Active focusing module of pathological section scanning equipment based on weak measurement
Through the active focus module of the pathological section scanning device based on weak measurement, the Wollaston prism and polarization optical elements decompose the beam, and the precise measurement of slight height changes on the surface of the pathological section is achieved, solving the problem of insufficient accuracy of traditional focusing technology and improving the imaging quality of pathological diagnosis.
Patent Information
- Application Number
- CN202510855122.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-25
- Publication Date
- 2025-07-25
- Estimated Expiration
- 2045-06-25
AI Technical Summary
The existing active focus technology of pathological section scanning equipment is insufficient in handling slight height changes, making it difficult to meet the needs of high-precision pathological diagnosis, and is susceptible to differences in tissue optical characteristics and environmental interference.
The active focus module of the pathological slice scanning device based on weak measurement is used to decompose the incident light into two orthogonal polarized light using Wollaston prism and polarization optical elements. The center of gravity offset of the bimodal spectrum is analyzed by a spectrometer to calculate the fluctuation and change of the sample surface ups and downs to achieve non-contact high sensitivity measurement.
It realizes accurate measurement of slight height changes on the sample surface, improves focus accuracy and imaging clarity, is suitable for living tissues or fragile samples, has strong anti-environmental interference ability, and meets the needs of high-speed scanning.