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126 results about "Convergent beam" patented technology

Measurement mechanism of lens focal length, measurement method and thereof and optical quality evaluation method

InactiveCN101140196APrecision Measuring Focal LengthPrecise measurement of depth of focusTesting optical propertiesMeasurement deviceLong-focus lens
The invention relates to a device and a method for measuring lens focal length as well as a method for evaluating optical quality, wherein the device for measuring the lens focal length is composed of a plane mirror, a lens to be measured, a point light source, a vertical incision, a one-dimensional precise flat movable guide rail, a laser distance measuring instrument, a CCD detector and a display, and the method for measuring the lens focal length is as follows: (1) adjusting the autocollimation of the point light source and the lens to be measured; (2) adjusting the plane mirror to make the transflective convergent beam enter the CCD detector; (3) measuring the focal depth of the lens to be measured; (4) measuring the distance L from the point light source to the geometric main plane of the lens to be measured; (5) calculating the focal length f = L + d of the lens to be measured, and the d is the distance between the geometric main plane of the lens and the optical main plane. The optical processing quality of the lens to be measured is qualitatively evaluated through the observation of shape of the far-field focal spot. The device and the method are applied to the measurement and evaluation of the small-bore short-focus and large-bore long-focus lens, and have the advantages of the intuitionism, the high measuring precision and the simple mechanism.
Owner:SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI

Detecting method and detecting device of surface-shape error of double curved surface convex reflecting mirror

The invention relates to a detecting method and a detecting device of the surface-shape error of a double curved surface convex reflecting mirror, which takes an aberrationless laser convergent beam as an incident beam scanning the convex of the detected reflecting mirror and takes wavefront detector as a measuring tool to coincide the focus of the incident beam with the virtual focus of the detected double curved surface reflector; the incident beam is imaged at the real focus of the detected double curved surface reflecting mirror after being reflected by the detected reflector, an imaging beam enters in the wavefront detector after being collimated by an anaberration collimating lens, and the surface-shape error of a local area is detected by the wavefront detector; the incident beam radically scans around the virtual focus of the detected double curved surface reflector, the detected double curved surface reflecting mirror rotates a circle around an optic axis when the incident beam scans each step, and the surface-shape error of each local area inside a whole mirror surface is detected circularly; and the detected surface-shape error of the local area is subject to matching and Zernike polynomial polynomial fitting to obtain the surface-shape error of the whole double curved surface convex reflecting mirror. The invention provides a low-cost and high-precision detection means of the large-caliber double curved surface convex reflecting mirror.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Optical system of helmet displayer

An optical system of a helmet displayer comprises a micro displayer, a bonding lens and an optical combiner. The micro displayer and the bonding lens are bonded integrally, the optical combiner comprises two tightly-adhered right-angle prisms forming a 45-degree angle and a concave-surface reflecting mirror, a narrow-band high-reflective optical surface is located at the bonding position of the two right-angle prisms and forms a 45-degree angle respectively with the horizontal optical axis and the vertical optical axis, the concave-surface reflecting mirror and the right-angle prisms are bonded integrally, and the concave surface is the high-reflective optical surface. Light beams are emitted from the micro displayer, are converged through the bonding lens, enter the optical combiner and pass through the narrow-band high-reflective optical surface, then transmitted light beams are converged through the high-reflective optical surface again, and reflected light beams become parallel light beams after the light beams pass through the narrow-band high-reflective optical surface again. An exit pupil is located at the position of a pupil of one human eye, extraneous light enters the optical combiner and passes through the narrow-band high-reflective optical surface, and then the transmitted light beams enter the pupil of one human eye. The optical system of the helmet displayer has the advantages of being compact in system, convenient to correct, good in aberration correction and high in reliability.
Owner:中航华东光电有限公司

Method for on-line detection of film growth rate and stress

The invention discloses a method for on-line detection of film growth rate and stress, which comprises the following steps: (1) putting a film sample in a light path of an optical sensor, and detecting light spot position distribution information and light intensity change information of each light spot of a reflected light beam array of the detected sample so as to obtain a reflectivity curve of the film growth; (2) performing parameter fitting on the reflectivity curve through MATLAB software so as to obtain the film growth rate and refractive index information; (3) irradiating the surface of the film sample by a two-dimensional convergent beam array, detecting reflected light beam array information in a reflection direction of the surface of the film sample by a CCD device, and measuring the space length d of an incident laser beam, the incident angle alpha, the relative distance L between the sample and an array sensor, the deflection displacement delta of a light beam at the L position, and the parameter of the film thickness hf; and (4) calculating the film stress sigma by a Stoney relation equation according to the measured film substrate curvature parameters. The method can be applied to film on-line measurements in the field of manufacturing semiconductor materials and devices.
Owner:XIDIAN UNIV

Curved-top total reflection type twice concentration and illumination balancing integration device

ActiveCN101694541AIncrease the concentration ratioImprove uniformity of spot intensityPhotovoltaicsCondensersLight spotLight beam
The invention discloses a curved-top total reflection type twice concentration and illumination balancing integration device, which is in a V-shaped prism trapezoid structure made of solid glass. In the invention, a curved-top surface is plated with an anti-reflection film, a curved-top bottom surface is the incidence surface of a light beam, a lower bottom surface is the emitting surface of the light beam, and the area of the curved-top bottom surface is larger than the area of the lower bottom surface. The curved-top total reflection type twice concentration and illumination balancing integration device works in the following steps: the light beam is changed into a convergent light beam by passing through the once condenser of a spotlight photovoltaic module group, the convergent light beam with a large caliber enters the incidence surface of the curved-top total reflection type twice concentration and illumination balancing integration device, after the refraction of the incidence surface and multiple total reflections of sidewalls, the convergent light beam is then refracted from the emitting surface to the solar cell with a small caliber, thereby achieving the purpose of twice concentration, and the multiple total reflections from the sidewalls can promote the light spots with uneven intensity distribution to be more even, thereby realizing the homogenization of the solar cell photic surface light spot.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Image sensing apparatus

An image sensing apparatus having a large depth of focus (DOF) and being compact in size is provided. The image sensing apparatus includes a plurality of light sources that shines light beams on an illumination portion of a document; a first mirror that receives incident light scattered by reflection from the document, to reflect the scattered light in the secondary scan direction; a plurality of first concaved aspheric mirrors that collimates light beams from the first mirror, to reflect therefrom the collimated light beams as substantially collimated light fluxes; an aperture mirror that reflects therefrom the light beams from the respective first aspheric mirrors, through apertures each having a light-shielded portion formed therearound and selectively passing the light beams therethrough; a plurality of second concaved aspheric mirrors that receives the light beams incident from the respective aperture mirror, to reflect the incident light beams as converging light beams; a second mirror that reflects the light beams in a direction perpendicular to the surface of the document, disposed on a path of the light beams to be converged by means of the second aspheric mirrors; a plurality of light receivers each having a light-receiving area that receives the light beams from the second mirrors, to form images according to the light beams from the respective apertures; and a casing where the first and second aspheric mirrors are disposed on a first side of the casing in the secondary scan direction, and the aperture mirror is disposed on a second side thereof in the secondary scan direction.
Owner:MITSUBISHI ELECTRIC CORP

Method for rapidly and accurately measuring low angle grain boundary orientation under transmission electron microscope

The invention discloses a method for rapidly and accurately measuring low angle grain boundary orientation under a transmission electron microscope. The method comprises the following steps: using a transmission electron microscope double bar-tilting rotation tilting sample, enabling a zone axis of a crystalline grain I in a coordinate system I to be at the position of a positive zone axis, and collecting a convergent beam electron diffraction pattern of the crystalline grain I at the moment; keeping a camera constant L of the transmission electron microscope and the parameter of the convergent beam diffraction condition unchanged, and collecting a convergent beam electron diffraction pattern of a crystalline grain II in a coordinate system II; superposing a kikuchi pattern of the collected crystalline grain I and a kikuchi pattern of the collected crystalline grain II by using software; measuring the distance S between a kikuchi pole of the crystalline grain I and a kikuchi pole of the crystalline grain II as well as the rotation angle gama of the kikuchi pole of the crystalline grain II vertical to the pattern surface relatively to the kikuchi pole of the crystalline grain I; calculating the angle theta according to the geometric characteristic of the kikuchi line, theta=arctan(s/L)=s/L; using a formula (6) cos theta=(cosgama+cosgamacostheta+costheta-1)/2 to calculate the orientation of the crystalline grain I and the crystalline grain II. The method does not need the additional installation of hardware and software, and the common transmission electron microscope is used to measure the orientation.
Owner:YANSHAN UNIV

Image sensing apparatus

An image sensing apparatus having a large depth of focus (DOF) and being compact in size is provided. The image sensing apparatus includes a plurality of light sources that shines light beams on an illumination portion of a document; a first mirror that receives incident light scattered by reflection from the document, to reflect the scattered light in the secondary scan direction; a plurality of first concaved aspheric mirrors that collimates light beams from the first mirror, to reflect therefrom the collimated light beams as substantially collimated light fluxes; an aperture mirror that reflects therefrom the light beams from the respective first aspheric mirrors, through apertures each having a light-shielded portion formed therearound and selectively passing the light beams therethrough; a plurality of second concaved aspheric mirrors that receives the light beams incident from the respective aperture mirror, to reflect the incident light beams as converging light beams; a second mirror that reflects the light beams in a direction perpendicular to the surface of the document, disposed on a path of the light beams to be converged by means of the second aspheric mirrors; a plurality of light receivers each having a light-receiving area that receives the light beams from the second mirrors, to form images according to the light beams from the respective apertures; and a casing where the first and second aspheric mirrors are disposed on a first side of the casing in the secondary scan direction, and the aperture mirror is disposed on a second side thereof in the secondary scan direction.
Owner:MITSUBISHI ELECTRIC CORP
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