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2051 results about "Wavefront" patented technology

In physics, a wavefront of a time-varying field is the set (locus) of all points where the wave has the same phase of the sinusoid. The term is generally meaningful only for fields that, at each point, vary sinusoidally in time with a single temporal frequency (otherwise the phase is not well defined).

Embedded interferometer for reference-mirror calibration of interferometric microscope

InactiveUS6545761B1Implemented easily and economicallyAccurately determineInterferometersUsing optical meansClosed loopOptoelectronics
A laser interferometer is embedded into an interference microscope to precisely determine the in-focus position of the microscope objective's reference mirror. A collimated laser beam is introduced into the microscope system and split into two beams directed toward a calibration reference surface and the interference objective. The light reflected from the calibration reference surface is returned to the camera. The light into the interference objective is focused onto the reference mirror and returned to the camera. For the purpose of calibration, the two beams are combined at the camera to produce interference fringes. When the reference mirror is in focus, the returned beam is collimated; if the mirror is on either side of focus, the beam is either converging or diverging. Accordingly, the interferogram produced at the camera reflects the in-focus or out-of-focus condition of the reference mirror. The curvature of the wavefront returned from the reference mirror is determined electronically by analyzing the interference fringes produced with the beam returned from the calibration reference surface. By minimizing the curvature of the reference-mirror wavefront as the mirror is translated along the optical path, the reference mirror can be focused with an accuracy greater than possible by visual observation. Furthermore, by automating the focusing system with a precise translation mechanism driven by closed-loop control, operator-to-operator variations are completely eliminated.
Owner:BRUKER NANO INC

Extrinsically influenced near-optimal path apparatus and method

InactiveUS6067572ARapidly and automatically determineRapidly and automatically designateError preventionFrequency-division multiplex detailsWavefrontOperational system
A method and apparatus for dynamically providing a path through a network of nodes or granules may use a limited, advanced look at potential steps along a plurality of available paths. Given an initial position, at an initial node or granule within a network, and some destination node or granule in the network, all nodes or granules may be represented in a connected graph. An apparatus and method may evaluate current potential paths, or edges between nodes still considered to lie in potential paths, according to some cost or distance function associated therewith. In evaluating potential paths or edges, the apparatus and method may consider extrinsic data which influences the cost or distance function for a path or edge. Each next edge may lie ahead across the advancing "partial" wavefront, toward a new candidate node being considered for the path. With each advancement of the wavefront, one or more potential paths, previously considered, may be dropped from consideration. Thus, a "partial" wavefront, limited in size (number of nodes and connecting edges) continues to evaluate some number of the best paths "so far." The method deletes worst paths, backs out of cul-de-sacs, and penalizes turning around. The method and apparatus may be implemented to manage a computer network, a computer internetwork, parallel processors, parallel processes in a multi-processing operating system, a smart scissor for a drawing application, and other systems of nodes.
Owner:ORACLE INT CORP

Method of and system for producing digital images of objects with subtantially reduced speckle-noise patterns by illuminating said objects with spatially and/or temporally coherent-reduced planar laser illumination

Methods of and systems for illuminating objects using planar laser illumination beams having substantially-planar spatial distribution characteristics that extend through the field of view (FOV) of image formation and detection modules employed in such systems. Each planar laser illumination beam is produced from a planar laser illumination beam array (PLIA) comprising an plurality of planar laser illumination modules (PLIMs). Each PLIM comprises a visible laser diode (VLD, a focusing lens, and a cylindrical optical element arranged therewith. The individual planar laser illumination beam components produced from each PLIM are optically combined to produce a composite substantially planar laser illumination beam having substantially uniform power density characteristics over the entire spatial extend thereof and thus the working range of the system. Preferably, each planar laser illumination beam component is focused so that the minimum beam width thereof occurs at a point or plane which is the farthest or maximum object distance at which the system is designed to acquire images, thereby compensating for decreases in the power density of the incident planar laser illumination beam due to the fact that the width of the planar laser illumination beam increases in length for increasing object distances away from the imaging optics. Advanced high-resolution wavefront control methods and devices are disclosed for use with the PLIIM-based systems in order to reduce the power of speckle-noise patterns observed at the image detections thereof. By virtue of the present invention, it is now possible to use both VLDs and high-speed CCD-type image detectors in conveyor, hand-held and hold-under type imaging applications alike, enjoying the advantages and benefits that each such technology has to offer, while avoiding the shortcomings and drawbacks hitherto associated therewith.
Owner:METROLOGIC INSTR
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