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2results about "Beam/ray deflecting arrangements" patented technology

Rasterized laser beams for swapping interconnect qubit states

PendingUS20260142115A1Quantum computersBeam/ray deflecting arrangementsGratingParticle physics
A network of quantum information processing (QIP) systems includes a first QIP system, a second QIP system, and an optical system. The first QIP system includes a first ion trap that traps a first interconnect ion and a first memory ion in a first interconnect zone. The second QIP system includes a second ion trap configured to trap a second interconnect ion and a second memory ion in a second interconnect zone. The optical system directs a first optical beam and a second optical beam to the first interconnect zone to perform a SWAP gate to transfer information between the first interconnect ion and the first memory ion during a first duration, and directs the first optical beam and the second optical beam to the second interconnect zone to perform a SWAP gate to transfer information between the second interconnect ion and the second memory ion during a second duration.
Owner:IONQ INC

Magnet assembly with integrated charged particle beam collector

PendingCN121925948ABeam/ray deflecting arrangementsMagnetic resonance acceleratorsParticle beamActive cooling
Magnet assemblies (e.g., dipole magnet assemblies) with integrated charged particle beam collectors and systems including the magnet assemblies are described. An example of a dipole magnet assembly includes a dipole deflection magnet and a channel assembly configured with a charged particle beam collector. The dipole magnet may be configured to generate a uniform magnetic field within the channel assembly that deflects a trajectory of a charged particle beam. The channel assembly may be configured to support a vacuum for the charged particle beam while absorbing secondary state particles using the charged particle beam collector. The charged particle beam collector may be removably secured to the channel assembly, welded to the channel assembly, or inserted into the channel assembly. Each charged particle beam collector may utilize an active cooling system, such as a cooling tube or embedded cooling channel, to mitigate excess heat generated by secondary state particle absorption. Materials are also described.
Owner:TAE TECHNOLOGIES INC