424 results about "Sample plane" patented technology

A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.

A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.

The utility model relates to the technical field of semiconductor detection, and aims to provide a two-dimensional semiconductor material impurity online detection system which comprises a main analysis target chamber and a sample replacement target chamber, the sample injection system comprises a magnetic coupling transmission rod connected with the sample change target chamber and a manipulator connected with the main analysis target chamber; the sample processing system comprises a laser annealing device and a sample rack positioned in the main analysis target chamber; the Ar + ion gun system is connected with the main analysis target chamber; the flight time detector is connected with the main analysis target chamber; the data acquisition system comprises a nuclear electronics system and is used for converting detected signals into electric signals and transmitting the electric signals to a computer. Through the cooperation of the main analysis target chamber, the sample changing target chamber, the sample injection system, the sample processing system, the Ar + ion gun system, the flight time detector and the nuclear electronics system, the dynamic data acquisition and analysis are realized, and the problem that the impurity H element of the two-dimensional semiconductor material cannot be nondestructively detected by the conventional surface analysis method is solved.

The invention discloses a helium detection device and method for the airtightness of a bonding interface and a bonding microcavity, and belongs to the field of the airtightness of MEMS devices. The device comprises a sample holder, a mass spectrometer, a molecular pump, a mechanical pump and other components, helium is used as detection gas, and the helium is leaked only through a bonding interface through a customized and processed test sample and sample holder structure, so that the interference of other leaks in a non-bonding area on a test result is avoided. The testing method comprises the steps of sample introduction, vacuum pumping, helium filling, signal detection, dynamic and steady state testing and the like, the helium leak rate is monitored in real time by combining with a helium mass spectrometer, and the minimum leak detection rate is that high-sensitivity air tightness detection is ensured. According to the method, the airtightness of the bonding interface can be independently evaluated, and a reliable basis is provided for development of a novel bonding process. The method is suitable for air tightness detection and evaluation of the bonding process in MEMS device processing and manufacturing.

The invention relates to a method for illuminating a sample plane (17) with wide-field illumination and comprises the steps of providing an illumination beam; guiding the illumination beam along an illumination beam path (3); focusing the illumination beam into an objective pupil (13) of an illumination objective (10) and generating an illumination pattern of wide-field illumination in the sample plane (17), wherein at least one optical element of the illumination beam path is moved in order to repeatedly change the formation of the illumination pattern in the sample plane (17) for the purpose of homogenizing the wide-field illumination.The invention is characterized in that a first scanner (7) is used as an optical element for generating different configurations of the illumination pattern, and the first scanner (7) oscillates in at least one direction around a set position in order to repeatedly change the location or illumination angle of the illumination pattern in the sample plane (17) for the purpose of homogenization. The invention also relates to a device for illuminating a sample plane (17) with wide-field illumination and a microscope (1).

The invention discloses a confocal full-Mueller matrix imaging device and method based on an optical fiber metasurface array, and belongs to the technical field of polarized optical imaging. The device comprises an optical fiber array multi-polarization illumination module, a sample scanning module, a scattered light transmission module, a metasurface array polarization modulation module and a polarized light intensity detection module. The polarization states of four beams of light are regulated and controlled through the optical fiber polarization controller, and four illumination focal spots in different polarization states are generated on a sample plane at the same time; sample scattered light is modulated by a polarization measurement metasurface array comprising four independent metasurface units, and the polarization state of each path of optical signals is projected to sixteen polarized light spots which are spatially separated; and finally, acquiring light spot intensity information by an area array detector, and reconstructing a full-Mueller matrix image of the sample through calculation. According to the invention, full-Mueller matrix information can be obtained through single scanning, and the device has the characteristics of high resolution, compact structure, good compatibility and the like, and can be used for multi-dimensional polarization microscopic analysis of samples.

The utility model discloses a wear resistance testing device for protective gloves, which comprises a test board, a test frame and a sample frame, the test frame and the sample frame are respectively and vertically mounted on two sides of the test board, the bottom of the test frame is mounted on the test board through a first adjusting component in a front-back sliding manner, and a grinding wheel is arranged in the test frame in a lifting manner. The bottom of the sample frame is installed on the test bench in a left-right sliding mode through a second adjusting assembly, a hand mold is rotatably installed on the sample frame through a third adjusting assembly, the surface of the hand mold is covered with an air inflation film layer, and the outer side of the air inflation film layer is sleeved with a protective glove. The device has the advantages that comprehensive wear resistance detection can be carried out on all positions of the protective glove, including the finger face, the first web, the palm and the back of the hand.

The utility model relates to the technical field of testing, in particular to a differential scanning calorimeter which comprises a differential scanning calorimeter, a heating assembly, a display screen and ground feet, the display screen is arranged on one side of the front face of the differential scanning calorimeter, and the ground feet are connected to the positions, close to the four corners, of the lower end of the differential scanning calorimeter. One side, far away from the display screen, of the upper end of the differential scanning calorimeter is connected with a heating assembly, and the heating assembly is composed of a heat insulation cover, a heat insulation sleeve, a handle, a first inner cover, a second inner cover, an inner furnace, an outer furnace, a heat insulation tank, a sealing ring, a heating ring, a sample holder, a soaking block, a sample box and a temperature difference sensor.

The invention discloses an automatic sample oil moisture detection system and method.The system comprises a detection module arranged on a base plate, the base plate is fixed to a workbench, the detection module comprises a moisture meter, functional parts and an operation panel, and the functional parts and the operation panel are arranged on the moisture meter; the base plate is further provided with a liquid injection device and a sample frame, the liquid injection device and the sample frame are both located on one side of the detection module, the sample frame is provided with a sample bottle, the workbench is further provided with a positioning fork, one side of the moisture meter is provided with a liquid injection port, the liquid injection port is located in the positioning fork, and the liquid injection port is located in the positioning fork. The liquid injection device is provided with a liquid injection mechanism which moves between the sample bottle and the moisture meter, and one side of the workbench is also provided with an AGV (Automatic Guided Vehicle) used for inputting and outputting a sample. Automatic operation of sample oil moisture determination is achieved, quantitative liquid injection of the sample to the moisture meter is completed, the determination process is more ordered, efficiency is high, and data consistency is good.

The application relates to a method for locating and identifying an electromagnetic interference source in a shielding box, which comprises the following steps: acquiring tangential magnetic field information of a sampling plane outside the shielding box, constructing an equivalent source model based on the tangential magnetic field information, acquiring dipole moment information of an initial equivalent electric dipole, and realizing first source reconstruction; acquiring a contribution degree evaluation index of each electric dipole based on the dipole moment information of the initial equivalent electric dipole, removing electric dipoles with low contribution degrees based on the contribution degree evaluation index, updating the equivalent source model, acquiring dipole moment information of an updated equivalent dipole, and realizing second source reconstruction; and realizing location and identification of the electromagnetic interference source in the shielding box based on the dipole moment information of the updated equivalent dipole. Compared with the prior art, the application has the advantages of improving equivalent source accuracy, being capable of accurately locating and identifying the electromagnetic interference source in the shielding box, and the like.

There is provided a microscopy device capable of (i) moving a liquid immersion objective lens to a location where liquid, such as an oil or water, can be applied to the liquid immersion objective lens, and (ii) moving the liquid immersion objective lens having liquid applied thereto to a sample holder, to be used to acquire images of a sample. The liquid application process can be automated so that the liquid on the objective lens is replenished as necessary. The device can automatically focus the lens to facilitate scanning, and can be configured to change objective lenses. Other embodiments, including using such a device in high content / high throughput scanning, are also described.

The utility model discloses a bottom solution residue prevention sample holder for vertical tellurium-cadmium-mercury liquid-phase epitaxial growth, which belongs to the field of infrared semiconductor material preparation and comprises a conical flow guide base, a micro-groove array, a SiC / SiO2 super-lyophobic functional layer and a thermal gradient regulation and control module. During working, the frame body is preheated, the melt flows back along the chamfer surface under the action of gravity during lifting, the micro-grooves generate capillary force for directional diversion, the super-lyophobic layer reduces the adhesion work, and the thermal gradient inhibits solution solidification. By applying the sample holder, the residual quantity of a melt can be greatly reduced, the defect density of an epitaxial layer is reduced, the available area is increased to more than 95%, and the problem of millimeter-scale particle residue in the traditional LPE growth is solved.

The application discloses a kind of hollow mask electrode deposition sample holder and method, including connecting tray, movable sample table and mask plate clamp;The bottom of slide rail connector is slidably connected with X linear slide rail in X direction, and the top of slide rail connector is slidably connected with the bottom of sample table in Y direction;Slide rail connector is provided with X through screw hole, and the threaded one end of X adjusting screw rod is installed in the X through screw hole of slide rail connector, and the other end is arranged in X clamping device;Sample table is provided with Y through screw hole, and the threaded one end of Y adjusting screw rod is installed in the Y through screw hole of sample table, and the other end is arranged in Y clamping device;Mask plate clamp fixing stud is higher than sample table, and mask plate clamp is connected with the top of mask plate clamp fixing stud.Carry out the precision requirement when using photolithography process to transfer single-crystal island two-dimensional material and grow single-crystal island two-dimensional material deposition electrode.

The application discloses an X-ray diffractometer high-temperature in-situ detection device, a base lifting assembly is installed on the diffractometer, a tank body assembly rear end is connected with a lifting pad in the base lifting assembly, and a tank body assembly front end is connected with an upper cover in a tank body cover assembly; a heat preservation cavity assembly is arranged in the tank body assembly; a heating chamber assembly is arranged in the heat preservation cavity assembly, and a connecting pipe at a tail of the heating chamber assembly is connected with a gas distribution connector in the tank body cover assembly; sample entering holes for sample passing are arranged at lower ends of the tank body assembly and the heat preservation cavity assembly; the tank body and the tank body cover are provided with cooling water channels; a sample holder assembly is fixed at the tank body assembly lower end, and a measured sample is placed in a sample holder in the sample holder assembly and is sent into the heating chamber assembly; the application has novel structure, stable performance and convenient use, and greatly improves the temperature range of the heating chamber. Since the heat preservation cavity is in a sealed form, the heating speed is fast, and heat preservation is long-lasting.

The utility model provides an automatic vertical wicking height tester, which is used for measuring the water absorption capacity of a fabric, and comprises a sample holder, a carrying mechanism, a test water tank and an industrial camera, the provided automatic vertical wicking height tester is in sliding connection with the sample holder through the carrying mechanism; the fabric sample can be automatically driven to move between the sample rack and the test water tank. Therefore, the fabric sample does not need to be manually placed or taken down, the operation is automatically completed by the carrying mechanism, and the industrial camera accurately records and analyzes the water absorption condition of the fabric sample, so that errors possibly caused by manual observation and classification are avoided, manual intervention is remarkably reduced, and the automation level of testing is improved.

The utility model belongs to the field of atomic force microscopes, and particularly relates to a modular atomic force microscope, which solves the problem that a sample holder of a traditional atomic force microscope in the prior art needs to fix a sample manually and is inconvenient to operate, and comprises a base, and a laser transmitter module and a reflector are mounted on the upper surface of the base. An optical microscope module, a CCD camera module and a monitor module are installed on the right side of the upper surface of the base, a fixing module is arranged in the middle of the upper surface of the base and comprises a cavity formed in the base, a servo motor is fixedly connected to the back face of the base, and an output rotating shaft of the servo motor penetrates through the base and extends into the base. An output rotating shaft of the servo motor is fixedly connected with a positive and negative threaded rod, two threaded surfaces of the positive and negative threaded rod are in threaded connection with threaded rings, and the outer surface of each threaded ring is fixedly connected with two movable plates, so that a sample can be automatically fixed on the whole, and the whole device has a relatively good fixing effect.

This application relates to the field of analytical chemistry detection technology, and in particular to a sample rack for a liquid chromatography-mass spectrometry (LC-MS) instrument used for TDM detection. The rack includes a support mechanism with a sample placement box at the top and a heat-insulating mechanism at the top. The invention utilizes components such as a pull-out plate, a spare support plate, and a table. The sliding engagement between the pull-out plate and the table allows for convenient horizontal sliding of the pull-out plate to retrieve and place samples placed in a first positioning slot. Simultaneously, the spare support plate is fixedly connected to a support side plate, enabling the categorized storage of samples after testing. These components work together to form an orderly sample management system, achieving the modular, partitioned design that efficiently distinguishes and quickly retrieves samples in different testing states, significantly improving the convenience and standardization of experimental operations.

A system and method for detecting movement of a sample subjected to a polishing operation in a vibratory polisher is disclosed. The system includes a sample holder for securing a sample to be polished. A housing supports a platen on which the sample holder is disposed. The platen allows movement of the sample holder during the polishing operation as the sample holder traverses a polishing fluid dispensed around the platen. One or more sensors are disposed around the housing and operable to monitor movement of the sample holder on the platen relative to the housing.

The invention provides a sample table for a table type X-ray diffractometer, and relates to the field of diffractometers, the sample table comprises a sample rack, a sample table structure is inserted in the sample rack, the sample rack is provided with a lifting locking part used for limiting the sample table structure, the lifting locking part comprises a first T-shaped tube mounted at the bottom of the sample rack, and the first T-shaped tube is provided with a second T-shaped tube; a second T-shaped pipe is inserted into the bottom end of the first T-shaped pipe, a second T-shaped rod is connected to the second T-shaped pipe in a penetrating mode, a first T-shaped rod is connected to the top end of the second T-shaped rod, the top of the first T-shaped rod penetrates through the sample frame and extends into the sample frame, and the top of the first T-shaped rod makes contact with the bottom of the sample table structure. According to the sample table structure, the lifting locking part is arranged, the lifting locking part can complete locking of the sample table structure in a mode of rotating after lifting, the lifting locking part can complete unlocking action by moving downwards and resetting after rotating, operation is convenient and fast, use is facilitated, and the abrasion problem of traditional screw adjustment is avoided.

A microscope is disclosed for imaging a sample. The microscope includes an illumination objective, a further illumination objective, an imaging objective and a further imaging objective, a sample holder, holder support and a drive system arranged to displace the sample holder along three perpendicular axes.

An infrared imaging system and a method for imaging a sample with a fluorescent marker are provided. The system includes a light source configured to illuminate a sample contact surface. The light source includes a first lighting module and a second lighting module, each configured to project a corresponding first infrared illumination beam and a second infrared illumination beam toward a sample holder, the infrared illumination beams interacting at an imaging plane to form an illumination area having a rectangular shape and uniform power distribution. The system also includes a control unit operably connected to a motor assembly and an optomechanical mechanism. The control unit is configured to cause a sampling plane and an imaging plane to overlap with each other at any of the multiple positions within the packaging shell. The system includes a detector configured to receive light emitted by the fluorescent marker of the sample when the sample is illuminated in the imaging plane when the sampling plane and the imaging plane overlap with each other.

Systems and methods for automated cap removal with an autosampler system are described. In an aspect, an autosampler system includes, but is not limited to, a sample rack; a sample vessel stabilizer configured to transition the sample rack between a load / unload state and a lock state; an uncapper supported by a first z-axis support; and a sample probe supported by a second z-axis support, wherein the uncapper is configured to remove a cap from a sample vessel held by the sample rack when the sample rack is in the lock state, and wherein the uncapper is configured to change the position of the removed cap to permit access to an interior of the sample vessel by the sample probe without removing the sample vessel from the sample rack.

The present invention discloses a sample transfer robot compatible with multiple sample racks in an ultra-high vacuum and a sample transfer method thereof, relating to the technical field of sample transfer robots. The robot comprises a sample transfer fork, wherein the top of the sample transfer fork is provided with a 2-inch wafer gripper, the bottom of the sample transfer fork is provided with a 4-inch wafer gripper, and one side of the sample transfer fork is provided with a sample grabbing mechanism; the sample grabbing mechanism comprises a sleeve, and the sleeve is provided with a first card slot and a second card slot, respectively. The present invention manufactures a sample transfer robot and a sample storage mechanism compatible with four types of sample racks for ultra-high vacuum systems such as the Omicron MBE and STM system, the Unisoku MBE and STM system, the 2-inch wafer MBE, and the 4-inch wafer MBE. The robot is capable of grabbing four types of sample racks and storing them in the same vacuum chamber. Therefore, by simply using the robot to manufacture an ultra-high vacuum suitcase, the problem of transferring samples from the four different ultra-high vacuum systems directly into an argon-protected glove box without passing through the atmosphere can be solved.

A system including a processor and a memory having instructions that, when executed by the processor, cause the system to obtain a point cloud of a turbine blade, the point cloud comprising data points corresponding to locations on an external contour of the turbine blade, generate an external mesh for the turbine blade based on the point cloud, define a reference axis along a length of the turbine blade, generate sampling planes along a length of the reference axis, each sampling plane being normal to the reference axis and having a shape defined by those portions of the external mesh intersecting the sampling plane, match each sampling plane to an airfoil profile in a database of known airfoil profiles, and create a geometrical representation of the turbine blade by placing the airfoil profiles on the reference axis and connecting the perimeter of each of the airfoil profiles.

The invention discloses an angle continuously adjustable super-resolution microscope illumination device and method. The device comprises a light beam coupling assembly; an LED-DMD excitation light path and a digital micromirror array perform intensity modulation on Kohler illumination light according to a loaded intensity distribution reference pattern, a first light beam is reflected, and the first light beam is projected to a sample plane through a light beam coupling assembly and a conjugate light path in sequence; an SLM-Laser excitation / light control light path, a spatial light modulator performs phase modulation on parallel light according to a loaded phase distribution reference pattern to generate a second light beam, and the second light beam is coupled with the first light beam through a light beam coupling assembly and then is projected to a sample plane; the excitation mode switching module is used for switching a conjugate surface to realize TIRF illumination or spot scanning excitation; the control system realizes seamless switching between a preset light control imaging mode and a real-time light control imaging mode. The problems that a traditional super-resolution microscope is single in function, high in phototoxicity, poor in adaptability and the like are solved, and a more powerful imaging platform can be provided for biomedical research.

The invention relates to the technical field of high-temperature electrochemical experiments, in particular to a multi-channel high-temperature electrochemical sample holder and an in-situ test sample preparation method. The multi-channel high-temperature electrochemical sample holder comprises a base, a ceramic sample holder and a plurality of groups of probe assemblies which are sequentially arranged from bottom to top, the ceramic sample holder is of an integrated structure and comprises a sample part, a connecting part and a fixing part, the plurality of groups of probe assemblies are detachably connected with the ceramic sample holder and the base through the fixed bottom plate, and each group of probe assemblies independently comprises a metal probe, a probe arm and a probe arm bracket and is used for fixing a sample, realizing electrical isolation and switching on a sample circuit. The multi-channel high-temperature electrochemical sample holder provided by the invention can adapt to laser heating and vacuum experiment environments, simplifies the sample preparation process, and remarkably improves the efficiency and reliability of high-temperature electrochemical experiments and widens the application range of the high-temperature electrochemical experiments.

The invention discloses a high-beam ion soft landing device based on a multistage difference technology, and belongs to the technical field of surface scientific sample preparation. The device comprises an electrospray ionization source, an ion transmission device, an ion deposition device and a sample transfer device which are connected in sequence. The ionization source couples high voltage to the solution through the spray needle fixing mechanism integrating the three-dimensional displacement table and the metal conductive connecting piece, and electrified micro-droplets are generated. The transmission device adopts a combination of a four-stage differential air exhaust cavity and a replaceable ion lens with a gradually increased aperture, so that efficient focusing and transmission of ions are realized, and desolvation is completed through a heating capillary tube. The deposition device drives a multi-clamping-groove vertical sample frame through a magnetic coupling sample transfer rod, and applies a deceleration electric field to a sample support by using an external bias power supply, so that ions are softly landed on a substrate with low kinetic energy. According to the invention, an expensive mass spectrum assembly is abandoned, and through linkage of all parts, high-flux and high-integrity clean deposition of macromolecules and heat-sensitive samples is realized while the cost is remarkably reduced.

The utility model provides a dismounting-free convertible solid sample holder device, which is characterized in that a rotating disc is rotatably connected to a base through a positioning locking column, a plurality of positioning holes are formed in the base, a steel ball is mounted at the lower end of the rotating disc, the periphery of the steel ball can be positioned and connected into one positioning hole, and a bottom plate and a shading plate are fixedly mounted on the rotating disc; a sample box is detachably installed on the bottom plate, through holes are formed in the two side walls of the shading plate respectively, and incident light irradiates a sample in the sample box through one through hole and is emitted out through the other through hole after being reflected by the sample. According to the dismounting-free convertible solid sample holder device, the base and the rotating disc are connected through the positioning locking column, so that the rotating disc can rotate relative to the base, the first pressure spring elastically tensions the relative position of the base and the rotating disc, and the relative position of a sample box mounted on the U-shaped bracket can be positioned through the matching of the steel ball and the positioning hole; the reversing function of the solid sample holder assembly is achieved under the disassembly-free and assembly-free condition.