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695 results about "Scanning electron microscope" patented technology

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using an Everhart-Thornley detector. The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. SEM can achieve resolution better than 1 nanometer.

Method and system for testing reliability of small general engine

The invention relates to the technical field of engine testing, and discloses a reliability test method and system for a small general engine, and the method comprises the steps: collecting an engine vibration signal through a superconducting quantum interferometer, and collecting a temperature distribution parameter through a quantum dot temperature sensor; performing combined testing of cold and hot shock, high-load operation and random working conditions, and synchronously monitoring dynamic response characteristic data; constructing a Weibull probability model, and determining key influence factors through a global sensitivity analysis method; acquiring a surface roughness parameter by adopting a field emission scanning electron microscope, obtaining a material component parameter through energy spectrum analysis, and establishing a parameter mapping relation; establishing a vibration and temperature early warning system, executing a graded sweep frequency excitation and abrasive particle acceleration test, and recording a parameter degradation process; and generating a three-dimensional parameter cloud picture, and outputting a reliability test report. According to the method, the reliability of the small general engine can be comprehensively and efficiently evaluated, and a scientific basis is provided for design, maintenance and improvement of the engine.
Owner:HARBIN FORESTRY MASCH RES INST STATE FORESTRY & GRASSLAND ADMINISTRATION

Method for measuring particle size of metal powder by using scanning electron microscope

The invention discloses a method for measuring the particle size of metal powder by using a scanning electron microscope, which comprises the following steps: step 1, sample treatment: adhering a small conductive adhesive tape on a sample table, sprinkling metal powder on the adhered conductive adhesive tape, and purging to obtain the conductive adhesive tape adhered with the metal powder; step 2, parameter setting: setting acceleration voltage, working distance, diaphragm, image contrast, brightness, magnification times and scanning speed of a scanning electron microscope to observe the conductive adhesive tape adhered with the metal powder obtained in the step 1 to obtain an electronic image of metal powder particles; and processing and calculating the electronic image of the metal powder particles by using software to obtain the average particle size of the metal powder particles. According to the method disclosed by the invention, a solvent is not needed to disperse the sample, pollution of the solvent to the sample is effectively avoided, and the result is more accurate than that of directly measuring the particle size by using length software.
Owner:ANGANG STEEL CO LTD

Fiber composite material skin isogeometric simulation modeling method considering micro pores

The invention provides a composite material skin isogeometric modeling method considering micro-pores, which comprises the following steps: obtaining internal characteristics of a composite material skin through an SEM scanning electron microscope, and establishing parameterized unit cell microstructure units according to the characteristics; determining a skin deformation area, constructing a constitutive matrix based on different components in the composite material, obtaining and endowing defined material attributes, and obtaining different unit mass matrixes and local stiffness matrixes in the area; and filling into the macroscopic overall matrix through an isogeometric mapping strategy, carrying out inverse mapping fitting on a skin appearance structure, and carrying out applied load calculation. According to the method provided by the invention, through an isogeometric analysis method, three-dimensional curved surface dimension reduction processing is realized, and the calculation cost is reduced; meanwhile, a parameterized microscopic unit is considered to ensure the accuracy of modeling; and the mechanical property of the composite material skin is really simulated. The method is suitable for the structure elasticoplastic deformation state that the skin bears large load, large deformation and the like, and calculation operation is easy and convenient.
Owner:NANJING FORESTRY UNIV

Method and device for identifying organic matter pores in shale electron microscope scanning image

The invention discloses a method and device for identifying organic matter pores in a shale electron microscope scanning image, and the method comprises the steps: obtaining a shale scanning electron microscope original image, carrying out the manual marking, and generating an original image and mask image data set; performing synchronous data enhancement on the data set and dividing a training set and a verification set; constructing an improved U-Net model containing a multi-scale feature fusion input module, a residual attention module and a wavelet domain feature enhancement center module; training the model by adopting a dynamic mixed loss function and an AdamW optimizer; and verifying the model through an average intersection-to-union ratio, a pore Dice coefficient and a pore error, and identifying the pores of the image to be processed after reaching the standard. The device correspondingly comprises an image acquisition annotation module, a data preprocessing module, a model construction module, a training module, a verification module and a pore recognition module. According to the method, full-automatic identification is realized, the multi-scale pore segmentation precision and the low-porosity sample adaptability are improved, and the efficient characterization requirement of the shale gas reservoir is met.
Owner:CHINA UNIV OF GEOSCIENCES (BEIJING)

Scanning electron microscope image edge detection method

The invention provides a scanning electron microscope image edge detection method, which comprises the following steps: carrying out anisotropic diffusion filtering on a scanning electron microscope image to suppress noise and reserve edges to obtain a filtered image; an original scale gradient and a down-sampling scale gradient of the filtered image are calculated, a plurality of pixel regions in the original scale gradient and the down-sampling scale gradient are fused based on a plurality of adaptive weights to obtain a gradient map, the adaptive weights are determined based on the complexity of the texture of the filtered image, and each pixel region corresponds to one adaptive weight; multi-dimensional features are extracted from the gradient map, the multi-dimensional features are input into a machine learning model for threshold prediction, a continuous pixel-level threshold map is generated based on a predicted threshold, and a gradient threshold included in the continuous pixel-level threshold map is a critical value for distinguishing different types of pixels in the gradient map; and comparing the gradient map with the continuous pixel-level threshold map to obtain a target edge pixel, and generating an edge detection result map based on the target edge pixel.
Owner:INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI

Machine vision-based automatic identification and calculation method for pore change of rock section under SEM (scanning electron microscope)

The invention discloses a machine vision-based automatic identification and calculation method for pore change of a rock section under an SEM (scanning electron microscope), and the method comprises the steps: obtaining original image data of the rock section through a scanning electron microscope, transmitting the original image data to a machine vision SEM pore intelligent quantification cloud platform, and dividing the original image data into a plurality of image sub-regions which are not overlapped with each other; calling a special threshold inversion model to analyze the gray information of each sub-region, and determining a dual-phase pore segmentation threshold; carrying out edge extraction on the sub-regions after threshold processing by adopting a pore edge gradient enhancement algorithm; performing topological structure analysis on the intermediate image data by using a biphase pore topological inversion model, constructing and optimizing a pore space topological network, and eliminating false pore structure data; and according to the optimized pore space topology network, integrating calculation results of all the sub-regions to obtain a pore change identification calculation result of the whole rock section. The method improves the pore identification precision and processing efficiency, and adapts to different types of rock samples.
Owner:HOHAI UNIV

Microscopic fracture dynamic in-situ characterization method

The invention discloses a microscopic crack dynamic in-situ characterization method, and relates to the technical field of crack in-situ detection. According to the method, a plurality of hardened cement paste bodies are soaked in a sulfate solution, the porosity development trend of the hardened cement paste bodies is obtained through a nuclear magnetic resonance test and a mercury injection test in the soaking process, a test sample and a test sample are prepared after soaking is finished, and the crack propagation length of the test sample is measured through a scanning electron microscope. According to the distance gradient between the sampling angle of the test sample and the exposed surface, space coordinates of crack cracking are converted into a time process along the center axis of the test sample, a delay microscope is established on the microscale, and the test sample is scanned by using X-ray computed tomography equipment in a matched mode; a crack propagation animation image is formed based on a crack form between adjacent X-ray tomography slices, and a crack development process is obtained by continuously capturing high-resolution images, so that omission of time information is avoided, and in-situ detection of microscopic cracks in a hardened cement paste sample is realized.
Owner:SHANDONG UNIV OF SCI & TECH

In-situ real-time monitoring method and system for rock microscopic fracture mechanism and stress evolution

The invention provides an in-situ real-time monitoring method and system for a rock microscopic fracture mechanism and stress evolution. The method comprises the following steps: S1, standardized preparation and pretreatment of a rock sample; s2, in-situ loading and multi-modal data synchronous acquisition are carried out; s3, crack dynamic tracking and stress-strain field joint calculation; s4, constructing a microscopic-macroscopic quantitative correlation and damage model; and S5, performing multi-dimensional dynamic visualization and engineering output. The in-situ scanning electron microscope and the mechanical loading device are integrated, so that cross-scale synchronous monitoring and quantitative analysis of micro crack evolution and macroscopic stress-strain response are realized. A low-disturbance clamping device and a conductive anti-charge sample are treated, and in-situ testing is ensured; combining DIC and deep learning to quantify a crack propagation path, a local strain field and energy characteristics; through DIC strain inversion and finite element calculation, a non-contact stress cloud picture is generated in real time, and finally quantitative correlation between a microscopic fracture mechanism and macromechanical response is established.
Owner:POWERCHINA HUADONG ENG CORP LTD +3

Contour measurement method, electronic equipment and storage medium

The invention provides a contour measurement method, electronic equipment and a storage medium. The method comprises the following steps: acquiring a standard image, a contour of the standard image and an SEM image of a to-be-measured product acquired by a critical dimension scanning electron microscope CD-SEM; adopting a target physical threshold model to extract a target contour of the SEM image; and determining a target edge placement error between the contour of the standard image and the target contour of the SEM image, and generating and outputting a contour measurement result of the to-be-measured product according to the target edge placement error, so as to improve the precision of contour extraction and the accuracy and efficiency of contour measurement.
Owner:QUANYI MASK PHOTOELECTRIC TECH (JINAN) CO LTD

Method for measuring and calculating article position of continuous silver ore with particle size of more than 0.037 mm

The invention provides a method for measuring and calculating the article position of continuous silver ore with the particle size of 0.037 mm or above, and belongs to the technical field of mineral grade detection. The silver grade in the sample is measured and calculated through screening; leaching and measuring the content of silver monomers and continuous silver minerals, and reselecting to obtain a heavy sand product; carrying out fluorescent dyeing on the heavy sand product, and selecting monomer silver minerals; analyzing the color of the silver mineral through point scanning data of a scanning electron microscope, melting the monomer silver mineral to obtain the volume of the monomer silver mineral, and calculating the content of the monomer silver mineral; and carrying out conversion to obtain the continuous silver ore article position with the size of more than 0.037 mm. According to the method, the target mineral is rapidly and accurately obtained by adopting density medium reselection and fluorescent dye tracing; introducing a scanning electron microscope to measure and calculate the actual density of the silver mineral to replace the theoretical density, smelting the silver mineral in a mold, and carrying out volume measurement and calculation to obtain the actual metal amount closer to the actual silver mineral; measuring and calculating errors caused by impurities and irregular shapes of mineral particles are reduced; and the calculated grade of the silver mineral is more accurate.
Owner:CHANGCHUN GOLD RES INST

Scanning electron microscope resolving power evaluation method and device, computer equipment and storage medium

The embodiment of the invention provides a scanning electron microscope resolving power evaluation method, computer equipment and a storage medium. The method comprises the following steps: acquiring a scanning image of a to-be-evaluated scanning electron microscope on a sample; performing image enhancement processing on the scanning image by using an image enhancement model to obtain an enhanced scanning image; and evaluating the resolving power of the scanning electron microscope to be evaluated through the enhanced scanning image. According to the method, on one hand, a sample is adopted as a scanning object of the scanning electron microscope to be evaluated, and the accuracy of an evaluation result is improved by utilizing the material property of a mesoporous molecular sieve, and on the other hand, the resolution of the scanning electron microscope to be evaluated is evaluated through an enhanced scanning image. Compared with the scanning image before enhancement, the enhanced scanning image has higher image quality, so that the accuracy of the evaluation result can be obviously improved by evaluating the resolving power of the scanning electron microscope to be evaluated through the enhanced scanning image.
Owner:HEFEI GUOJING INSTR TECH CO LTD

Melted electrostatic spinning polymer / molecular sieve blended composite fiber as well as preparation method and application thereof

The invention discloses a fused electrostatic spinning polymer / molecular sieve blended composite fiber as well as a preparation method and application thereof. The melt electrostatic spinning polymer / molecular sieve blended composite fiber is prepared from the following raw materials in parts by weight: 25-90 parts of a thermoplastic polymer matrix, 5-75 parts of a molecular sieve, 1-10 parts of a compatibilizer and 0-5 parts of a conductive additive. According to the polymer / molecular sieve blended composite fiber material and the preparation technology, no solvent participates in the whole process, and the green manufacturing requirement is met. Moreover, in the fiber material, the molecular sieves can be uniformly distributed on the superfine polymer fibers, scanning electron microscope pictures show that the molecular sieves are uniformly embedded into the material, no aggregate larger than 10 microns exists, and the fiber material has a hierarchical pore structure, a high specific surface area and excellent mechanical properties. Therefore, the fiber material can be applied to the fields of air filtration, catalytic reaction, drying purification, adsorption separation and the like.
Owner:SHENZHEN FANGQIU SPECIAL DESICCANT TECHNOLOGY CO LTD

Preparation method of lead-bismuth reactor nuclear sampler coating and coating

The invention provides a lead-bismuth reactor nuclear sampler coating and a preparation method thereof.The preparation method comprises the steps that S3, according to the thickness of a CrAl coating, the bias voltage and target current of multi-arc ion plating equipment are adjusted, the bonding strength of the coating and a base body is optimized, and the target adhesive force reaches the scratch test critical load or above; s4, according to the bonding strength, the nitrogen flow and the air pressure are adjusted, a compact CrAl coating microstructure with the porosity lower than a porosity threshold value is generated, and the quality of the microstructure is detected and verified through a scanning electron microscope; s7, according to the thickness consistency, a screw rod or a pin shaft is selected as a base body part, a CrAl coating is deposited on the surface of the screw rod or the pin shaft to be matched with the sleeve cap, and the gap between the sleeve cap and the shaft part is controlled to be within a gap threshold value; and S10, according to hardness and wear resistance test results, the deposition time and bias voltage are adjusted, the performance of the CrAl coating and the performance of the TiN coating are optimized, and the requirements for long-term corrosion resistance and wear resistance in the lead-bismuth alloy environment are met. According to the invention, excellent performances of long-term corrosion resistance and wear resistance in a high-temperature lead-bismuth environment are realized, and the service life of parts is remarkably prolonged.
Owner:NANJING HAITONG ELECTRONIC MATERIAL TECH CO LTD

Image processing method and device, medium and computer program product

The invention discloses an image processing method and device, a medium and a computer program product, and relates to the technical field of semiconductor manufacturing. The image processing method comprises the following steps: acquiring target image samples of a plurality of wafer samples through a scanning electron microscope, and obtaining a first contour image label of each target image sample; based on the target image sample, a first contour image result is generated through a generator of a preset image edge model, iteration training is carried out on the preset image edge model through pixel difference loss, adversarial loss and edge supervision loss until a convergence condition is met, and a target image edge model is obtained; the generator of the target image edge model can output an edge contour image based on the target image of the target wafer. Through multi-dimensional constraints of pixel difference loss, edge supervision loss and adversarial loss, the preset image edge model is trained in the direction of generating an actual edge contour, and the accuracy of the edge contour image is improved.
Owner:DONGFANG JINGYUAN ELECTRON LTD

Shale reservoir polymer fracturing fluid retention characteristic analysis method and system

The invention belongs to but is not limited to the technical field of petroleum engineering, and particularly relates to a shale reservoir polymer fracturing fluid retention characteristic analysis method and system, and the method comprises the following steps: S1, carrying out a displacement experiment by using polymer solutions with different molecular weights and concentrations; s2, the retention condition of polymers in the rock core before and after displacement is observed through a micron CT and scanning electron microscope technology; and S3, analyzing the influence of the polymer solutions with different molecular weights and concentrations on the retention characteristics in the shale reservoir. The invention aims to carry out a displacement experiment on the rock core by using polymer solutions with different molecular weights and concentrations, and then observe and compare the polymer solutions of the rock core before and after displacement by using equipment such as a CT scanner and an electron microscope, so as to obtain the retention and migration conditions of the polymer in the hole seam of the rock core. The retention characteristics of fracturing fluid polymer molecules in a microporous structure and a matrix are studied, so that a correct polymer molecular weight range is provided for reservoir transformation, fracturing fluid reservoir damage is reduced, and the fracturing yield increasing effect is finally improved.
Owner:CHINA UNIV OF GEOSCIENCES (WUHAN)

Method, device and equipment for correcting geometric distortion in scanning electron microscope measurement, medium and program product

PendingCN121812442AMeasurement improvementsPrecisely compensates for differences in deflection sensitivityImage enhancementImage analysisImage correctionElectron microscope
The invention relates to the technical field of electron microscopic imaging, in particular to a correction method and device for geometric distortion in scanning electron microscope measurement, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring a scanning electron microscope image of a standard sample; calculating an orthogonal included angle parameter and a length-width ratio parameter of the scanning electron microscope image; iteratively adjusting the angle correction parameter and the gain correction parameter under a fixed scanning rotation angle until a preset local calibration constraint condition is met; verifying the orthogonal included angle parameter and the length-width ratio parameter under each scanning rotation angle; and when the orthogonality included angle parameter and the length-width ratio parameter do not meet a preset global stability constraint condition, adjusting a relative gain coefficient, and re-executing calibration verification under each scanning rotation angle until a full-angle correction requirement is met. By adopting the method, high precision and stability of imaging correction can be kept in a full-angle range.
Owner:WUXI GENXINYUE TECH CO LTD

Scanning electron microscope

The invention relates to the technical field of scanning electron microscopes, in particular to a scanning electron microscope which comprises a mounting frame, an electron microscope body, a vacuumizing mechanism, an adapter, a damping mechanism and a vacuum tube structure, the electron microscope body comprises a lens cone and a sample bin, and the vacuumizing mechanism is used for synchronously vacuumizing the lens cone and the sample bin; the damping mechanism is arranged between the mounting rack and the electron microscope main body; the adapter comprises an adapter tube, a first joint and a second joint, and the first joint and the second joint are arranged on the two sides of the adapter tube; the vacuum tube structure comprises a first flexible tube, a first rigid tube, a second flexible tube and a second rigid tube, and the first flexible tube and the second flexible tube are symmetrically arranged. Due to the fact that the flexible pipes are connected with the vacuumizing mechanism and the rigid pipe is connected with the electron microscope body, the symmetrical flexible pipes can balance pulling force in the vacuumizing process, the influence of the pulling force on the electron microscope body is reduced, the influence on the image quality is reduced, and the detection accuracy of the scanning electron microscope and the definition of images are effectively guaranteed.
Owner:CHOTEST TECH INC

Method for detecting surface defects of aluminum alloy plate with epoxy coating

The invention relates to the technical field of processing, testing or inspection of aircraft parts, and provides a method for detecting surface defects of an aluminum alloy plate with an epoxy coating. The method comprises the following steps: applying an epoxy coating doped with a zinc yellow pigment to an anodic oxide film to construct a coating test piece with a color difference indication function, and placing the coating test piece in a coastal atmospheric environment for exposure sampling. In the detection process, the gloss loss rate, the chromatic aberration, the contact angle, the defect area proportion and the corrosion current density are collected, a dynamic correction coefficient is calculated according to the hydrolysis degree of the zinc yellow pigment, all parameter thresholds are adjusted in a self-adaptive mode, and a threshold set is constructed. And in combination with scanning electron microscope image segmentation and Tafel extrapolation analysis, multi-source indexes are fused to judge whether the coating is invalid. According to the method, the hydrolysis behavior of the zinc yellow pigment can be tracked in real time, the judgment standards of optical, morphology and electrochemical indexes are automatically corrected, and the accuracy and reliability of failure detection of the epoxy coating aluminum alloy plate under the coastal service condition are improved.
Owner:AIR FORCE UNIV PLA

Corrosion-resistant structured transition metal alloy electrode suitable for hydrogen production from alkaline water and preparation method of corrosion-resistant structured transition metal alloy electrode

The invention belongs to the technical field of new energy and electrochemistry, and particularly relates to a corrosion-resistant structured transition metal alloy electrode suitable for hydrogen production from alkaline water and a preparation method of the corrosion-resistant structured transition metal alloy electrode. The method comprises the following steps: sequentially carrying out sand blasting treatment and electrochemical activation treatment on a nickel net substrate so as to improve the surface roughness and the number of active sites; and then performing constant-current deposition in an electro-deposition solution containing nickel salt and ferric salt and / or cobalt salt, and constructing a nickel-based alloy catalyst layer in a micron array shape to obtain the alloy electrode. Through observation of a scanning electron microscope, the surface of the obtained electrode has a sphere-like microstructure, the arrangement is compact, and the catalytic efficiency and durability can be improved. The prepared structured alloy electrode has the advantages of being high in interface bonding force, high in electro-catalytic performance, high in alkali corrosion resistance and the like, and is suitable for efficient and long-term operation of hydrogen production through alkaline electrolysis of water.
Owner:BEIJING SMART ENERGY RES INST +1

Rapid positioning method for scanning electron microscope

The invention discloses a rapid positioning method for a scanning electron microscope. The rapid positioning method comprises the following steps: acquiring a reference image and a target image of a sample; decomposing the reference image and the target image into a plurality of areas, and respectively extracting target points of each area in the reference image and the target image; matching the target point pairs in the same area of the reference image and the target image, calculating the deformation tensor of the area where the target point is located in the target image, and distinguishing the deformation type of each area in the target image; according to the local deformation type, affine or thin-plate spline transformation models are dynamically allocated to a plurality of areas of the target image; splicing the plurality of sub-models to obtain a complete three-dimensional model of the sample; based on the obtained three-dimensional model, mapping coordinates of a target point in real time; according to the method, the accurate sample three-dimensional model is obtained by using the transformation model according to the deformation tensors of different areas of the target image, so that high-precision reconstruction of the target point at the position of the warped edge curved surface is realized, and the positioning precision of the target point in the three-dimensional space is improved.
Owner:NANJING MOSTECH INTELLIGENT TECH CO LTD

A sample fixture for realizing the combination of FIB-TKD and a scanning electron microscope detection system

The present invention discloses a sample fixture for realizing the combination of FIB-TKD and a scanning electron microscope detection system. The sample fixture includes a sample holder and a semi-copper mesh clamping piece rotatably mounted on the sample holder. The sample holder is detachably connected to the sample stage of the scanning electron microscope. At least one semi-circular groove is provided on the semi-copper mesh clamping piece for placing the semi-copper mesh, and each semi-circular groove is equipped with a pressing spring piece for clamping and fixing the semi-copper mesh on the semi-circular groove. A positioning unit is provided between the sample holder and the semi-copper mesh clamping piece to fix the position of the semi-copper mesh clamping piece after rotating a certain angle by using the positioning unit. Based on this sample fixture, the present application also proposes a scanning electron microscope detection system for simultaneously realizing FIB sample preparation and TKD experiments, including a TKD experiment unit, a sample preparation system, etc. By adjusting the position of the sample using the sample fixture, a planar transmission electron microscope sample that meets the test requirements can be prepared quickly and efficiently, and a transmission EBSD (TKD) experiment can also be completed.
Owner:JICUI NEW MATERIAL R & D CO LTD +1

A method for analyzing the fracture of high-cr steel or alloy cracked in high-temperature environment

This invention discloses a method for analyzing the fracture surface of high-Cr steel or alloy steel that cracks in a high-temperature environment. The method involves cutting a metallographic sample at the crack tip of a crack-containing block, polishing it, visually observing the crack morphology, and analyzing the composition of corrosion products on the sample. The sample is then etched with an etchant, and the relationship between the crack direction and the microstructure of the sample is observed under a metallographic microscope to obtain the crack metallographic test results. The remaining crack in the crack-containing block is opened, and the macroscopic features of the fracture surface are visually observed. The microscopic features of different regions of the fracture surface are observed using a scanning electron microscope, and the composition is tested to obtain the micro-region composition. The surface corrosion of the fracture surface is removed using an electrostatic descaling method, and the microscopic features of different regions of the fracture surface are observed under a scanning electron microscope. Based on the crack metallographic test results, the macroscopic and microscopic features of the fracture surface, and the micro-region composition, the cause of the cracking is determined. This invention provides a complete analytical procedure, yields abundant information, and effectively analyzes the causes of component cracking.
Owner:XIAN THERMAL POWER RES INST CO LTD

Identification method for self-sealing reservoir formation of shallow shale gas

PendingCN121595416APermeability/surface area analysisMicro porosityRock core
The invention discloses a shallow shale gas self-sealing reservoir formation identification method, which comprises the following steps: firstly, carrying out dual-energy CT scanning on a shale full-diameter core sample to obtain DEI values, and the difference of the DEI values embodies different lithologic (physical property) longitudinal change rules, i.e., different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, and different shale lithologic grain interlayer interlayers; the development of the top and bottom plates of the high-quality shale reservoir enables the shale gas to have a self-sealing reservoir forming characteristic; then simulating the adsorbability of the shale gas through laboratory thermal cracking to obtain a shale gas adsorbability rule, and identifying whether the shale gas has a self-sealing reservoir forming characteristic or not. And finally, measuring the distribution rule of the microscopic porosity and the pore diameter through a scanning electron microscope, judging whether the shale layer is a non-or ultra-low permeability layer under the formation temperature and pressure condition or not, and identifying whether the shale gas has the self-sealing reservoir forming characteristic or not. According to the method, the self-sealing reservoir forming of the shale gas is identified in multiple aspects, and the method provides effective technical support for evaluating the favorable layer section of the shale and is of great significance in improving the exploration and development effect of the shale gas.
Owner:PETROCHINA CO LTD

Method for detecting dislocation of single crystal silicon specimen, method for determining target value of oxygen concentration of single crystal silicon wafer, method for manufacturing single crystal silicon ingot, and method for manufacturing single crystal silicon wafer

To provide a novel method for detecting dislocation that is present in a single crystal silicon specimen after a coating is formed thereto.SOLUTION: A method for detecting dislocation of a single crystal silicon specimen includes a step of detecting a part as dislocation that is observed as a bright line in an electronic channeling image that is acquired by irradiating a surface of a single crystal silicon specimen with an electron beam by a scanning electron microscope, where the irradiation with the electron beam includes a step of irradiating one or more crystal planes of the single crystal silicon specimen with the electron beam in an incidence azimuth within a range of satisfying an electronic channeling condition and the one or more crystal planes include a {220} surface.SELECTED DRAWING: None
Owner:SUMCO CORP

Method for simulating and detecting micro / nano plastic released by food contact plastic product

The invention relates to the technical field of analysis and detection, in particular to a method for simulating and detecting micro / nano plastic released by food contact plastic products. The method provided by the invention aims at the blank of the existing food-source micro-plastic detection system, simulative component liquid is collected by simulating the contact between food components and food plastic products, micro-nano plastics are separated through a 1m filter membrane, and micro-sized plastics on the filter membrane are qualitatively and quantitatively detected by adopting a microscopic infrared spectrum and a scanning electron microscope. The water sample under the filter membrane is subjected to qualitative and quantitative treatment on the nano-plastic by a thermal cracking-gas chromatography-mass spectrometry combined technology and a nano-particle tracking analyzer, so that programmed comprehensive detection is realized. According to the method, the amount and what kind of micro-nano plastic can be released by the plastic product in a real use chain are more clearly revealed, support is provided for a market supervision system, health and life safety of the masses are guaranteed, and the method has a good application prospect.
Owner:ZHEJIANG GONGSHANG UNIVERSITY

Bus duct insulation performance evaluation system

The invention discloses a bus duct insulation performance evaluation system, and the system comprises a microscopic collection module which is used for collecting a joint interface microscopic image through a scanning electron microscope, and obtaining material distribution and defect parameters; the finite element analysis module is used for performing finite element analysis by utilizing the material distribution and defect parameters and calculating an electric field intensity gradient value; the electric field distortion identification module is used for identifying an electric field distortion area according to the electric field intensity gradient value and determining a partial discharge position coordinate; the dielectric parameter measurement module is used for measuring a dielectric constant and a loss factor at the partial discharge position coordinates to generate a change curve; the aging index calculation module is used for extracting peak value and slope characteristics from the change curve and calculating a material aging index; the correlation model building module is used for building a correlation model of the material aging index and the insulation strength and generating a prediction coefficient; and the evaluation optimization module is used for correcting the insulation performance evaluation value by using the prediction coefficient and outputting an optimization evaluation report.
Owner:HUANENG ELECTRIC (GUANGDONG) CO LTD

Comprehensive optimization method and system for thermal conductive plastic performance

The invention relates to a comprehensive optimization method and system for thermal conductive plastic performance in the technical field of new materials, and the method comprises the following steps: obtaining initial dispersion state data of an inorganic filler in thermal conductive plastic, and analyzing spatial distribution of filler particles through a scanning electron microscope to obtain characteristic parameters of random distribution of the filler; according to the characteristic parameters of the random distribution of the filler, calculating the heat transfer efficiency among filler particles by adopting a finite element simulation method, and determining the distribution rule of the phonon scattering phenomenon; according to the improved interface bonding strength parameters, the Monte Carlo method is adopted to simulate orientation distribution of filler particles in a matrix, and a preliminary scheme of filler orientation control is obtained; for optimization parameters of complex mold forming, a particle swarm optimization algorithm is adopted to adjust the filler proportion and distribution, and the structure configuration of the efficient three-dimensional heat conduction network is generated; and according to the structure configuration of the efficient three-dimensional heat-conducting network, the improvement degree of the heat-conducting plastic performance is analyzed and verified through a heat-conducting finite element, and final heat transfer efficiency data is obtained.
Owner:DONGGUAN WANGPIN IND CO LTD

Amplification power calibration method of scanning electron microscope

The invention relates to the technical field of semiconductors, and provides an amplification factor calibration method of a scanning electron microscope. The method comprises the following steps: in a TEM imaging mode, TEM measurement data of a key structure of a TEM sample is determined, and the TEM sample is a TEM sample with a known process structure size or clear lattice fringes; in an SEM imaging mode, determining an SEM measurement data set of the key structure of the TEM sample under different SEM amplification factors; each SEM magnification of the scanning electron microscope is calibrated based on the TEM measurement data and the SEM measurement data set. The method is easy and convenient to operate, does not need to depend on a standard sample, and is lower in calibration cost and higher in calibration accuracy.
Owner:GIGA FORCE ELECTRONICS CO LTD +1

Sample preparation method for observing surface morphology of medium-high voltage formed foil

The invention discloses a sample preparation method for observing the surface appearance of a medium-high voltage formed foil, which comprises the following steps: cutting the formed foil into a strip-shaped sample with a specific size, grinding and polishing, carrying out primary ultrasonic cleaning, putting into a special alkaline corrosive liquid for treatment, carrying out secondary ultrasonic cleaning, and finally observing by using a scanning electron microscope. The alkaline corrosive liquid comprises various components such as potassium hydroxide and sodium silicate, and the components have a synergistic effect and are prepared under the conditions of optimized temperature, stirring rotation speed and the like. The sample preparation method has remarkable advantages, and compared with a traditional method, the use of chemicals easy to explode is avoided, so that the safety is greatly improved; the operation process is standard, parameters are clear, simplicity and convenience are achieved, and repeatability is good; by accurately controlling the corrosion process, the sample preparation effect is good, and the surface appearance can be clearly presented; meanwhile, the components of the used corrosive liquid are environment-friendly, and environmental pollution is reduced. The method has a wide application prospect in the related scientific research and production fields of electronic materials.
Owner:广西广投正润新材料科技有限公司

Automatic electron beam calibration on periodic nanostructures

ActiveUS20250357075A1Image enhancementImage analysisPeriodic nanostructuresElectron microscope
Systems, methods, and media for calibrating a scanning electron microscope (SEM). The system includes a processor and a memory. The memory stores instructions that, when executed by the processor, configure the system to perform operations. An electron microscope image of a periodic structure is generated by the SEM. A Fourier transform of the electron microscope image is computed to generate a spectrum. Reciprocal lattice vectors are computed based on a known periodicity of the periodic structure. A pixel mask is generated based on the reciprocal lattice vectors and applied to filter the spectrum. A quality metric is generated based on an aggregate magnitude of the filtered spectrum and a magnitude of a zero-frequency component of the filtered spectrum. A pixel scaling parameter, focus parameter, and / or stigmation parameter of the SEM are determined based on the quality metric.
Owner:SNAP INC