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1593 results about "Microscopic image" patented technology

Method for analyzing pore structure of solid material based on microscopic image

InactiveCN101639434ACalculated pore sizeCalculate porosityPermeability/surface area analysis3D-image renderingPorosityMicroscopic image
The invention provides a method for analyzing the pore structure of solid material based on microscopic image, belonging to the technical field for analyzing the pore structure of the solid material.The method is characterized of: obtaining the CT single cross section image of the solid material by microscopic CT scanning; using computer language to digitally image process the CT single cross section image; taking the pixel side of the image as the size of hole diameter; computing the hole diameter of the solid material, porosity and change regularity of the hole diameter and the porosity based on the microscopic CT single image; selecting the CT single image after processing a plurality of digital image; generating a CT image sequence; three dimensionally rebuilding the CT single image with a volume rendering algorithm in a visual rebuilding algorithm; generating the three dimensional digital image of the solid material; and computing the hole diameter of the solid material, the porosity and the change regularity of the hole diameter and the porosity based on the microscopic CT single image. The method is widely used for analyzing and computing the hole size and the porosity of the solid material under the various hole sizes of the solid material.
Owner:TAIYUAN UNIV OF TECH

Automatic focusing microscope based on eccentric beam method and focusing method thereof

The invention discloses an automatic focusing microscope based on an eccentric beam method and a focusing method thereof. The hardware comprises an eccentric beam defocus amount detection module, a microscopic imaging module, a piezo lens drive, an XY stage and a computer processing system. The defocus amount detection module transmits a semicircular laser beam to irradiate the surface of a sample and acquire a semicircular spot image formed by sample reflection. The computer processing system uses self-adaptive median filtering, Canny edge detection based on OSTU, the least square fitting and other algorithms to process the grayscaled spot image to acquire spot radius. According to a radius-defocus amount linear relationship model, the sample defocus amount in a field of vision can be calculated. The piezo lens drive drives a lens to compensate the defocus amount. After focusing, the microscopic imaging module acquires a clear sample image. The automatic focusing microscope based on the eccentric beam method and the focusing method thereof, which are provided by the invention, have the advantages of fast focusing speed, high focusing accuracy and large linear range, and can meet the requirement of fast and precise focusing of the microscope under a high power lens.
Owner:SHANGHAI JIAO TONG UNIV

System and method for intelligent water treatment micro-organism machine vision identification

The invention provides an intelligent water-treatment microorganism machine vision identification system and a method. By using artificial intelligent technology, the system and the method can real-timely shoot microscopic images of microorganism in water and carry out the steps of automatic image pre-treatment, image segmentation, microorganism characteristic parameter extraction and selection, and microorganism classification and identification. The system and the method have the advantages that optimal segmentation threshold value can be searched automatically in HIS color space by using self-adaptive image segmentation algorithm; and the classifier is designed in a voting manner to obviate the low classification accuracy by using single classifier so as to effectively improve the entire classification accuracy and accurately identify microorganisms in drinking water and urban domestic sewage. The implementation of the method can further shorten the microorganism detection period in the water treatment process and accurately predict the condition of the water-treatment microorganisms to allow the operators to take measures in time. Accordingly, the method and the system can powerfully ensure the safety of drinking water and the normal operation of urban domestic sewage treatment facility so as to achieve considerable economic and social benefits.
Owner:吴俊 +2

Method and device of stimulated emission depletion (STED) microscopy based on tangential polarized light

The invention discloses a stimulated emission depletion (STED) microscopy method based on tangential polarized light. The stimulated emission depletion microscopy method comprises the following steps of: respectively converting a first laser beam and a second laser beam into first tangential polarized light and second tangential polarized light; projecting the first tangential polarized light onto a fluorescence sample to form an exciting light spot after phase modulation; decomposing the second tangential polarized light into a first working beam and a second working beam, and carrying out phase modulation on the first working beam and the second working beam to form a first STED beam and a second STED beam; projecting the first STED beam and the second STED beam onto the fluorescence sample to form a corresponding STED light spot through incoherence addition, wherein the central point of the STED light spot coincide with the central point of the exciting light spot to obtain a focusing light spot; and collecting fluorescence emitted by the fluorescence sample under the action of the focusing light spot, and obtaining a microscopic image after processing. The invention also discloses an STED microscopy device based on the STED microscopy method. According to the STED microscopy method and the STED microscopy device, a higher resolution can be realized under the same working light intensity.
Owner:ZHEJIANG UNIV

Microscopic image fusing method based on two-dimensional empirical mode decomposition

The invention relates to a microscopic image fusing method based on two-dimensional empirical mode decomposition, which comprises the following steps: performing multi-scale decomposition on the acquired ordered microscopic original images by using a two-dimensional empirical mode decomposition method, thereby acquiring the multi-scale high-frequency components of original images; fusing the multi-scale high-frequency components according to local obvious standard; fusing the low-frequency components of the original images by using a principal component analysis method; and finally reversely recomposing to acquire a merged image. By using the method provided by the invention, the multi-scale decomposition is performed on the acquired ordered microscopic original images by using the two-dimensional empirical mode decomposition method and the decomposition process is adaptive; high-frequency fusing treatment is performed according to the local obvious standard based on a big area value and the relevance between adjacent coefficients is considered, so the detail information clearly focused of each original image can be supplied; and the low-frequency fusing treatment is performed by using the principal component analysis method, so the relevant information of original image pixel is utilized and the visual decoding effect of the merged image is increased, thereby increasing the quality of the fused image.
Owner:NAT SPACE SCI CENT CAS

Complex index refraction tomography with sub lambda/6-resolution

The present invention discloses a method to improve the image resolution of a microscope. This improvement is based on the mathematical processing of the complex field computed from the measurements with a microscope of the wave emitted or scattered by the specimen. This wave is, in a preferred embodiment, electromagnetic or optical for an optical microscope, but can be also of different kind like acoustical or matter waves. The disclosed invention makes use of the quantitative phase microscopy techniques known in the sate of the art or to be invented. In a preferred embodiment, the complex field provided by Digital Holographic Microscopy (DHM), but any kind of microscopy derived from quantitative phase microscopy: modified DIC, Shack-Hartmann wavefront analyzer or any analyzer derived from a similar principle, such as multi-level lateral shearing interferometers or common-path interferometers, or devices that convert stacks of intensity images (transport if intensity techniques: TIT) into quantitative phase image can be used, provided that they deliver a comprehensive measure of the complex scattered wavefield. The hereby-disclosed method delivers superresolution microscopic images of the specimen, i.e. images with a resolution beyond the Rayleigh limit of the microscope. It is shown that the limit of resolution with coherent illumination can be improved by a factor of 6 at least. It is taught that the gain in resolution arises from the mathematical digital processing of the phase as well as of the amplitude of the complex field scattered by the observed specimen. In a first embodiment, the invention teaches how the experimental observation of systematically occurring phase singularities in phase imaging of sub-Rayleigh distanced objects can be exploited to relate the locus of the phase singularities to the sub-Rayleigh distance of point sources, not resolved in usual diffraction limited microscopy. In a second, preferred embodiment, the disclosed method teaches how the image resolution is improved by complex deconvolution. Accessing the object's scattered complex field—containing the information coded in the phase—and deconvolving it with the reconstructed complex transfer function (CTF) is at the basis of the disclosed method. In a third, preferred embodiment, it is taught how the concept of “Synthetic Coherent Transfer Function” (SCTF), based on Debye scalar or Vector model includes experimental parameters of MO and how the experimental Amplitude Point Spread Functions (APSF) are used for the SCTF determination. It is also taught how to derive APSF from the measurement of the complex field scattered by a nanohole in a metallic film. In a fourth embodiment, the invention teaches how the limit of resolution can be extended to a limit of λ/6 or smaller based angular scanning. In a fifth embodiment, the invention teaches how the presented method can generalized to a tomographic approach that ultimately results in super-resolved 3D refractive index reconstruction.
Owner:ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
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