581 results about "Optical microscope" patented technology

The invention discloses a metallographic detection method and system based on image recognition, and belongs to the technical field of metallographic detection. The detection method comprises the following steps: image acquisition and preprocessing: acquiring a metal metallographic image by an optical microscope, performing median filtering and denoising, and extracting a grain boundary by adaptive binarization; and field-of-view and scale calibration: selecting a corresponding scale according to the shooting magnification. The multi-parameter automatic measurement comprises grain size analysis, grain size rating, second phase analysis and intelligent report generation, a report is automatically generated based on a preset template and comprises an original image, a binary image, measurement data and a histogram, and report fonts and layout can be adjusted in real time through a visual control. According to the detection method disclosed by the invention, the efficiency, the precision and the reliability of metallographic structure analysis of the metal material are remarkably improved through the full-process design of image acquisition standardization, preprocessing intellectualization, data analysis automation and report generation templating.

The invention discloses a method for automatically evaluating the average grain size of a metal material by using a cross-point method, and relates to the field of metal material metallographic image analysis, and the method comprises the following steps: selecting an identification model according to a tested material; inputting the optical microscope image pic into a system with an identification model; extracting scale information of the input image pic by using mask extraction and Hough straight line detection: firstly extracting a scale region by using a mask, then extracting a scale length by using a Hough straight line detection algorithm, and finally extracting a scale value by using a KNN classifier; and identifying the grain boundary pixels of the input image by using the selected identification model: classifying each pixel of the input optical microscope image pic by using UNet, judging whether the pixel is the grain boundary pixel, finally performing optimization, performing intercept method rating according to the optimized grain boundary image, counting the number of intersections per unit length, and calculating the grain size G. According to the method, the precision and consistency of grain size evaluation are remarkably improved.

The invention discloses an annealing temperature control method based on a differentiated ohmic contact material, and aims to solve the problems that the annealing temperature of an N-surface Au / Ge ohmic contact layer of an existing AlGaInP-based red light Micro-LED is not accurately monitored, a temperature field is not uniform and is difficult to detect, and abnormal response lags, the method comprises seven steps of processes (two times of patterning, two times of metal coating, two times of photoresist removal, annealing and observation), and the annealing temperature of the N-surface Au / Ge ohmic contact layer of the existing AlGaInP-based red light Micro-LED is controlled. Preparing a first Au / Ge ohmic contact layer (for function) and a second Au / Ge / Ni ohmic contact layer (for detection) on the N surface of the wafer; by means of the characteristic that Ni inhibits Au / Ge agglomeration, the two-layer agglomeration state difference is observed through an optical microscope, and the temperature is judged (in the normal state, the former agglomerates, and the latter does not agglomerate); the method is convenient in detection, supports batch detection, can find temperature abnormity in real time, improves the process stability, and is suitable for industrial mass production.

Disclosed in the present invention is a stimulated emission depletion and super-resolution fluorescence lifetime imaging method, which is applied to the technical field of optical microscope imaging. The method provided in the present invention combines the stimulated emission depletion and fluorescence lifetime imaging principles, a depletion laser pulse frequency used therein is half of an excitation light pulse frequency, and a time interval between two pulse sequences is adjusted, such that a depletion laser pulse follows an adjacent excitation light pulse; and analysis processing is performed on collected fluorescence lifetime data, such that a super-resolution fluorescence lifetime image is obtained, thereby solving the problem of the fluorescence lifetime of a stimulated emission depletion and fluorescence lifetime imaging microscope being significantly shortened under the action of a high-energy depletion laser, and thus accurately reflecting real information of a fluorochrome and a micro-environment. Therefore, the innovative technique provides important technical support for life science research, significantly improves the accuracy and effectiveness of research, and promotes further development in the field of biomedicine.

The invention provides a floor wear resistance detection method and system, is applied to the technical field of floor wear detection, and reflects the wear resistance of a floor coating by obtaining the variation of porosity before and after floor wear. When the porosity after abrasion is obtained, a two-dimensional optical image of a to-be-detected surface is collected through multi-direction illumination, and the image is subjected to alignment processing. By analyzing the light and shade change information and the shadow form information of the dark area in different illumination directions, when the light and shade change information of the dark area changes along with the change of the position of the light source and the shadow form information shows the dynamic change of rotation or movement, it is judged that the hole is the floor hole. The discrimination mechanism based on the illumination dynamic change effectively solves the problem that a two-dimensional optical microscope scheme in the prior art cannot distinguish real pores and shallow scratches, and avoids misjudgment of scratches generated by a large amount of wear as pores, thereby significantly improving the accuracy of porosity calculation after wear.

A deep learning-based super-resolution fluorescence lifetime imaging microscopy (SR-FLIM) method includes the steps of: S1, performing fluorescence microscopic imaging on a sample to obtain confocal intensity images and stimulated emission depletion (STED) intensity images at a same location; S2, co-registering the acquired confocal and STED intensity images; S3, pairing the co-registered confocal and STED intensity images as input (Input) and ground truth (GT) to assemble a dataset; S4, partitioning the dataset into training and validation sets following a predefined ratio; and S5, constructing a network, and selecting hyperparameters and an optimizer. This method may achieve SR-FLIM within a conventional confocal FLIM system, surpassing spatial resolution limitations of FLIM, breaking through resolution barriers of conventional optical microscopy, while preserving normal fluorescence lifetime characteristics of fluorescent probes.

The invention relates to the technical field of section analysis of printed circuit boards, in particular to a section analysis method for PCB positioning cutting, a target abnormal area is positioned on a PCB through an optical microscope, the optical microscope not only can observe the morphology of the surface layer of a sample, but also can observe the morphology within a certain range below the surface layer, and the accuracy of section analysis is improved. And meanwhile, the optical microscope is very sensitive and accurate in color identification, so that compared with the prior art in which the target abnormal area is positioned on the PCB through a scanning electron microscope, the target abnormal area can be more effectively positioned on the PCB, and the purpose of reducing the positioning difficulty of the target abnormal area is achieved. Besides, the positioning layer and the protection layer are deposited in the target abnormal area, so that the cross section sample can be prevented from being physically and chemically damaged in the cutting process on the basis of improving the cutting precision of the cross section sample, and the failure analysis precision of the PCB is improved.

The invention relates to the field of cell analysis, and provides a multi-mode digital micro-fluidic system and method for cell sorting analysis, the system comprises an active digital micro-fluidic platform, the active digital micro-fluidic platform comprises a micro-fluidic chip, an upper computer control system and an FPGA hardware circuit, an upper computer generates a liquid drop path planning instruction, the FPGA hardware circuit converts the liquid drop path planning instruction into an electrode driving signal, and the electrode driving signal is transmitted to the micro-fluidic chip; the nanoliter-grade liquid drops are driven to change between the electrodes; the optical tweezers platform comprises a laser device, an optical microscope and a CMOS camera, laser beams are generated by the laser device to form a three-dimensional optical potential well, the laser beams are transmitted into the micro-fluidic chip through the optical microscope to realize non-contact control on cells, and the CMOS camera records images and transmits the images back to the upper computer; the objective table clamp is used for realizing cooperative control of the optical tweezers and the active digital microfluidics; and the image recognition system is used for recognizing morphological characteristics of cells in the liquid drops based on a convolutional neural network and screening target cells. According to the invention, integration of high-throughput nondestructive cell sorting and in-situ multi-modal analysis is realized.

The present invention provides a real-time flow cytometric analyzer of single-cell dynamics combining droplet microfluidics and multimodal optical microscopy, and belongs to the field of cell biology experimental devices. The analyzer comprises a cell / signal loading & acquisition and control system, a high-throughput microfluidic single-cell manipulation chip, a multi-channel optical microscopy and multimodal signal acquisition and control system, and a data processing and analysis system. Based on droplet-based microfluidic chip technology, multimodal optical microscopy technology, single-cell dynamics theoretical modeling and analysis methods, and artificial intelligence technology, the integrated detection of spatiotemporal information of single-cell dynamics can be realized. The analyzer provides a new rapid and accurate single-cell dynamics analysis platform for exploring the occurrence and development mechanism of major human diseases, disease diagnosis, cell sorting and drug screening, etc.

A super-resolution single-objective light-sheet optical microscopy system and method, and a related imaging system, are configured to generate two light sheets that are guided to a single objective. The single objective is configured to allow the two light sheets to transmit through same and interfere with each other to generate structured light fringe regions. The single objective is further configured to receive a fluorescence signal that is recorded by a fluorescence detection module.

The invention relates to the technical field of material mechanical property testing, and discloses a material indentation and scratch testing device and method under a composite energy field, and the device comprises a supporting experiment table, a vertical micro-motion platform, a horizontal micro-motion platform, a high-definition optical microscope, a force sensor, a displacement sensor and an additional energy field generation system. According to the method, a controllable additional energy field is synchronously applied while a mechanical indentation or scratch load is applied to a hard and brittle material sample, and load displacement data is collected in real time. In the data processing stage, the real hardness is calculated by adopting a corrected proportion sample resistance model, the elastic modulus is calculated based on the Oliver-Pharr theory, and the fracture toughness of the material is analyzed and calculated according to the size of the indentation tip crack. The problem that in-situ mechanical property characterization cannot be carried out in a composite energy field in a traditional test is solved, the hardness calculation precision is improved, the fracture toughness measurement function is expanded, and the experimental device and method are provided for research of a hard and brittle material composite machining mechanism.

The invention belongs to the technical field of semiconductor material detection, and particularly relates to a method for representing micro-defects of a near-perfect czochralski silicon wafer by regulating and controlling near-surface copper concentration. The invention discloses a method for representing micro-defects of a near-perfect czochralski silicon wafer by regulating and controlling the concentration of near-surface copper. The method specifically comprises the following steps: (S.1) cleaning the silicon wafer and immersing the silicon wafer into a copper nitrate solution for standing; (S.2) rinsing the silicon wafer with ionized water, taking out the silicon wafer and airing the silicon wafer; (S.3) performing high-temperature heat treatment on the silicon wafer for a period of time, and quickly cooling; (S.4) carrying out chemical polishing on the cooled silicon wafer; (S.5) horizontally placing the silicon wafer in the corrosive liquid; and (S.6) observing the surface of the silicon wafer by using an optical microscope or a scanning electron microscope so as to display the microdefects. According to the invention, copper precipitates at different depths are observed after copper is introduced at high temperature, so that the microdefect condition of the silicon wafer can be reflected. The method can clearly display the micro-defects in the nearly perfect czochralski silicon wafer, and has high detection efficiency and accuracy. The method is easy to operate, low in cost and suitable for silicon wafer microdefect detection in large-scale production.

Systems and methods for capturing and processing image data captured by an optical microscope, such as an Open Top Light Sheet (OTLS) microscope are disclosed. Image data can be processed by techniques including flat fielding, image depth correction, and edge correction, and pixel classification and image segmentation techniques can be applied to more accurately identify lipid droplets and fibrous structures for assessment of, for example, steatosis and fibrosis in human liver biopsy tissue samples. Systems and methods are also related to capturing low resolution images of a sample, identifying regions of interest, and then capturing high resolution image of the regions of interest to reduce memory used for storage, increase computation speed, and reduce computational power.

The present invention provides a metal material that is particularly suitable for use as a component of a compression-sealed glass hermetic seal, that has high bonding reliability with the sealing glass, that allows a large current to pass through it even with a small diameter, that can realize a lead pin that generates little heat when current is passed through it, that can appropriately compress the sealing glass and lead pin in the plate surface direction, that has high bonding reliability with the sealing glass, and that can realize a stem base that has excellent heat dissipation performance in the plate thickness direction. [Solution] The composite consists of a [Cr and / or Mo]-Cu composite having a metal structure in which Cr phases and / or Mo phases are dispersed in a Cu matrix. This [Cr and / or Mo]-Cu composite is a diameter-reduced, elongated powder metallurgy compact, and when cross-sectionally observed with an optical microscope, it has a cross-sectional structure in the elongation direction in which lamellar or linear Cr phases and / or Mo phases are dispersed in the Cu matrix, and a cross-sectional structure perpendicular to the elongation direction in which flake-like, small platelet-like, or granular Cr phases and / or Mo phases are dispersed in the Cu matrix.

The invention relates to the technical field of material analysis, in particular to a light microscope-field emission electron microscope combined shale rock slice analysis and identification method, which comprises the following steps of: firstly, combining a brightness distribution condition represented by a bright field image of a shale rock slice and a birefringence deviation condition represented by a cross polarization image from an optical angle; determining a mineral discrimination index representing an atomic number agent; applying offsets of different sizes based on the distribution condition of mineral discrimination indexes and the surface fluctuation condition of shale rock slices, and determining a position offset vector by combining gray scale gradient distribution on the basis; and finally, determining the cross-scale positioning and more accurate electron microscope objective table coordinates corresponding to each pixel point in combination with a position offset vector in a pixel coordinate conversion process based on an image physical distance scale and rotation translation processing, so that the cross-scale positioning accuracy of the optical microscope and the field emission scanning electron microscope is higher. The reliability of analyzing and identifying the shale rock slice is obviously improved.

The invention relates to the technical field of biomedicine detection reagent manufacturing and reproductive medicine, in particular to an embryonic development potential sperm key protein kit and a use method thereof. The method is characterized in that an antibody combination capable of specifically recognizing a group of key proteins related to embryonic development potential in human sperms is prepared, and the antibodies, a fluorescence labeled secondary antibody, a cell nucleus dye, a concentrated washing liquid, a mounting medium and a pre-coated control porous glass slide are assembled into the special detection kit. The kit can be combined with a multi-mode imaging system (such as a fluorescence / confocal microscope and a common optical microscope) and image analysis software to realize the traditional analysis of sperm morphology and movement ability, and can perform synchronous and accurate qualitative and quantitative analysis with the expression level and subcellular localization of the key protein. The invention provides an integrated molecular detection solution, and provides a powerful tool for sperm quality screening and embryonic development potential prediction in an assisted reproduction technology.

The invention focuses on optimization of process parameters of titanium alloy, mainly aims at solving the problems of poor interlayer bonding degree, incomplete fusion, more pores and the like caused by titanium alloy additive manufacturing under certain parameters, provides a research method for process parameters of titanium alloy laser additive manufacturing, and relates to the field of laser additive manufacturing. According to the method, parameter optimization logic is determined, and a unique optimization path of titanium alloy additive manufacturing is provided by combining grain morphology, defect distribution and mechanical properties. The analysis method mainly comprises optical microscope metallographic analysis and mechanical property testing, the structure observation precision is improved, and the isotropy of the titanium alloy additive part is evaluated by testing the tensile strength, the yield strength and the ductility. The interlayer bonding problem of titanium alloy additive manufacturing is solved in a targeted mode. The method is suitable for the manufacturing field of aerospace, medical implants and high-corrosion-resistance parts, and the comprehensive performance and isotropy of additive manufacturing components are improved.

The invention discloses a dual-mode microscope and a special assembly, an operation method and application thereof, the dual-mode microscope comprises an optical microscope assembly and a lensless microscopy assembly, the optical microscope assembly and the lensless microscopy assembly form a switchable dual-mode microscope, a lensless microscopy mode is used for preliminary screening of a to-be-tested sample, and the optical microscope mode is used for accurate observation of the to-be-tested sample; the lensless microscopy assembly comprises a first light source, an image sensor and an image signal processor; in the lensless microscopy mode, the first light source and the image sensor are located on the two sides of a to-be-detected sample on the objective table, when light emitted by the first light source passes through the to-be-detected sample, the image sensor receives an optical signal and converts the optical signal into an electric signal, and the image signal processor converts the electric signal into an interference or diffraction image; and the image is restored into an image which can be directly observed. According to the dual-mode microscope, through dual-mode switching, the observation precision is guaranteed, meanwhile, the workload is greatly reduced, and too high requirements for the detection resolution of lensless microscopy are not needed.

This invention provides a PAM staining method that enables staining suitable for magnified observation of various samples using a range of microscopes, from optical microscopes to electron microscopes. [Solution] A PAM staining method comprising the steps of: silvering a biological sample; coloring the biological sample; and fixing the color of the biological sample, wherein the biological sample is a biologically derived sample that has been oxidized; the silvering step involves immersing the biological sample in a methenamine silver aqueous solution at room temperature, raising the methenamine silver aqueous solution from room temperature to 62°C or higher and 68°C or lower, and carrying out the silvering reaction for 30 to 40 minutes from the start of the reaction at room temperature; the coloring step involves immersing the silvered biological sample in a 0.2% gold chloride aqueous solution at room temperature for 8 to 12 hours; and the fixing step involves immersing the sample in a hard film fixing solution containing 11% to 13% sodium thiosulfate and aluminum potassium sulfate dodecahydrate for 3 minutes or more at room temperature.

A light irradiation apparatus focuses light on a surface or an inside of an object to observe or process the object, and includes a laser light source, a lens, a lens, a mask, a wave plate, and a lens. The mask is a multi-ring mask for spatially intensity-modulating input light in a beam cross-section and outputting modulated light, and includes a plurality of ring-shaped light-shielding areas provided around a center position, and a transmitting area provided between two adjacent light-shielding areas out of the plurality of light-shielding areas. A radial width of each of the two adjacent light-shielding areas out of the plurality of light-shielding areas is larger than a radial width of the transmitting area provided between the two light-shielding areas.

The invention relates to a control method for improving EDT roller texturing efficiency and high-surface automobile aluminum plate oil storage amount. The control method comprises the steps that (1) a single-rack cold rolling mill is adopted; (2) carrying out roller surface treatment by adopting an electrode electric spark roller grinder, wherein the roughness Ra of a working roller before roughening is less than or equal to 0.4 mu m; the roughness Ra after EDT roughening is equal to 1.95 to 2.2 [mu] m; (3) a single-rack cold rolling mill is adopted for production, the rolling oil temperature is 35 + / -5 DEG C, and the rolling oil pressure is 6.0-9.0 bar; (4) an air cushion type continuous annealing line is adopted for cleaning and solid solution aging treatment; (5) carrying out surface appearance and pit size measurement on the prepared aluminum plate by adopting a 3D optical microscope; and (6) the manufactured aluminum plate is measured through a 3D non-contact optical contourgraph. By means of the method, the requirements for the surface roughness Ra and Rpc of the automobile sheet can be met, the downstream stamping cracking risk and the corrosion spot defect caused by the too large surface pit diameter are reduced, the better high-surface automobile sheet, the higher aluminum sheet surface oil storage amount and the lower friction coefficient can be obtained, and the EDT roller texturing working time can be saved.

The invention discloses a method for measuring the thickness of a thin film through an atomic force microscope assisted by a low-power optical microscope, which comprises the following steps of: pre-aligning the tip of a probe of the atomic force microscope with a step of a sample to be measured by virtue of the low-power optical microscope, and then controlling the tip to descend to a first height of the surface of the step; the needle tip is lifted under real-time monitoring, the needle tip and the surface of the sample are located in the focal plane range of the low-power optical microscope, the position of the probe is adjusted, and the projection of the needle tip is located over the step to complete accurate positioning. Starting a linear scanning mode, carrying out single-line scanning in a direction perpendicular to the step extension direction, dynamically adjusting scanning range parameters until a scanning curve presents a step-shaped characteristic, adjusting the scanning curve to a view center, switching a line-by-line scanning mode to obtain three-dimensional shape data, and obtaining the film thickness of the to-be-detected sample based on the three-dimensional shape data. According to the method, the probe and sample positioning process is optimized, scanning parameters and a data processing method are reasonably set, and the problems of long time consumption and low precision of measuring the film thickness by the atomic force microscope under the assistance of the low-power light microscope are effectively solved.

The invention discloses a method for measuring the molar concentration of nano-particles. The method comprises the following steps: diluting a nano-particle suspension with a high-molecular polymer solution or dispersing nano-particle powder into the high-molecular polymer solution; transferring the suspension liquid to a spacing net on the side of a sample pool in an electrophoresis tank; nano-particles migrate from the sample pool to the buffer pool under the driving of the electric field and are uniformly distributed on the spacing net in a single-particle manner; performing single-particle imaging on the spacing net by using an optical microscope; and counting the number of the nanoparticles in the image so as to measure the molar concentration of the nanoparticles in the sample. The method can be used under the condition that the properties of the nanoparticles are unknown or no standard substance exists, the detection object has no additional condition, and the accuracy is high.

The invention relates to an all-solid-state battery thin-layer electrode device for multi-mode in-situ interface research. The all-solid-state battery thin-layer electrode device comprises the following components: a solid electrolyte substrate; the functional thin layer is arranged on the surface of the solid electrolyte substrate; the functional thin layer has conductivity; the functionalized thin layer allows a detection signal of an in-situ characterization technology to effectively penetrate or be reflected from the surface of the functionalized thin layer; the in-situ characterization techniques include atomic force microscopes, optical microscopes, and Raman spectroscopy, X-ray photoelectron spectroscopy, infrared spectroscopy, or X-ray diffraction. The invention provides a universal thin-layer electrode design and system and a thin-layer electrode in-situ imaging and spectroscopic characterization method for all-solid-state battery interface reaction. The objective of the invention is to expose a solid electrolyte-electrode interface reaction process which is difficult to observe in an effective detection range of various characterization technologies so as to realize real-time and in-situ visualization and accurate analysis of a dynamic evolution process of an internal interface of an all-solid-state battery.

A large-field-of-view, high-throughput and high-resolution pathological section analyzer includes an image collector for collecting a set of computing microscopic images of a pathological section sample; a data preprocessing circuit for iteratively updating the set of computing microscopic images by a multi-height phase recovery algorithm to obtain a low-resolution reconstructed image; an image super-resolution circuit for super-resolving the low-resolution reconstructed image according to a pre-trained super-resolution model to obtain a high-resolution reconstructed image; and an image analysis circuit for automatically analyzing the high-resolution reconstructed image according to different tasks, and specifically selecting different analysis models according to the different tasks to obtain corresponding auxiliary diagnosis results. Imaging visual field of the pathological section analyzer is hundreds of times that of the traditional optical microscope, a deep learning network is adopted to analyze pathological conditions of unstained pathological sections, so that the analysis process of pathological sections is simplified.

In various aspects, microscope systems are described, comprising or corresponding to optical microscopes, such as for example a transillumination microscope or a fluorescence microscope. The microscope systems may be used independently or configured with or integrated into another device or system, such as an imaging mass spectrometer or imaging mass cytometer. In various embodiments of this aspect, the microscope system is used to obtain one or more images of a sample, such as at a variety of different light collection wavelengths and / or for a variety of different illumination conditions. The microscope systems can employ various optical components and configurations allowing for high throughput imaging, such as components for imaging the sample at suitable resolutions with a wide field of view and / or for spatially separating different detection channel wavelengths from light output (e.g., transmitted or emitted light) from the sample.

The invention provides a testicular artery intelligent recognition system and method based on multi-modal fusion and dynamic learning, and is suitable for microscope spermatocord vein ligation. The system integrates an optical microscope, an ultrasonic probe and an electrophysiological device, optical images, ultrasonic blood flow and electrophysiological signal characteristics are fused through a multi-branch neural network, and high-precision real-time identification and three-dimensional navigation of testicular arteries are realized in combination with an intra-operative online fine tuning and postoperative feedback optimization mechanism. The method comprises the processes of collaborative labeling of multi-modal data, dynamic fusion training, real-time multi-modal processing, closed-loop decision support and the like. According to the method, through multi-modal information complementation and model adaptive learning, the recognition accuracy is improved to 97.3%, the false pricking rate is reduced to 1% or below, the operation safety and efficiency are effectively improved, and the method has high environmental adaptability and model evolution ability and is suitable for microsurgery operation navigation scenes.

The invention discloses a multi-mode nanometer measurement system and method based on terahertz scattering type scanning near-field optical microscopy and multi-frequency electrostatic force microscopy, and belongs to the technical field of near-field imaging, the measurement system comprises an AFM main body, a terahertz source, an optical path system, a terahertz detector, a multi-frequency signal generator and two phase-locked amplifiers; terahertz waves emitted by the terahertz source reach the terahertz detector through the optical path system, and near-field optical signals are obtained. The AFM comprises a metal coating probe; the multi-frequency signal generator generates sinusoidal signals with frequencies of omega1 and omega2; a sample is placed on the scanner, and the cantilever beam is controlled to vibrate at the frequency omega 1; an alternating voltage with the frequency of omega 2 is applied to a metal coating probe arranged at the top end of the cantilever beam; laser emitted by the laser is reflected to the light spot position detector through the cantilever beam, and morphology and electrostatic force signals are obtained through the two lock-in amplifiers respectively. According to the invention, a morphology signal, an optical signal and an electrostatic force signal can be synchronously obtained through single scanning.

The present invention discloses a method for simultaneously characterizing the mechanical properties and microstructure of a single granular body. This method is suitable for simultaneously characterizing the mechanical properties and microstructure of explosive granular bodies and other energetic material crystals or granular materials. The test process includes six steps: sample preparation, sample installation, parameter adjustment of a mechanical-optical microscope combined test system, mechanical-optical real-time monitoring testing, analysis of the granular body's compression performance and optical images, and simultaneous characterization of its mechanical properties and microstructure. A dedicated compression test fixture is designed, and an evaluation basis for the simultaneous characterization of mechanical properties and microstructure is proposed. The present invention monitors the deformation characteristics of a single granular body during compression. The test process is observable, and the test conditions are more scientific and reasonable, improving the accuracy of the characterization. The method is also simple to operate and requires less experimental personnel.

The invention discloses a preparation method of a hydrogen-responsive composite multilayer magnesium-based film surface self-wrinkle pattern. The preparation method comprises the following steps: A, preparing a polymer elastic layer on the surface of a supporting substrate; b, depositing a plurality of layers of metal-based films on the polymer elastic layer by adopting a magnetron sputtering method; and C, exposing the prepared sample in a hydrogen-containing atmosphere, and forming a wrinkle pattern of which the recognizable size is in a range of 10nm-1000mu m on the surface through hydrogenation reaction at normal temperature. According to the method, the surface of the thin film can be deformed by exposing the thin film to the hydrogen-containing atmosphere environment, so that the three-dimensional wrinkle texture can be quickly realized, and the three-dimensional wrinkle morphology can be accurately regulated and controlled by adjusting the element components, sputtering time, sputtering power, working gas flow and hydrogen treatment parameters of the magnesium or magnesium alloy hydrogen-sensitive reaction film layer. The pattern features of the prepared wrinkle pattern can be recognized through characterization means such as an optical microscope, a scanning electron microscope, an atomic force microscope or a diffraction light-variable device.