67 results about "Spatially resolved" patented technology

Disclosed are approaches to data acquisition, analysis, and computational forecasting that employs quantitative MRI data to predict the response of cancer to therapy. Example protocols detail how to acquire needed images followed by registration, segmentation, quantitative perfusion and diffusion analysis, model calibration, and prediction. The response of individual cancer patients to therapy is forecast by application of a biophysical, reaction-diffusion model to these data. Application of the protocol results in coregistered MRI data from at least two scan visits that quantifies an individual tumor's size, cellularity and vascular properties. This enables a spatially resolved prediction of how a particular patient's tumor will respond to therapy. A modified therapy can be determined based on predicted response.

Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

A system and method for contact-based spatial frequency domain imaging. A medium to be imaged is contacted by a sheet comprising an array of lighting elements generating illumination light patterns illuminating the medium, and comprising an array of sensor elements measuring spatially resolved images of resulting light patterns reflected back after interaction of the illumination light patterns with the medium. The lighting elements generate illumination light patterns that are spatially modulated in light intensity along a surface of the illuminated medium according to a respective different spatial frequency. A set of spatially modulated images is determined based on the measured resulting light patterns caused by the different illumination light patterns. An image of the medium can be generated based on a combination of the spatially modulated images.

A medical imaging device configured to spatially resolve recording of multispectral video data of an examination area of a patient including a light source having multiple optical emitters with different wavelengths in the visible and NIR spectral range. The light source has an emitter whose wavelength lies in the range of ±50% of its half-width around the intersection of the blue and green filter curves or the green and red filter curves, and the exposure control and the data processing means are arranged to separately detect the affected two of the red and green or the green and blue colour signals in an exposure pattern with activation of the emitter at the intersection point and to evaluate them in the multispectral analysis with mutually different wavelengths shifted by the two affected filter curves as two supporting point wavelengths.

To improve sampling time while collecting microscopic data on the composition of a sample over a wide field of view.SOLUTION: The system includes an infrared radiation source 200 configured to illuminate a broad area of a sample with a beam of infrared radiation, a probe radiation source 222 configured to illuminate the broad area of the sample with a beam of probe radiation, a collector 212 configured to collect as collected probe radiation at least a portion of the probe radiation from each of a plurality of spatially resolved locations on the sample, and at least one camera 250 configured to detect as collected probe radiation at least a portion of the probe radiation from each of the plurality of spatially resolved locations on the sample and generate a signal indicative of infrared absorption corresponding to each of the plurality of spatially resolved locations.SELECTED DRAWING: Figure 2

The detection system of an x-ray or charged particle imaging system utilizes a high bandgap, direct conversion x-ray detection material. The signal of the x-ray / charged particle projection is recorded in a spatial light modulator, for example a liquid crystal (LC) light valve. The light valve is then read out by a polarized light optical microscope and a high speed camera. The camera is used to track the halo in the light valve to resolve its intensity and correlate it to the intensity of the incoming x-ray photons or charged particles. This allows for a spatially resolved imaging with an x-ray and / or charged particle spectrometer.

The invention relates to a sensor device (10) for thermally monitoring a room of a building (1000), comprising a sensor housing (100) which can be mounted on a ceiling or wall of a room; an infrared array sensor (200) which is attached to the side of the sensor housing facing the room and has an IR pixel array and a corresponding IR optical unit for a spatially resolved recording of thermal image pixel data; an image processing unit (300) for processing and analyzing the thermal image pixel data of the infrared array sensor (200); and a central processing unit (400) for detecting objects (40) on the image pixel plane of the thermal image pixel data processed by the image processing unit (300). The central processing unit (400) is adapted so as to track and classify detected objects (40) in order to assign associated data vectors with determined object parameters to the detected objects (40).

The application discloses a wavelength modulation surface plasmon resonance imaging sensing method, which generates multiple groups of illumination spectra by controlling a light-emitting diode, processes the spectra into p-polarized light, excites a sensing chip to generate surface plasmon resonance through prism coupling, collects corresponding reflected light intensity images by using a CMOS camera, and reconstructs surface plasmon resonance reflection spectra of each pixel on the sensing chip by using a smooth constraint reconstruction algorithm according to intensity observation values of the pixel in all images and corresponding illumination spectrum data, so as to further extract a phase signal and generate a spatially resolved phase image. The phase signal and the imaging scheme realize high-sensitivity and high-throughput sensing performance. The method realizes low-cost, high-signal-to-noise ratio and high-throughput sensing imaging.

Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

An image scanning microscope (100, 200) comprises a detection arrangement (112, 204) comprising a beam splitting element (122) configured to receive detection light (120), to split the detection light (120) into two parts, to direct a first part (124a) of the detection light (120) into a first beam path (126a), and to direct a second part (124b) of the detection light (120) into a second beam path (126b). The first beam path (126a) comprises a spatially resolved detector (128, 202) configured to detect a spatial distribution of the intensity of the first part (124a) of the detection light (120). The second beam path (126b) comprises a spectrally resolved detector (130) configured to detect a spectral information of the second part (124b) of the detection light (120). The image scanning microscope (100, 200) further comprises a controller (116) configured to determine a spatial distribution of at least one fluorophore species in a sample (104) based on the spatial distribution of the intensity of the first part (124a) of the detection light (120) and the spectral information of the second part (124b) of the detection light (120).

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.

The invention relates to an apparatus for multimodal analysis of sample material, for example from a tissue, which detects molecular image information from the sample material in a spatially resolved manner, for example using a MALDI time-of-flight mass analyser, records light microscopy image information from the sample material in a spatially resolved manner, and associates the two with improved accuracy to give spatially resolved co-registered overall image information.

This invention discloses a laser measurement method and system for measuring temperature and particle size in non-isothermal multiphase flow, belonging to the field of optical measurement and laser diagnostics. The method includes: generating multispectral illumination light; acquiring RGB color images of the flow before and after transient non-isothermal multiphase flow; separating the two image channels to obtain a single-channel reference image and a single-channel detection image; calculating the logarithmic extinction value of each pixel at the wavelength of that channel based on its single-channel reference image and single-channel detection image; taking any channel wavelength as the reference wavelength, decoupling the temperature-related absorption coefficient and particle size-related scattering coefficient at the reference wavelength based on the logarithmic extinction value and a pre-constructed lookup table; and using a structured index to search the lookup table and invert the temperature and particle size values ​​of each pixel at the reference wavelength, generating a spatially resolved temperature and particle size distribution map at the reference wavelength. This invention improves computational efficiency and reduces system cost.

The invention discloses a spatial resolution microscopic fluorescence detection system and method, and belongs to the technical field of fluorescence detection. The microscopic fluorescence system is composed of five core modules including an exciting light module, a spatial resolution module, a white light illumination module, a signal detection module and a software control module. A light source provided by the excitation light module focuses light on the surface of a to-be-detected sample through the spatial resolution module and separates the to-be-detected sample from a detection point, energy is transmitted by taking the sample as a medium so as to excite fluorescence of the to-be-detected point, a generated signal is collected, processed and stored by the signal detection module, and the white light illumination module is an observation sample. A white light source is provided for a mobile sample and the like, and a software control module provides mechanization, automation and digitization of control for the whole system instrument, so that the spatial resolution effect of the device is more favorably displayed, the practicability and operability are improved, and experimental errors are reduced.

Method for spatially resolved localization of a defect in a component, the method comprising the steps: - Providing (S1) a salience map of a NOK image or a NOK fault class image of a component exhibiting a defect; - Apply (S2) at least one dimension reduction method to the provided salience map to generate a dimensionally reduced salience map; and - spatially resolved localization (S3) of the component defect based on the dimensionally reduced salience map.

The invention discloses a single Rydberg atom receiver multi-target direction of arrival estimation method based on spatial resolution fluorescence spectrum analysis. According to the method, a modulation pattern formed by interference of a plurality of radio frequency signals and a local oscillation field in the steam chamber is obtained through spatial resolution fluorescence imaging, traditional lumped power measurement is replaced, and therefore multi-target spatial information is completely reserved. On the basis, complex spatial modulation caused by a plurality of signals is linearized into superposition of sine waves with different spatial frequencies by utilizing a strong local oscillation condition, so that a multi-target direction-of-arrival estimation problem is converted into a classical frequency spectrum estimation problem. And finally, through spectrum analysis, extracting each spatial frequency and calculating a corresponding direction of arrival. According to the method, through the core steps of spatial resolution imaging, linear modeling and spectral analysis, the limitation that a single Rydberg atom receiver can only estimate a single target is fundamentally broken through, and simultaneous estimation of the directions of arrival of a plurality of signal sources by using a single receiver is realized.

Method for determining reflection properties of a test surface (38) of an optical element (41) that reflects EUV radiation, comprising the following steps: - Generating a measuring beam (26) using an EUV beam generation unit (31), - Positioning the test surface (38) of the optical element (41) in relation to the measuring beam (26) such that the measuring beam hits the test surface (38) at a measuring point and a reflected beam (261) is generated at the test surface (38), - Providing an imaging system (50) in the beam path of the reflected beam (261) between the test surface (38) and a two-dimensionally extended sensor surface (34) such that an image of a beam spot (60, 61) of the measuring beam (26) generated at the measuring point is produced on the sensor surface (34), - spatially resolved detection of the image of the beam spot (60, 61) using the sensor area (34). The invention further relates to a corresponding measuring system suitable for carrying out the method. By spatially resolving the beam spot, the method or the measuring system enables a significantly simplified calibration of the measuring system as well as an improvement in measurement accuracy.

In a method for producing an optical element, at least one substrate is supplied with coating material from at least one source for depositing a respective layer system on the substrate. A plurality of zones (111, 112, 121, 122) that are laterally adjacent to one another in at least one predefined direction and each have a defined layer thickness profile and a defined layer composition are formed by targeted spatially resolved selection and / or treatment of the deposited coating material and / or the substrate. These zones differ from each other in their layer thickness profiles and / or their layer compositions. The average dimension of each of the zones in the predefined direction is between 0.1 mm and 2 cm. The optical element is a mirror array with plural mirror elements. For different substrates of this mirror array, mutually different layer thickness profiles and / or layer compositions of the respectively deposited layer system are generated.

The application discloses a kind of time and space resolution GHz spin precession detection method and system, comprising: obtaining the static synchronous radiation XMCD signal of the magnetic sample to be measured and the information of ferromagnetic resonance under specific frequency;High-frequency microwave signal is extracted from the accelerator center main microwave source and is pulsed with the same frequency (with the same frequency with the synchronous radiation X-ray pulse signal), phase delay, low-frequency modulation, power gain and microwave frequency multiplication processing after inputting plane waveguide to excite sample and generate ferromagnetic resonance;At the same time, the synchronous radiation X-ray is incident on the magnetic sample through waveguide hole, and the photoluminescence signal of the magnetic sample under different phase delays of high-frequency microwave signal relative to X-ray pulse is measured, to obtain dynamic spin precession signal;Finally, change detection position and repeat, realize spatial resolution.The application designs the detection method of system module, utilizes the advantages of synchronous radiation X-ray pulse time structure and small size light spot, realizes time and space resolution GHz spin precession detection.

When measuring a reflectivity of an object for measurement light, initially the object and a reflectivity measurement apparatus are provided. The latter includes a measurement light source, an object holder for holding the object and a spatially resolving detector for capturing measurement light reflected by the object. A measurement light beam impinges on a section of the object within a field of view of the measurement apparatus. The reflected measurement light coming from the impinged-upon section of the object is captured. A surface area of the captured section is at most 50 μm×50 μm. The measurement is performed by the detector. Next, at least one reflectivity parameter of the object is determined on the basis of an intensity of the captured measurement light. The result is a measurement method and a metrology system operating therewith, whereby reflectivities in particular of very finely structured objects, such as lithography masks, can be measured with sufficient precision.

The invention relates to a system (100) for detecting optical signals (20) of a test object (10) that is moved relative to a target (50) in the intended test state, wherein the test object (10) has at least one light source (12) for transmitting the optical signals (20), comprising at least one optical receiving unit (30) for receiving the optical signals (20) of the at least one light source (12), wherein the optical receiving unit (30) is designed for digital high-speed data acquisition with pixels addressable in spatially resolved fashion, in particular in the order of microseconds, wherein the at least one light source (12) is oriented towards the optical receiving unit (30), wherein an intensity of the optical signals (20) is encoded in the pixels of temporally successive image recordings by the optical receiving unit (30). The invention further relates to a method of using a system (100) of this kind for detecting optical signals (20) of a test object (10) that is moved in an intended test state.

To provide an apparatus for spatially resolved measurement of temperature and strain via Brillouin scattering, and a method for spatially resolved measurement of temperature and strain.SOLUTION: An apparatus 10 for digitizing an optical signal comprises: an optical detector 1 configured to detect optical signals and to generate electric signals corresponding to the optical signals; an envelope curve detector 4 configured to determine the amplitudes of the electric signals generated by the optical detector 1 and to output electric signals corresponding to the amplitudes; an analog to digital converter 7 configured to digitize the electric signals output by the envelope curve detector 4 and to output corresponding data; and a variable voltage source 9 having an output unit connected or connectable to an input unit of the envelope curve detector 4, where the apparatus for digitizing the optical signal is configured to calibrate the envelope curve detector 4 with the variable voltage source 9.SELECTED DRAWING: Figure 1

The invention comprises a method for managing cropland, comprising the steps of: (1) measuring, each of a set of spatially resolved locations, level zero data with an orbiting satellite, the level zero data comprising, spectral responses in ranges of 400 to 00; 1,100 to 2,500; and 2,500 to 12,000 nm; (2) processing, on-board the orbiting satellite, the level zero data comprising a first data storage size, to yield crop condition information comprising a second data storage size of less than one percent of the first data storage size; (3) measuring, on-board the orbiting satellite, crop transpiration with the near-infrared radiation to determine drought locations of the set of spatially resolved locations; (4) receiving from the orbiting satellite to a ground based communication system the crop condition information including the drought locations; and (5) relaying at least a portion of the crop condition information to a farmer within twenty-four hours.

The invention relates to a method and a device for spatially resolved localization of defects of a component. The invention relates to a method for spatially resolved localization of a defect of a component, comprising the following steps: providing (S1) a saliency map of a NOK image or a NOK defect-like image of a component having a defect; applying (S2) at least one dimensionality reduction method to the provided saliency map for generating a dimensionality-reduced saliency map; and-spatially resolved localization (S3) of defects of the component on the basis of the dimensionality-reduced saliency map.

An X-ray microscopy system and method for phase contrast and dark-field imaging utilize a partially coherent X-ray beam generated by a micro-focused X-ray source with a small focal spot size. A spatial beam modulator such as a random phase object, e.g., silicon carbide sandpaper, is placed between the source and the sample to create a random granular speckle pattern. The system employs a high-resolution detection setup with a thin scintillator and a spatially resolved detector with small pixel size to capture shifts in the speckle pattern caused by the sample's refraction effects. By analyzing these shifts, the system computes phase gradients and integrates them to produce detailed phase images, enhancing contrast in low-atomic-number materials like soft tissues and polymers. The compact design reduces source-to-detector distance, improving flux efficiency and system throughput while enabling high-resolution, three-dimensional tomographic imaging.

Device (10) for detecting the position of a body (12), in particular for detecting errors in several degrees of freedom, wherein the device (10) comprises a transmitter unit (14), at least one spatially resolving sensor (16), an evaluation and control unit (18), and a target element (20) with three retroreflectors (22), wherein the transmitter unit (14) is configured to emit three parallel light beams (24), wherein the retroreflectors (22) are configured to reflect one of the three light beams (24) back to the transmitter unit (14) as a retroreflected light beam (26), wherein the at least one spatially resolving sensor (16) is configured to detect a first signal, wherein the transmitter unit (14) is configured to detect a second signal from the three retroreflected light beams (26), and wherein the evaluation and control unit (18) is configuredto determine, by means of the first signal and the second signal, six degrees of freedom of the body (12) exhibiting a position error (48), a first translation error (50), a second translation error (52), a roll error (54), a yaw error (56) and a pitch error (58), wherein the evaluation and control device (18) is configured to determine, by means of the first signal, the first translation error (50), the second translation error (52) and the roll error (54) and, by means of the second signal, the position error (48), the yaw error (56) and the pitch error (58).

The invention relates to a differential phase polarimeter (10), comprising a light source (12) for polarized irradiation light (14); a sample chamber (16) for a test object (18), the sample chamber (16) being arranged such that the test object (18) can be irradiated with the irradiation light (14); a linear polarizer (20) arranged downstream of the sample chamber (16) in the light propagation direction; and a detector (22) arranged downstream of the linear polarizer (20) in the light propagation direction and designed to detect a light intensity of the irradiation light (14) which has passed through the linear polarizer (20); wherein the detector (22) is spatially resolving and arranged in such a way that both test object light (32) which has passed through the test object (18) and background light (34) which has not passed through the test object (18) can be detected.

Method for spatially resolved measurement of a physical quantity, comprising the following process steps: Laser radiation is generated, the laser radiation is modulated, the method utilizing an OFDR measurement technique in which amplitude-modulated signals are formed from the laser radiation by modulation with modulation frequencies, the modulation frequency being changed in successive time intervals such that in a first time interval the laser radiation is modulated with at least one first modulation frequency and that in a second time interval, which follows the first time interval, the laser radiation is modulated with at least one second modulation frequency which is different from the first modulation frequency, to measure the physical quantity the modulated laser radiation is coupled into an optical fiber (3),Backscatter signals are generated in the optical fiber (3) by the laser radiation, the backscatter signals are coupled out of the optical fiber (3), the backscatter signals coupled out of the optical fiber (3) are detected, the physical quantity is determined spatially resolved from the detected backscatter signals, wherein, in the modulation of the laser radiation, the amplitude of the laser radiation is modulated with at least two different modulation frequencies in each time interval.

An apparatus for measuring alignment errors of a laser diode or other directional beam source (12) includes a holder (22) for the beam source (12) rotatably mounted about an axis of rotation (18) by a drive (18). The apparatus also includes a first spatially resolved radiation sensor (36), a beam splitter (26) that splits a beam (24) generated by the beam source (12) into a first partial beam (28) and a second partial beam (30), and focusing optics (32). The focusing optics is positioned in the radiation path of the first partial beam (28) and has a focal plane in which the first radiation sensor (36) is positioned. A second spatially resolved radiation sensor (38) is positioned in the radiation path of the second partial beam (30). The computing device (40) calculates the tilt (d) and lateral shift (α) of the beam (24) generated by the beam source (12) from a first position on the first radiation sensor (36) swept by the first partial beam (28) during rotation of the beam source (12), and from a second position on the second radiation sensor (38) swept by the second partial beam (30) during rotation of the beam source (12).