an image pick-up section that is configured such that respective reflected images of the predetermined pattern on a front face and back face of the measurement object is separated in a separation direction perpendicular to an extension direction of the predetermined pattern
Data Source
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AI summary
A measuring device is equipped with: an image capture unit for capturing reflected images of a prescribed pattern at the front surface and the rear surface of a transparent object to be measured; and a computing unit for using reflected images captured by the image capture unit to calculate the position of the front surface or the rear surface in the thickness direction. The prescribed pattern includes a plurality of elements, each element of the plurality of elements having a first end and another end which are formed in a direction orthogonal to the direction of extension of the pattern, and which are mutually offset in the direction of extension.