78 results about "Charged particle" patented technology

The application discloses a deposition device based on a programmable electrode array and a patterning deposition method, which comprises the following steps: generating charged particles and / or mist droplets by a charged particle source; an insulating substrate comprises a front surface for receiving deposition and a back surface opposite to the front surface; a programmable electrode array is arranged on the back surface of the insulating substrate and used for guiding the deposition of the charged particles and / or the mist droplets; a voltage driving unit is used for providing independent voltage signals for the electrode unit, and the voltage signals are pulse signals or direct current signals; and a control unit is used for programming and controlling the output of the voltage driving unit according to a target pattern, so that the programmable electrode array forms a spatial electric field corresponding to the target pattern on the front surface of the insulating substrate. Through the deposition device based on the programmable electrode array and the patterning deposition method, any pattern can be generated and changed instantly through programming of an electric field, and a physical mask is replaced by an electric mask, so that the physical mask is not needed, and the flexibility is extremely high.

This invention discloses an ion trap teaching experiment observation device, including an observation box, an ion trap housed within the observation box, and a laser. The ion trap includes a linear ion trap and a ring-shaped ion trap. The observation box is a transparent, insulating box. The observation box has electrical ports for introducing AC and DC voltage sources to the electrodes of the ion trap. The observation box also has a first air blowing pipe port and a second air blowing pipe port. The first air blowing pipe port is used to install a first air blowing pipe to blow charged particles into the linear ion trap. The second air blowing pipe port is used to install a second air blowing pipe to blow charged particles into the ring-shaped ion trap. Two lasers are provided, one on each side of the linear ion trap and the other on the ring-shaped ion trap, for irradiating the trapped charged particles. This invention clearly demonstrates the flexibility of trapping physics based on radio frequency electromagnetic fields and symmetry.

A microfluidic system for controlling movement of charged particles, including a microfluidic channel, at least three electrodes, a plurality of conductor leads and at least two drive power supplies. Each electrode is in electrical contact with the electrolyte, and a pseudo-capacitance, a double-layer capacitance or a combination thereof is formed at an electrode-electrolyte interface. Each drive power supply periodically produces a voltage or current excitation, and is connected to one or more electrodes via the conductor leads. Each electrode continuously undergoes charging-discharging alternating cycles to form a traveling-wave electric field in the microfluidic channel. A maximum charge capacity of each electrode is greater than a total amount of charges transferred thereon during a charging or discharging process. A control method based on the microfluidic system is also provided.

The application relates to a satellite energy acquisition system based on space charged particle collection, belonging to the technical field of spacecraft power supply. The application aims at solving the problem that the discharge phenomenon of the space charged particles deposited on the surface of a satellite can cause physical damage to materials. The application comprises a collection capacitor used for capturing the space charged particles, forming a high-voltage electrostatic field through the accumulated charges of the space charged particles; an energy-taking conversion circuit used for converting the high-voltage electrostatic field energy stored in the collection capacitor into low-voltage electrostatic field energy and transferring the low-voltage electrostatic field energy to an energy storage capacitor; the energy storage capacitor is used for storing the low-voltage electrostatic field energy, setting a target electric field energy according to the working requirement of a rear-end load, and discharging after the target electric field energy is reached; and a switch voltage stabilizing circuit used for adjusting the discharging output voltage of the energy storage capacitor, realizing constant voltage power supply for the rear-end load. The application can reduce the charging and discharging fault risk of the surface of the satellite by collecting the particles radiated to the satellite and controllably transferring and utilizing the particles.

The present disclosure relates to a module of a trap for charged particles (e.g. ions), to manufacturing such module, to a trap including the module and a manufacturing of such modular trap . The module comprises a monolithic body made of a non-conductive substrate and an electrode arranged on a portion of a surface of the monolithic body. A part of the monolithic body forms a spring element. An electrically conductive area is arranged on and covers a portion of a surface of the spring element and is conductively connected with the electrode. The spring element is adapted to compress upon pressure applied on the electrically conductive area.

The invention relates to a cyclotron which enables the production of α- or β-emitting radionuclides. The cyclotron, with a magnetic periodicity of 3, comprises three accelerating cavities connected to the centre, thus not requiring phase control between the cavities, forming a single high-frequency resonator. The six accelerating gaps per turn enable rapid acceleration (the angle ϕ between the accelerating gaps of each cavity being approximately 30°) which is essential for acceleration at the third and sixth harmonics. This cyclotron preferably has an injection system (31) supplied by different types of ion sources, making it possible to efficiently accelerate charged particles having Z / A ratios equal to 1 / 2 and to 1 / 4. The cyclotron may also have stripping extraction means positioned in the cyclotron so as to extract the charged particles and double their state of charge. These particles enable a set of nuclear reactions for producing α-emitting radionuclides.

Provided are a vacuum duct and an accelerator that allow charged particles to pass in intersecting directions, without having to have a plurality of ducts with different degrees of vacuum three-dimensionally intersect with each other. According to one embodiment, a vacuum duct includes: a first duct configured to form a first beam trajectory of charged particles; a vacuum chamber provided in a straight part of the first duct; and a second duct configured to form a second beam trajectory that intersects with the first beam trajectory inside the vacuum chamber.

The present disclosure is directed to at least one embodiment of a filter that is configured to remove contaminants utilizing a first conductive mesh (e.g., first electrode) and a second conductive mesh (e.g., second electrode) that extends around the first conductive mesh. For example, the first conductive mesh may receive a first electrical signal and the second conductive mesh may receive a second electrical signal such that the first and second conductive meshes are oppositely charged from each other (e.g., the first conductive mesh is positively charged and the second conductive mesh is negatively charged). Anions that are present within the fluid or generated by an electrical field between the first and second conductive meshes may interact with the contaminants such that the contaminants are attracted to at least one of the first and second conductive meshes, respectively.

This invention relates to the field of radiation detectors, and more particularly to an ultrathin flexible neutron detector based on silicon carbide, its fabrication method, and its applications. The ultrathin flexible neutron detector based on silicon carbide includes: a flexible substrate; multiple ultrathin silicon carbide radiation detector units disposed on the flexible substrate; a flexible circuit electrically connected to each ultrathin silicon carbide radiation detector unit; a neutron conversion layer for converting neutrons into detectable charged particle signals; the neutron conversion layer is disposed on the surface of the ultrathin silicon carbide radiation detector unit, or sandwiched between two ultrathin silicon carbide radiation detector units; and a flexible encapsulation protective layer covering the surface of the ultrathin flexible neutron detector based on silicon carbide. This invention obtains an ultrathin silicon carbide film through femtosecond laser ablation, photoelectrochemical etching, or substrate thinning methods, and integrates it with a flexible substrate. Combined with a serpentine stretchable circuit design, the device can withstand bending, winding, and folding.

The application provides a sample detection method, a detection device and a charged particle optical detection system. The sample detection method comprises the following steps: acquiring a surface topography image and cathodoluminescence data of a to-be-detected sample having a dark spot defect; extracting a region in which the cathodoluminescence intensity is lower than a set intensity threshold in each cathodoluminescence image to obtain a dark spot region; and determining failure information of the to-be-detected sample based on the surface topography image, the dark spot region, the corresponding electrical stress of the dark spot region and the corresponding time of the dark spot region. Through the application, dynamic defect detection of a blue-green laser chip is realized.

This system / technique provides a way to facilitate the resolution of large-scale language models of disruptions in scientific instrument workflows. [Solution] In various embodiments, the system can cause scientific instruments (e.g., charged particle microscopes, chromatographs, mass spectrometers) to perform a workflow on a sample. In various embodiments, the system can retrieve runtime data logged by the scientific instrument during the workflow in response to the scientific instrument generating an error message that interrupts the workflow. In various cases, the system can synthesize a first text explaining why the workflow was interrupted by running a large-scale language model on the error message and runtime data.

Electron microscope imaging system and imaging method. The present invention provides systems and methods for electron microscope imaging, including methods of imaging a sample with a charged particle microscope, the method comprising: acquiring a first initial image of a surface of the sample with the charged particle microscope; during imaging with the charged particle microscope, receiving automatic function instructions for one or more initial regions of interest; during imaging with the charged particle microscope, acquiring a series of subsequent images of subsequent surfaces of the sample. Wherein, for each subsequent image, acquiring the subsequent image comprises exposing a respective subsequent surface of the sample; identifying one or more regions of interest corresponding to the one or more initial regions of interest; imaging the respective subsequent surface, wherein imaging the respective subsequent surface comprises applying one or more automatic functions based on at least one identified region of interest corresponding to the one or more initial regions of interest.

A system and method are provided for defect inspection using voltage comparison in a charged particle system. Some embodiments of the system and method include: positioning a stage at a first position such that a first beam of a plurality of beams can scan a first surface region of a wafer at a first time to generate a first image associated with the first surface region; positioning the stage at a second position such that a second beam of the plurality of beams can scan the first surface region at a second time to generate a second image associated with the first surface region; and comparing the first image with the second image to detect whether a defect is identified in the first surface region of the wafer.

The electrophoretic medium comprises a plurality of first-type charged particles in a nonpolar liquid. Each of the plurality of first-type charged particles has a core and a shell. The core comprises an organic pigment and a graphene oxide layer. The shell comprises an organosilane layer and a polymer layer. The electrophoretic medium may be incorporated into a color electrophoresis device to improve its electro-optical performance. The present invention relates to an electrophoretic medium for electro-optical displays, comprising a nonpolar liquid and charged particles. Each particle has a core and a shell, the core comprises an organic pigment and graphene oxide, and the shell comprises an organosilane layer and a polymer layer.

This invention belongs to the field of liquid level measurement technology for containers or pipelines containing highly radioactive media, and relates to an ionization chamber type liquid level detection device suitable for various highly radioactive media. The device includes a multi-electrode ionization chamber detector, a collimating shield, and a pre-processing unit. This invention guides the radiation emitted by the highly radioactive media into the housing through multiple collimating windows. This ionizes the inert gas in each detection sensitive area, generating charged particles. The high-voltage electric field in each detection sensitive area drives the particles to move to the corresponding collecting electrode. The collecting electrode captures the charged particles and generates an ionization signal, which is sent to the pre-processing unit. The pre-processing unit determines the liquid level height of the corresponding highly radioactive media based on the varying ionization strength signals generated by the ionized inert gas caused by the different radiation intensity emitted by the various highly radioactive media. This allows for the simultaneous identification and location of multiple coexisting highly radioactive media under non-contact conditions.

The invention relates to a sample holder tip for use in a charged particle microscope, such as a transmission electron microscope; a sample holder comprising said sample holder tip and methods of using said sample holder tip and sample holder.

The present disclosure provides a modified positive electrode material and a preparation method and application thereof, the preparation method comprising the following steps: (1) mixing tungsten disulfide with a tannic acid solution, performing ultrasonic treatment, and then separating to obtain a TA-WS2 nanosheet solution; (2) mixing a positive electrode material with a solvent after performing corona discharge treatment, to obtain a positive electrode material solution, mixing the positive electrode material solution with the TA-WS2 nanosheet solution, and obtaining a mixed solution; (3) performing solid-liquid separation treatment on the mixed solution, and performing calcination treatment on the obtained solid material, to obtain the modified positive electrode material. The present disclosure prepares nanoparticles with strong electronegativity, simultaneously charges the positive electrode material particles, utilizes the interaction force between the strong electronegativity and electrons, makes the nanoparticles with strong electronegativity uniformly and spontaneously loaded on the charged particles, and finally forms a uniform coating layer on the surface of the positive electrode material through calcination.

The invention relates to a method of evaluating a sample using charged particle microscopy, comprising the steps of a sample containing primary particles of interest. The method further comprises the steps of imaging said sample using said charged particle microscope for obtaining at least one image of said primary particles; and determining a concentration of said primary particles using said at least one image. As defined herein, the sample further contains secondary particles that are independent from said primary particles, and which are present in said at least one image. The method is characterized by the steps of providing a known concentration of said secondary particles and using said known concentration of said secondary particles in said step of determining said concentration of said primary particles.

A detector module configured to detect charged particles emitted by a sample, the detector module comprising a detector unit electrically coupled to a conversion unit; the detector unit comprising a detector substrate, comprising a detector element and a pre-amplifier circuit electrically connected to the detector element, the detector substrate comprising a first metal material for conducting signals in the detector substrate; the conversion unit comprising a conversion circuit and / or a data routing circuit, the conversion circuit and / or the data routing circuit integrated into a conversion substrate, the conversion substrate comprising a second metal material for conducting signals in the conversion substrate; wherein the first conducting metal material is different from the second conducting metal material.

A method and apparatus for detecting charged particles are provided. The detection system includes a signal processing circuit (502) configured to generate a set of intensity gradients based on electron intensity data received from a plurality of electron sensing elements (244). The detection system further includes a beam spot processing module (506) configured to: determine at least one boundary of a beam spot based on the set of intensity gradients; and determine, based on said at least one boundary, that a first group of electron sensing elements is located within the beam spot. The beam spot processing module may be further configured to: determine an intensity value of the beam spot based on electron intensity data received from the first group of electron sensing elements, and also generate an image of a wafer based on the intensity value.

The utility model discloses an ion transmission device, including ion source, ion source orientation mass spectrometer's mass spectrum entrance setting, still including setting at the mass spectrum entrance of mass spectrometer's dielectric ring. The utility model is with the polarization effect phenomenon of dielectric ring in the electric field, and the polarization charge is produced to the surface layer of dielectric ring to form the polarization electric field for focusing transmission charged particle, and compared with prior art, the utility model is passive and lower cost.

A charged particle-optical apparatus is configured to direct charged particles toward a sample. A charged particle-optical device is configured to direct a plurality of beams of charged particles along respective beam paths toward a sample. A detector array of detector elements is configured to detect signal charged particles emitted from respective areas of a surface of the sample so as to generate respective detection signals. A controller is configured to determine cross talk values indicative of proportions of each detection signal resulting from the detector element detecting signal charged particles emitted from areas other than its respective area. The controller is configured to reduce cross talk by operating on the detection signals using the determined cross talk values based on signals resulting from subsets of the primary beams on the sample.

An inclination angle measurement device 100 comprises: a light source 101 that irradiates a sample 104 with light; a two-dimensional opening member 102 that is disposed between the light source 101 and the sample 104 and has a two-dimensionally shaped opening through which some of the light emitted from the light source 101 selectively passes; a light-receiving element 107 that receives reflected light reflected from the surface of the sample 104 irradiated by the light through the opening; and a measurement unit 110 that measures the inclination angle of the two axes of the sample 104 on the basis of a feature of a two-dimensional image obtained from the light-receiving element 107.

The present application relates to the technical field of space physics and space environment detection, and relates to a multi-layer nested electrostatic analyzer, which comprises a shielding grid, an electrostatic deflection device, a trajectory guiding device, a hemispherical multi-layer concentric grid electrode, a microchannel plate, a position sensitive anode, an electronic processor and a device shell; the device shell is arranged on the electronic processor, the shell opening is covered by the shielding grid, and the electrostatic deflection device, the trajectory guiding device, the hemispherical multi-layer concentric grid electrode, the microchannel plate and the position sensitive anode are arranged in the shell; the present application reduces two-dimensional voltage scanning required by traditional electrostatic analysis type low-energy charged particle measurement to one-dimensional voltage scanning, can greatly save voltage scanning time, improve the time resolution of low-energy charged particle measurement, and has wide application demand in the detection of small-scale structures in space.

Systems and methods are provided for recovering charged particle measurement information during operation of a charge detection mass spectrometer, in which multiple ions are captured and simultaneously measured. The recovered charged particle measurement information exemplarily includes charged particle measurement information for at least some ions whose oscillation frequencies overlap with the oscillation frequencies of other ions among the multiple captured ions. One example charged particle recovery process operates on charged particle measurement information in which the overlapping oscillation frequencies are distinguishable from each other, while another example charged particle recovery process operates on charged particle measurement information in which the overlapping oscillation frequencies are indistinguishable from each other. The charge detection mass spectrometer can be operated using any one or both of the said charged particle recovery processes.

A charged particle-optical element for a charged particle-optical module configured to direct charged particles along at least one beam path, the charged particle-optical element comprising: a substrate comprising at least one aperture for passage therethrough of the at least one beam path; at least one electronic component so as to provide a component surface of the substrate; and an electrical connector electrically connected to the at least one electronic component and extending through the substrate; wherein the substrate comprises a thicker portion and a thinner portion that is thinner than the thicker portion, and the electrical connector extends through the thinner portion.

[Problem] To provide a technique capable of visualizing, with high spatial resolution in neutron imaging, the internal structure of an object to be inspected, without performing chemical treatment that is required when a nuclear emulsion is used. [Solution] A neutron position recording device 10 is provided with a conversion film 1 and a fluorescent nuclear track detector 2 in order to generate an image representing the fine structure of an object T to be inspected. When each neutron that has passed through the object T to be inspected is incident, the conversion film 1 converts each neutron into a charged particle. The fluorescent nuclear track detector 2 has a surface 2a facing the conversion film 1, and records, due to the incidence of the charged particle from the conversion film 1, the track of the charged particle corresponding to the position of the neutron.