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83962results about "Using optical means" patented technology

System and method for calibrating a surgical instrument

A calibration system for a surgical instrument. The calibration system includes an actuator, such as a motor system and a flexible shaft. The calibration system also includes a surgical instrument actuatable by the actuator. The calibration system also include calibration data corresponding to the surgical instrument. A processor is configured to process the calibration data for determining a position of the surgical instrument. The calibration system may include a sensor configured to provide a signal corresponding to a movement of the actuator, the processor being further configured to process the signal for determining a position of the surgical instrument.
Owner:TYCO HEALTHCARE GRP LP

Methods and Scatterometers, Lithographic Systems, and Lithographic Processing Cells

In a method of determining the focus of a lithographic apparatus used in a lithographic process on a substrate, the lithographic process is used to form a structure on the substrate, the structure having at least one feature which has an asymmetry in the printed profile which varies as a function of the focus of the lithographic apparatus on the substrate. A first image of the periodic structure is formed and detected while illuminating the structure with a first beam of radiation. The first image is formed using a first part of non-zero order diffracted radiation. A second image of the periodic structure is foamed and detected while illuminating the structure with a second beam of radiation. The second image is formed using a second part of the non-zero order diffracted radiation which is symmetrically opposite to the first part in a diffraction spectrum. The ratio of the intensities of the measured first and second portions of the spectra is determined and used to determine the asymmetry in the profile of the periodic structure and / or to provide an indication of the focus on the substrate. In the same instrument, an intensity variation across the detected portion is determined as a measure of process-induced variation across the structure. A region of the structure with unwanted process variation can be identified and excluded from a measurement of the structure.
Owner:ASML NETHERLANDS BV

Volume dimensioning systems and methods

Systems and methods for volume dimensioning packages are provided. A method of operating a volume dimensioning system may include the receipt of image data of an area at least a first three-dimensional object to be dimensioned from a first point of view as captured using at least one image sensor. The system can determine from the received image data a number of features in three dimensions of the first three-dimensional object. Based at least on part on the determined features of the first three-dimensional object, the system can fit a first three-dimensional packaging wireframe model about the first three-dimensional object. The system can display of an image of the first three-dimensional packaging wireframe model fitted about an image of the first three-dimensional object on a display device.
Owner:INTERMEC IP

Dimensioning system calibration systems and methods

Systems and methods of determining the volume and dimensions of a three-dimensional object using a dimensioning system are provided. The dimensioning system can include an image sensor, a non-transitory, machine-readable, storage, and a processor. The dimensioning system can select and fit a three-dimensional packaging wireframe model about each three-dimensional object located within a first point of view of the image sensor. Calibration is performed to calibrate between image sensors of the dimensioning system and those of the imaging system. Calibration may occur pre-run time, in a calibration mode or period. Calibration may occur during a routine. Calibration may be automatically triggered on detection of a coupling between the dimensioning and the imaging systems.
Owner:INTERMEC IP

Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus

A method and apparatus for mapping depth of an object (22) in a preferred arrangement uses a projected light pattern to provide a selected texture to the object (22) along the optical axis (24) of observation. An imaging system senses (32, 34) first and second images of the object (22) with the projected light pattern and compares the defocused of the projected pattern in the images to determine relative depth of elemental portions of the object (22).
Owner:THE TRUSTEES OF COLUMBIA UNIV IN THE CITY OF NEW YORK

Stage device and exposure apparatus

A stage device suitable for exposure apparatus used to produce semiconductor devices, is movable in an area wider than the measurement area of interferometer for position measurement, and is capable of measuring the position with high precision. When a movable stage moves from the position where the laser beams from laser interferometers are not applied into the measurement area of the laser interferometer, the position of reference mark is measured by a wafer alignment sensor, and the measurement value measured by the laser interferometer is corrected based on the results of the measurement by the wafer alignment sensor. When another movable stage enters the measurement area of the laser interferometer, the position of the reference mark is similarly measured by a wafer alignment sensor, and the measurement value measured by the laser interferometer is corrected based on the results of the measurement by the wafer alignment sensor.
Owner:NIKON CORP

Pattern forming apparatus, mark detecting apparatus, exposure apparatus, pattern forming method, exposure method, and device manufacturing method

While a wafer stage linearly moves in a Y-axis direction, a multipoint AF system detects surface position information of the wafer surface at a plurality of detection points that are set at a predetermined distance in an X-axis direction and also a plurality of alignment systems that are arrayed in a line along the X-axis direction detect each of marks at positions different from one another on the wafer. That is, detection of surface position information of the wafer surface at a plurality of detection points and detection of the marks at positions different from one another on the wafer are finished, only by the wafer stage (wafer) linearly passing through the array of the plurality of detection points of the multipoint AF system and the plurality of alignment systems, and therefore, the throughput can be improved, compared with the case where a detection operation of the marks and a detection operation of the surface position information (focus information) are independently performed.
Owner:NIKON CORP

Method and system for predictive physiological gating

A method and system for physiological gating is disclosed. A method and system for detecting and predictably estimating regular cycles of physiological activity or movements is disclosed. Another disclosed aspect of the invention is directed to predictive actuation of gating system components. Yet another disclosed aspect of the invention is directed to physiological gating of radiation treatment based upon the phase of the physiological activity. Gating can be performed, either prospectively or retrospectively, to any type of procedure, including radiation therapy or imaging, or other types of medical devices and procedures such as PET, MRI, SPECT, and CT scans.
Owner:VARIAN MEDICAL SYSTEMS

Handheld dimensioning system with measurement-conformance feedback

A system and method for obtaining a dimension measurement that conforms to a conformance criteria is disclosed. The dimensioning system provides either (i) feedback to confirm that the measurement complies with the criteria or (ii) information on how the measurement geometry could be adjusted in order to provide a compliant measurement in a subsequent dimension measurement.
Owner:HAND HELD PRODS

Processing of Gesture-Based User Interactions

Systems and methods for processing gesture-based user interactions with an interactive display are provided.
Owner:META PLATFORMS INC

Three-dimensional measurement method and apparatus

The apparatus and method measure the three-dimensional surface shape of a surface without contact with the surface, and without any physical constraint on the device during measurement. The device is a range-sensor or scanner, and in one embodiment is a laser-camera sensor, which has a portable camera and multi-line light projector encased in a compact sensor head, and a computer. The apparatus provides three-dimensional coordinates in a single reference frame of points on the surface. The sensor head does not have to be physically attached to any mechanical positioning device such as a mechanical arm, rail, or translation or rotation stage, and its position in three-dimensional space does not have to be measured by any position-tracking sensor. This allows unrestricted motion of the sensor head during scanning, and therefore provides much greater access to surfaces which are immovable, or which have large dimensions or complex shape, and which are in confined spaces such as interior surfaces. It also permits measurement of a surface to be made by a continuous sweeping motion rather than in stages, and thus greatly simplifies the process of measurement. The apparatus can be hand-held, mounted on any moving device whose motion is unknown or not accurately known, or airborne. The apparatus and method also permit unknown and unmeasured movement of the object whose surface is to be measured, which may be simultaneous with the movement of the range-sensor head.
Owner:ALIGN TECH
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