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1198 results about "Sample plane" patented technology

High throughput processing system and method of using

Briefly, the present invention provides a system and method for high throughput processing using sample holders. The system has a plurality of work perimeters, with a rotational robot preferably associated with each work perimeter. At least one transfer station area is provided between adjacent work perimeters to facilitate robotic transfer of sample holders from one work perimeter to another area. Each work perimeter typically includes a plurality of defined station locations, with each station location positioned to be accessible by the robot associated with that area. In addition, each station location is typically configured to receive a device, such as an automated instrument or a holding nest. Device components are arranged at selected station locations according to specific application requirements to provide a flexible, robust, reliable, and accurate high throughput processing system.
Owner:NOVARTIS AG

Method and apparatus for transporting biological samples

A container assembly and method for storing, treating, transporting and stabilizing a biological sample includes a container, a closure member and a sample holder removably received in the container. The sample holder can be a platform-like device dimensioned to be supported on a ledge formed in the side wall of the container. The sample holder includes a central cavity for receiving the sample and immersing the sample in the stabilizing agent in the container. The closure member includes a body member to close the top end of the central cavity of the sample holder and to limit movement of the sample holder in the container. In another embodiment, the sample holder has a closure cap for closing the open top end of the cavity. The container includes a liquid reagent in an amount sufficient to treat the biological sample. The biological sample is retained in a predetermined containment area of the container to maintain the biological sample immersed in the reagent without regard to the orientation of the container.
Owner:BECTON DICKINSON & CO

Large diopter range real time sequential wavefront sensor

Example embodiments of a large dynamic range sequential wavefront sensor for vision correction or assessment procedures are disclosed. An example embodiment optically relays a wavefront from an eye pupil or corneal plane to a wavefront sampling plane in such a manner that somewhere in the relaying process, the wavefront beam from the eye within a large eye diopter range is made to reside within a desired physical dimension over a certain axial distance range in a wavefront image space and / or a Fourier transform space. As a result, a wavefront beam shifting device can be disposed there to fully intercept and hence shift the whole beam to transversely shift the relayed wavefront.
Owner:CLARITY MEDICAL SYST

Apparatus and method for filtering biological samples

There is provided an apparatus and method for collection and filtration of a sample having a sample holder, a filtrate holder and a connection conduit having a sample receiving end and a filtrate receiving end and containing a filter. The sample holder has an entry end portion and an exit end portion, with a diaphragm normally closing the exit end portion. The filtrate holder has a closeable receiving end portion for receiving the filtered sample. The connection conduit has a rupturing device for rupturing the diaphragm on exit end portion of the sample holder. When the sample holder is inserted into the connection conduit, the diaphragm rupturing device ruptures the diaphragm, allowing the sample be filtered by the filter located within the connection conduit and the filtrate is collected in the filtrate holder. Also described is a method of collecting a biological sample, and filtering the sample, and holding the filtrate in a filtrate holder.
Owner:ST JOSEPHS HEALTHCARE HAMILTON

Bio electron microscope and observation method of specimen

A bio electron microscope and an observation method which can observe a bio specimen by low damage and high contrast to perform high-accuracy image analysis, and conduct high-throughput specimen preparation. 1) A specimen is observed at an accelerating voltage 1.2 to 4.2 times a critical electron accelerating voltage possible to transmit a specimen obtained under predetermined conditions. 2) An electron energy filter of small and simplified construction is provided between the specimen and an electron detector for imaging by the electron beam in a specified energy region of the electron beams transmitting the specimen. 3) Similarity between an observed image such as virus or protein in the specimen and a reference image such as known virus or protein is subjected to quantitative analysis by image processing. 4) A preparation protocol of the bio specimen is made into a chip using an MEMS technique, which is then mounted on a specimen stage part of an electron microscope to conduct specimen introduction, preparation and transfer onto a specimen holder.
Owner:HITACHI HIGH-TECH CORP +1

Protein Microscope

A system and method for analyzing and imaging a sample containing molecules of interest combines modified MALDI mass spectrometer and SNOM devices and techniques, and includes: (A) an atmospheric-pressure or near-atmospheric-pressure ionization region; (B) a sample holder for holding the sample; (C) a laser for illuminating said sample; (D) a mass spectrometer having at least one evacuated vacuum chamber; (E) an atmospheric pressure interface connecting said ionization region and said mass spectrometer; (F) a scanning near-field optical microscopy instrument comprising a near-field probe for scanning the sample; a vacuum capillary nozzle for sucking in particles which are desorbed by said laser, the nozzle being connected to an inlet orifice of said atmospheric pressure interface; a scanner platform connected to the sample holder, the platform being movable to a distance within a near-field distance of the probe; and a controller for maintaining distance information about a current distance between said probe and said sample; (G) a recording device for recording topography and mass spectrum measurements made during scanning of the sample with the near-field probe; (H) a plotting device for plotting said topography and mass spectrum measurements as separate x-y mappings; and (I) an imaging device for providing images of the x-y mappings.
Owner:GEORGE WASHINGTON UNIVERSITY

High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source

A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
Owner:CARL ZEISS X RAY MICROSCOPY

Contact microscope using point source illumination

The embodiments of the invention include a microscope having a transparent specimen holder and a digital imaging device positioned within the transparent specimen holder. The digital imaging device can include a wireless transmitter. The transparent specimen holder can have a top surface and a bottom surface, wherein the transparent specimen holder is completely transparent between the top surface and the bottom surface. Thus, the transparent specimen holder is completely transparent above and below the digital imaging device. Furthermore, a processor is operatively connected to the digital imaging device, wherein the processor produces an image of a specimen positioned on the specimen holder. A display is operatively connected to the processor, wherein the display displays the image.
Owner:GLOBALFOUNDRIES INC

Sample Holder, Method for Observation and Inspection, and Apparatus for Observation and Inspection

A sample holder used in SEM (scanning electron microscopy) or TEM (transmission electron microscopy) permitting observation and inspection at higher resolution. The holder has a frame-like member provided with an opening that is covered with a film. The film has a first surface on which a sample is held. The thickness D of the film and the length L of the portion of the film providing a cover over the opening in the frame-like member satisfy a relationship given by L / D <200,000.
Owner:JEOL LTD

Magnetic Conveyor Systems, Apparatus and Methods Including Moveable Magnet

Disclosed are magnetic conveyor systems and apparatus having a magnetic coupling with a housing and moveable magnet therein. The moveable magnet is substantially constrained in one dimension and adapted to move in another. The moveable magnet is adapted to magnetically couple with an attracting portion of a sample rack and move the rack along a conveying surface. Ease of transfer of sample racks is provided while minimizing spillage from the open sample containers therein. Method of operating the conveyor system are provided, as are other aspects.
Owner:SIEMENS HEALTHCARE DIAGNOSTICS INC

Aberration-correcting dark-field electron microscopy

A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope operates in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.
Owner:MOCHII VOXA

Light diffuser used in a testing apparatus

An apparatus for photometrically testing several specimens each irradiated by a light source, the light altered by the specimens being detected by an optical device and analyzed, the apparatus including a light source, a plurality of sample holders configured adjacent to one another on a support, a detector that receives altered light from sample within the sample holders, the detector including a filter for eliminating interfering light, a sensor having a sensor face and a diffusing optical member located between the filter and the sensor, wherein light is diffused and shines on a greater portion of the sensor surface, and with a more homogeneous brightness as compared to when the light is not diffused.
Owner:EPPENDORF AG

Method and apparatus for effecting rapid thermal cycling of samples in microtiter plate size

A method and apparatus for effecting rapid thermal cycling of samples, by producing a high-velocity air flow through a closed loop flow path, and energizing an electrical heater within the closed loop flow path to heat the air flowing therethrough to a desired temperature. A sample holder is introduced into the closed loop flow path for exposing the sample holder to the high-velocity heated air flowing therethrough for rapidly heating the sample. The sample is rapidly cooled to a desired temperature by de-energizing the electrical heater, and opening an air outlet from the closed loop flow path, while continuing to produce the high-velocity air flow therethrough.
Owner:INTEGRATED GENETIC DEVICES

Particle-optical device and detection means

A particle-optical apparatus comprising a sample holder for receiving a sample, a particle source embodied to produce a primary beam of first electrically charged particles along an optical axis for the purpose of irradiating the sample, first detector embodied to detect second electrically charged particles that emanate from the sample as a result of the irradiation thereof, a detection space that at the least is formed by the sample holder and the first detector, and an immersion lens embodied to produce a magnetic field for the purpose of focusing the primary beam in the vicinity of the sample holder. The first detector are embodied to produce an electric field in the detection space, and the detection space is embodied to comprise a gas.
Owner:FEI CO

High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source

A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
Owner:CARL ZEISS X RAY MICROSCOPY

Method and System for Multiplex Genetic Analysis

The present disclosure provides apparatus, systems and method for detecting separately and substantially simultaneously light emissions from a plurality of localized light-emitting analytes. A system according to exemplary embodiments of the present disclosure comprises a sample holder having structures formed thereon for spatially separating and constraining a plurality of light-emitting analytes each having a single nucleic acid molecule or a single nucleic acid polymerizing enzyme, a light source configured to illuminate the sample holder, an optical assembly configured to collect and detect separately and substantially simultaneously light emissions associated with the plurality of light emitting analytes. The system may further include a computer system configured to analyze the light emissions to determine the structures or properties of a target nucleic acid molecule associated with each analyte.
Owner:APPL BIOSYSTEMS INC

Hermetic sample holder and method for performing microanalysis under controlled atmosphere environment

A hermetic sample holder for use in performing microanalysis of a sample under a controlled atmosphere environment. The sample holder comprises a sample holder body with a sample cavity to receive the sample and a cover movably mounted to the holder body between an open position to allow access to the cavity and a closed position to seal the cavity. The cover is secured in and released from the closed position at least in part by a pressure differential between the cavity and the ambient atmosphere. The cover may be biased toward the open position. The cover may be pivotally mounted about an axis that is perpendicular to a sealing surface of the cover and / or movable in a direction along the pivot axis. A valve may be provided to allow direct evacuation of the cavity to create a pressure differential. An adjustable clamp may be located in the cavity to secure the sample.
Owner:SION POWER CORP

Formation core sample holder assembly and testing method

A core sample holder assembly for performing laboratory core flooding experiments with a core sample:a pressure chamber provided by a tubular hull made of a carbon fiber composite material and an aluminum liner, and a pair of disk-shaped flanges;a flexible core sample holder sleeve within the pressure chamber, which sleeve comprises a tubular steel sheet with a plastic inner lining;an opening for injecting oil into an annular space between the hull and the sleeve;pressure control means for maintaining the oil at a predetermined pressure;an fluid injection port for injecting a fluid into a cylindrical core sample within the sleeve;a fluid outlet port arranged in the other flange for discharge of fluid from the core sample; andmeans for monitoring the migration of injected and / or pore fluid through the pores of the core sample.
Owner:SHELL OIL CO

Multi-factor comprehensive simulation accelerated testing device for climatic environment

The invention discloses a multi-factor comprehensive simulation accelerated testing device for a climatic environment. The multi-factor comprehensive simulation accelerated testing device comprises a testing box in which a sample frame is arranged, a light source system, an intelligent spraying system, a temperature and humidity regulating system, a circulation air system and a control system. With the adoption of the device, an environmental effect with five environmental factors, such as illumination, corrosive medium, temperature, humidity and air speed can be simultaneously simulated or strengthened; actions, such as radiation power variation, atomizing (or spraying), heating (or cooling), air speed and the like of the light source can be controlled by using an PLC (programmable logic controller) or a singe-chip so as to simulate and strengthen a plurality of typical climate environments; drying and watering circulation on the surface of a sample in the test box can be controlled well through adopting intelligent atomizing (or spraying) control; and accelerated ratio and relevance are improved. The testing device can be used for developing two kinds of different light aging test and damp heat test so as to achieve the effect that one box has multi purposes.
Owner:NO 59 RES INST OF CHINA ORDNANCE IND

Systems, methods, and devices for handling terahertz radiation

Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
Owner:RENESSELAER POLYTECHNIC INST

Specimen Analyzing Apparatus and Specimen Holder

In a specimen analyzing apparatus such as a transmission electron microscope for analyzing the structure, composition and electron state of an observing specimen in operation by applying external voltage to the specimen to be observed, a specimen support (mesh) including a mesh electrode connectable to external voltage applying portions of the specimen and a specimen holder including a specimen holder electrode connectable to the mesh electrode and current inlet terminals as well are provided. Voltage is applied externally of the specimen analyzing apparatus to the external voltage applying portions of the specimen through the medium of the specimen holder electrode and mesh electrode.
Owner:HITACHI LTD

Method and apparatus for handling sample holders

A sample handling apparatus identifies sample holders and their location in a sample holder carrier. This information may be used to determine the identity of sample holders based only on location in the carrier during subsequent processing of material contained in the sample holders. Sample holder identity may be automatically read, and placement of holders in a carrier may be automatically determined and correlated with the holder identity. Such information may be stored, e.g., in a memory in the carrier so that sample holders can be easily identified later.
Owner:PROTEDYNE

Scanning electron microscope

In a VP-SEM that uses gas multiplication induced within a low-vacuum sample chamber and uses a method of detecting a positive displacement current, a secondary electron detector for the VP-SEM that responds at high speed, which can acquire a TV-Scan rate image at a low cost while saving a space is provided. A secondary electron detector is formed by forming the electron supplying electrode and the detection electrode on the flexible thin film type substrate such as a polyimide film, etc., by an etching method. Thereby, the space can be saved while realizing low cost due to mass production. Further, the ion horizontally moving with respect to the surface of the secondary electron detector is detected and the ion moving in a vertical direction returned to the sample holder is not detected, making it possible to realize a high-speed response.
Owner:HITACHI HIGH-TECH CORP

Portable multi-channel device for optically testing a liquid sample

A portable multi-channel device for optically testing of a liquid sample includes a controller; and a sample holder with a cylindrical sample compartment and at least two optical channels respectively for measuring turbidity of the sample liquid and for measuring one other optical property of the sample liquid. Each of the optical channels including: a light source placed at one end of the channel, a main detector placed across the sample compartment from the light source, a reference detector for measuring an intensity of light emitted by the light source, and an excitation focusing optic for directing a light emitted by the light source through the sample compartment towards the main detector. Signals from the reference detector of the channel, the main detector of the channel, and another main detector of another channel perpendicular to the channel are processed by the controller to evaluate the turbidity of the liquid sample.
Owner:ECOLAB USA INC

Sample carrier for carrying a sample to be irradiated with an electron beam

Sample carriers for use in Transmission Electron Microscopes (TEMs) and freely commercially available have the form of a gauze with a strengthening edge. The thickness of these known sample carriers is of the order of magnitude of 20 μm, and is uniform across the entire sample holder. The tiny thickness of these fragile sample carriers makes manipulation difficult. There is a desire to realize automatic introduction and removal of sample carriers in a TEM, seeing as this would make it possible to use the TEM continuously, without human intervention.The invention describes a robust sample carrier whereby—both in the case of manual and automatic manipulation—deformation of and / or damage to the sample carrier is avoided. This is achieved by employing a strengthening edge portion 2 with a thickness 6 larger than the thickness 5 of the middle portion 1 of the sample carrier. The ability to use the sample carrier in analyses in which tilting is important is hereby not impeded.
Owner:FEI CO

Analyzer and measurement restarting method

An analyzer includes a measuring section for measuring samples; a transporting section for transporting a sample rack which holds sample container containing the sample to the measuring section; a motion controller for controlling the measuring section and the transporting section; an error detector for detecting an error of the analyzer; a display section; a display controller for displaying on the display section information representing handling of the sample rack present on the transporting section when the error detector detects the error; and a restart command receiver for receiving an instruction for measurement restart when the error occurs in the analyzer, wherein the motion controller controls the measuring section and the transporting section so as to selectively suction a sample required to be suctioned when the restart command receiver receives the instruction for measurement restart is disclosed. A measurement restarting method is also disclosed.
Owner:SYSMEX CORP
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