696 results about "Optical microscope" patented technology

The invention discloses an optimized preparation method of a high-strength flame-retardant polyamide-based composite material in the technical field of information, which comprises the following steps: in the preparation process of the composite material, acquiring online dispersed state monitoring data of a modified filler by using a laser particle size analyzer and an optical microscope, including particle size distribution, agglomeration degree and dispersion uniformity of the filler; according to online dispersion state monitoring data, parameter ranges of melt flow property characterization are determined, the parameter ranges comprise the shearing rate and the temperature, particle size distribution data are used for determining the shearing rate range, small particle size distribution corresponds to the high shearing rate range, and agglomeration degree data are used for determining the temperature range; the higher degree of agglomeration corresponds to a higher temperature range to promote the dispersion of the filler, and these parameters are directly used to guide the setting of the subsequent rheological test.

The invention relates to the technical field of oil exploration, and discloses a rock mechanical parameter logging intelligent evaluation method considering continental facies shale fabric characteristics. The method comprises the following steps: 1, dividing shale lithofacies, identifying and determining the bedding development thickness of a sample through an optical microscope, determining a granularity experiment of the sample through granularity analysis, and forming mineral composition and bedding factor lithofacies division; 2, constructing a typical logging facies based on a rock electricity response relationship, and dividing the imaging logging facies of the research area according to natural gamma curves of conventional logging and imaging logging, core deposition structure characteristics and imaging logging image characteristics; 3, testing the longitudinal and transverse wave velocities and the porosity of different shale lithofacies, and calculating the dynamic elastic modulus and the Poisson's ratio. Through fine division and description, the method for accurately evaluating the bedding development condition, the particle size characteristics and the mineral components of the shale sample is provided, the testing time is short, the cost is low, and accurate evaluation of shale can be achieved.

The invention discloses a metallographic detection method and system based on image recognition, and belongs to the technical field of metallographic detection. The detection method comprises the following steps: image acquisition and preprocessing: acquiring a metal metallographic image by an optical microscope, performing median filtering and denoising, and extracting a grain boundary by adaptive binarization; and field-of-view and scale calibration: selecting a corresponding scale according to the shooting magnification. The multi-parameter automatic measurement comprises grain size analysis, grain size rating, second phase analysis and intelligent report generation, a report is automatically generated based on a preset template and comprises an original image, a binary image, measurement data and a histogram, and report fonts and layout can be adjusted in real time through a visual control. According to the detection method disclosed by the invention, the efficiency, the precision and the reliability of metallographic structure analysis of the metal material are remarkably improved through the full-process design of image acquisition standardization, preprocessing intellectualization, data analysis automation and report generation templating.

The invention discloses a method for evaluating the quality of a metal part, which comprises the following steps of: determining the laser type according to the characteristics of the metal part, obtaining various laser parameters for evaluating the quality of the metal part through an experimental method, and performing laser irradiation by adopting the accurately controlled laser parameters. In combination with real-time monitoring and regulation of instruments such as a power meter, a spectrograph, a roughmeter and an optical microscope, a laser parameter-grain boundary definition data set is formed, and finally a quality evaluation model is established to realize accurate evaluation of the quality of the metal parts. According to the method, the quality of the metal parts can be evaluated quickly and economically.

The invention discloses a method for automatically evaluating the average grain size of a metal material by using a cross-point method, and relates to the field of metal material metallographic image analysis, and the method comprises the following steps: selecting an identification model according to a tested material; inputting the optical microscope image pic into a system with an identification model; extracting scale information of the input image pic by using mask extraction and Hough straight line detection: firstly extracting a scale region by using a mask, then extracting a scale length by using a Hough straight line detection algorithm, and finally extracting a scale value by using a KNN classifier; and identifying the grain boundary pixels of the input image by using the selected identification model: classifying each pixel of the input optical microscope image pic by using UNet, judging whether the pixel is the grain boundary pixel, finally performing optimization, performing intercept method rating according to the optimized grain boundary image, counting the number of intersections per unit length, and calculating the grain size G. According to the method, the precision and consistency of grain size evaluation are remarkably improved.

The invention discloses an annealing temperature control method based on a differentiated ohmic contact material, and aims to solve the problems that the annealing temperature of an N-surface Au / Ge ohmic contact layer of an existing AlGaInP-based red light Micro-LED is not accurately monitored, a temperature field is not uniform and is difficult to detect, and abnormal response lags, the method comprises seven steps of processes (two times of patterning, two times of metal coating, two times of photoresist removal, annealing and observation), and the annealing temperature of the N-surface Au / Ge ohmic contact layer of the existing AlGaInP-based red light Micro-LED is controlled. Preparing a first Au / Ge ohmic contact layer (for function) and a second Au / Ge / Ni ohmic contact layer (for detection) on the N surface of the wafer; by means of the characteristic that Ni inhibits Au / Ge agglomeration, the two-layer agglomeration state difference is observed through an optical microscope, and the temperature is judged (in the normal state, the former agglomerates, and the latter does not agglomerate); the method is convenient in detection, supports batch detection, can find temperature abnormity in real time, improves the process stability, and is suitable for industrial mass production.

Disclosed in the present invention is a stimulated emission depletion and super-resolution fluorescence lifetime imaging method, which is applied to the technical field of optical microscope imaging. The method provided in the present invention combines the stimulated emission depletion and fluorescence lifetime imaging principles, a depletion laser pulse frequency used therein is half of an excitation light pulse frequency, and a time interval between two pulse sequences is adjusted, such that a depletion laser pulse follows an adjacent excitation light pulse; and analysis processing is performed on collected fluorescence lifetime data, such that a super-resolution fluorescence lifetime image is obtained, thereby solving the problem of the fluorescence lifetime of a stimulated emission depletion and fluorescence lifetime imaging microscope being significantly shortened under the action of a high-energy depletion laser, and thus accurately reflecting real information of a fluorochrome and a micro-environment. Therefore, the innovative technique provides important technical support for life science research, significantly improves the accuracy and effectiveness of research, and promotes further development in the field of biomedicine.

The invention provides a floor wear resistance detection method and system, is applied to the technical field of floor wear detection, and reflects the wear resistance of a floor coating by obtaining the variation of porosity before and after floor wear. When the porosity after abrasion is obtained, a two-dimensional optical image of a to-be-detected surface is collected through multi-direction illumination, and the image is subjected to alignment processing. By analyzing the light and shade change information and the shadow form information of the dark area in different illumination directions, when the light and shade change information of the dark area changes along with the change of the position of the light source and the shadow form information shows the dynamic change of rotation or movement, it is judged that the hole is the floor hole. The discrimination mechanism based on the illumination dynamic change effectively solves the problem that a two-dimensional optical microscope scheme in the prior art cannot distinguish real pores and shallow scratches, and avoids misjudgment of scratches generated by a large amount of wear as pores, thereby significantly improving the accuracy of porosity calculation after wear.

A deep learning-based super-resolution fluorescence lifetime imaging microscopy (SR-FLIM) method includes the steps of: S1, performing fluorescence microscopic imaging on a sample to obtain confocal intensity images and stimulated emission depletion (STED) intensity images at a same location; S2, co-registering the acquired confocal and STED intensity images; S3, pairing the co-registered confocal and STED intensity images as input (Input) and ground truth (GT) to assemble a dataset; S4, partitioning the dataset into training and validation sets following a predefined ratio; and S5, constructing a network, and selecting hyperparameters and an optimizer. This method may achieve SR-FLIM within a conventional confocal FLIM system, surpassing spatial resolution limitations of FLIM, breaking through resolution barriers of conventional optical microscopy, while preserving normal fluorescence lifetime characteristics of fluorescent probes.

The invention relates to the technical field of section analysis of printed circuit boards, in particular to a section analysis method for PCB positioning cutting, a target abnormal area is positioned on a PCB through an optical microscope, the optical microscope not only can observe the morphology of the surface layer of a sample, but also can observe the morphology within a certain range below the surface layer, and the accuracy of section analysis is improved. And meanwhile, the optical microscope is very sensitive and accurate in color identification, so that compared with the prior art in which the target abnormal area is positioned on the PCB through a scanning electron microscope, the target abnormal area can be more effectively positioned on the PCB, and the purpose of reducing the positioning difficulty of the target abnormal area is achieved. Besides, the positioning layer and the protection layer are deposited in the target abnormal area, so that the cross section sample can be prevented from being physically and chemically damaged in the cutting process on the basis of improving the cutting precision of the cross section sample, and the failure analysis precision of the PCB is improved.

The invention discloses a three-dimensional visualization method for deformation dislocation Schmidt factor distribution, and the method comprises the steps: preparing a transmission sample based on a deformation sample, and obtaining a physical identifier marking the direction of an external load; dislocation images of a plurality of different angles of the transmission sample are obtained through a transmission electron microscope, three-dimensional reconstruction is carried out, and a dislocation three-dimensional image under a sample coordinate system is obtained; tilting the sample in situ, and obtaining conversion parameters of a sample coordinate system and a crystal coordinate system according to the tilting parameters and the diffraction pattern; acquiring optical images of the sample rod and the transmission sample through an optical microscope, acquiring an applied load direction under a sample coordinate system according to the optical images, and acquiring an applied load direction under a crystal coordinate system based on the conversion parameters; and determining a dislocation slippage system according to the dislocation Burkholtz vector and the dislocation three-dimensional image, and calculating to obtain a dislocation Schmidt factor by combining with the direction of the external load under the crystal coordinate system, and displaying the dislocation Schmidt factor in the three-dimensional image. According to the method, the deformation dislocation Schmidt factor can be accurately and intuitively represented in the dislocation three-dimensional image.

The invention relates to the field of cell analysis, and provides a multi-mode digital micro-fluidic system and method for cell sorting analysis, the system comprises an active digital micro-fluidic platform, the active digital micro-fluidic platform comprises a micro-fluidic chip, an upper computer control system and an FPGA hardware circuit, an upper computer generates a liquid drop path planning instruction, the FPGA hardware circuit converts the liquid drop path planning instruction into an electrode driving signal, and the electrode driving signal is transmitted to the micro-fluidic chip; the nanoliter-grade liquid drops are driven to change between the electrodes; the optical tweezers platform comprises a laser device, an optical microscope and a CMOS camera, laser beams are generated by the laser device to form a three-dimensional optical potential well, the laser beams are transmitted into the micro-fluidic chip through the optical microscope to realize non-contact control on cells, and the CMOS camera records images and transmits the images back to the upper computer; the objective table clamp is used for realizing cooperative control of the optical tweezers and the active digital microfluidics; and the image recognition system is used for recognizing morphological characteristics of cells in the liquid drops based on a convolutional neural network and screening target cells. According to the invention, integration of high-throughput nondestructive cell sorting and in-situ multi-modal analysis is realized.

A detection method and detection apparatus for atomic-scale defects in gallium oxide crystals. In the detection method, a scattering-type scanning near-field optical microscope system and / or a nano-infrared system are used to detect atomic-scale defects in gallium oxide crystals. Aiming at real requirements for the detection of internal structural defects in Ga2O3 materials and devices, a near-field optical microscope system and a nano-infrared system are used to detect structural defects in Ga2O3 crystals, thereby realizing highly sensitive and nondestructive detection of atomic-scale defects in materials.

The present invention provides a real-time flow cytometric analyzer of single-cell dynamics combining droplet microfluidics and multimodal optical microscopy, and belongs to the field of cell biology experimental devices. The analyzer comprises a cell / signal loading & acquisition and control system, a high-throughput microfluidic single-cell manipulation chip, a multi-channel optical microscopy and multimodal signal acquisition and control system, and a data processing and analysis system. Based on droplet-based microfluidic chip technology, multimodal optical microscopy technology, single-cell dynamics theoretical modeling and analysis methods, and artificial intelligence technology, the integrated detection of spatiotemporal information of single-cell dynamics can be realized. The analyzer provides a new rapid and accurate single-cell dynamics analysis platform for exploring the occurrence and development mechanism of major human diseases, disease diagnosis, cell sorting and drug screening, etc.

A super-resolution single-objective light-sheet optical microscopy system and method, and a related imaging system, are configured to generate two light sheets that are guided to a single objective. The single objective is configured to allow the two light sheets to transmit through same and interfere with each other to generate structured light fringe regions. The single objective is further configured to receive a fluorescence signal that is recorded by a fluorescence detection module.

The invention relates to the technical field of material mechanical property testing, and discloses a material indentation and scratch testing device and method under a composite energy field, and the device comprises a supporting experiment table, a vertical micro-motion platform, a horizontal micro-motion platform, a high-definition optical microscope, a force sensor, a displacement sensor and an additional energy field generation system. According to the method, a controllable additional energy field is synchronously applied while a mechanical indentation or scratch load is applied to a hard and brittle material sample, and load displacement data is collected in real time. In the data processing stage, the real hardness is calculated by adopting a corrected proportion sample resistance model, the elastic modulus is calculated based on the Oliver-Pharr theory, and the fracture toughness of the material is analyzed and calculated according to the size of the indentation tip crack. The problem that in-situ mechanical property characterization cannot be carried out in a composite energy field in a traditional test is solved, the hardness calculation precision is improved, the fracture toughness measurement function is expanded, and the experimental device and method are provided for research of a hard and brittle material composite machining mechanism.

The invention belongs to the technical field of semiconductor material detection, and particularly relates to a method for representing micro-defects of a near-perfect czochralski silicon wafer by regulating and controlling near-surface copper concentration. The invention discloses a method for representing micro-defects of a near-perfect czochralski silicon wafer by regulating and controlling the concentration of near-surface copper. The method specifically comprises the following steps: (S.1) cleaning the silicon wafer and immersing the silicon wafer into a copper nitrate solution for standing; (S.2) rinsing the silicon wafer with ionized water, taking out the silicon wafer and airing the silicon wafer; (S.3) performing high-temperature heat treatment on the silicon wafer for a period of time, and quickly cooling; (S.4) carrying out chemical polishing on the cooled silicon wafer; (S.5) horizontally placing the silicon wafer in the corrosive liquid; and (S.6) observing the surface of the silicon wafer by using an optical microscope or a scanning electron microscope so as to display the microdefects. According to the invention, copper precipitates at different depths are observed after copper is introduced at high temperature, so that the microdefect condition of the silicon wafer can be reflected. The method can clearly display the micro-defects in the nearly perfect czochralski silicon wafer, and has high detection efficiency and accuracy. The method is easy to operate, low in cost and suitable for silicon wafer microdefect detection in large-scale production.

Systems and methods for capturing and processing image data captured by an optical microscope, such as an Open Top Light Sheet (OTLS) microscope are disclosed. Image data can be processed by techniques including flat fielding, image depth correction, and edge correction, and pixel classification and image segmentation techniques can be applied to more accurately identify lipid droplets and fibrous structures for assessment of, for example, steatosis and fibrosis in human liver biopsy tissue samples. Systems and methods are also related to capturing low resolution images of a sample, identifying regions of interest, and then capturing high resolution image of the regions of interest to reduce memory used for storage, increase computation speed, and reduce computational power.

The invention provides a nanoscale metal tip intelligent detector and a use and analysis method thereof. The device integrates a high-precision imaging and positioning module, an intelligent analysis module, an intelligent control interaction module and an automatic execution mechanism. The imaging and positioning module is composed of an optical microscope, a high-resolution CCD camera and a three-axis precision objective table and supports nanoscale morphology feature capture and micron-scale positioning precision. The intelligent analysis module can automatically extract the curvature radius, the taper angle, the surface roughness and other key parameters. The control interaction module is coupled with the automatic execution mechanism, so that automatic control of the detection process and remote storage and optimization of process data can be realized. The device can automatically complete the detection and intelligent analysis of the morphology of the nanoscale metal tip, is compatible with application scenes such as single nanopore / pore channel preparation, scanning probe tip morphology characterization and nano device detection, and remarkably improves the operation efficiency while maintaining high-precision detection.

To provide a photoelectric conversion element improved in durability.SOLUTION: A photoelectric conversion element has a first electrode, a second electrode, and a photoelectric conversion layer arranged between the first electrode and the second electrode and including a crystal of a perovskite structure. The photoelectric conversion element has, between the photoelectric conversion layer and the first electrode, a charge transport layer. The charge transport layer contains a charge transport substance and insulating resin that are phase separated. The ratio of the volume of an area of the charge transport substance to the volume of an area of the insulating resin is 5 or more and 30 or less. In a binarized image of the two-dimensional space distribution of an area A and an area B obtained by measuring the charge transport layer with an optical microscope, when a value that is obtained through Fourier analysis on the binarized image and that is determined by the following calculation method for D is defined as D μm, D μm satisfies 4≤D≤12.SELECTED DRAWING: Figure 1

The present invention provides a metal material that is particularly suitable for use as a component of a compression-sealed glass hermetic seal, that has high bonding reliability with the sealing glass, that allows a large current to pass through it even with a small diameter, that can realize a lead pin that generates little heat when current is passed through it, that can appropriately compress the sealing glass and lead pin in the plate surface direction, that has high bonding reliability with the sealing glass, and that can realize a stem base that has excellent heat dissipation performance in the plate thickness direction. [Solution] The composite consists of a [Cr and / or Mo]-Cu composite having a metal structure in which Cr phases and / or Mo phases are dispersed in a Cu matrix. This [Cr and / or Mo]-Cu composite is a diameter-reduced, elongated powder metallurgy compact, and when cross-sectionally observed with an optical microscope, it has a cross-sectional structure in the elongation direction in which lamellar or linear Cr phases and / or Mo phases are dispersed in the Cu matrix, and a cross-sectional structure perpendicular to the elongation direction in which flake-like, small platelet-like, or granular Cr phases and / or Mo phases are dispersed in the Cu matrix.

A method of increasing the interference contrast in interferometric scattering optical microscopy. The method comprises providing a particle detection region comprising a chamber or channel having a boundary defined by one or more interfaces, illuminating a particle in the particle detection region with coherent light using an objective lens such that the light is reflected from the interface and scattered by the particle, capturing the reflected light and the scattered light using the objective lens, and providing the captured reflected and scattered light to an imaging device to image interference between the reflected light and the scattered light. The particle is illuminated by coherent light at an oblique angle to the interface.

The invention relates to the technical field of material analysis, in particular to a light microscope-field emission electron microscope combined shale rock slice analysis and identification method, which comprises the following steps of: firstly, combining a brightness distribution condition represented by a bright field image of a shale rock slice and a birefringence deviation condition represented by a cross polarization image from an optical angle; determining a mineral discrimination index representing an atomic number agent; applying offsets of different sizes based on the distribution condition of mineral discrimination indexes and the surface fluctuation condition of shale rock slices, and determining a position offset vector by combining gray scale gradient distribution on the basis; and finally, determining the cross-scale positioning and more accurate electron microscope objective table coordinates corresponding to each pixel point in combination with a position offset vector in a pixel coordinate conversion process based on an image physical distance scale and rotation translation processing, so that the cross-scale positioning accuracy of the optical microscope and the field emission scanning electron microscope is higher. The reliability of analyzing and identifying the shale rock slice is obviously improved.

The invention provides a wafer defect detection method, device and equipment, and relates to the technical field of semiconductors, and the wafer defect detection method comprises the steps: carrying out the optical detection of the surface of a wafer through an optical microscope, obtaining the first position information and the first size information of a burn feature on the surface of the wafer, the burn characteristics are obtained by performing scanning electron detection on the wafer by using a scanning electron microscope; according to the first position information and the first size information, a scanning electron microscope is used for conducting scanning electron detection on the wafer, and an electron scanning result of the surface of the wafer is obtained; and determining second position information and second size information of the defect on the surface of the wafer according to the first position information, the first size information and the electronic scanning result. The burn features are identified and marked by using the optical microscope, so that secondary identification of the burn features is prevented when a scanning electron microscope is used for detection, defects and local burns are identified respectively, and the accuracy of defect detection is improved.

The invention relates to the technical field of biomedicine detection reagent manufacturing and reproductive medicine, in particular to an embryonic development potential sperm key protein kit and a use method thereof. The method is characterized in that an antibody combination capable of specifically recognizing a group of key proteins related to embryonic development potential in human sperms is prepared, and the antibodies, a fluorescence labeled secondary antibody, a cell nucleus dye, a concentrated washing liquid, a mounting medium and a pre-coated control porous glass slide are assembled into the special detection kit. The kit can be combined with a multi-mode imaging system (such as a fluorescence / confocal microscope and a common optical microscope) and image analysis software to realize the traditional analysis of sperm morphology and movement ability, and can perform synchronous and accurate qualitative and quantitative analysis with the expression level and subcellular localization of the key protein. The invention provides an integrated molecular detection solution, and provides a powerful tool for sperm quality screening and embryonic development potential prediction in an assisted reproduction technology.

The invention relates to the field of anode conversion film voltage withstanding performance testing, in particular to an anode conversion film voltage withstanding performance testing device and method. Comprising a temperature control box, a pressurizing mechanism and an optical microscope, a pressure measuring platform is further arranged in the temperature control box, the pressurizing mechanism comprises a pressing disc and a pressurizing driving assembly, and the pressurizing mechanism further comprises a rubber pressing sleeve fixedly arranged on the pressing disc in a sleeving mode and an expanding assembly capable of expanding the rubber pressing sleeve. And a pressure maintaining structure for avoiding insufficient contact between the rubber pressing sleeve and the sample is arranged in the rubber pressing sleeve. The rubber pressing sleeve is driven by the expansion assembly to deform, so that the rubber pressing sleeve is synchronously expanded in multiple directions to ensure that the whole sample is uniformly pressed, and meanwhile, the pressure maintaining structure is started, so that the condition that the rubber pressing sleeve and the sample are insufficiently contacted is avoided, and the pressure uniformity is further improved.

The invention focuses on optimization of process parameters of titanium alloy, mainly aims at solving the problems of poor interlayer bonding degree, incomplete fusion, more pores and the like caused by titanium alloy additive manufacturing under certain parameters, provides a research method for process parameters of titanium alloy laser additive manufacturing, and relates to the field of laser additive manufacturing. According to the method, parameter optimization logic is determined, and a unique optimization path of titanium alloy additive manufacturing is provided by combining grain morphology, defect distribution and mechanical properties. The analysis method mainly comprises optical microscope metallographic analysis and mechanical property testing, the structure observation precision is improved, and the isotropy of the titanium alloy additive part is evaluated by testing the tensile strength, the yield strength and the ductility. The interlayer bonding problem of titanium alloy additive manufacturing is solved in a targeted mode. The method is suitable for the manufacturing field of aerospace, medical implants and high-corrosion-resistance parts, and the comprehensive performance and isotropy of additive manufacturing components are improved.

The invention discloses a dual-mode microscope and a special assembly, an operation method and application thereof, the dual-mode microscope comprises an optical microscope assembly and a lensless microscopy assembly, the optical microscope assembly and the lensless microscopy assembly form a switchable dual-mode microscope, a lensless microscopy mode is used for preliminary screening of a to-be-tested sample, and the optical microscope mode is used for accurate observation of the to-be-tested sample; the lensless microscopy assembly comprises a first light source, an image sensor and an image signal processor; in the lensless microscopy mode, the first light source and the image sensor are located on the two sides of a to-be-detected sample on the objective table, when light emitted by the first light source passes through the to-be-detected sample, the image sensor receives an optical signal and converts the optical signal into an electric signal, and the image signal processor converts the electric signal into an interference or diffraction image; and the image is restored into an image which can be directly observed. According to the dual-mode microscope, through dual-mode switching, the observation precision is guaranteed, meanwhile, the workload is greatly reduced, and too high requirements for the detection resolution of lensless microscopy are not needed.

This invention provides a PAM staining method that enables staining suitable for magnified observation of various samples using a range of microscopes, from optical microscopes to electron microscopes. [Solution] A PAM staining method comprising the steps of: silvering a biological sample; coloring the biological sample; and fixing the color of the biological sample, wherein the biological sample is a biologically derived sample that has been oxidized; the silvering step involves immersing the biological sample in a methenamine silver aqueous solution at room temperature, raising the methenamine silver aqueous solution from room temperature to 62°C or higher and 68°C or lower, and carrying out the silvering reaction for 30 to 40 minutes from the start of the reaction at room temperature; the coloring step involves immersing the silvered biological sample in a 0.2% gold chloride aqueous solution at room temperature for 8 to 12 hours; and the fixing step involves immersing the sample in a hard film fixing solution containing 11% to 13% sodium thiosulfate and aluminum potassium sulfate dodecahydrate for 3 minutes or more at room temperature.

A light irradiation apparatus focuses light on a surface or an inside of an object to observe or process the object, and includes a laser light source, a lens, a lens, a mask, a wave plate, and a lens. The mask is a multi-ring mask for spatially intensity-modulating input light in a beam cross-section and outputting modulated light, and includes a plurality of ring-shaped light-shielding areas provided around a center position, and a transmitting area provided between two adjacent light-shielding areas out of the plurality of light-shielding areas. A radial width of each of the two adjacent light-shielding areas out of the plurality of light-shielding areas is larger than a radial width of the transmitting area provided between the two light-shielding areas.