Active focusing module of pathological section scanning equipment based on weak measurement

Abstract

The invention discloses an active focusing module of pathological section scanning equipment based on weak measurement, which is characterized in that incident light in a preset polarization state is emitted by a light source and is divided into first reference light and detection light through a polarization splitting prism and a Wollaston prism; the first reference light is reflected by the lower surface of the cover glass to form second reference light, the detection light is reflected by the surface of the sample to form sample light, and the second reference light and the sample light enter the Wollaston prism again for weak coupling and beam combination to form emergent light; the emergent light is received by a spectrometer after phase modulation and polarization selection, and the center-of-gravity shift of the double-peak spectrum can reflect the fluctuation height change of the surface of the sample, so that high-precision focusing is realized. According to the technology, the weak measurement principle is utilized, tiny physical quantity changes are converted into observable spectrum shift, the theoretical sensitivity reaches the picometer level, the focusing accuracy is remarkably improved, and the definition of a scanned image is guaranteed.

Description

Technical Field

[0001] The present invention relates to the field of microscopic scanning technology, and particularly to an active focusing module for a pathological section scanning device based on weak measurement. Background Art

[0002] In the process of pathological diagnosis, the scanning imaging quality of pathological sections plays a decisive role in the accurate diagnosis of diseases. As one of the key technologies of pathological section scanning devices, the focusing accuracy of the active focusing technology directly affects the clarity and accuracy of imaging. The existing active focusing technologies for pathological section scanning devices mostly adopt traditional optical detection methods, such as those based on optical coherence tomography technology or laser triangulation method. These methods have certain limitations. The focusing method based on optical coherence tomography technology is easily interfered by differences in tissue optical properties. On different pathological tissue samples, the intensity and stability of signals fluctuate greatly, resulting in focusing errors. When the laser triangulation method is used to process slightly undulating or transparent samples, the reflected light signal is weak, and it is difficult to accurately capture the subtle changes in the surface height of the sample, thus affecting the focusing accuracy. In addition, traditional focusing methods are not sensitive enough to the weak height changes on the surface of the sample in a complex pathological section sample environment, resulting in difficulty for the lens to achieve precise focusing on different height positions on the surface of the sample during the moving scanning process, and thus unable to meet the increasing demand for high-precision pathological diagnosis.

[0003] Therefore, in the active focusing technology, how to accurately measure the tiny height changes on the surface of the sample is a key problem that urgently needs to be solved for achieving precise focusing. Summary of the Invention

[0004] The purpose of the present invention is to solve the deficiencies in the prior art, and to provide an active focusing module for a pathological section scanning device based on weak measurement.

[0005] The object of the present invention is achieved by the following technical solutions: An active focusing module for a pathological section scanning device based on weak measurement, comprising a light source and a Wollaston prism. The light emitted by the light source is modulated into incident light with a preset polarization state. After passing through a polarization beam splitter prism, the incident light is split into a first reference light and a detection light by the Wollaston prism. The polarization directions of the first reference light and the detection light are perpendicular. The first reference light is reflected by the lower surface of the cover glass to obtain a second reference light and then enters the Wollaston prism again. The detection light is reflected by the surface of the sample to obtain sample light and then enters the Wollaston prism again. The sample light and the second reference light are weakly coupled in the Wollaston prism and combined into an outgoing light. The outgoing light is reflected by the polarization beam splitter prism and the phase difference between the two beams of light in the outgoing light is adjusted to π / 2 by a phase modulator. The outgoing light after phase modulation is received by a spectrometer after polarization selection. The spectrometer analyzes the outgoing light to obtain the double-peak spectrum of the outgoing light, and calculates the change in the undulation height of the sample surface through the centroid shift of the double-peak spectrum; and focuses according to the measured change in the undulation height of the sample surface.

[0006] Preferably, a quarter-wave plate is provided between the Wollaston prism and the sample. The first reference light and the detection light emitted by the Wollaston prism pass through the quarter-wave plate. The first reference light is reflected by the lower surface of the cover glass to obtain a second reference light and the second reference light passes through the quarter-wave plate. The detection light is reflected by the surface of the sample to obtain sample light and the sample light passes through the quarter-wave plate; the polarization state of the incident reference light before passing through the quarter-wave plate is perpendicular to the polarization state of the second reference light after passing through the quarter-wave plate; the polarization state of the detection light before passing through the quarter-wave plate is perpendicular to the polarization state of the sample light after passing through the quarter-wave plate.

[0007] Preferably, an optical attenuator is provided between the Wollaston prism and the sample. The first reference light and the second reference light pass through the optical attenuator, and the optical intensity of the second reference light is made consistent with the optical intensity of the sample light through the optical attenuator.

[0008] Preferably, a front selection polarizer is provided between the light source and the Wollaston prism, and a rear selection polarizer is provided between the phase modulator and the spectrometer.

[0009] Preferably, the wavelength of the light source is 830 nm.

[0010] Preferably, the distance between the sample light and the second reference light in the outgoing light is 4 mm.

[0011] Preferably, the change in the undulation height of the sample surface is calculated by the following formula: ; In the formula, is the change in the undulation height of the sample surface, is the centroid shift amount of the double-peak spectrum, is the calibration coefficient.

[0012] Preferably, it is applied to the microscopic scanning of pathological sections.

[0013] The beneficial effects of the present invention are as follows: 1. Based on weak measurement technology, the present invention can convert tiny physical quantity changes (such as nanoscale height differences) into observable spectral shifts. The theoretical sensitivity can reach the picometer level, capable of sensitively capturing tiny height fluctuations on the sample surface, thereby providing a data basis for precise focusing, effectively improving the accuracy of focusing, and ensuring the clarity of sample scanning.

[0014] 2. The spectral analysis speed is fast, capable of achieving millisecond-level response, can track the surface undulations of the sample in real time, can effectively support dynamic focusing during high-speed scanning, and meets the requirements of high-throughput pathological analysis.

[0015] 3. The present invention adopts non-contact measurement technology, utilizes the polarization light reflection characteristics, realizes non-contact measurement of the surface topography of pathological sections, avoids damage to the sample caused by mechanical contact, and is applicable to living tissues or fragile samples.

[0016] 4. It has strong anti-environmental interference ability. Through polarization coding and interference measurement, it can effectively suppress environmental light noise and scattering interference, still maintain high precision under low signal-to-noise ratio conditions, and effectively improve the reliability of detection results. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a schematic diagram of the optical path structure of the present invention.

[0018] Figure 2 is a schematic diagram of the reflection of light by the lower end surface of the cover glass and the sample surface.

[0019] Figure 3 is a schematic diagram of the shift of the centroid position of the double-peak spectrum with the change of the sample surface height.

[0020] In the figure: 1. Light source, 2. Front selection polarizer, 3. Polarizing beam splitter prism, 4. Wollaston prism, 5. Quarter-wave plate, 6. Optical attenuator, 7. Phase modulator, 8. Rear selection polarizer, 9. Spectrometer, 10. Cover glass, 11. Sample, 12. Sealing glue. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0021] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art belong to the scope of protection of the present invention.

[0022] Those skilled in the art should understand that in the disclosure of the present invention, the orientation or positional relationships indicated by terms such as "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationships shown in the drawings. These are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, the above terms should not be construed as limiting the present invention.

[0023] It can be understood that the term "one" should be understood as "at least one" or "one or more". That is, in one embodiment, the number of an element can be one, while in other embodiments, the number of this element can be multiple. The term "one" should not be construed as a limitation on the quantity.

[0024] As Figures 1 to 2 shown, the active focusing module of the pathological section scanning device based on weak measurement includes a light source 1 and a Wollaston prism 4. The light emitted by the light source 1 is modulated into incident light with a preset polarization state. After passing through the polarization beam splitter prism 3, the incident light is split into a first reference light and a detection light by the Wollaston prism 4. The polarization directions of the first reference light and the detection light are perpendicular. The first reference light is reflected by the lower surface of the cover glass 10 to obtain a second reference light and then enters the Wollaston prism 4 again. The detection light is reflected by the surface of the sample 11 to obtain the sample 11 light and then enters the Wollaston prism 4 again. The sample 11 light and the second reference light are weakly coupled and combined into an outgoing light in the Wollaston prism 4. The outgoing light is reflected by the polarization beam splitter prism 3 and the phase difference between the two beams of light in the outgoing light is adjusted to π / 2 by the phase modulator 7. The outgoing light after phase modulation is received by the spectrometer 9 after polarization selection. The spectrometer 9 analyzes the outgoing light to obtain the double-peak spectrum of the outgoing light, and calculates the change in the undulation height of the surface of the sample 11 through the centroid shift of the double-peak spectrum; focusing is performed according to the measured change in the undulation height of the surface of the sample 11.

[0025] Weak measurement is an indirect measurement method different from traditional measurement methods. In the theory of weak measurement, a pointer state is coupled with the measured system, and after the evolution of the system, a value that can read out the parameter to be measured will be contained in the outgoing pointer. By selecting appropriate pre-selection states and post-selection states, this tiny separation can be indirectly read out in the outgoing pointer state after being amplified by the weak value.

[0026] The active focusing module of the pathological section scanning device based on weak measurement of the present invention highly sensitively detects the tiny height change of the surface of the sample 11 based on weak measurement technology, and realizes non-contact detection of the surface of the sample 11 through polarization light interference.

[0027] The light source 1 emits light of a specific wavelength, and the light emitted by the light source 1 is polarized by a polarizer. The polarization-selected light is modulated into an incident light with a preset polarization state, and then the incident light passes through the polarization splitter prism 3 and enters the Wollaston prism 4. The function of the Wollaston prism 4 is to decompose the incident light into two linearly polarized lights with orthogonal polarization directions, wherein the first reference light is vertically polarized and the detection light is horizontally polarized, and the first reference light and the detection light after the splitting are separated in space due to the orthogonal polarization, but the first reference light and the detection light maintain parallel propagation.

[0028] The first reference light is reflected by the lower surface of the cover glass 10 (the junction surface between the cover glass 10 and the sealing glue 12) to obtain the second reference light and enter the Wollaston prism 4 again. The detection light is reflected by the surface of the sample 11 to obtain the sample 11 light and enter the Wollaston prism 4 again. The sample 11 light and the second reference light are weakly coupled in the Wollaston prism 4 and combined into an outgoing light. Since the polarization orthogonality of the sample 11 light and the second reference light is maintained, the two light beams are weakly coupled in the Wollaston prism 4 (that is, they are only weakly correlated through the polarization state to avoid strong interference) and are combined into one outgoing light. The polarization state of the outgoing light emitted by the Wollaston prism 4 is opposite to the polarization state of the incident light. According to the characteristics of the polarization beam splitter prism 3, the outgoing light will be reflected by the polarization beam splitter prism 3. The outgoing light reflected by the polarization beam splitter prism 3 will pass through the phase modulator 7. The phase modulator 7 adjusts the phase difference of the two beams in the outgoing light to π / 2; when the phase difference between the two beams (the second reference light and the sample 11 light) is π / 2, the two are in an orthogonal polarization state, which is used to meet the conditions for realizing a weak measurement system. At this time, they will form a stable intensity modulation during the interference process, which is convenient for extracting information through subsequent polarization analysis (later selection of polarizer 8); and the orthogonal phase difference is used to reduce the disturbance of the measurement to the system, which meets the "low interference" requirement of weak measurement. If the phase difference between the two beams is not π / 2, the two beams may be in the same polarization state and interfere, resulting in a strong disturbance (strong measurement) to the system during the measurement process, destroying the weak coupling condition, and having a greater negative impact on the system.

[0029] The output light after phase modulation undergoes polarization selection. At this time, the weak measurement signal is amplified and received by the spectrometer 9. The spectrometer 9 analyzes the output light signal. Since the output light contains the second reference light and the sample 11 light, a double-peak spectrum will be formed in the spectrometer 9. The center-of-gravity position of the double-peak spectrum (resulting from the interference of the two beams of light) is directly related to the optical path difference between the second reference light and the sample 11 light, and the optical path difference between the second reference light and the sample 11 light is directly related to the surface height of the sample 11. Therefore, by analyzing the shift of the center of gravity of the double-peak spectrum, the height change of the surface of the sample 11 can be analyzed. By inputting the height change of the surface of the sample 11 into the control system, the control system controls the movement of the lens to compensate for the lens height, greatly improving the accuracy of the optical lens focusing, and thus effectively enhancing the clarity of the scanned image.

[0030] Among them, the center of gravity of the double-peak spectrum refers to the weighted average position of the two peak wavelengths in the interference spectrum, which is directly related to the optical path difference between the two beams of light (the second reference light and the sample 11 light).

[0031] The linear response characteristic of the center-of-gravity position of the double-peak spectrum to the optical path difference enables the height measurement accuracy to reach the sub-wavelength level (such as the nanometer level), which is much higher than that of traditional optical focusing technologies (such as the micron-level accuracy of the laser triangulation method), meeting the high-resolution imaging requirements of cell structures in pathological sections.

[0032] Traditional focusing technologies (such as the contrast method and the defocus detection method) are prone to failure when there are strong reflection regions (such as cell nuclei) or low-contrast regions (such as cytoplasm) on the surface of the sample 11. In this solution, through polarization state modulation and interference spectrum analysis, the polarization characteristics of light are used to separate the reference light and the sample 11 light, avoiding the interference of multiple internal reflected lights of the sample 11, and having stronger adaptability to non-uniform and strongly scattering biological tissues (such as adipose tissue and connective tissue), and can be widely applied to the microscopic scanning of various biological pathological sections.

[0033] The Wollaston prism 4 used in the present invention is a polarization optical device based on the birefringence effect, mainly used to decompose a beam of unpolarized light or polarized light into two linearly polarized lights with mutually perpendicular vibration directions, or to realize the combination of two beams of polarized light. In the present invention, the Wollaston prism 4 is placed at an angle of 45 degrees with the horizontal interface. Its material is calcite.

[0034] Furthermore, a quarter-wave plate 5 is disposed between the Wollaston prism 4 and the sample 11. The first reference light and the detection light emitted from the Wollaston prism 4 pass through the quarter-wave plate 5. The first reference light is reflected by the lower surface of the cover glass 10 to obtain a second reference light, and the second reference light passes through the quarter-wave plate 5. The detection light is reflected by the surface of the sample 11 to obtain the sample 11 light, and the sample 11 light passes through the quarter-wave plate 5. The polarization state of the incident reference light before passing through the quarter-wave plate 5 is perpendicular to the polarization state of the second reference light after passing through the quarter-wave plate 5. The polarization state of the detection light before passing through the quarter-wave plate 5 is perpendicular to the polarization state of the sample 11 light after passing through the quarter-wave plate 5.

[0035] In the active focusing module of the pathological section scanning device based on weak measurement of the present invention, the core function of the quarter-wave plate 5 is to convert the orthogonally linearly polarized light into circularly polarized light through two phase delays (one each when entering and exiting), and utilize the reflection rotation direction reversal to finally achieve the orthogonal conversion of the polarization state. This process enables the orthogonally polarized light that was originally path-separated in the calcite prism to have its polarization state swapped and spatially coincide after reflection, so that they can be combined into one beam of light, laying a foundation for subsequent light intensity detection, phase analysis or interference measurement. Essentially, the quarter-wave plate 5 acts as a "polarization state converter" and an "optical path control element" here.

[0036] In the present invention, the polarization state of the two orthogonally polarized light beams is swapped by the quarter-wave plate 5 to provide conditions for subsequent beam combination. Without the phase delay effect of the quarter-wave plate 5 in the first two times, the polarization state of the linearly polarized light after reflection remains unchanged (horizontal remains horizontal, vertical remains vertical), and the Wollaston prism 4 cannot combine them (because the orthogonally polarized light is path-separated in the prism). After being converted by the quarter-wave plate 5, the polarization state of the reflected light is orthogonally swapped, making the polarization states of the two beams of light orthogonal and spatially coincident in the calcite prism, meeting the beam combination conditions.

[0037] An optical attenuator 6 is disposed between the Wollaston prism 4 and the sample 11. The first reference light and the second reference light pass through the optical attenuator 6, and the optical intensity of the second reference light is made consistent with the optical intensity of the sample 11 light through the optical attenuator 6.

[0038] During the reflection process of two light beams (the first reference light and the detection light) at different interfaces, there will be multiple reflected light beams (including the interfaces between air and the upper surface of the cover glass 10, between the cover glass 10 and the mounting medium 12, between the mounting medium 12 and the surface of the sample 11, between the surface of the sample 11 and the upper surface of the glass slide, between the lower surface of the glass slide and air, etc.). Among them, the interface between the surface of the sample 11 and the mounting medium 12 has undulations, the interface between the cover glass 10 and the mounting medium 12 is a plane, and the light intensities of different reflected light beams are different. In the present invention, the interface between the cover glass 10 and the mounting medium 12 (i.e., the lower end face of the cover glass 10) is used as a reference surface, and the undulation height change of the surface of the sample 11 is detected based on this reference surface. In the present invention, the brightness of the reference light and the light of the sample 11 is adjusted to be consistent through an attenuator, and by balancing the light intensity of the second reference light and the light of the sample 11, the measurement accuracy, dynamic range, and robustness of the system are significantly improved. In actual pathological section scanning, due to a large difference in the reflectivity between the lower end face of the cover glass 10 and the surface of the sample 11, there is a large difference in the light intensity between the second reference light and the light of the sample 11. This light intensity difference will cause a decrease in the interference contrast, and even distort the spectral double peaks due to a serious imbalance in the signal intensity, thus seriously affecting the accurate calculation of the centroid shift amount of the double-peak spectrum.

[0039] In the actual process, since the light reflectivity of the lower end face of the cover glass 10 (similar to specular reflection) is higher than the reflectivity of the surface of the sample 11 (diffuse reflection), by arranging the optical attenuator 6 on the optical paths of the first reference light and the second reference light, the light absorption and attenuation effect of the optical attenuator 6 is used to reduce the light intensity of the second reference light, so that the light intensity of the second reference light is consistent with the light of the sample 11, effectively balancing the light intensities of the two, avoiding the distortion of the spectral double peaks due to a serious imbalance in the signal intensity, and improving the detection accuracy.

[0040] Among them, the optical attenuator 6 is an optical device that can accurately adjust the light intensity. The optical attenuator 6 realizes the attenuation of the optical power by absorbing, scattering, or reflecting part of the optical signal, thereby reducing the intensity of the light beam to the target value.

[0041] A pre-selection polarizer 2 is arranged between the light source 1 and the Wollaston prism 4, and a post-selection polarizer 8 is arranged between the phase modulator 7 and the spectrometer 9. The light emitted by the light source 1 is polarized and rotated through the pre-selection polarizer 2, so that the incident light reaches the preset polarization state. The polarization selection of the outgoing light is performed through the post-selection polarizer 8 to exclude interfering light and improve the detection sensitivity of the system.

[0042] Among them, the undulation height change of the sample surface is calculated by the following formula: ; In the formula, is the undulation height change of the sample surface, is the centroid offset of the bimodal spectrum, is the calibration coefficient. is a constant, which is related to the light source wavelength range and the parameters of the optical elements, and its value can be measured by the experimental calibration method. The specific method is as follows: Under laboratory conditions, scan a standard sample with a known height (such as a step sample slice) and record the centroid offset of the bimodal spectrum corresponding to different height changes Then fit the curve, and determine the value of the calibration coefficient by fitting the curve. In this embodiment, the wavelength of the light source 1 is 830 nm. When using the light of this specific wavelength of 830 nm, the detection accuracy of the undulation height of the sample surface can reach the picometer level.

[0043] In this embodiment, the sample light and the second reference light in the outgoing light are parallel to each other, and the distance between the sample light and the second reference light in the outgoing light is 4 mm.

[0044] In this embodiment, the active focusing module of the pathological section scanning device based on weak measurement is applied to the microscopic scanning of pathological sections.

[0045] In this embodiment, the active focusing module of the pathological section scanning device based on weak measurement is applied to the microscopic scanning of pathological sections.

[0046] The present invention has the following advantages: 1. Based on weak measurement technology, the present invention can convert tiny physical quantity changes (such as nanometer-level height differences) into observable spectral offsets, with a theoretical sensitivity reaching the picometer level. It can sensitively capture the tiny height fluctuations on the sample surface, thereby providing a data basis for precise focusing, effectively improving the accuracy of focusing, and ensuring the clarity of sample scanning.

[0047] 2. The spectral analysis speed is fast, capable of achieving millisecond-level response, can track the surface undulations of the sample in real time, and can effectively support dynamic focusing during high-speed scanning, meeting the requirements of high-throughput pathological analysis.

[0048] 3. The present invention adopts non-contact measurement technology, utilizes the polarization light reflection characteristics, and realizes non-contact measurement of the surface topography of pathological sections, avoiding damage to the sample caused by mechanical contact, and is applicable to living tissues or fragile samples.

[0049] 4. It has strong anti-environmental interference ability. Through polarization coding and interference measurement, it effectively suppresses environmental light noise and scattering interference, and can still maintain high precision under low signal-to-noise ratio conditions, effectively improving the reliability of detection results.

[0050] The present invention is not limited to the above-mentioned optimal embodiments. Any person can obtain other various forms of products under the inspiration of the present invention. However, no matter what changes are made in its shape or structure, as long as it has a technical solution identical or similar to the present application, it falls within the protection scope of the present invention.

Claims

1. An active focusing module for a pathological section scanning device based on weak measurement, characterized in that It includes a light source and a Wollaston prism. The light emitted by the light source is modulated into incident light with a preset polarization state. After passing through the polarization beam splitter prism, the incident light is split into a first reference light and a detection light by the Wollaston prism. The polarization directions of the first reference light and the detection light are perpendicular. The first reference light is reflected by the lower surface of the cover glass to obtain a second reference light and then enters the Wollaston prism again. The detection light is reflected by the sample surface to obtain a sample light and then enters the Wollaston prism again. The sample light and the second reference light are weakly coupled in the Wollaston prism and combined into an outgoing light. The outgoing light is reflected by the polarization beam splitter prism and the phase difference between the two beams of light in the outgoing light is adjusted to π / 2 by the phase modulator. The outgoing light after phase modulation is received by the spectrometer after polarization selection. The spectrometer analyzes the outgoing light to obtain the double-peak spectrum of the outgoing light, and the height change of the sample surface is calculated by the centroid shift of the double-peak spectrum; focusing is performed according to the measured height change of the sample surface.

2. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, characterized in that A quarter-wave plate is arranged between the Wollaston prism and the sample. The first reference light and the detection light emitted by the Wollaston prism pass through the quarter-wave plate. The first reference light is reflected by the lower surface of the cover glass to obtain a second reference light and the second reference light passes through the quarter-wave plate. The detection light is reflected by the sample surface to obtain a sample light and the sample light passes through the quarter-wave plate; the polarization state of the incident reference before passing through the quarter-wave plate is perpendicular to the polarization state of the second reference light after passing through the quarter-wave plate; the polarization state of the detection light before passing through the quarter-wave plate is perpendicular to the polarization state of the sample light after passing through the quarter-wave plate.

3. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, wherein An optical attenuator is arranged between the Wollaston prism and the sample. The first reference light and the second reference light pass through the optical attenuator, and the optical intensity of the second reference light is made consistent with the optical intensity of the sample light through the optical attenuator.

4. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, characterized in that, A pre-selection polarizer is arranged between the light source and the Wollaston prism, and a post-selection polarizer is arranged between the phase modulator and the spectrometer.

5. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, wherein, The wavelength of the light source is 830 nm.

6. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, characterized in that, The distance between the sample light and the second reference light in the outgoing light is 4 mm.

7. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, wherein, The height change of the sample surface is calculated by the following formula: ； wherein, is the change in the undulation height of the sample surface, is the centroid offset of the double-peak spectrum, is the calibration coefficient.

8. The active focusing module of the pathological section scanning device based on weak measurement according to claim 1, characterized in that Applied to microscopic scanning of pathological sections.

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