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2243results about "Investigating moving sheets" patented technology

Method and apparatus for use in camera and systems employing same

There are many inventions described herein. Some aspects are directed to methods and / or apparatus to provide relative movement between optics, or portion(s) thereof, and sensors, or portion(s) thereof, in a digital camera. The relative movement may be in any of various directions. In some aspects, relative movement between an optics portion, or portion(s) thereof, and a sensor portion, or portion(s) thereof, are used in providing any of various features and / or in the various applications disclosed herein, including, for example, but not limited to, increasing resolution, optical and electronic zoom, image stabilization, channel alignment, channel-channel alignment, image alignment, lens alignment, masking, image discrimination, range finding, 3D imaging, auto focus, mechanical shutter, mechanical iris, multi and hyperspectral imaging, and / or combinations thereof. In some aspects, movement is provided by actuators, for example, but not limited to MEMS actuators, and by applying appropriate control signal thereto.
Owner:INTELLECTUAL VENTURES II

Method and device for representing an object

A process for obtaining an object image of at least one object (40) is described, wherein at least two partial images of the object (40) are taken under differing object conditions which are formed on the object with spatial patterns, wherein a non-linear dependence of the light detectable from the object point on the object conditions given at the object point exists and the partial images contain different contributions of various space frequency components of the object structure, and the desired object image is determined from the partial images by reconstruction of the space frequency components. Optical systems for implementing this type of process are also described.
Owner:MAX PLANCK GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN EV

Optical sensor and method of operation

A multiple single use optical sensor includes a series of continuous sensor stripes deposited on a substrate web. At least one sample chamber is adapted to extend transversely across a discrete portion of the series of sensor stripes to facilitate analysis of a sample disposed therein. The sample chamber may be moved, or additional sample chambers provided to enable subsequent measurements of additional samples at unused discrete portions of the sensor stripes. The continuous nature of the sensor stripes provides consistency along the lengths thereof to enable calibration data obtained from one discrete portion of the sensor stripes to be utilized for testing an unknown sample an other discrete portion of the sensor stripes. This advantageously eliminates the need for any particular discrete portion of the sensor stripes to be contacted by more than one sample, for improved sensor performance.
Owner:SIEMENS HEALTHCARE DIAGNOSTICS INC

Contour triangulation system and method

A method and apparatus for reconstructing a surface shape of an object having contour lines, includes assigning points to each contour line. A first triangulation scheme is performed with respect to respective points on two adjacently-positioned contour lines, to determine a first surface shape for a portion of the object corresponding to the two contour lines. The first surface shape is checked to determine if the first surface shape is in error. If the first surface shape is not in error, the first surface shape is outputted for the portion of the object as determined by the first triangulation scheme, as a reconstructed surface shape for that portion of the object. If the first surface shape is in error, a second triangulation scheme is performed with respect to the respective points on the two contour lines, to determine a second surface shape for that portion of the object, and the second surface shape is outputted for that portion of the object as determined by the second triangulation scheme, as a reconstructed surface shape.
Owner:MAKO SURGICAL CORP

Wafer inspection system for distinguishing pits and particles

A surface inspection system and method is provided which detects defects such as particles or pits on the surface of a workpiece, such as a silicon wafer, and also distinguishes between pit defects and particle defects. The surface inspection system comprises an inspection station for receiving a workpiece and a scanner positioned and arranged to scan a surface of the workpiece at the inspection station. The scanner includes a light source arranged to project a beam of P-polarized light and a scanner positioned to scan the P-polarized light beam across the surface of the workpiece. The system further provides for detecting differences in the angular distribution of the light scattered from the workpiece and for distinguishing particle defects from pit defects based upon these differences.
Owner:ADE OPTICAL SYST
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