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2827results about "Stability-of-path spectrometers" patented technology
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Apparatus for generating a plurality of beamlets
ActiveUS7129502B2Reduce blurThermometer detailsStability-of-path spectrometersMolecular physicsCharged particle beam
The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
Owner:ASML NETHERLANDS BV
Programmable radio frequency waveform generator for a synchrocyclotron
ActiveUS7402963B2Stability-of-path spectrometersBeam/ray focussing/reflecting arrangementsCapacitanceRadio frequency
Owner:MEVION MEDICAL SYST
Micromachined field asymmetric ion mobility filter and detection system
InactiveUS6495823B1High resolutionQuick checkStability-of-path spectrometersTime-of-flight spectrometersNon symmetricAsymmetry
A micromechanical field asymmetric ion mobility filter for a detection system includes a pair of spaced substrates defining between them a flow path between a sample inlet and an outlet; an ion filter disposed in the path and including a pair of spaced filter electrodes, one electrode associated with each substrate; and an electrical controller for applying a bias voltage and an asymmetric periodic voltage across the ion filter electrodes for controlling the paths of ions through the filter.
Owner:CHARLES STARK DRAPER LABORATORY
Apparatus for detecting chemical substances and method therefor
ActiveUS20050061964A1High detection sensitivityPrevent false detectionStability-of-path spectrometersAnalysis using chemical indicatorsNon detectionData treatment
An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided. An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5. A data processor 6 determines the detection or non-detection of a specific m / z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m / z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m / z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded. False detection can be prevented.
Owner:HITACHI LTD
Objective lens with deflector plates immersed in electrostatic lens field
InactiveUS8698093B1Stability-of-path spectrometersBeam/ray focussing/reflecting arrangementsMagnetic polesPole piece
One embodiment relates to an objective lens utilizing magnetic and electrostatic fields which is configured to focus a primary electron beam onto a surface of a target substrate. The objective lens includes a magnetic pole piece and an electrostatic deflector configured within the pole piece. An electrostatic lens field is determined by the pole piece and the electrostatic deflector, and the electrostatic lens field is configured by adjusting offset voltages applied to plates of the electrostatic deflector. Other embodiments, aspects and features are also disclosed.
Owner:KLA TENCOR TECH CORP
Device and method for regulating intensity of beam extracted from a particle accelerator
InactiveUS6873123B2Thermometer detailsStability-of-path spectrometersParticle acceleratorAccelerated particle
The invention concerns a device (10) for regulating the intensity of a beam extracted from a particle accelerator, such as a cyclotron, used for example for protontherapy, said particles being generated from an ion source. The invention is characterized in that it comprises at least: a comparator (90) determining a difference ε between a digital signal IR representing the intensity of the beam measured at the output of the accelerator and a setpoint value IC of the beam intensity: a Smith predictor (80) which determines on the basis of the difference ε, a correct value of the intensity of the beam IP; an inverted correspondence table (40) supplying, on the basis of the corrected value of the intensity of the beam IP, a setpoint value IA for supply arc current from the ion source (20).
Owner:ION BEAM APPL
Charged particle therapy system, range modulation wheel device, and method of installing range modulation wheel device
InactiveUS7053389B2Increase the number ofShort timeStability-of-path spectrometersDiagnosticsIrradiationPatient treatment
The invention provides a charged particle therapy system capable of increasing the number of patients treated. An irradiation filed forming apparatus for irradiating a charged particle beam extracted from a charged particle beam generator to an irradiation target includes an RMW device. The RMW device comprises a housing and an RMW disposed within the housing. A rotary shaft of the RMW is rotatably mounted to the housing. The RMW device is detachably installed in an RMW holding member provided in a casing of the irradiation filed forming apparatus. The housing can be placed in contact with the RMW holding member, and hence positioning of the rotary shaft of the RMW to a predetermined position can be performed in a short time. This contributes to cutting a time required for treatment per patient and increasing the number of patients treated.
Owner:HITACHI LTD
Longitudinal field driven field asymmetric ion mobility filter and detection system
InactiveUS6512224B1Improve accuracyHigh resolutionStability-of-path spectrometersTime-of-flight spectrometersNon symmetricIon-mobility spectrometry
An asymmetric field ion mobility spectrometer with an ionization source for ionizing a sample media and creating ions. An ion filter is disposed in the analytical gap downstream from the ionization source for creating an asymmetric electric field to filter the ions. An ion flow generator for creating an electric field in a direction transverse to the asymmetric electric field and which propels the ions through the asymmetric electric field towards a detector.
Owner:CHARLES STARK DRAPER LABORATORY
System for the Delivery of Proton Therapy
InactiveUS20080023644A1Improve consistencyIncrease rangeThermometer detailsStability-of-path spectrometersProtonIntensity modulation
A process for an intensity-modulated proton therapy of a predetermined volume within an object includes discretising the predetermined volume into a number of iso-energy layers each corresponding to a determined energy of the proton beam. A final target dose distribution is determined for each iso-energy layer. The final target dose distribution or at least a predetermined part of this final target dose distribution is applied by parallel beam scanning by controlling the respective beam sweepers, thereby scanning one iso-energy layer after the other using an intensity-modulated proton beam while scanning a predetermined iso-energy layer.
Owner:PAUL SCHERRER INSTITUT
Particle beam processing system
InactiveUS6838676B1Decreased beam sizeLow costStability-of-path spectrometersMaterial analysis by optical meansParticle beamParticle physics
A method for slowing and controlling a beam of charged particles includes the steps of superimposing at least one magnetic field on a mass and passing the beam through the mass and at least one magnetic field such that the beam and the mass slows but does not stop the particles. An apparatus for slowing and controlling a beam of charged particles includes a bending magnetic field superimposed on a focusing magnetic field within a mass.
Owner:HBAR TECH LC
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
ActiveUS7244949B2High accuracy of focusingMaintain propertiesStability-of-path spectrometersSemiconductor/solid-state device testing/measurementSecondary electronsAtomic physics
An electron-optical arrangement provides a primary beam path for a beam of primary electrons and a secondary beam path for secondary electrons. The electron-optical arrangement includes a magnet arrangement having first, second and third magnetic field regions. The first magnetic field region is traversed by the primary beam path and the secondary beam path. The second magnetic field region is arranged in the primary beam path upstream of the first magnetic field region and is not traversed by the secondary beam path. The first and second magnetic field regions deflect the primary beam path in substantially opposite directions. The third magnetic field region is arranged in the secondary beam path downstream of the first magnetic field region and is not traversed by the first beam path. The first and third magnetic field regions deflect the secondary beam path in a substantially same direction.
Owner:CARL ZEISS MICROSCOPY GMBH +1
Charged particle beam irradiation equipment and control method thereof
InactiveUS6881970B2Short timeIrradiation time can be shortenedThermometer detailsStability-of-path spectrometersParticle physicsElectrical current
A power supply for applying a voltage to a scanning electromagnet for deflecting a charged particle beam has a first power supply unit having no filter and a second power supply unit having a filter. When an irradiation position of the charged particle beam in an irradiation object is moved, the first power supply unit, namely a power supply unit having no filter, is used to apply the voltage to the scanning electromagnet, so that an exciting current flowing in the scanning electromagnet can be changed in a short time. Further, when the irradiation position of the charged particle beam is maintained, the second power supply is used to apply a voltage whose pulsating component was removed to the scanning electromagnet, so that the exciting current flowing in the scanning electromagnet can be controlled precisely. Consequently, the charged particle beam can be applied uniformly to the irradiation object and an irradiation time of the charged particle beam to the irradiation object can be curtailed.
Owner:HITACHI LTD
RF accelerator method and apparatus used in conjunction with a charged particle cancer therapy system
ActiveUS20100060209A1Stability-of-path spectrometersBeam/ray focussing/reflecting arrangementsLow voltageCharged particle radiotherapy
The invention comprises a radio-frequency accelerator method and apparatus used in conjunction with multi-axis charged particle radiation therapy of cancerous tumors. An RF synthesizer provides a low voltage RF signal, that is synchronized to the period of circulation of protons in the proton beam path, to a set of integrated microcircuits, loops, and coils where the coils circumferentially enclose the proton beam path in a synchrotron. The integrated components combine to provide an accelerating voltage to the protons in the proton beam path in a size compressed and price reduced format. The integrated RF-amplifier microcircuit / accelerating coil system is operable from about 1 MHz, for a low energy proton beam, to about 15 MHz, for a high energy proton beam.
Owner:BALAKIN ANDREY VLADIMIROVICH +1
Method And Software For Irradiating A Target Volume With A Particle Beam And Device Implementing Same
The present invention is related to a method for treating or irradiating a target volume with a particle beam produced by an accelerator, comprising the steps of: deflecting said particle beam with the help of scanning means in two orthogonal (X, Y) directions, thereby constituting an irradiation plane perpendicular to the direction (Z) of the beam, defining in the irradiation plane a scanning field which circumscribes the area of intersection of target volume and irradiation plane and scanning said scanning field by drawing scan lines which form a scan pattern comprising interleaved frames of triangle waves. The scan pattern is preferably continuous and represents contiguous rhombi figures. The invention is equally related to a device and a software program or sequencer implementing the method.
Owner:ION BEAM APPL
Mass spectrometer
InactiveUS6906319B2High sensitivityIncrease delay timeStability-of-path spectrometersTime-of-flight spectrometersIon trap mass spectrometryMass analyzer
A mass spectrometer is disclosed wherein ions having a particular desired charge state are selected by operating an ion mobility spectrometer in combination with a quadrupole mass filter. Precursor ions are fragmented or reacted to form product ions in a collision cell ion trap and sent back upstream to an upstream ion trap. The fragment or product ions are then passed through the ion mobility spectrometer wherein they become temporally separated according to their ion mobility. Fragment or product ions are then re-trapped in the collision cell ion trap before being released therefrom in packets. A pusher electrode of a time of flight mass analyzer is energized a predetermined period of time after a packet of ions is released from the collision cell ion trap. Accordingly, it is possible to select multiply charged precursor ions from a background of singly charged ions, fragment them, and mass analyze the fragment ions with a near 100% duty cycle across the whole mass range.
Owner:MICROMASS UK LTD
Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
ActiveUS7157698B2Improve performanceImprove ejection efficiencyStability-of-path spectrometersTime-of-flight spectrometersNarrow rangeIon trap mass spectrometry
This invention relates to tandem mass spectrometry and, in particular, to tandem mass spectrometry using a linear ion trap and a time of flight detector to collect mass spectra to form a MS / MS experiment. The accepted standard is to store and mass analyze precursor ions in the ion trap before ejecting the ions axially to a collision cell for fragmentation before mass analysis of the fragments in the time of flight detector. This invention makes use of orthogonal ejection of ions with a narrow range of m / z values to produce a ribbon beam of ions that are injected into the collision cell. The shape of this beam and the high energy of the ions are accommodated by using a planar design of collision cell. Ions are retained in the ion trap during ejection so that successive narrow ranges may be stepped through consecutively to cover all precursor ions of interest.
Owner:THERMO FINNIGAN
Rectilinear ion trap and mass analyzer system and method
InactiveUS6838666B2New and simple geometryImprove capture abilityStability-of-path spectrometersIsotope separationMass storageIon trap mass spectrometry
A new geometry ion trap and its use as a mass spectrometer is described. The ion traps can be combined linearly and in parallel to form systems for mass storage, analysis, fragmentation, separation, etc. of ions. The ion trap has a simple rectilinear geometry with a high trapping capacity. It can be operated to provide mass analysis in the mass-selective instability mode as well as the mass-selective stability mode. Arrays of multiple ion traps allow combinations of multiple gas-phase processes to be applied to the trapped ions to achieve high sensitivity, high selectivity and / or higher throughput in the analysis of ions.
Owner:PURDUE RES FOUND INC
Rectilinear ion trap and mass analyzer system and method
ActiveUS20040135080A1New and simple geometryImprove capture abilityStability-of-path spectrometersIsotope separationMass storageIon trap mass spectrometry
A new geometry ion trap and its use as a mass spectrometer is described. The ion traps can be combined linearly and in parallel to form systems for mass storage, analysis, fragmentation, separation, etc. of ions. The ion trap has a simple rectilinear geometry with a high trapping capacity. It can be operated to provide mass analysis in the mass-selective instability mode as well as the mass-selective stability mode. Arrays of multiple ion traps allow combinations of multiple gas-phase processes to be applied to the trapped ions to achieve high sensitivity, high selectivity and / or higher throughput in the analysis of ions.
Owner:PURDUE RES FOUND INC
Charged particle beam irradiation equipment having scanning electromagnet power supplies
InactiveUS6903351B1Irradiation time can be shortenedShort timeThermometer detailsStability-of-path spectrometersExcitation currentElectrical current
A power supply for applying a voltage to a scanning electromagnet for deflecting a charged particle beam has a first power supply unit having no filter and a second power supply unit having a filter. When an irradiation position of the charged particle beam in an irradiation object is moved, the first power supply unit, namely a power supply unit having no filter, is used to apply the voltage to the scanning electromagnet, so that an exciting current flowing in the scanning electromagnet can be changed in a short time. Further, when the irradiation position of the charged particle beam is maintained, the second power supply is used to apply a voltage whose pulsating component was removed to the scanning electromagnet, so that the exciting current flowing in the scanning electromagnet can be controlled precisely. Consequently, the charged particle beam can be applied uniformly to the irradiation object and an irradiation time of the charged particle beam to the irradiation object can be curtailed.
Owner:HITACHI LTD
Integrated beam modifying assembly for use with a proton beam therapy machine
InactiveUS20110127443A1Stability-of-path spectrometersBeam/ray focussing/reflecting arrangementsLight beamProton
An integrated beam modifying assembly for use with a proton beam therapy machine. Typically the snouts of a proton beam therapy machine are adapted to receive separate apertures and range compensators. Applicants provide an integrated assembly for slotting into the snout of a proton beam therapy machine, which integrated assembly incorporates both aperture material and range compensator material for profiling, shaping, and modulating the beam.
Owner:COMER SEAN +1
Two-dimensional quadrupole ion trap operated as a mass spectrometer
InactiveUS6797950B2Improve trapping efficiencyImprove capture abilityStability-of-path spectrometersIsotope separationIon trap mass spectrometryImage resolution
Owner:THERMO FINNIGAN
Objective lens for an electron microscopy system and electron microscopy system
InactiveUS6855938B2Reduced space requirementsThermometer detailsStability-of-path spectrometersIon beam processingElectron microscope
An objective lens with magnetic and electrostatic focusing for an electron microscopy system is provided whose at least partially conical outer shape allows orienting an object to be imaged at a large angle range in respect of an electron beam, said objective lens exhibiting, at the same time, good optical parameters. This is enabled by a specific geometry of the lens elements. Furthermore, an examination for the simultaneous imaging and processing of an object is proposed which comprises, besides an electron microscopy system with the above-mentioned objective lens, also an ion beam processing system and an object support.
Owner:CARL ZEISS NTS GMBH
Charged particle beam irradiation equipment and control method thereof
InactiveUS6900446B2Irradiation time can be shortenedShort timeStability-of-path spectrometersStatic indicating devicesParticle physicsElectrical current
A power supply for applying a voltage to a scanning electromagnet for deflecting a charged particle beam has a first power supply unit having no filter and a second power supply unit having a filter. When an irradiation position of the charged particle beam in an irradiation object is moved, the first power supply unit, namely a power supply unit having no filter, is used to apply the voltage to the scanning electromagnet, so that an exciting current flowing in the scanning electromagnet can be changed in a short time. Further, when the irradiation position of the charged particle beam is maintained, the second power supply is used to apply a voltage whose pulsating component was removed to the scanning electromagnet, so that the exciting current flowing in the scanning electromagnet can be controlled precisely. Consequently, the charged particle beam can be applied uniformly to the irradiation object and an irradiation time of the charged particle beam to the irradiation object can be curtailed.
Owner:HITACHI LTD
Particle beam therapy system
ActiveUS20090289194A1Shorten the timeLower requirementStability-of-path spectrometersBeam/ray focussing/reflecting arrangementsBeam dumpParticle beam
A particle beam therapy system that is capable of irradiating a target area with an irradiation beam suitable for a particle beam therapy using a spot scanning method includes a synchrotron, a beam transport system and an irradiation device. The beam transport system is provided with a beam interrupting device adapted to block supply of a charged particle beam to the irradiation device. The beam interrupting device has a beam shielding magnet, an exciting power supply for the beam shielding magnet and a beam dump. The beam transport system has a bending magnet. The beam shielding magnet is provided on an inlet side of the bending magnet. The beam dump is provided on an outlet side of the bending magnet. A controller controls the exciting power supply to control the timing of an operation of the beam shielding magnet.
Owner:HITACHI LTD
Apparatus and method for focusing and selecting ions and charged particles at or near atmospheric pressure
The present invention relates to an apparatus and method for focusing, separating, and detecting gas-phase ions using the principles of quadrupole fields, substantially at or near atmospheric pressure. Ions are entrained in a concentric flow of gas and travel through a high-transmission element into a RF / DC quadrupole, through a second high-transmission element, and then impact on an ion detector, such as a faraday plate; or through an aperture with subsequent identification by a mass spectrometer. Ions with stable trajectories pass through the RF / DC quadrupole while ions with unstable trajectories drift off-axis collide with the rods and are lost. Embodiments of this invention are devices and methods for focusing, separating and detecting gas-phase ions without the need for a vacuum chamber when coupled to atmospheric ionization sources.
Owner:CHEM SPACE ASSOIATES
Ion beam focusing lens method and apparatus used in conjunction with a charged particle cancer therapy system
The invention comprises an ion beam focusing method and apparatus used as part of an ion beam injection system, which is used in conjunction with multi-axis charged particle or proton beam radiation therapy of cancerous tumors. The ion beam focusing system includes two or more electrodes where one electrode of each electrode pair partially obstructs the ion beam path with conductive paths, such as a conductive mesh. In a given electrode pair, electric field lines, running between the conductive mesh of a first electrode and a second electrode, provide inward forces focusing the negative ion beam. Multiple such electrode pairs provide multiple negative ion beam focusing regions.
Owner:BALAKIN ANDREY VLADIMIROVICH +1
Multi beam charged particle device
InactiveUS6943349B2Improve data acquisition speedIncrease speedThermometer detailsStability-of-path spectrometersImage resolutionParticle beam
The present invention provides an improved column for a charged particle beam device. The column comprises an aperture plate having multiple apertures to produce multiple beams of charged particles and a deflector to influence the beams of charged particles so that each beam appears to come from a different source. Furthermore, an objective lens is used in order to focus the charged-particle beams onto the specimen. Due to the deflector, multiple images of the source are created on the surface of the specimen whereby all the images can be used for parallel data acquisition. Accordingly, the speed of data acquisition is increased. With regard to the focusing properties of the objective lens, the beams of charged particles can basically be treated as independent particle beams which do not negatively affect each other. Accordingly, each beam basically provides the same resolution as the beam of a conventional charged particle beam device.
Owner:ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK GMBH
Integrated sub-nanometer-scale electron beam systems
InactiveUS20050092929A1Stability-of-path spectrometersAdditive manufacturing apparatusNanometreElectron
Owner:BIOMED SOLUTIONS
Particle beam processing system
InactiveUS20050017193A1Small sizeLow costStability-of-path spectrometersBeam/ray focussing/reflecting arrangementsParticle beamLight beam
Owner:HBAR TECH LC
Charged particle cancer therapy imaging method and apparatus
ActiveUS20110147608A1Stability-of-path spectrometersMaterial analysis by optical meansBeam energyBeam trajectory
The invention relates to a method and apparatus for treatment of a solid tumor. More particularly, the invention comprises a multi-axis and / or multi-field charged particle cancer therapy system. In one embodiment, the tumor is imaged from multiple directions in phase with patient respiration. The two-dimensional images are combined to produce a three-dimensional picture of the tumor relative to patient features. The resulting three-dimensional image is used in generation of a radiation treatment plan and subsequent radiation therapy with the radiation beam in terms of control of two-dimensional beam trajectory, delivered beam energy, delivered beam intensity, and / or beam velocity each as a function of patient vertical translation position, patient rotation position, and / or patient respiration.
Owner:BALAKIN ANDREY VLADIMIROVICH +1
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