693 results about "Sample plane" patented technology

A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.

A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.

A plenoptic imaging device for forming an image of the light field of an object, includes a sample holder suitable for holding the object; a main optical assembly, arranged to focus rays of the light field of the object, at a distance z0, referred to as the object distance, from the sample holder, which distance is smaller than an object focal distance f1 from the main optical assembly so as to form an intermediate optical image (Iv) of the object in an intermediate image plane at a distance z1 from the optical assembly; an assembly for sampling the light field, which assembly is suitable for acquiring spatiodirectional information on the rays forming the virtual image and for forming the image of the light field.

The invention provides a micro-area variable-angle grazing incidence wide-angle scattering test method based on a single-crystal X-ray diffractometer, which comprises the following steps: preparing a sample from a test material deposited on a substrate, and placing the sample on an improved sample rack which is provided with a specific structure and a driver for controlling an incident angle and the like; selecting an X-ray light source, aligning the X-ray light source with the sample, and switching and matching a copper target and a molybdenum target; z-scan scanning and tilting scanning along a light path direction and a direction vertical to the light path are carried out, and related parameters are set; the scattered X-rays are collected through a two-dimensional surface detector; and finally obtaining a correlation graph through software integration. Specific requirements for the table size, scanning parameters and the like of the improved sample holder are met, a height reference position, an adjusting structure and the like are further arranged, and a connecting part is installed on an equipment sample table through screw joint. The problems of inaccurate incident angle and height control and the like in the prior art are solved, and the test accuracy and reliability are improved.

The utility model relates to a rotary sample holder and an oven in the technical field of material testing. The rotary sample holder comprises a main shaft; the two circular ring fixers are coaxially arranged on the main shaft respectively, and the two circular ring fixers are arranged on the main shaft in a spaced mode; the plurality of sample holders are uniformly divided into two groups, and the two groups of sample holders are respectively mounted on the two circular ring fixers; the driver is arranged on the main shaft and used for driving the main shaft to rotate around the axis of the main shaft. The rotary sample holder can ensure that each group of samples are heated consistently and uniformly in the test process, and the accuracy of a rubber aging test result is improved.

The utility model relates to the technical field of semiconductor detection, and aims to provide a two-dimensional semiconductor material impurity online detection system which comprises a main analysis target chamber and a sample replacement target chamber, the sample injection system comprises a magnetic coupling transmission rod connected with the sample change target chamber and a manipulator connected with the main analysis target chamber; the sample processing system comprises a laser annealing device and a sample rack positioned in the main analysis target chamber; the Ar + ion gun system is connected with the main analysis target chamber; the flight time detector is connected with the main analysis target chamber; the data acquisition system comprises a nuclear electronics system and is used for converting detected signals into electric signals and transmitting the electric signals to a computer. Through the cooperation of the main analysis target chamber, the sample changing target chamber, the sample injection system, the sample processing system, the Ar + ion gun system, the flight time detector and the nuclear electronics system, the dynamic data acquisition and analysis are realized, and the problem that the impurity H element of the two-dimensional semiconductor material cannot be nondestructively detected by the conventional surface analysis method is solved.

A microscope stage comprising a planar base (1) with two or more parallel grooves (2) formed extending in a first direction (5). A carriage (3) is mounted on the base with at least two projections (4) that slide in the grooves. The carriage receives a microscope slide or other sample holder (6). The carriage includes at least one guide and a biasing means (7) to urge the sample holder against the guide while permitting it to move relative to the guide in a second direction (8) orthogonal to the first direction.

The invention discloses a helium detection device and method for the airtightness of a bonding interface and a bonding microcavity, and belongs to the field of the airtightness of MEMS devices. The device comprises a sample holder, a mass spectrometer, a molecular pump, a mechanical pump and other components, helium is used as detection gas, and the helium is leaked only through a bonding interface through a customized and processed test sample and sample holder structure, so that the interference of other leaks in a non-bonding area on a test result is avoided. The testing method comprises the steps of sample introduction, vacuum pumping, helium filling, signal detection, dynamic and steady state testing and the like, the helium leak rate is monitored in real time by combining with a helium mass spectrometer, and the minimum leak detection rate is that high-sensitivity air tightness detection is ensured. According to the method, the airtightness of the bonding interface can be independently evaluated, and a reliable basis is provided for development of a novel bonding process. The method is suitable for air tightness detection and evaluation of the bonding process in MEMS device processing and manufacturing.

In one aspect, a specimen holder includes a first end configured to attach to a cooling device and a second end configured to be inserted into a microscope; a section with a sample tip at the second end; an interface between the first end configured to attach to the cooling device and the section with the sample tip; and an internal thermal connection section configured to be in thermal contact with a cold finger of the cooling device when the specimen holder is attached to the cooling device and extending through the section with the sample tip to the sample tip.

Various embodiments of a laser illumination system are disclosed. In some examples, a system includes one or more lasers and a beam combiner configured to direct a combined light beam along a path. The system can include a polychroic optical assembly that receives the combined light beam and to output a first beam of the first light of the first wavelength and a second beam of the second light of the second wavelength. The second beam can be offset from the first beam. The polychroic optical assembly can be a prism assembly. The system can include one or more optical elements configured alter a distribution of light of the first beam to output a first output line at a sample plane, and to alter a distribution of light of the second beam to output a second output line at the sample plane.

The invention relates to the technical field of angular resolution photoelectron spectroscopy sample preparation, in particular to a multi-electrode sample table suitable for ultrahigh vacuum and low-temperature environments, which comprises a sample seat and a sample support, the sample support comprises a mounting table, a placement table, a sample bearing piece and a female head electrode assembly, the placement table is arranged on the mounting table, and the female head electrode assembly is arranged on the placement table. The sample bearing part is used for placing a sample and is detachably connected with the placing table, and the female head electrode assembly is arranged on the mounting table; and the sample seat is used for connecting the mounting table and the sample frame and comprises a male head electrode assembly matched with the female head electrode assembly. After a sample is tested, only the sample bearing piece on the sample support needs to be replaced, the whole sample support does not need to be replaced, and repeated use of the sample support is achieved; and the front part of the sample holder is not shielded, so that incident photons or photoelectrons excited from the sample are prevented from being shielded, and the effective acquisition space of the photoelectron spectroscopy is further improved.

The present invention relates to a sample stage for an ultrasonic scanning microscope, comprising: a sample rack for placing samples; a driving device for driving the sample rack to rotate, the sample rack being fixed on a power output shaft of the driving device; a lifting assembly for driving the driving device to rise or fall, the driving device being arranged on the lifting assembly; a limit position assembly being arranged on the lifting assembly, for limiting the maximum rotation angle of the sample rack. Based on the sample stage for an ultrasonic scanning microscope of the present invention, the sample rack can be rotated at a certain angle as required to achieve scanning detection of the object to be measured at different angles.

A sample holder system for holding a microscopic sample in a microscope system comprises a first and a second rotation element, which are rotatably connected to one another. The side surfaces of the two rotation elements in each case enclose an angle α, with the result that the rotation elements have a wedge-shaped cross section. The second rotation element is configured to receive a sample, while the first rotation element can be rotatably connected to a holder receiving surface. The rotation elements are each rotatable by an angle β about a rotation axis. The inclination of the third side surface on which the sample can be received is settable by combining all of the involved angles α and β.

A device useful as a spectrometer or a sensor, comprising a source of a short electromagnetic pulses at a first wavelength and having a full width at half maximum in a range of 1 femtosecond-1 nanosecond; a sample holder in which the short pulses interact with the sample in the sample holder so as to form an output signal comprising a background residual of the short pulses and a sample response signal in the time domain, and an amplifier comprising nonlinear medium. The nonlinear medium comprises an input for receiving the output signal and a pump pulse at a second wavelength, and a second-order nonlinearity configured for a nonlinear process selectively amplifying the sample response signal, for example by temporally overlapping the pump pulse and the sample response signal.

The invention relates to a method for illuminating a sample plane (17) with wide-field illumination and comprises the steps of providing an illumination beam; guiding the illumination beam along an illumination beam path (3); focusing the illumination beam into an objective pupil (13) of an illumination objective (10) and generating an illumination pattern of wide-field illumination in the sample plane (17), wherein at least one optical element of the illumination beam path is moved in order to repeatedly change the formation of the illumination pattern in the sample plane (17) for the purpose of homogenizing the wide-field illumination.The invention is characterized in that a first scanner (7) is used as an optical element for generating different configurations of the illumination pattern, and the first scanner (7) oscillates in at least one direction around a set position in order to repeatedly change the location or illumination angle of the illumination pattern in the sample plane (17) for the purpose of homogenization. The invention also relates to a device for illuminating a sample plane (17) with wide-field illumination and a microscope (1).

The invention discloses a confocal full-Mueller matrix imaging device and method based on an optical fiber metasurface array, and belongs to the technical field of polarized optical imaging. The device comprises an optical fiber array multi-polarization illumination module, a sample scanning module, a scattered light transmission module, a metasurface array polarization modulation module and a polarized light intensity detection module. The polarization states of four beams of light are regulated and controlled through the optical fiber polarization controller, and four illumination focal spots in different polarization states are generated on a sample plane at the same time; sample scattered light is modulated by a polarization measurement metasurface array comprising four independent metasurface units, and the polarization state of each path of optical signals is projected to sixteen polarized light spots which are spatially separated; and finally, acquiring light spot intensity information by an area array detector, and reconstructing a full-Mueller matrix image of the sample through calculation. According to the invention, full-Mueller matrix information can be obtained through single scanning, and the device has the characteristics of high resolution, compact structure, good compatibility and the like, and can be used for multi-dimensional polarization microscopic analysis of samples.

The utility model discloses an optical filter assembly mounting angle detection device, which comprises a computer, a sample holder, a 45-degree semi-transparent and semi-reflective rectangular prism, an adjustable laser and a camera, the 45-degree semi-transparent and semi-reflective rectangular prism is arranged corresponding to the sample holder, and the camera is arranged corresponding to the 45-degree semi-transparent and semi-reflective rectangular prism. The adjustable laser and the 45-degree semi-transparent and semi-reflecting rectangular prism are directly or indirectly arranged correspondingly, the adjustable laser is connected with the computer, and the camera is connected with the computer. Compared with the prior art, the device does not need to move back and forth in a near field and a far field, so that the movement time is saved, and the detection efficiency is improved. In addition, the surface mounting angle of each optical filter can be quantitatively obtained.

The invention discloses a high-precision sample holder and sample stage for micro-area analysis, and belongs to the field of measurement and testing, the high-precision sample holder and sample stage for micro-area analysis comprises a displacement table base mounting flange, a corrugated pipe, a differential component mounting flange, a sample rod and a customized sample stage arranged at one end of the sample rod; the displacement table base mounting flange and the differential component are respectively arranged at two ends of the sample rod; the corrugated pipe is arranged between the displacement table base mounting flange and the differential component mounting flange; a temperature control module is arranged on one side, close to the displacement table base mounting flange, of the sample rod. According to the high-precision sample holder and the four-axis displacement table for micro-area analysis, a sample can be kept stable in the analysis process, and movement in the X direction, movement in the Y direction and movement in the Z direction and angle rotation can be achieved at the same time; meanwhile, the adjustable temperature control device can adjust the temperature of the sample, so that the sample is always in a constant-temperature state, and the precision and temperature requirements of the sample during micro-area analysis test can be ensured at the same time.

The invention relates to a device for measuring a friction coefficient measurable between samples (I la, 11b; 21a, 21b; 41a, 41b; 71a, 71b; 81a, 81b) and a test piece (12; 22; 42; 62; 72; 82), comprising sample holders (13a, 13b; 23a, 23b; 43a, 43b; 73a, 73b) adapted for securing the samples (I la, 11b; 21a, 21b; 41a, 41b; 71a, 71b; 81a, 81b), sample mounts (14a, 14b; 24a, 24b; 44a, 44b; 74a, 74b) adapted for mounting the sample holders (13a, 13b; 23a, 23b; 43a, 43b; 73a, 73b), tensioning arms (15a, 15b; 25a, 25b; 35a, 35b; 45a, 45b; 65a, 65b; 71a, 71b; 81a, 81b) connected to the sample mounts (14a, 14b; 24a, 24b; 44a, 44b; 74a, 74b), a tensioning mechanism (16; 26; 36; 46; 76) that is connected to the tensioning arms (15a, 15b; 25a, 25b; 35a, 35b; 45a, 45b; 65a, 65b; 71a, 71b; 81a, 81b) and is adapted for pressing the samples (I la, 11b; 21a, 21b; 41a, 41b; 71a, 71b; 81a, 81b) against the test piece (12; 22; 42; 62; 72; 82), and a pull frame (17; 27; 37; 47; 67; 77; 87) connected to the tensioning arms (15a, 15b; 25a, 25b; 35a, 35b; 45a, 45b; 65a, 65b; 71a, 71b; 81a, 81b). The device according to the invention is characterised in that the tensioning arms (15a, 15b; 25a, 25b; 35a, 35b; 45a, 45b; 65a, 65b; 71a, 71b; 81a, 81b) are connected to the pull frame (17; 27; 37; 47; 67; 77; 87) along cylindrical surfaces (18a, 18b; 28; 38a, 38b; 48a, 48b; 68a, 68b) allowing their rotation, with the axes of rotation of the cylindrical surfaces (18a, 18b) being located substantially in the planes of the contacting surface of the samples (I la, 11b; 21a, 21b; 41a, 41b; 71a, 71b; 81a, 81b) and the test piece (12; 22; 42; 62; 72; 82). The invention further relates to a method for measuring a friction coefficient measurable between samples (I la, 11b; 21a, 21b; 41a, 41b; 71a, 71b; 81a, 81b) and a test piece (12; 22; 42; 62; 72; 82) applying the device according to any of the preceding claims.

Fluorescence imaging system designs are described that provide larger fields-of-view, increased spatial resolution, improved modulation transfer and image quality, higher spatial sampling frequency, faster transitions between image capture when repositioning the sample plane to capture a series of images (e.g., of different fields-of-view), and improved imaging system duty cycle, and thus enable higher throughput image acquisition and analysis for genomics and other imaging applications.

The invention discloses an X-ray diffractometer sample holder powder sample automatic preparation device, and relates to the technical field of experimental equipment, the X-ray diffractometer sample holder powder sample automatic preparation device comprises a sample table, a sample holder is arranged on the sample table, and a plurality of sample boxes are sequentially placed on the sample holder; the sample table comprises a circular positioning plate, two placement tables, two mounting frames, a feeding mechanism for conveying sample powder into the sample box, a flattening mechanism for flattening the sample powder in the sample box, and a driving mechanism for driving the sample frame to move in the length direction of the placement tables and penetrate through the circular positioning plate; according to the invention, through the uniform flattening of sample powder by the flattening mechanism and the control of the powder granularity by a screen of the feeding mechanism, the preferred orientation phenomenon of crystals in a sample due to overlarge pressure or improper method is reduced, the diffraction line broadening phenomenon is reduced, the definition of a diffraction pattern and the intensity measurement precision of a diffraction peak are improved, and the measurement accuracy of the diffraction peak is improved. The uniform distribution of the powder in each sample box is ensured, and the repeatability of experimental data is improved.

The utility model discloses a wear resistance testing device for protective gloves, which comprises a test board, a test frame and a sample frame, the test frame and the sample frame are respectively and vertically mounted on two sides of the test board, the bottom of the test frame is mounted on the test board through a first adjusting component in a front-back sliding manner, and a grinding wheel is arranged in the test frame in a lifting manner. The bottom of the sample frame is installed on the test bench in a left-right sliding mode through a second adjusting assembly, a hand mold is rotatably installed on the sample frame through a third adjusting assembly, the surface of the hand mold is covered with an air inflation film layer, and the outer side of the air inflation film layer is sleeved with a protective glove. The device has the advantages that comprehensive wear resistance detection can be carried out on all positions of the protective glove, including the finger face, the first web, the palm and the back of the hand.

The invention discloses a salt mist box, and belongs to the technical field of service performance tests of cement-based materials in a marine environment. The salt mist box comprises a box body, wherein the internal space of the box body is divided into an upper chamber and a lower chamber by a fixedly arranged sample rack; the salt mist box further comprises an ultraviolet light source located in the upper cavity and a salt water chamber located in the lower cavity and is provided with a spray tower. Wherein the sample rack is provided with a loading device, and the loading device is used for placing a sample and applying pressure to the sample. The salt mist box can simulate various environmental conditions, so that the service life and the performance change of a material can be predicted more accurately.

The invention discloses a perforated powder reverse filling device for an x-ray diffractometer, and relates to the technical field of experimental equipment. The sample table comprises a circular positioning plate, a sample frame, a flattening mechanism used for flattening sample powder in the sample box, an abutting mechanism used for sealing an opening of the sample box, and a driving mechanism used for driving the sample box to enter the abutting mechanism. Through cooperation of the pressing mechanism and the piston cylinder, the uniformity and consistency of the sample are ensured, particle distribution of the sample is more random, the influence of the preferred orientation of the sample is reduced, a more accurate diffraction pattern is obtained, multiple times of slicking is not needed, and the situation that multiple times of flattening is needed due to unevenness of powder is avoided; and the lattice of the sample powder after long-time grinding is damaged.

The utility model relates to the technical field of testing, in particular to a differential scanning calorimeter which comprises a differential scanning calorimeter, a heating assembly, a display screen and ground feet, the display screen is arranged on one side of the front face of the differential scanning calorimeter, and the ground feet are connected to the positions, close to the four corners, of the lower end of the differential scanning calorimeter. One side, far away from the display screen, of the upper end of the differential scanning calorimeter is connected with a heating assembly, and the heating assembly is composed of a heat insulation cover, a heat insulation sleeve, a handle, a first inner cover, a second inner cover, an inner furnace, an outer furnace, a heat insulation tank, a sealing ring, a heating ring, a sample holder, a soaking block, a sample box and a temperature difference sensor.

The invention discloses an automatic sample oil moisture detection system and method.The system comprises a detection module arranged on a base plate, the base plate is fixed to a workbench, the detection module comprises a moisture meter, functional parts and an operation panel, and the functional parts and the operation panel are arranged on the moisture meter; the base plate is further provided with a liquid injection device and a sample frame, the liquid injection device and the sample frame are both located on one side of the detection module, the sample frame is provided with a sample bottle, the workbench is further provided with a positioning fork, one side of the moisture meter is provided with a liquid injection port, the liquid injection port is located in the positioning fork, and the liquid injection port is located in the positioning fork. The liquid injection device is provided with a liquid injection mechanism which moves between the sample bottle and the moisture meter, and one side of the workbench is also provided with an AGV (Automatic Guided Vehicle) used for inputting and outputting a sample. Automatic operation of sample oil moisture determination is achieved, quantitative liquid injection of the sample to the moisture meter is completed, the determination process is more ordered, efficiency is high, and data consistency is good.

The invention relates to a low-temperature convergent transmission spectrum measuring device based on a Fourier transform infrared spectrometer. The device comprises a Fourier transform infrared spectrometer, a convergence angle optical system, a low-temperature optical system and a receiver. The convergence angle optical system comprises a collimating lens, a diaphragm, a convergent lens group and a reflector, and the low-temperature optical system comprises a diaphragm, a sample holder and a low-temperature thermostat. The collimating lens is used for converting divergent light emitted by the infrared spectrometer into parallel light, the aperture diaphragm is used for regulating and controlling the spot size of the parallel light, the convergent lens is used for converting the parallel light into convergent light, and after the convergent light is emitted through a sample, the emergent divergent light is converted into the parallel light. Incident parallel light is reflected into a receiver in a convergent state by using an aspheric concave reflector, and the temperature of a sample is reduced to a temperature to be measured by using a cryostat. The low-temperature convergent transmission spectrum measuring device has the characteristics of simple structure, large convergent angle regulation and control range, wide spectrum band and temperature coverage range and the like.

Various embodiments may provide a method of illuminating a sample plane. The method may include providing an illumination subsystem including a light source and at least one lens, the illumination subsystem having a raw optical axis at an angle of incidence greater than 0 DEG and less than 90 DEG to a normal to a sample plane. A reference illumination profile is generated on a sample using an illumination subsystem at a primary inclined position. The method may also include rotating the illumination subsystem about a pivot point along the original optical axis between the light source and the sample plane to a secondary inclined position having another optical axis, the illumination subsystem is located at the original optical axis such that the adjusted illumination distribution produced by the illumination subsystem at the sample plane has an improved symmetry of the intensity distribution in comparison to a reference illumination distribution produced by the illumination subsystem located at the original optical axis at the sample plane.

The invention belongs to the field of plate plastic processing, and discloses an experimental system for directly measuring anisotropy coefficient in any direction in a plate surface, which comprises an experimental sample, an experimental mold, a press machine, a data acquisition unit, a clamp, a data processing unit and a rotary table. According to the experimental system provided by the invention, the experimental result can directly reflect the plastic deformation condition of the plate in any direction, the anisotropy coefficient in any direction in an experimental sample plane is obtained through one-time experiment, and the defect that only discrete experimental data in a certain specific direction can be obtained in the current uniaxial tension experiment is overcome.

The invention belongs to the field of superconducting material measurement, and discloses an external field critical current test sample rod under axial strain of a superconducting tape, which comprises a mechanical transmission device, a worm vertical to a left-right rotation trapezoidal screw rod, and a worm gear connected with the middle part of the left-right rotation trapezoidal screw rod through an optical axis key; the axial strain loading platform and the nut seat are respectively screwed into a left thread part and a right thread part of the left-handed and right-handed trapezoidal screw rod, the sample holder is supported and fixed through convex parts at two sides of the nut seat, the copper current terminals are respectively fixed at two ends of a platform part of the sample holder, and the strain gauge is used for being fixed on a middle shaft in the middle of a superconducting tape to be tested; and the electric signal transmission device is electrically connected with the strain gauge. According to the invention, the left-handed and right-handed trapezoidal screw rods are driven to rotate, so that the pair of nut seats with opposite threads are linearly opened and closed, the superconducting tape to be measured on the sample holder tape welding platform is driven to generate axial strain, and the critical current of the superconducting tape under the axial strain in a background magnetic field is measured.