524 results about "Sample plane" patented technology

A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.

A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.

The utility model relates to the technical field of semiconductor detection, and aims to provide a two-dimensional semiconductor material impurity online detection system which comprises a main analysis target chamber and a sample replacement target chamber, the sample injection system comprises a magnetic coupling transmission rod connected with the sample change target chamber and a manipulator connected with the main analysis target chamber; the sample processing system comprises a laser annealing device and a sample rack positioned in the main analysis target chamber; the Ar + ion gun system is connected with the main analysis target chamber; the flight time detector is connected with the main analysis target chamber; the data acquisition system comprises a nuclear electronics system and is used for converting detected signals into electric signals and transmitting the electric signals to a computer. Through the cooperation of the main analysis target chamber, the sample changing target chamber, the sample injection system, the sample processing system, the Ar + ion gun system, the flight time detector and the nuclear electronics system, the dynamic data acquisition and analysis are realized, and the problem that the impurity H element of the two-dimensional semiconductor material cannot be nondestructively detected by the conventional surface analysis method is solved.

A microscope stage comprising a planar base (1) with two or more parallel grooves (2) formed extending in a first direction (5). A carriage (3) is mounted on the base with at least two projections (4) that slide in the grooves. The carriage receives a microscope slide or other sample holder (6). The carriage includes at least one guide and a biasing means (7) to urge the sample holder against the guide while permitting it to move relative to the guide in a second direction (8) orthogonal to the first direction.

The invention discloses a helium detection device and method for the airtightness of a bonding interface and a bonding microcavity, and belongs to the field of the airtightness of MEMS devices. The device comprises a sample holder, a mass spectrometer, a molecular pump, a mechanical pump and other components, helium is used as detection gas, and the helium is leaked only through a bonding interface through a customized and processed test sample and sample holder structure, so that the interference of other leaks in a non-bonding area on a test result is avoided. The testing method comprises the steps of sample introduction, vacuum pumping, helium filling, signal detection, dynamic and steady state testing and the like, the helium leak rate is monitored in real time by combining with a helium mass spectrometer, and the minimum leak detection rate is that high-sensitivity air tightness detection is ensured. According to the method, the airtightness of the bonding interface can be independently evaluated, and a reliable basis is provided for development of a novel bonding process. The method is suitable for air tightness detection and evaluation of the bonding process in MEMS device processing and manufacturing.

In one aspect, a specimen holder includes a first end configured to attach to a cooling device and a second end configured to be inserted into a microscope; a section with a sample tip at the second end; an interface between the first end configured to attach to the cooling device and the section with the sample tip; and an internal thermal connection section configured to be in thermal contact with a cold finger of the cooling device when the specimen holder is attached to the cooling device and extending through the section with the sample tip to the sample tip.

Various embodiments of a laser illumination system are disclosed. In some examples, a system includes one or more lasers and a beam combiner configured to direct a combined light beam along a path. The system can include a polychroic optical assembly that receives the combined light beam and to output a first beam of the first light of the first wavelength and a second beam of the second light of the second wavelength. The second beam can be offset from the first beam. The polychroic optical assembly can be a prism assembly. The system can include one or more optical elements configured alter a distribution of light of the first beam to output a first output line at a sample plane, and to alter a distribution of light of the second beam to output a second output line at the sample plane.

The invention relates to the technical field of angular resolution photoelectron spectroscopy sample preparation, in particular to a multi-electrode sample table suitable for ultrahigh vacuum and low-temperature environments, which comprises a sample seat and a sample support, the sample support comprises a mounting table, a placement table, a sample bearing piece and a female head electrode assembly, the placement table is arranged on the mounting table, and the female head electrode assembly is arranged on the placement table. The sample bearing part is used for placing a sample and is detachably connected with the placing table, and the female head electrode assembly is arranged on the mounting table; and the sample seat is used for connecting the mounting table and the sample frame and comprises a male head electrode assembly matched with the female head electrode assembly. After a sample is tested, only the sample bearing piece on the sample support needs to be replaced, the whole sample support does not need to be replaced, and repeated use of the sample support is achieved; and the front part of the sample holder is not shielded, so that incident photons or photoelectrons excited from the sample are prevented from being shielded, and the effective acquisition space of the photoelectron spectroscopy is further improved.

A device useful as a spectrometer or a sensor, comprising a source of a short electromagnetic pulses at a first wavelength and having a full width at half maximum in a range of 1 femtosecond-1 nanosecond; a sample holder in which the short pulses interact with the sample in the sample holder so as to form an output signal comprising a background residual of the short pulses and a sample response signal in the time domain, and an amplifier comprising nonlinear medium. The nonlinear medium comprises an input for receiving the output signal and a pump pulse at a second wavelength, and a second-order nonlinearity configured for a nonlinear process selectively amplifying the sample response signal, for example by temporally overlapping the pump pulse and the sample response signal.

The invention relates to a method for illuminating a sample plane (17) with wide-field illumination and comprises the steps of providing an illumination beam; guiding the illumination beam along an illumination beam path (3); focusing the illumination beam into an objective pupil (13) of an illumination objective (10) and generating an illumination pattern of wide-field illumination in the sample plane (17), wherein at least one optical element of the illumination beam path is moved in order to repeatedly change the formation of the illumination pattern in the sample plane (17) for the purpose of homogenizing the wide-field illumination.The invention is characterized in that a first scanner (7) is used as an optical element for generating different configurations of the illumination pattern, and the first scanner (7) oscillates in at least one direction around a set position in order to repeatedly change the location or illumination angle of the illumination pattern in the sample plane (17) for the purpose of homogenization. The invention also relates to a device for illuminating a sample plane (17) with wide-field illumination and a microscope (1).

The invention discloses a confocal full-Mueller matrix imaging device and method based on an optical fiber metasurface array, and belongs to the technical field of polarized optical imaging. The device comprises an optical fiber array multi-polarization illumination module, a sample scanning module, a scattered light transmission module, a metasurface array polarization modulation module and a polarized light intensity detection module. The polarization states of four beams of light are regulated and controlled through the optical fiber polarization controller, and four illumination focal spots in different polarization states are generated on a sample plane at the same time; sample scattered light is modulated by a polarization measurement metasurface array comprising four independent metasurface units, and the polarization state of each path of optical signals is projected to sixteen polarized light spots which are spatially separated; and finally, acquiring light spot intensity information by an area array detector, and reconstructing a full-Mueller matrix image of the sample through calculation. According to the invention, full-Mueller matrix information can be obtained through single scanning, and the device has the characteristics of high resolution, compact structure, good compatibility and the like, and can be used for multi-dimensional polarization microscopic analysis of samples.

The invention discloses a high-precision sample holder and sample stage for micro-area analysis, and belongs to the field of measurement and testing, the high-precision sample holder and sample stage for micro-area analysis comprises a displacement table base mounting flange, a corrugated pipe, a differential component mounting flange, a sample rod and a customized sample stage arranged at one end of the sample rod; the displacement table base mounting flange and the differential component are respectively arranged at two ends of the sample rod; the corrugated pipe is arranged between the displacement table base mounting flange and the differential component mounting flange; a temperature control module is arranged on one side, close to the displacement table base mounting flange, of the sample rod. According to the high-precision sample holder and the four-axis displacement table for micro-area analysis, a sample can be kept stable in the analysis process, and movement in the X direction, movement in the Y direction and movement in the Z direction and angle rotation can be achieved at the same time; meanwhile, the adjustable temperature control device can adjust the temperature of the sample, so that the sample is always in a constant-temperature state, and the precision and temperature requirements of the sample during micro-area analysis test can be ensured at the same time.

Fluorescence imaging system designs are described that provide larger fields-of-view, increased spatial resolution, improved modulation transfer and image quality, higher spatial sampling frequency, faster transitions between image capture when repositioning the sample plane to capture a series of images (e.g., of different fields-of-view), and improved imaging system duty cycle, and thus enable higher throughput image acquisition and analysis for genomics and other imaging applications.

The invention discloses an X-ray diffractometer sample holder powder sample automatic preparation device, and relates to the technical field of experimental equipment, the X-ray diffractometer sample holder powder sample automatic preparation device comprises a sample table, a sample holder is arranged on the sample table, and a plurality of sample boxes are sequentially placed on the sample holder; the sample table comprises a circular positioning plate, two placement tables, two mounting frames, a feeding mechanism for conveying sample powder into the sample box, a flattening mechanism for flattening the sample powder in the sample box, and a driving mechanism for driving the sample frame to move in the length direction of the placement tables and penetrate through the circular positioning plate; according to the invention, through the uniform flattening of sample powder by the flattening mechanism and the control of the powder granularity by a screen of the feeding mechanism, the preferred orientation phenomenon of crystals in a sample due to overlarge pressure or improper method is reduced, the diffraction line broadening phenomenon is reduced, the definition of a diffraction pattern and the intensity measurement precision of a diffraction peak are improved, and the measurement accuracy of the diffraction peak is improved. The uniform distribution of the powder in each sample box is ensured, and the repeatability of experimental data is improved.

The utility model discloses a wear resistance testing device for protective gloves, which comprises a test board, a test frame and a sample frame, the test frame and the sample frame are respectively and vertically mounted on two sides of the test board, the bottom of the test frame is mounted on the test board through a first adjusting component in a front-back sliding manner, and a grinding wheel is arranged in the test frame in a lifting manner. The bottom of the sample frame is installed on the test bench in a left-right sliding mode through a second adjusting assembly, a hand mold is rotatably installed on the sample frame through a third adjusting assembly, the surface of the hand mold is covered with an air inflation film layer, and the outer side of the air inflation film layer is sleeved with a protective glove. The device has the advantages that comprehensive wear resistance detection can be carried out on all positions of the protective glove, including the finger face, the first web, the palm and the back of the hand.

The invention discloses a salt mist box, and belongs to the technical field of service performance tests of cement-based materials in a marine environment. The salt mist box comprises a box body, wherein the internal space of the box body is divided into an upper chamber and a lower chamber by a fixedly arranged sample rack; the salt mist box further comprises an ultraviolet light source located in the upper cavity and a salt water chamber located in the lower cavity and is provided with a spray tower. Wherein the sample rack is provided with a loading device, and the loading device is used for placing a sample and applying pressure to the sample. The salt mist box can simulate various environmental conditions, so that the service life and the performance change of a material can be predicted more accurately.

The invention discloses a perforated powder reverse filling device for an x-ray diffractometer, and relates to the technical field of experimental equipment. The sample table comprises a circular positioning plate, a sample frame, a flattening mechanism used for flattening sample powder in the sample box, an abutting mechanism used for sealing an opening of the sample box, and a driving mechanism used for driving the sample box to enter the abutting mechanism. Through cooperation of the pressing mechanism and the piston cylinder, the uniformity and consistency of the sample are ensured, particle distribution of the sample is more random, the influence of the preferred orientation of the sample is reduced, a more accurate diffraction pattern is obtained, multiple times of slicking is not needed, and the situation that multiple times of flattening is needed due to unevenness of powder is avoided; and the lattice of the sample powder after long-time grinding is damaged.

The utility model relates to the technical field of testing, in particular to a differential scanning calorimeter which comprises a differential scanning calorimeter, a heating assembly, a display screen and ground feet, the display screen is arranged on one side of the front face of the differential scanning calorimeter, and the ground feet are connected to the positions, close to the four corners, of the lower end of the differential scanning calorimeter. One side, far away from the display screen, of the upper end of the differential scanning calorimeter is connected with a heating assembly, and the heating assembly is composed of a heat insulation cover, a heat insulation sleeve, a handle, a first inner cover, a second inner cover, an inner furnace, an outer furnace, a heat insulation tank, a sealing ring, a heating ring, a sample holder, a soaking block, a sample box and a temperature difference sensor.

The invention discloses an automatic sample oil moisture detection system and method.The system comprises a detection module arranged on a base plate, the base plate is fixed to a workbench, the detection module comprises a moisture meter, functional parts and an operation panel, and the functional parts and the operation panel are arranged on the moisture meter; the base plate is further provided with a liquid injection device and a sample frame, the liquid injection device and the sample frame are both located on one side of the detection module, the sample frame is provided with a sample bottle, the workbench is further provided with a positioning fork, one side of the moisture meter is provided with a liquid injection port, the liquid injection port is located in the positioning fork, and the liquid injection port is located in the positioning fork. The liquid injection device is provided with a liquid injection mechanism which moves between the sample bottle and the moisture meter, and one side of the workbench is also provided with an AGV (Automatic Guided Vehicle) used for inputting and outputting a sample. Automatic operation of sample oil moisture determination is achieved, quantitative liquid injection of the sample to the moisture meter is completed, the determination process is more ordered, efficiency is high, and data consistency is good.

The invention relates to a low-temperature convergent transmission spectrum measuring device based on a Fourier transform infrared spectrometer. The device comprises a Fourier transform infrared spectrometer, a convergence angle optical system, a low-temperature optical system and a receiver. The convergence angle optical system comprises a collimating lens, a diaphragm, a convergent lens group and a reflector, and the low-temperature optical system comprises a diaphragm, a sample holder and a low-temperature thermostat. The collimating lens is used for converting divergent light emitted by the infrared spectrometer into parallel light, the aperture diaphragm is used for regulating and controlling the spot size of the parallel light, the convergent lens is used for converting the parallel light into convergent light, and after the convergent light is emitted through a sample, the emergent divergent light is converted into the parallel light. Incident parallel light is reflected into a receiver in a convergent state by using an aspheric concave reflector, and the temperature of a sample is reduced to a temperature to be measured by using a cryostat. The low-temperature convergent transmission spectrum measuring device has the characteristics of simple structure, large convergent angle regulation and control range, wide spectrum band and temperature coverage range and the like.

Various embodiments may provide a method of illuminating a sample plane. The method may include providing an illumination subsystem including a light source and at least one lens, the illumination subsystem having a raw optical axis at an angle of incidence greater than 0 DEG and less than 90 DEG to a normal to a sample plane. A reference illumination profile is generated on a sample using an illumination subsystem at a primary inclined position. The method may also include rotating the illumination subsystem about a pivot point along the original optical axis between the light source and the sample plane to a secondary inclined position having another optical axis, the illumination subsystem is located at the original optical axis such that the adjusted illumination distribution produced by the illumination subsystem at the sample plane has an improved symmetry of the intensity distribution in comparison to a reference illumination distribution produced by the illumination subsystem located at the original optical axis at the sample plane.

The invention belongs to the field of superconducting material measurement, and discloses an external field critical current test sample rod under axial strain of a superconducting tape, which comprises a mechanical transmission device, a worm vertical to a left-right rotation trapezoidal screw rod, and a worm gear connected with the middle part of the left-right rotation trapezoidal screw rod through an optical axis key; the axial strain loading platform and the nut seat are respectively screwed into a left thread part and a right thread part of the left-handed and right-handed trapezoidal screw rod, the sample holder is supported and fixed through convex parts at two sides of the nut seat, the copper current terminals are respectively fixed at two ends of a platform part of the sample holder, and the strain gauge is used for being fixed on a middle shaft in the middle of a superconducting tape to be tested; and the electric signal transmission device is electrically connected with the strain gauge. According to the invention, the left-handed and right-handed trapezoidal screw rods are driven to rotate, so that the pair of nut seats with opposite threads are linearly opened and closed, the superconducting tape to be measured on the sample holder tape welding platform is driven to generate axial strain, and the critical current of the superconducting tape under the axial strain in a background magnetic field is measured.

The application relates to a method for locating and identifying an electromagnetic interference source in a shielding box, which comprises the following steps: acquiring tangential magnetic field information of a sampling plane outside the shielding box, constructing an equivalent source model based on the tangential magnetic field information, acquiring dipole moment information of an initial equivalent electric dipole, and realizing first source reconstruction; acquiring a contribution degree evaluation index of each electric dipole based on the dipole moment information of the initial equivalent electric dipole, removing electric dipoles with low contribution degrees based on the contribution degree evaluation index, updating the equivalent source model, acquiring dipole moment information of an updated equivalent dipole, and realizing second source reconstruction; and realizing location and identification of the electromagnetic interference source in the shielding box based on the dipole moment information of the updated equivalent dipole. Compared with the prior art, the application has the advantages of improving equivalent source accuracy, being capable of accurately locating and identifying the electromagnetic interference source in the shielding box, and the like.

There is provided a microscopy device capable of (i) moving a liquid immersion objective lens to a location where liquid, such as an oil or water, can be applied to the liquid immersion objective lens, and (ii) moving the liquid immersion objective lens having liquid applied thereto to a sample holder, to be used to acquire images of a sample. The liquid application process can be automated so that the liquid on the objective lens is replenished as necessary. The device can automatically focus the lens to facilitate scanning, and can be configured to change objective lenses. Other embodiments, including using such a device in high content / high throughput scanning, are also described.

The utility model discloses a bottom solution residue prevention sample holder for vertical tellurium-cadmium-mercury liquid-phase epitaxial growth, which belongs to the field of infrared semiconductor material preparation and comprises a conical flow guide base, a micro-groove array, a SiC / SiO2 super-lyophobic functional layer and a thermal gradient regulation and control module. During working, the frame body is preheated, the melt flows back along the chamfer surface under the action of gravity during lifting, the micro-grooves generate capillary force for directional diversion, the super-lyophobic layer reduces the adhesion work, and the thermal gradient inhibits solution solidification. By applying the sample holder, the residual quantity of a melt can be greatly reduced, the defect density of an epitaxial layer is reduced, the available area is increased to more than 95%, and the problem of millimeter-scale particle residue in the traditional LPE growth is solved.

The application discloses a kind of hollow mask electrode deposition sample holder and method, including connecting tray, movable sample table and mask plate clamp;The bottom of slide rail connector is slidably connected with X linear slide rail in X direction, and the top of slide rail connector is slidably connected with the bottom of sample table in Y direction;Slide rail connector is provided with X through screw hole, and the threaded one end of X adjusting screw rod is installed in the X through screw hole of slide rail connector, and the other end is arranged in X clamping device;Sample table is provided with Y through screw hole, and the threaded one end of Y adjusting screw rod is installed in the Y through screw hole of sample table, and the other end is arranged in Y clamping device;Mask plate clamp fixing stud is higher than sample table, and mask plate clamp is connected with the top of mask plate clamp fixing stud.Carry out the precision requirement when using photolithography process to transfer single-crystal island two-dimensional material and grow single-crystal island two-dimensional material deposition electrode.

The application discloses an X-ray diffractometer high-temperature in-situ detection device, a base lifting assembly is installed on the diffractometer, a tank body assembly rear end is connected with a lifting pad in the base lifting assembly, and a tank body assembly front end is connected with an upper cover in a tank body cover assembly; a heat preservation cavity assembly is arranged in the tank body assembly; a heating chamber assembly is arranged in the heat preservation cavity assembly, and a connecting pipe at a tail of the heating chamber assembly is connected with a gas distribution connector in the tank body cover assembly; sample entering holes for sample passing are arranged at lower ends of the tank body assembly and the heat preservation cavity assembly; the tank body and the tank body cover are provided with cooling water channels; a sample holder assembly is fixed at the tank body assembly lower end, and a measured sample is placed in a sample holder in the sample holder assembly and is sent into the heating chamber assembly; the application has novel structure, stable performance and convenient use, and greatly improves the temperature range of the heating chamber. Since the heat preservation cavity is in a sealed form, the heating speed is fast, and heat preservation is long-lasting.

The utility model provides an automatic vertical wicking height tester, which is used for measuring the water absorption capacity of a fabric, and comprises a sample holder, a carrying mechanism, a test water tank and an industrial camera, the provided automatic vertical wicking height tester is in sliding connection with the sample holder through the carrying mechanism; the fabric sample can be automatically driven to move between the sample rack and the test water tank. Therefore, the fabric sample does not need to be manually placed or taken down, the operation is automatically completed by the carrying mechanism, and the industrial camera accurately records and analyzes the water absorption condition of the fabric sample, so that errors possibly caused by manual observation and classification are avoided, manual intervention is remarkably reduced, and the automation level of testing is improved.

The utility model belongs to the field of atomic force microscopes, and particularly relates to a modular atomic force microscope, which solves the problem that a sample holder of a traditional atomic force microscope in the prior art needs to fix a sample manually and is inconvenient to operate, and comprises a base, and a laser transmitter module and a reflector are mounted on the upper surface of the base. An optical microscope module, a CCD camera module and a monitor module are installed on the right side of the upper surface of the base, a fixing module is arranged in the middle of the upper surface of the base and comprises a cavity formed in the base, a servo motor is fixedly connected to the back face of the base, and an output rotating shaft of the servo motor penetrates through the base and extends into the base. An output rotating shaft of the servo motor is fixedly connected with a positive and negative threaded rod, two threaded surfaces of the positive and negative threaded rod are in threaded connection with threaded rings, and the outer surface of each threaded ring is fixedly connected with two movable plates, so that a sample can be automatically fixed on the whole, and the whole device has a relatively good fixing effect.