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606 results about "Microscopy" patented technology

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.

Microscopic automatic focusing method and system based on image gray histogram features

The invention provides a microscopic automatic focusing method and system based on image gray histogram characteristics, and the method comprises the steps: collecting an image sequence under different focal lengths, carrying out the fuzzy processing, extracting a gray histogram of each frame of image, and calculating the peak position and full width at half maximum of the histogram as the evaluation characteristics of the image definition; calculating the variance of each feature and automatically allocating a weight according to the relative response degree; and finally, comprehensively evaluating the image definition through a weighted definition scoring function, and selecting the focal length corresponding to the image with the optimal score as the optimal focusing position. The method is based on the global features of the gray histogram, is high in anti-noise capability, is adaptive to different imaging scenes through weight adaptive adjustment, is low in calculation complexity, supports real-time focusing, is especially suitable for high-noise fluorescence microscopic imaging scenes, is high in system portability, is low in operation threshold, and effectively improves the accuracy and stability of microscopic automatic focusing.
Owner:SHANGHAI JIAOTONG UNIV

Reticulocyte recognition and grading system based on blood smear

The invention discloses a reticulocyte recognition and grading system based on a blood smear, and particularly relates to the field of medical cell morphology examination, and the system comprises an image acquisition module, a staining normalization module, an instance segmentation module, an erythrocyte classification module, a reticulocyte grading module and a statistics output module. The image acquisition module adopts an automatic microscope platform to continuously scan the blood smear under a 100-time visual field, acquires a high-quality bright field channel image through an automatic focusing technology, and monitors image definition, contrast and illumination uniformity; the statistical output module is used for calculating the proportion and bluish violet intensity statistics of reticulocytes of each level, and generating a visual quality control result and a diagnostic report; according to the invention, full-automatic processing from samples to reports is realized, interpretability and high classification precision are both considered, subjective difference and omission ratio of manual microscopic examination are significantly reduced, and efficiency and consistency of clinical detection are improved.
Owner:RUIJIN HOSPITAL AFFILIATED TO SHANGHAI JIAO TONG UNIV SCHOOL OF MEDICINE

Rock ore microscopic image splicing method and system based on deep learning

The invention discloses a rock and ore microscopic image splicing method and system based on deep learning, and relates to the field of image processing and the technical field of microscopes, and the method comprises the steps: obtaining a local rock and ore microscopic image of a rock and ore slice, carrying out the preprocessing of the local rock and ore microscopic image, and carrying out the overlapping region coarse registration of the preprocessed local rock and ore microscopic image through a phase correlation method; based on an improved image feature detection model, basic features and description features in the local rock and ore microscopic image after coarse registration are extracted, and local image features of the local rock and ore microscopic image are obtained; performing feature matching on the local image features of the two groups of local rock and mineral microscopic images by using an image feature matching model to obtain a matching corresponding relation of the local image features; and based on an image fusion algorithm of a homography matrix and a partial differential equation, splicing and optimizing the local rock and ore microscopic images in combination with a matching corresponding relation of local image features, and generating a large-view-field rock and ore microscopic image. According to the method, the complex transformation between the images can be better processed.
Owner:HEBEI INSTITUTE OF ARCHITECTURE AND CIVIL ENGINEERING

Mixing parameter regulation and control method, system and terminal for SBS-T modified asphalt mixture

PendingCN121266435ADigital technique networkTransportation and packagingAtomic force microscopyDynamic shear rheometer
The invention discloses a mixing parameter regulation and control method and system for an SBS-T modified asphalt mixture and a terminal. The method comprises the following steps: analyzing a modification mechanism through a scanning electron microscope and X-ray photoelectron spectroscopy combined technology, dividing three stages of rapid melting and the like, and establishing a temperature-viscosity model; constructing a multi-scale capture system by using an atomic force microscope, a Fourier transform infrared spectrum and a dynamic shear rheometer; designing a five-factor three-level test matrix by adopting a response surface method, and establishing a road performance prediction model in combination with a BP neural network; mixing parameters are optimized in a multi-objective mode based on a genetic algorithm, and dynamic correction is achieved through an Internet of Things sensor and Kalman filtering. The system comprises a mechanism analysis module, a multi-scale detection module, a terminal integrated storage unit, a processing unit and a man-machine interaction unit. According to the scheme, the limitation of traditional single-factor analysis is broken through, microscopic and macroscopic collaborative optimization and dynamic parameter regulation and control are achieved, and the construction adaptability and precision are improved.
Owner:SHANDONG DATONG HIGHWAY ENG CO LTD

Deep learning-based super-resolution fluorescence lifetime imaging microscopy method

A deep learning-based super-resolution fluorescence lifetime imaging microscopy (SR-FLIM) method includes the steps of: S1, performing fluorescence microscopic imaging on a sample to obtain confocal intensity images and stimulated emission depletion (STED) intensity images at a same location; S2, co-registering the acquired confocal and STED intensity images; S3, pairing the co-registered confocal and STED intensity images as input (Input) and ground truth (GT) to assemble a dataset; S4, partitioning the dataset into training and validation sets following a predefined ratio; and S5, constructing a network, and selecting hyperparameters and an optimizer. This method may achieve SR-FLIM within a conventional confocal FLIM system, surpassing spatial resolution limitations of FLIM, breaking through resolution barriers of conventional optical microscopy, while preserving normal fluorescence lifetime characteristics of fluorescent probes.
Owner:SHENZHEN UNIV

Shear responsive colloidal cellulose composition

PCT designated stageWO2026022302A1Non-newtonian sol preparationSol preparationCelluloseMicroparticle
The present invention relates to a colloidal composition comprising unmodified, discrete cellulose microparticles, such as a colloidal emulsion or colloidal gel, a method of preparing the colloidal composition and uses of the colloidal composition and cellulose particles The colloidal composition comprises a continuous phase and a dispersed phase, wherein the continuous phase is a liquid; wherein the dispersed phase comprises cellulose microparticles which are dispersed in the continuous phase of the colloidal composition, wherein the cellulose microparticles have a mean average particle length of from 0.1 to 20 µm a mean average particle width from 0.05 to 1.3 µm, and a maximum thickness not exceeding 0.2 µm determined by scanning electron microscopy; and an aspect ratio of length / width of 1 to 25, and wherein the colloidal composition has a flow index n of ≤ 1 determined by a rheometer at NTP (normal temperature (25°C) and pressure (1 atm)).
Owner:SEPRIFY AG

Conductive silver paste for solar cell and application thereof

The invention discloses conductive silver paste for a solar cell and application of the conductive silver paste, and belongs to the technical field of conductive silver paste. According to the invention, the prepared silver paste is printed on a silicon wafer cell in a silk-screen printing manner, so that the good rheological property of printing can be obtained. And a rheometer is introduced for testing, and an SEM scanning electron microscope is introduced for checking the surface appearance of the silver grid line. The invention discloses a TOPCon silicon wafer for a silicon solar cell, which comprises the following components in percentage by weight: 82-90% of silver powder, 20-30% of glass powder and 20-30% of organic carrier. 2-5% of glass powder; and 8-13% of an organic carrier. The conductive silver paste with good rheological property is prepared by using a mixture of polyamide wax and hydrogenated castor oil in a mass ratio of 1: 1 as a thixotropic agent. The main grid silver paste for the silicon solar cell provided by the invention can be well matched with step-by-step printing of a cell piece, different proportions of the binder and the thixotropic agent are used, the photoelectric conversion efficiency is high, the peeling strength of the main grid is high, and the step-by-step printing main grid paste requirements of current different types of paste and cell pieces can be well met.
Owner:KUNMING UNIV OF SCI & TECH +1

Prediction and evaluation method for multi-axial fatigue life of additive manufacturing K418B high-temperature alloy

The invention relates to a method for predicting and evaluating the multi-axial fatigue life of an additive manufacturing K418B nickel-based superalloy. Comprising the following steps: S1, carrying out intrinsic characteristic characterization on a material, including mechanical property test and defect statistical analysis based on industrial CT and a scanning electron microscope; s2, carrying out single-axis, multi-axis and notch fatigue tests of the system, and analyzing the association between the microstructure and the fatigue life; s3, based on a fracture mechanics theory, correcting the traditional model by taking the equivalent crack propagation driving force delta KDF as a special parameter, and constructing a multi-axial fatigue life prediction model; s4, determining a calculation method of an equivalent stress strength factor Keq optimized by adopting a weight coefficient through a multi-axial fatigue test, and establishing a notched part service life prediction model considering crack propagation driving force; and S5, performing fatigue test verification by designing and manufacturing a simulation piece, and verifying the accuracy and reliability of the multi-axial fatigue life prediction model. According to the method, the prediction precision and the engineering applicability of the fatigue life of the additive manufacturing K418B alloy under the high-temperature multi-axial load are remarkably improved.
Owner:HUNAN UNIV

Microscope lens for ultra-long working distance

The invention relates to the technical field of optical elements, in particular to a microscope lens for an ultra-long working distance. The microscope lens comprises a lens cone, and a first lens group, a diaphragm and a second lens group which are coaxially arranged in the lens cone. The first lens group is used for collecting and pre-collimating incident light, the diaphragm is used for limiting the angle and light flux of incident light entering the second lens group, and the second lens group is used for performing residual aberration correction on light passing through the first lens group and the diaphragm; the first lens group comprises six lenses which are a first lens, a second lens, a third lens, a fourth lens, a fifth lens and a sixth lens in sequence from the object side to the image side; the lens II is an asymmetric biconvex positive lens; the lenses 3 to 6 are meniscus lenses; the second lens group comprises two lenses which are a seventh lens and an eighth lens in sequence from the object side to the image side, and the seventh lens and the eighth lens are both biconcave lenses. According to the microscope lens provided by the invention, high-quality imaging of the lens is also realized on the premise of realizing super-long working distance (600mm) microscopy.
Owner:UNITED OPTICAL TECH (CHONGQING) PRECISION TECH CO LTD

Shale rock slice analysis and identification method based on combination of light microscope and field emission electron microscope

The invention relates to the technical field of material analysis, in particular to a light microscope-field emission electron microscope combined shale rock slice analysis and identification method, which comprises the following steps of: firstly, combining a brightness distribution condition represented by a bright field image of a shale rock slice and a birefringence deviation condition represented by a cross polarization image from an optical angle; determining a mineral discrimination index representing an atomic number agent; applying offsets of different sizes based on the distribution condition of mineral discrimination indexes and the surface fluctuation condition of shale rock slices, and determining a position offset vector by combining gray scale gradient distribution on the basis; and finally, determining the cross-scale positioning and more accurate electron microscope objective table coordinates corresponding to each pixel point in combination with a position offset vector in a pixel coordinate conversion process based on an image physical distance scale and rotation translation processing, so that the cross-scale positioning accuracy of the optical microscope and the field emission scanning electron microscope is higher. The reliability of analyzing and identifying the shale rock slice is obviously improved.
Owner:DAQING OILFIELD CO LTD +1

Reducing image artefacts in electron microscopy

In a method, for training an artificial neural network (ANN) to reduce noise and / or artefacts in an electron microscopy image, a plurality of training image pairs is generated. For each pair, an undistorted synthetic specimen image and a distorted image are created by simulating additional noise and / or artefact features. The ANN is trained, in which the distorted images are used as input and the corresponding undistorted images as output. An adversarial training strategy is used in which the ANN is trained, as a generator network, in conjunction with concomitantly training a further ANN, as a discriminator network, to differentiate output produced by the generator network from synthetic images in the training set. In training, parameters of the ANN and further ANN are optimized using a generator loss function and a discriminator loss function, in which a dependency exists between said loss functions to train the networks in an adversarial manner.
Owner:UNIVERSITEIT ANTWERPEN

Design method of high-performance grouting material accurately matched with physical property structure of soft coal rock

The invention discloses a design method of a high-performance grouting material accurately matched with a soft coal rock physical property structure, and relates to the technical field of geotechnical engineering grouting. According to the method, mineral components, permeability, fracture distribution, strength, wettability and hydrological characteristics of soft coal rock are analyzed through multi-dimensional tests such as X-ray diffraction and a scanning electron microscope, and a quantitative mapping relation between physical property parameters and grouting material performance is established; constructing a grouting reinforcement material database comprising a material sub-library, a performance sub-library and a case sub-library, and introducing a generative adversarial network to dynamically update the fracture model; an orthogonal test and a machine learning algorithm are adopted to carry out multi-objective ratio optimization, and precise matching of grouting material performance and engineering geological conditions is realized in combination with field adaptability index closed-loop verification. According to the method, the grout groutability and the surrounding rock deformation control effect can be remarkably improved, the technical problems that a traditional grouting material depends on experience, and a database is static and low in efficiency are solved, and an intelligent solution is provided for complex soft coal rock engineering reinforcement.
Owner:CHINA UNIV OF MINING & TECH

A hydrogen damage rapid evaluation method for super-long service life structure under alternating load

This invention discloses a rapid assessment method for hydrogen damage in ultra-long-life structures under alternating loads, relating to the field of materials performance evaluation. The method includes the following steps: S1: Analyzing the service conditions of typical ultra-long-life structures and key components to determine the service environment of key component materials; S2: Conducting ultra-high cycle fatigue tests under different stress ratios to obtain stress-life data for different lifespans; S3: Observing the fracture morphology of high-cycle fatigue and ultra-high cycle fatigue samples using scanning electron microscopy; S4: Performing hydrogen element detection to obtain the hydrogen content distribution around micro-defects; S5: Using the Basquin formula, piecewise linearly fitting the S-N data for the high-cycle fatigue and ultra-high cycle fatigue stages to obtain the slopes of two fitted lines; S6: Using the ratio of the slopes of the two fitted lines as the hydrogen damage factor. The method disclosed in this invention can achieve rapid assessment of hydrogen damage in long-life structures under alternating loads while ensuring the reliability of the assessment results.
Owner:EAST CHINA UNIV OF SCI & TECH

Phase diversity-based wavefront sensing for fluorescence microscopy

A light beam is imaged within a sample and images of the sample are generated based on light received from the sample in response to the light imaged within the sample. A wavefront modulating element modifies a wavefront of the received light and / or a wavefront of the light imaged within the sample. One or more known aberrations are introduced into at least one image of the sample and, based on at least two images of the sample, where the images include a raw image and at least one image that includes a known aberration, an aberration of a wavefront of light emitted from, and / or provided to, the sample is estimated. The wavefront modulating element is controlled to modulate the wavefront of light emitted from, and / or provided to, the sample, such that the estimated aberration of the wavefront of light emitted from, and / or provided to, the sample is reduced.
Owner:UNIVERSITY OF CHICAGO +2

Scintillator defect correction in x-ray microscopes

A method and system for correcting detector defects in an X-ray microscope system based on deep learning. Normal geometry projections and offset geometry projections are collected for a given detector, mappings between defective regions and healthy regions are created, and a machine learning system is trained using these projections. The trained neural network system is then used to correct the tomographic projection dataset, thereby improving the image quality of the resulting reconstructed tomographic image volume set.
Owner:CARL ZEISS GMBH

Multi-mode nanometer measurement system and method based on terahertz scattering type scanning near-field optical microscopy and multi-frequency electrostatic force microscopy

The invention discloses a multi-mode nanometer measurement system and method based on terahertz scattering type scanning near-field optical microscopy and multi-frequency electrostatic force microscopy, and belongs to the technical field of near-field imaging, the measurement system comprises an AFM main body, a terahertz source, an optical path system, a terahertz detector, a multi-frequency signal generator and two phase-locked amplifiers; terahertz waves emitted by the terahertz source reach the terahertz detector through the optical path system, and near-field optical signals are obtained. The AFM comprises a metal coating probe; the multi-frequency signal generator generates sinusoidal signals with frequencies of omega1 and omega2; a sample is placed on the scanner, and the cantilever beam is controlled to vibrate at the frequency omega 1; an alternating voltage with the frequency of omega 2 is applied to a metal coating probe arranged at the top end of the cantilever beam; laser emitted by the laser is reflected to the light spot position detector through the cantilever beam, and morphology and electrostatic force signals are obtained through the two lock-in amplifiers respectively. According to the invention, a morphology signal, an optical signal and an electrostatic force signal can be synchronously obtained through single scanning.
Owner:INST OF ENERGY HEFEI COMPREHENSIVE NAT SCI CENT (ANHUI ENERGY LAB)

A mirror defect three-dimensional detection method and system combining bright field and dark field imaging

This invention belongs to the field of optical precision testing technology, and provides a method and system for three-dimensional detection of mirror defects using combined bright-field and dark-field imaging. The method includes: rapidly scanning the surface of the component under test using a bright-field imaging system; identifying defects and obtaining their location coordinates using a rapid defect detection algorithm; based on the defect location coordinates, switching to a dark-field microscopy system to image the defect area and acquiring both in-focus and out-of-focus images; performing a second precise determination of the defect; and calculating the length and width parameters of the defect using a precise measurement algorithm; reconstructing the three-dimensional morphology of the defect using the in-focus and out-of-focus images combined with a phase retrieval algorithm based on the light intensity transmission equation, thereby completing the three-dimensional measurement of the mirror defect. This invention enables rapid and accurate three-dimensional measurement of defects.
Owner:CHINA PRECISION ENG INST FOR AIRCRAFT IND AVIC +1

A dual-gel system suitable for large-volume biological tissue expansion micro-ablation

PendingCN122306769AFluorescenceTissue sample
This application belongs to the field of fluorescence microscopy imaging, and more specifically, relates to a dual-gel system suitable for dilatational microscopy of large-volume biological tissues. This dual-gel system achieves uniform expansion and morphological stability of tissue samples through a dilatational gel, and then imparts high mechanical strength using a stabilizing gel. This allows millimeter-scale large-volume biological tissue samples to possess both high expansion ratio and excellent mechanical stability, achieving 3-5 times linear expansion with a Young's modulus of not less than 300 kPa. It can stably adapt to vibrational cutting operations and support cutting of 100-500 μm thick layers, with intact cut surfaces and good interlayer consistency, greatly improving the efficiency and quality of three-dimensional data acquisition. Furthermore, the hydrogel sections obtained from the cutting have intact morphology and can be used as independent slides for multidimensional analysis. This application overcomes the limitations of traditional dilatational microscopy techniques in terms of sample volume and mechanical stability, providing an efficient and reliable solution for the three-dimensional reconstruction of millimeter-scale biological tissues.
Owner:HUAZHONG UNIV OF SCI & TECH

Microscopic imaging system and focusing method thereof

The invention provides a microscopic imaging system and a focusing method thereof, the microscopic imaging system comprises two imaging channels, and each imaging channel is provided with a first light source, a relay assembly, an objective lens and a first imaging module; the first light source is used for generating first light signals; the relay assembly is used for projecting the first optical signal to the objective lens; the objective lens is arranged between the relay assembly and the sample and used for converging the first optical signal to the sample and projecting the first optical signal reflected by the sample to the first imaging module along the relay assembly; the first imaging module is used for imaging the first optical signal; in the two groups of imaging channels, one group of objective lenses converge the first optical signals on the front surface of the sample, and the other group of objective lenses converge the first optical signals on the back surface of the sample; the microscopic imaging system provided by the invention meets the acquisition of different surface image signals of the sample, and meanwhile, the focusing operation of the objective lens and the sample in the microscopic imaging system can be conveniently realized by utilizing the focusing method provided by the invention.
Owner:BEIJING ZHAOWEI XINYUAN COMM TECH

Super-resolution microscopic imaging method and system based on fluorescence wavelength optimization

The invention discloses a super-resolution microscopic imaging method and system based on fluorescence wavelength optimization, and relates to the technical field of super-resolution microscopy, and the method comprises the steps: obtaining the position of a fluorescent molecule in a to-be-generated super-resolution image, an emission wavelength and a corresponding original image, and generating a point spread function; generating a current measurement matrix based on the point spread function; obtaining a current correlation absolute maximum value based on the current measurement matrix; updating the emission wavelength, returning to the step of generating the point spread function, and carrying out iteration to obtain a corresponding current related absolute maximum value; circulating the iteration process until the requirements are met, obtaining a plurality of emission wavelengths and corresponding current related absolute maximum values, and drawing a performance curve; taking the emission wavelength corresponding to the valley bottom of the performance curve as the optimal wavelength, and taking the current measurement matrix corresponding to the optimal wavelength as the optimal measurement matrix; and generating a super-resolution image based on the optimal measurement matrix and the original image. And the generation quality and the signal-to-noise ratio of the super-resolution image are improved.
Owner:GUANGXI NORMAL UNIV OF SCI & TECH

Large language model assistance for charged-particle microscope operation

Systems / techniques are provided for facilitating large language model assistance for charged-particle microscope operation. In various embodiments, a system can access a natural language instruction associated with a charged-particle microscope, where the natural language instruction can request that the charged-particle microscope undergo a configurable settings adjustment or perform an automated task. In various aspects, the system can cause, in response to the natural language instruction, the charged-particle microscope to capture, according to a default microscopy protocol, an image or an energy spectrum of a specimen that is currently loaded on a stage of the charged-particle microscope. In various instances, the system can execute a large language model on both the natural language instruction and the image or energy spectrum of the specimen, thereby yielding a natural language response that indicates how implementing the natural language instruction would affect the specimen.
Owner:FEI CO

Multi-functional optical imaging system

This invention discloses a multi-functional optical microscopy imaging system that integrates multiple imaging techniques, including fluorescence lifetime imaging, bright-field microscopy, Raman microscopy, and one sample manipulation technique, optical tweezers, in a single microscope setup. This allows for the acquisition of structural, functional, and molecular information from the sample with simultaneous sample manipulation function. Various design approaches have been outlined for a multi-modality microscopy by segmenting the entire operational wavelength range of an objective lens into separate spectral channels, each dedicated to a specific optical technique.
Owner:JIANG JAMES +1

Light sheet microscopy and methods for light sheet microscopy

PendingCN122331099AOptical axisLighting system
A light-sheet microscope includes an illumination system configured to generate a light sheet. The light-sheet microscope also includes an optical system having an objective lens and a detector element. The optical system is configured to illuminate an illumination plane in a sample space via the objective lens using the light sheet, the illumination plane being tilted relative to the optical axis of the objective lens. The optical system is further configured to generate an image of a detection plane in the sample space via the objective lens using the detector element, the detection plane being tilted relative to the optical axis of the objective lens. The objective lens has a correction element configured to be adjustable for correcting aberrations. The light-sheet microscope further includes: a first adjustment unit configured to adjust the position of the illumination plane relative to a sample disposed in the sample space; a second adjustment unit configured to adjust the position of the detection plane relative to the sample; and a controller configured to control the first adjustment unit and / or the second adjustment unit to align the illumination plane with the detection plane based on the current setting of the correction element.
Owner:LEICA MICROSYSTEMS CMS GMBH

A high-density fluorescence fluctuation super-resolution microscopic imaging calculation method

PendingCN122330064AMicro imagingFluorescence
This invention belongs to the field of fluorescence microscopy imaging technology, specifically a calculation method for high-density fluorescence fluctuation super-resolution microscopy imaging. This method dynamically controls the activation-quenching cycle of reversible fluorescent molecules through alternating sequential irradiation with activation and excitation light, effectively reducing the density of fluorescent molecules by combining activation light control and image differential processing techniques. Specifically, it includes: optimizing light control parameters such as frame rate, activation light power and exposure time, and excitation light power and exposure time; using an inter-frame difference algorithm to reduce the effective fluorescence density; and employing the SOFI algorithm for high-order cumulant calculation to achieve super-resolution reconstruction. Compared to existing technologies, this invention eliminates the need for complex multicolor labeling, significantly improves imaging resolution through a light control-differential synergistic strategy, and is compatible with various microscopy systems such as wide-field and confocal microscopy, providing an efficient and reliable technical solution for live-cell super-resolution observation.
Owner:FUDAN UNIVERSITY

A method for identifying the origin of quartz based on scanning electron microscopy multimodal signal fusion

ActiveCN121740927BImprove work efficiencyThe whole process analysis time is shortenedMaterial analysis using wave/particle radiationMaterial analysis by optical meansQuartzCathodoluminescence
This invention discloses a method for identifying the origin of quartz based on multimodal signal fusion using scanning electron microscopy (SEM). It utilizes only one SEM equipped with an energy dispersive spectroscopy (EDS) probe, a cathodoluminescence (CAT) probe, and a backscattered electron diffraction (BSE) probe. By comprehensively employing multiple indicators, including the coefficient of variation of CL band width (a), the Al-Ti influence coefficient (b), the lattice orientation difference influence coefficient (c), and the relative gravity coefficient of inclusion type (d), the method determines whether a quartz sample is of hydrothermal or metamorphic origin. This invention achieves rapid and accurate identification of the origin of quartz.
Owner:INST OF MINERAL RESOURCES CHINESE ACAD OF GEOLOGICAL SCI

Method for measuring thickness of a layer of a metal compound by scanning electron microscopy

The application relates to a scanning electron microscope measurement method for the thickness of a metal compound layer, which comprises the following steps: obtaining a cross section containing the compound layer by wire cutting, and polishing after inlaying; observing under a scanning electron microscope, selecting a copper-tin alloy compound layer to be measured, selecting a backscattering electron probe to obtain a composition contrast image, adjusting the image contrast so that the measured object and the matrix have obvious differences; selecting a magnification of 2500 times matching the thickness of the metal compound layer, obtaining a high-definition backscattering electron image at a scanning speed of 28 seconds / frame; and quantitatively and finely measuring the thickness of the metal compound layer by using ImageJ software. The advantages of the application are as follows: the metal compound layer is extracted by using the ImageJ image processing software, the area is calculated to obtain the average thickness of the film thickness measurement method, not only the accurate alloy layer thickness information is obtained, but also the standard deviation value of the measured object is obtained to evaluate the uniformity of the measured object; the measurement method improves the accuracy and can be applied to detection and analysis practices.
Owner:ANGANG STEEL CO LTD

Powder sample preparation device for scanning electron microscope

The utility model discloses a powder sample preparation device for a scanning electron microscope, which comprises a sample seat, a conductive adhesive tape and a plurality of sample preparation tables, and a sample preparation groove with an opening on the upper surface is arranged on the sample seat; the conductive adhesive tape is adhered to the groove bottom of the sample preparation groove; the sample preparation tables are sequentially placed in the sample preparation groove and are all located above the conductive adhesive tape, so that the interior of the sample preparation groove is divided into a plurality of sample preparation sections, and different powder samples are bonded to the conductive adhesive tape in each sample preparation section. The sample preparation device has the beneficial effects that a plurality of samples can be prepared on one sample seat at the same time, the sample preparation efficiency is improved, the mutual pollution among different powder samples can be avoided, and the reliability and the accuracy of a test result are ensured.
Owner:FUAN QINGMEI ENERGY MATERIALS CO LTD

Methods and apparatus for a mechanical testing system to characterize the heterogeneous deformation at microscale

A method, apparatus, and software for an in-situ mechanical testing system to characterize heterogeneous deformation at microscale are disclosed. The current intellectual property landscape shows the in-situ mechanical testing of metals and alloys is severely limited to a maximum of about 1% macroscopic strain due to the optical microscopy's low depth of focus. To address this challenge, we disclose a smart imaging system consisting of several novel techniques. The techniques include digitally enhanced effective depth of field, real-time targeting and maintaining of a region of interest to image within the field of view and focus, and a panoramic imaging method to digitally widen the field of view. We also disclose a deformation quantification subsystem to analyze the collected data and quantify deformation characteristics. Finally, an expert system to extract the influence of microstructural features on the elastic-plastic and fracture properties is also disclosed.
Owner:CLARKSON UNIVERSITY

Method for detecting and spectrally imaging microparticles, and associated system

The invention relates to a method for spatial tracking and spectral imaging of microparticles (202) in a sample (200).This method comprises the following steps: A) illumination of the sample by an annular illumination cone (124) from a light beam partially reflected by an annular mirror (13) and focused by a peripheral region (142) of a dark-field microscope objective (14), B) recording of a dark-field microscopy image, this being collected by a central region (144) of the objective, C) identification of the points of interest in the image, D) extraction of the coordinates of the points of interest, in order to form a list of points, E) movement of the sample, so as to scan one of the extracted points, F) illumination of the point on the sample using a laser beam transmitted through the annular mirror and focused by the central region of the dark-field microscope objective, G) collection by the central region of the objective of an emitted Raman spectrum. The invention also relates to an associated system. Figure for the abstract: Fig. 1.
Owner:HORIBA FRANCE SAS