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9results about "Beam/ray deflecting arrangements" patented technology

Rasterized laser beams for swapping interconnect qubit states

PendingUS20260142115A1Quantum computersBeam/ray deflecting arrangementsGratingParticle physics
A network of quantum information processing (QIP) systems includes a first QIP system, a second QIP system, and an optical system. The first QIP system includes a first ion trap that traps a first interconnect ion and a first memory ion in a first interconnect zone. The second QIP system includes a second ion trap configured to trap a second interconnect ion and a second memory ion in a second interconnect zone. The optical system directs a first optical beam and a second optical beam to the first interconnect zone to perform a SWAP gate to transfer information between the first interconnect ion and the first memory ion during a first duration, and directs the first optical beam and the second optical beam to the second interconnect zone to perform a SWAP gate to transfer information between the second interconnect ion and the second memory ion during a second duration.
Owner:IONQ INC

Magnetic cutting module and electron gun device

ActiveCN120072597BBeam/ray deflecting arrangementsDischarge tube electron gunsPole pieceParticle physics
The present invention discloses a magnetic field shear module and an electron gun device, relating to the technical field of electron guns. Among them, the electron gun includes a cathode and an anode, and the magnetic field shear module includes a main coil, an auxiliary coil, a cathode coil, a first pole shoe, and a second pole shoe; the main coil is arranged corresponding to the anode of the electron gun, the auxiliary coil is arranged corresponding to the junction of the anode and the cathode of the electron gun, the cathode of the auxiliary coil is connected to the anode of the main coil through the first pole shoe, the cathode coil is arranged corresponding to the cathode of the electron gun, and the anode of the cathode coil is connected to the anode of the auxiliary coil through the second pole shoe; wherein, the main coil, the auxiliary coil, and the cathode coil respectively generate a first magnetic field, a second magnetic field, and a third magnetic field, the first magnetic field is less than the second magnetic field, the third magnetic field is opposite to the directions of the first magnetic field and the second magnetic field, and one end of the first pole shoe faces the junction of the anode and the cathode of the electron gun. The magnetic field shear module provided by the present invention aims to improve the stability of the large cyclotron electron beam emitted by the electron gun.
Owner:SHENZHEN SHUNENG TECHNOLOGY CO LTD

X-ray inspection system for inspection of an object

PendingUS20250146958A1Beam/ray deflecting arrangementsX-ray tube multi-cathode assemblyNuclear medicineRay
An X-ray inspection system serves for inspection of an object. An X-ray source of the system generates X-rays to propagate through a region of interest of the object. An object mount holds the object to be inspected such that the ROI is accessible for the generated X-rays. A detection system detects the X-rays after propagation through the ROI. The X-ray source generates a plurality of separate X-ray light bundles to propagate through the ROI. Chief rays of at least two of the generated separate X-ray light bundles impinge on the ROI of the object with different chief ray illumination angles. The detection system comprises separate detection areas to detect the separate X-ray light bundles, respectively. Such an inspection system can exhibit relatively fast image data acquisition.
Owner:CARL ZEISS SMT GMBH

Magnet assembly with integrated charged particle beam collector

PendingCN121925948ABeam/ray deflecting arrangementsMagnetic resonance acceleratorsParticle beamActive cooling
Magnet assemblies (e.g., dipole magnet assemblies) with integrated charged particle beam collectors and systems including the magnet assemblies are described. An example of a dipole magnet assembly includes a dipole deflection magnet and a channel assembly configured with a charged particle beam collector. The dipole magnet may be configured to generate a uniform magnetic field within the channel assembly that deflects a trajectory of a charged particle beam. The channel assembly may be configured to support a vacuum for the charged particle beam while absorbing secondary state particles using the charged particle beam collector. The charged particle beam collector may be removably secured to the channel assembly, welded to the channel assembly, or inserted into the channel assembly. Each charged particle beam collector may utilize an active cooling system, such as a cooling tube or embedded cooling channel, to mitigate excess heat generated by secondary state particle absorption. Materials are also described.
Owner:TAE TECHNOLOGIES INC

Device for an ion spectrometric system that facilitates the transfer of ions

PendingDE102024137613A1Beam/ray deflecting arrangementsMaterial analysis by electric/magnetic means
The invention relates to an apparatus for an ion spectrometric system that facilitates the transfer of ions, the apparatus comprising a concave ion deflector, the concave ion deflector comprising a plurality of conductive electrodes forming an inwardly curved surface and a pusher element for deflecting ions; an RF voltage supply for applying an RF voltage to the concave ion deflector; and an outlet designed and arranged to discharge a directed gas stream containing ions; the outlet and the concave ion deflector being arranged relative to one another such that the directed gas stream containing ions is directed towards the inwardly curved surface of the concave ion deflector; the outlet being located outside the concave ion deflector;and the concave ion deflector is designed and arranged to retain and deflect ions coming from the exit, while simultaneously allowing other particles coming from the exit to pass through the inwardly curved surface. The present invention also relates to a method for facilitating the transfer of ions in an ion spectrometric system.
Owner:BRUKER SWITZERLAND AG

Magnetic cutting module and electronic gun equipment

ActiveCN120072597ABeam/ray deflecting arrangementsDischarge tube electron guns
The invention discloses a magnetic cusping module and electron gun equipment, and relates to the technical field of electron guns, the electron gun comprises a cathode and an anode, and the magnetic cusping module comprises a main coil, an auxiliary coil, a cathode coil, a first pole shoe and a second pole shoe; the main coil corresponds to the anode of the electron gun, the auxiliary coil corresponds to the junction of the anode and the cathode of the electron gun, the cathode of the auxiliary coil is connected with the anode of the main coil through a first pole shoe, the cathode coil corresponds to the cathode of the electron gun, and the anode of the cathode coil is connected with the anode of the auxiliary coil through a second pole shoe; wherein the main coil, the auxiliary coil and the cathode coil respectively generate a first magnetic field, a second magnetic field and a third magnetic field, the first magnetic field is smaller than the second magnetic field, the third magnetic field is opposite to the first magnetic field and the second magnetic field in direction, and one end of the first pole shoe faces the junction of the anode and the cathode of the electron gun. The magnetic cusping module provided by the invention aims to improve the stability of the large cyclotron electron beam emitted by the electron gun.
Owner:SHENZHEN SHUNENG TECHNOLOGY CO LTD

X-ray inspection system for inspection of an object

PendingEP4549919A1X-ray tube electrodesBeam/ray deflecting arrangementsNuclear medicineRay
An X-ray inspection system (1) serves for inspection of an object (2). An X-ray source (9) of the system serves for generating X-rays to propagate through a region of interest (ROI, 10) of the object (2). An object mount holds the object (2) to be inspected such that the ROI (10) is accessible for the generated X-rays. A detection system (7a) serves to detect the X-rays after propagation through the ROI (10). The X-ray source (9) generates a plurality of separate X-ray light bundles (9i) to propagate through the ROI (10). Chief rays (16i) of at least two of the generated separate X-ray light bundles (9i) impinge on the ROI (10) of the object (2) with different chief ray illumination angles (CRAi). The detection system (7a) comprises separate detection areas to detect the separate X-ray light bundles (9i), respectively. An inspection system results enabling an inspection of an object with fast image data acquisition.
Owner:CARL ZEISS SMT GMBH

X-ray inspection system for inspection of an object

PCT designated stage expiredWO2025098589A1X-ray tube electrodesBeam/ray deflecting arrangementsNuclear medicineCorner detection
An X-ray inspection system (1) serves for inspection of an object (2). An X-ray source (9) of the system serves for generating X-rays to propagate through a region of interest (ROI, 10) of the object (2). An object mount holds the object (2) to be inspected such that the ROI (10) is accessible for the generated X-rays. A detection system (7a) serves to detect the X-rays after propagation through the ROI (10). The X-ray source (9) generates a plurality of separate X-ray light bundles (9i) to propagate through the ROI (10). Chief rays (16i) of at least two of the generated separate X-ray light bundles (9i) impinge on the ROI (10) of the object (2) with different chief ray illumination angles (CRAi). The detection system (7a) comprises separate detection areas to detect the separate X-ray light bundles (9i), respectively. An inspection system results enabling an inspection of an object with fast image data acquisition.
Owner:CARL ZEISS SMT GMBH

Electrostatic energy filter module

PendingUS20250285825A1Unwanted particle removal/diversion trapsElectric discharge tubesOptical axisHemt circuits
An electrostatic energy filter module that includes a (i) biasing circuit, (ii) distal electrodes, (iii) intermediate electrodes that are upstream to the distal electrodes; and (iv) proximal electrodes that are upstream to the intermediate electrodes. The electrodes are disk-shaped, concentric, are parallel to each other and define an optical axis. The distal electrodes are configured to receive first biasing signals from the biasing circuit, and to form first equipotential lines that are parallel to each other and are perpendicular to the optical axis. The intermediate electrodes are configured to receive second biasing signals from the biasing circuit, and to form a wide energy barrier. The proximal electrodes are configured to third biasing signals from the biasing circuit, and to form second equipotential lines that are parallel to each other and are perpendicular to the optical axis.
Owner:APPL MATERIALS ISRAEL LTD