371 results about "Scanning electron microscope" patented technology

The invention discloses a method and device for identifying organic matter pores in a shale electron microscope scanning image, and the method comprises the steps: obtaining a shale scanning electron microscope original image, carrying out the manual marking, and generating an original image and mask image data set; performing synchronous data enhancement on the data set and dividing a training set and a verification set; constructing an improved U-Net model containing a multi-scale feature fusion input module, a residual attention module and a wavelet domain feature enhancement center module; training the model by adopting a dynamic mixed loss function and an AdamW optimizer; and verifying the model through an average intersection-to-union ratio, a pore Dice coefficient and a pore error, and identifying the pores of the image to be processed after reaching the standard. The device correspondingly comprises an image acquisition annotation module, a data preprocessing module, a model construction module, a training module, a verification module and a pore recognition module. According to the method, full-automatic identification is realized, the multi-scale pore segmentation precision and the low-porosity sample adaptability are improved, and the efficient characterization requirement of the shale gas reservoir is met.

The invention provides a scanning electron microscope image edge detection method, which comprises the following steps: carrying out anisotropic diffusion filtering on a scanning electron microscope image to suppress noise and reserve edges to obtain a filtered image; an original scale gradient and a down-sampling scale gradient of the filtered image are calculated, a plurality of pixel regions in the original scale gradient and the down-sampling scale gradient are fused based on a plurality of adaptive weights to obtain a gradient map, the adaptive weights are determined based on the complexity of the texture of the filtered image, and each pixel region corresponds to one adaptive weight; multi-dimensional features are extracted from the gradient map, the multi-dimensional features are input into a machine learning model for threshold prediction, a continuous pixel-level threshold map is generated based on a predicted threshold, and a gradient threshold included in the continuous pixel-level threshold map is a critical value for distinguishing different types of pixels in the gradient map; and comparing the gradient map with the continuous pixel-level threshold map to obtain a target edge pixel, and generating an edge detection result map based on the target edge pixel.

The invention discloses a machine vision-based automatic identification and calculation method for pore change of a rock section under an SEM (scanning electron microscope), and the method comprises the steps: obtaining original image data of the rock section through a scanning electron microscope, transmitting the original image data to a machine vision SEM pore intelligent quantification cloud platform, and dividing the original image data into a plurality of image sub-regions which are not overlapped with each other; calling a special threshold inversion model to analyze the gray information of each sub-region, and determining a dual-phase pore segmentation threshold; carrying out edge extraction on the sub-regions after threshold processing by adopting a pore edge gradient enhancement algorithm; performing topological structure analysis on the intermediate image data by using a biphase pore topological inversion model, constructing and optimizing a pore space topological network, and eliminating false pore structure data; and according to the optimized pore space topology network, integrating calculation results of all the sub-regions to obtain a pore change identification calculation result of the whole rock section. The method improves the pore identification precision and processing efficiency, and adapts to different types of rock samples.

The invention provides an in-situ real-time monitoring method and system for a rock microscopic fracture mechanism and stress evolution. The method comprises the following steps: S1, standardized preparation and pretreatment of a rock sample; s2, in-situ loading and multi-modal data synchronous acquisition are carried out; s3, crack dynamic tracking and stress-strain field joint calculation; s4, constructing a microscopic-macroscopic quantitative correlation and damage model; and S5, performing multi-dimensional dynamic visualization and engineering output. The in-situ scanning electron microscope and the mechanical loading device are integrated, so that cross-scale synchronous monitoring and quantitative analysis of micro crack evolution and macroscopic stress-strain response are realized. A low-disturbance clamping device and a conductive anti-charge sample are treated, and in-situ testing is ensured; combining DIC and deep learning to quantify a crack propagation path, a local strain field and energy characteristics; through DIC strain inversion and finite element calculation, a non-contact stress cloud picture is generated in real time, and finally quantitative correlation between a microscopic fracture mechanism and macromechanical response is established.

The invention provides a contour measurement method, electronic equipment and a storage medium. The method comprises the following steps: acquiring a standard image, a contour of the standard image and an SEM image of a to-be-measured product acquired by a critical dimension scanning electron microscope CD-SEM; adopting a target physical threshold model to extract a target contour of the SEM image; and determining a target edge placement error between the contour of the standard image and the target contour of the SEM image, and generating and outputting a contour measurement result of the to-be-measured product according to the target edge placement error, so as to improve the precision of contour extraction and the accuracy and efficiency of contour measurement.

The invention discloses an image processing method and device, a medium and a computer program product, and relates to the technical field of semiconductor manufacturing. The image processing method comprises the following steps: acquiring target image samples of a plurality of wafer samples through a scanning electron microscope, and obtaining a first contour image label of each target image sample; based on the target image sample, a first contour image result is generated through a generator of a preset image edge model, iteration training is carried out on the preset image edge model through pixel difference loss, adversarial loss and edge supervision loss until a convergence condition is met, and a target image edge model is obtained; the generator of the target image edge model can output an edge contour image based on the target image of the target wafer. Through multi-dimensional constraints of pixel difference loss, edge supervision loss and adversarial loss, the preset image edge model is trained in the direction of generating an actual edge contour, and the accuracy of the edge contour image is improved.

The invention relates to the technical field of electron microscopic imaging, in particular to a correction method and device for geometric distortion in scanning electron microscope measurement, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring a scanning electron microscope image of a standard sample; calculating an orthogonal included angle parameter and a length-width ratio parameter of the scanning electron microscope image; iteratively adjusting the angle correction parameter and the gain correction parameter under a fixed scanning rotation angle until a preset local calibration constraint condition is met; verifying the orthogonal included angle parameter and the length-width ratio parameter under each scanning rotation angle; and when the orthogonality included angle parameter and the length-width ratio parameter do not meet a preset global stability constraint condition, adjusting a relative gain coefficient, and re-executing calibration verification under each scanning rotation angle until a full-angle correction requirement is met. By adopting the method, high precision and stability of imaging correction can be kept in a full-angle range.

The invention relates to the technical field of processing, testing or inspection of aircraft parts, and provides a method for detecting surface defects of an aluminum alloy plate with an epoxy coating. The method comprises the following steps: applying an epoxy coating doped with a zinc yellow pigment to an anodic oxide film to construct a coating test piece with a color difference indication function, and placing the coating test piece in a coastal atmospheric environment for exposure sampling. In the detection process, the gloss loss rate, the chromatic aberration, the contact angle, the defect area proportion and the corrosion current density are collected, a dynamic correction coefficient is calculated according to the hydrolysis degree of the zinc yellow pigment, all parameter thresholds are adjusted in a self-adaptive mode, and a threshold set is constructed. And in combination with scanning electron microscope image segmentation and Tafel extrapolation analysis, multi-source indexes are fused to judge whether the coating is invalid. According to the method, the hydrolysis behavior of the zinc yellow pigment can be tracked in real time, the judgment standards of optical, morphology and electrochemical indexes are automatically corrected, and the accuracy and reliability of failure detection of the epoxy coating aluminum alloy plate under the coastal service condition are improved.

This invention discloses a method for analyzing the fracture surface of high-Cr steel or alloy steel that cracks in a high-temperature environment. The method involves cutting a metallographic sample at the crack tip of a crack-containing block, polishing it, visually observing the crack morphology, and analyzing the composition of corrosion products on the sample. The sample is then etched with an etchant, and the relationship between the crack direction and the microstructure of the sample is observed under a metallographic microscope to obtain the crack metallographic test results. The remaining crack in the crack-containing block is opened, and the macroscopic features of the fracture surface are visually observed. The microscopic features of different regions of the fracture surface are observed using a scanning electron microscope, and the composition is tested to obtain the micro-region composition. The surface corrosion of the fracture surface is removed using an electrostatic descaling method, and the microscopic features of different regions of the fracture surface are observed under a scanning electron microscope. Based on the crack metallographic test results, the macroscopic and microscopic features of the fracture surface, and the micro-region composition, the cause of the cracking is determined. This invention provides a complete analytical procedure, yields abundant information, and effectively analyzes the causes of component cracking.

The invention discloses a shallow shale gas self-sealing reservoir formation identification method, which comprises the following steps: firstly, carrying out dual-energy CT scanning on a shale full-diameter core sample to obtain DEI values, and the difference of the DEI values embodies different lithologic (physical property) longitudinal change rules, i.e., different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, different shale lithologic grain interlayer interlayers, and different shale lithologic grain interlayer interlayers; the development of the top and bottom plates of the high-quality shale reservoir enables the shale gas to have a self-sealing reservoir forming characteristic; then simulating the adsorbability of the shale gas through laboratory thermal cracking to obtain a shale gas adsorbability rule, and identifying whether the shale gas has a self-sealing reservoir forming characteristic or not. And finally, measuring the distribution rule of the microscopic porosity and the pore diameter through a scanning electron microscope, judging whether the shale layer is a non-or ultra-low permeability layer under the formation temperature and pressure condition or not, and identifying whether the shale gas has the self-sealing reservoir forming characteristic or not. According to the method, the self-sealing reservoir forming of the shale gas is identified in multiple aspects, and the method provides effective technical support for evaluating the favorable layer section of the shale and is of great significance in improving the exploration and development effect of the shale gas.

The invention relates to the technical field of analysis and detection, in particular to a method for simulating and detecting micro / nano plastic released by food contact plastic products. The method provided by the invention aims at the blank of the existing food-source micro-plastic detection system, simulative component liquid is collected by simulating the contact between food components and food plastic products, micro-nano plastics are separated through a 1m filter membrane, and micro-sized plastics on the filter membrane are qualitatively and quantitatively detected by adopting a microscopic infrared spectrum and a scanning electron microscope. The water sample under the filter membrane is subjected to qualitative and quantitative treatment on the nano-plastic by a thermal cracking-gas chromatography-mass spectrometry combined technology and a nano-particle tracking analyzer, so that programmed comprehensive detection is realized. According to the method, the amount and what kind of micro-nano plastic can be released by the plastic product in a real use chain are more clearly revealed, support is provided for a market supervision system, health and life safety of the masses are guaranteed, and the method has a good application prospect.

The invention relates to a comprehensive optimization method and system for thermal conductive plastic performance in the technical field of new materials, and the method comprises the following steps: obtaining initial dispersion state data of an inorganic filler in thermal conductive plastic, and analyzing spatial distribution of filler particles through a scanning electron microscope to obtain characteristic parameters of random distribution of the filler; according to the characteristic parameters of the random distribution of the filler, calculating the heat transfer efficiency among filler particles by adopting a finite element simulation method, and determining the distribution rule of the phonon scattering phenomenon; according to the improved interface bonding strength parameters, the Monte Carlo method is adopted to simulate orientation distribution of filler particles in a matrix, and a preliminary scheme of filler orientation control is obtained; for optimization parameters of complex mold forming, a particle swarm optimization algorithm is adopted to adjust the filler proportion and distribution, and the structure configuration of the efficient three-dimensional heat conduction network is generated; and according to the structure configuration of the efficient three-dimensional heat-conducting network, the improvement degree of the heat-conducting plastic performance is analyzed and verified through a heat-conducting finite element, and final heat transfer efficiency data is obtained.

The invention relates to the technical field of semiconductors, and provides an amplification factor calibration method of a scanning electron microscope. The method comprises the following steps: in a TEM imaging mode, TEM measurement data of a key structure of a TEM sample is determined, and the TEM sample is a TEM sample with a known process structure size or clear lattice fringes; in an SEM imaging mode, determining an SEM measurement data set of the key structure of the TEM sample under different SEM amplification factors; each SEM magnification of the scanning electron microscope is calibrated based on the TEM measurement data and the SEM measurement data set. The method is easy and convenient to operate, does not need to depend on a standard sample, and is lower in calibration cost and higher in calibration accuracy.

The invention provides a rock mass internal pore intelligent characterization and three-dimensional reconstruction method and system, and relates to the technical field of rock mass internal structure analysis, and the method comprises the steps: obtaining a two-dimensional image sequence of a rock core in a target rock mass through a focused ion beam scanning electron microscope slicing-imaging sequence working mode; performing pore segmentation on each two-dimensional image in the two-dimensional image sequence by using the pore segmentation network to obtain a plurality of pore two-dimensional segmentation maps; on the basis of the pore two-dimensional segmentation map, constructing three-dimensional binary volume data of the pores according to a slice sequence; according to the three-dimensional binary volume data, performing three-dimensional reconstruction and structural characterization on rock core pores; according to the method, an imaging-recognition-reconstruction-evaluation integrated workflow is constructed, and a full-chain closed loop from nanoscale real three-dimensional data acquisition to intelligent recognition, three-dimensional reconstruction and quantitative analysis is realized.

The invention discloses a sample bracket, and relates to the technical field of scanning electron microscopes, the sample bracket provided by the invention comprises a mounting base, a clamping base, an inclination angle sample seat, a carrying net and a positioning device, the mounting base can be fixed on a vacuum transfer device; the clamping base is fixedly arranged on the mounting base, and a plurality of fixed mounting positions and at least one adjusting mounting position are arranged on the clamping base; the plurality of inclination angle sample seats are respectively arranged at the fixed mounting position and the adjusting mounting position, and the inclination angle of the inclination angle sample seat at the adjusting mounting position can be adjusted; the carrying net is used for carrying a sample and is arranged on the inclination angle sample seat; the positioning device can abut against the side, away from the dip angle sample base, of the carrying net so that the carrying net can be fixed to the dip angle sample base. According to the sample bracket provided by the invention, the dip angle of the dip angle sample seat at the mounting position can be adjusted, the sample bracket is adaptive to a scanning electron microscope vacuum transfer device, and the dip angle of the sample can be flexibly adjusted according to different crystal orientation requirements.

The invention provides an improved Arcan disc complex stress metal fatigue test method. The method specifically comprises the following steps: (1) designing clamps for stretching, stretching-shearing and pure shearing fatigue tests; (2) designing a clamp for compression, compression-shear and pure shear fatigue tests; (3) designing a stretching-shearing or compression-shearing sample, and connecting the clamps designed in the step (1) and the step (2) to a clamping rod and a pin required by a fatigue testing machine; and (4) assembling the clamps designed in the step (1) and the step (2) and the sample designed in the step (3), and connecting to a fatigue testing machine by using a clamping rod and a pin. The metal fatigue performance test under different stress states such as stretching / compression, stretching-shearing / compression-shearing, pure shearing and the like can be realized, the fatigue test result difference caused by different stress states can be quantified, optical and high-resolution scanning electron microscope observation under in-situ conditions can be compatible, and the fatigue failure mechanism analysis is facilitated.

The invention relates to the technical field of scanning electron microscope image processing, and discloses a scanning electron microscope image restoration method based on a wavelet frequency domain adjustment diffusion model, and the method comprises the steps: constructing a two-stage degradation pipeline comprising random light path disturbance and fixed circuit collection limitation, and generating a specific domain training data set; extracting multi-scale high-frequency energy characteristic modulation noise distribution by using a frequency domain prior encoder, and training a wavelet frequency domain adjustment diffusion model; and inputting a target low-quality degraded image into the pre-training model, initializing a potential noisy state, then executing reverse denoising iteration, calculating wavelet domain consistency gradient correction noise prediction, and updating the potential noisy state until a restored image is generated. According to the method, data distribution mismatch is relieved through physical degradation modeling, high-frequency detail perception is enhanced by means of a frequency domain adjustment mechanism, the structural fidelity is improved through wavelet domain gradient guidance, and balance between scanning electron microscope image noise suppression and detail recovery is achieved.

The invention discloses a scanning electron microscope three-dimensional shape measurement method and a measurement system thereof, which are characterized in that the method adopts a directional focusing method to perform separated focusing and measurement on the top and the bottom of a target structure, and three-dimensional shape parameters of the target structure are obtained through a definition evaluation function; the system comprises a displacement sample stage system, an electron beam imaging system and an image processing algorithm, the electron beam imaging system is composed of an electron source, an electromagnetic lens, an electron detector and an imaging module, and the electron beam imaging system generates a focused electron beam and obtains a secondary electronic signal image; the image processing algorithm is integrated in an electron beam imaging module in the CD-SEM, and accurate positioning, feature recognition and precise measurement of a target structure are achieved. Compared with the prior art, the method has the advantages that directional focusing of the top or the bottom is achieved by analyzing the gradient distribution characteristics of the image profile curve, and the measurement problem of separating and quantifying key three-dimensional parameters such as the side wall angle, the bottom key size and the structure depth is effectively solved.

The utility model discloses an objective table of a scanning electron microscope, which comprises a base, a knob arranged on the side edge of the base, a transmission assembly arranged in the base, a rotating assembly connected with the transmission assembly, and a supporting assembly connected with the rotating assembly, the transmission assembly comprises a worm arranged in the knob and a worm gear connected to the worm; the rotating assembly comprises a threaded piece connected to the worm gear and a lead screw connected to the threaded piece. The supporting assembly comprises a supporting base connected to the top of the lead screw and a first platform arranged on the supporting base. According to the utility model, the worm and the worm gear are matched with each other to adjust the height of the sample, and the displacement of the sample in the horizontal direction is realized through the matching among the first slide rail, the first slide block, the second slide rail and the second slide block.

The invention relates to a method for rapidly preparing a cell scanning electron microscope sample through cell surface metal deposition. The method comprises immobilizing a cell sample with an immobilizing agent; incubating in a catalyst solution; placing in a metal deposition solution for cell metal deposition; the cell sample is obtained. The prepared cell sample can be directly used for scanning electron microscope imaging after being dried. According to the method, the micro-nano structure on the surface of the cell is directly mechanically enhanced in the solution through electroless metal deposition, the cell sample is endowed with electrical conductivity, additional chemical modification on the cell is not needed, gradient dehydration on the cell is not needed, and metal spraying treatment on the cell is not needed; and cell scanning electron microscope sample preparation and imaging can be conveniently and quickly carried out.

Provided are: composite copper particles suitable for use as a raw material for a paste that can be sintered even in an inert atmosphere and that can be used in a non-pressure bonding method; and a bonding member containing the paste; and a method for producing the composite copper particles. The present invention is a composite copper particle containing a copper particle, a monocarboxylic acid or a salt thereof, and a compound represented by general formula 1: R1 (OCH2CH2) nOR2 (in the formula, R1 represents an alkyl group, an aryl group, or a hydrogen atom, R2 represents an alkyl group, an aryl group, a hydrogen atom, or an acetyl group, and n is an integer of 1-4 (inclusive), but not the case where both R1 and R2 are a hydrogen atom), and a compound represented by general formula 1: R1 (OCH2CH2) nOR2 (in the formula, R1 represents an alkyl group, an aryl group, or a hydrogen atom, R2 represents an alkyl group, an aryl group, a hydrogen atom, or an acetyl group). The average particle diameter of the composite copper particles measured by a scanning electron microscope is 170 nm or more and 600 nm or less.

The utility model discloses an auxiliary jig for microscopic analysis of a thin sample, which comprises a main mounting component, a limiting component arranged on the main mounting component, a middle hole arranged on the main mounting component, auxiliary holes arranged on two sides of the middle hole on the main mounting component, a guide component arranged in the auxiliary holes, and a positioning component arranged on the guide component. A stop assembly is arranged in the middle hole, a movable clamping assembly is arranged at one end of the guide assembly, and a supporting assembly is arranged on the guide assembly and located between the movable clamping assembly and the main installation assembly. The auxiliary jig has the advantages that the auxiliary jig is ingenious in structural design, high in practicability and convenient to operate, by means of the auxiliary jig, fixation and microscopic analysis of thin samples are achieved, conductive adhesive is avoided, stability of the samples in the sample observation process is guaranteed, and the sample observation efficiency is improved. The method is of great significance to the service life and cost saving of the scanning electron microscope.

The invention relates to the field of wafer detection, in particular to a wafer detection device and method, the device comprises a scanning electron microscope, an atomic force microscope and piezoelectric ceramics, the scanning electron microscope comprises a lens cone, an objective lens and a sample chamber, the objective lens is arranged in the sample chamber, and a sample table for bearing a wafer to be detected is arranged in the sample chamber; the objective lens is used for acquiring a two-dimensional morphology image of the surface of the wafer to be detected; the atomic force microscope is arranged in the sample chamber, the atomic force microscope is not in contact with the sample table, the atomic force microscope comprises a cantilever and a probe installed at the end of the cantilever, the probe is used for obtaining the three-dimensional structure of a wafer to be detected, and the piezoelectric ceramic is arranged at the end, away from the probe, of the cantilever; and the piezoelectric ceramic pressure realizes fine adjustment of the probe in horizontal and height directions through directional deformation. Vibration of the sample table and transmission of heat to the atomic force microscope are effectively isolated, and measurement errors caused by mismatch of vibration noise and thermal expansion are reduced. Precise control of the position of the probe is realized through piezoelectric ceramics.

The invention relates to the technical field of in-situ detection of electron microscopes, in particular to a one-stop four-dimensional transmission scanning focused ion beam double-beam electron microscope, which comprises a vacuum cavity provided with a vacuum cavity cover; a sample table is arranged on the inner side of the vacuum cavity cover; the electron beam, the ion beam, the manipulator, the sample holder and the gas injection system are mounted on the vacuum cavity through the multifunctional in-situ sealing flange; the system further comprises a 4D STEM detector. According to the invention, electron beam observation, ion beam processing, four-dimensional scanning transmission electron microscope imaging information acquisition and in-situ electric, optical, thermal, force and other external field loading functions are integrated, and scanning electron microscope imaging, transmission electron microscope sample preparation and in-situ 4D STEM diffraction information acquisition under multi-field combined application can be carried out on a sample in one device. One-stop full-scale multi-field combined application detection is realized, the test result is prevented from being influenced by contact with air, water and other external environments in the sample transfer process, and meanwhile, the test efficiency is remarkably improved.

The application provides an electron microscope for in-situ characterization of material surface and interface damage under multi-factor coupled corrosion, relates to the technical field of in-situ detection equipment, and aims at solving the technical problem that the scanning electron microscope in the prior art cannot realize the research on the damage mechanism of the material under a specific corrosion environment in-situ. The electron microscope for in-situ characterization of material surface and interface damage under multi-factor coupled corrosion comprises an electron microscope bin, a support frame, a corrosion-resistant loading table, a laser heating device and a gas needle. The corrosion-resistant loading table clamps a sample after salt spraying and applies stress to the sample. The laser heating device and the gas needle are integrated in the electron microscope bin. The sample is heated by the laser heating device, the hot salt environment under the stress state of the service of the sample is simulated, trace reaction gas is introduced to the surface of the sample through the gas needle, the test environment is closer to the actual environment, and thus the damage mechanism of the material under a specific environment is more truly revealed, thereby laying a foundation for establishing a hot, force and electrochemical multi-field coupled corrosion damage theory and a corrosion damage evaluation model.

The invention discloses a preparation method of an iron ore concentrate powder scanning electron microscope sample, and belongs to the field of material analysis and testing. The preparation method comprises the following steps: (1) adding iron ore concentrate powder to be detected into absolute ethyl alcohol, and fully and uniformly shaking to obtain a sample solution; (2) adding a dispersing agent into the sample solution, and uniformly oscillating by using an ultrasonic method to obtain a solution after ultrasonic oscillation; and (3) pouring the solution subjected to ultrasonic oscillation into a sprayer, uniformly spraying the solution to the surface of a conductive adhesive tape fixed on an objective table of a scanning electron microscope through the sprayer, and naturally drying to obtain the iron ore concentrate powder scanning electron microscope sample. The method is simple in sample preparation process, uniform in iron ore concentrate particle dispersion and easy to operate, the problem of iron ore concentrate powder agglomeration is solved, meanwhile, a scanning electron microscope sample chamber is not polluted, and the observation result is real and reliable.

The invention belongs to the field of basic research of sandstone type uranium ore associated resource evaluation, and particularly relates to a method for judging the existence form of associated gallium in a sandstone type uranium deposit, which comprises the following steps of: measuring the contents of major elements and trace elements of a plurality of uranium ore samples, and judging whether gallium meets the lowest grade requirement of associated resources of the uranium deposit; for uranium ore samples exceeding the lowest grade requirement of gallium associated resources, correlation analysis of gallium elements, main elements and trace elements is carried out, and possible key mineral types closely related to gallium are preliminarily speculated; carrying out slice analysis, and circling an approximate range of speculated possible key mineral types; carrying out scanning electron microscope and energy spectrum analysis combined observation, and determining the existence form of gallium in the uranium deposit; the position exceeding the associated grade gallium is determined through laser in-situ analysis; the gallium-related mineral type is directly determined through electron probe analysis; and comprehensively judging the existence form of gallium in the uranium deposit. According to the method, the existence form of associated gallium in the sandstone type uranium deposit can be accurately and quickly judged.

The invention discloses an early fatigue damage detection method for a rare earth-containing steel rail. The method comprises the following steps: 1) ultrasonic multi-angle probe positioning; 2) preparing and breaking a sample; 3) performing scanning electron microscope and energy spectrum analysis; 4) observing a metallographic structure: analyzing a microstructure around the fracture by adopting a metallographic microscope; and 5) microhardness testing: carrying out high-density hardness testing on a crack source and an adjacent region, and analyzing the correlation between the rare earth induced hardness distribution abnormity and fatigue crack initiation. The invention aims to provide the early fatigue damage detection and identification method for the rare earth element-containing steel rail material, a multi-step microscopic analysis means is adopted to identify a nuclear damage source, and a correlation mechanism between rare earth inclusions and fatigue crack formation is disclosed.

The invention discloses a method for evaluating the residual strength of a multi-scale fiber-reinforced flexible pipe under a stretch-bending load, and relates to the technical field of structural strength evaluation of ocean engineering composite materials, and the method comprises the following steps: extracting fiber distribution characteristics by adopting digital image processing based on a scanning electron microscope image; a Monte Carlo method is combined to construct a two-dimensional RVE geometric model of the fiber reinforced structure containing the damp-heat degradation, and macroscopic elastic parameters are predicted; a VUMAT user material subprogram containing dynamic damage is written based on Fortran, damage starting and evolution failure criteria of a fiber reinforced structure are embedded, and the nonlinear coupling evolution process of multiple damage modes such as fiber fracture, matrix cracking and interface debonding is simulated. According to the method, a material-damage-response multi-scale analysis framework is constructed by coupling microscopic material components, a microscopic damage model and macroscopic pipeline structure analysis, the problem that a traditional method lacks multi-scale damage coupling analysis under a complex load is solved, and the residual strength evaluation precision of the pipeline under the action of a stretching-bending combined load is improved.

The invention relates to the technical field of scanning electron microscopes, and discloses a molecular pump damping device for a high-resolution scanning electron microscope, the molecular pump damping device comprises a first damping assembly, the first damping assembly comprises a first connecting structure, a corrugated pipe, a second connecting structure and a plurality of supporting columns, the two ends of the corrugated pipe are respectively connected with the first connecting structure and the second connecting structure, and the first connecting structure is connected with the second connecting structure; the two ends of the supporting column are connected with the first connecting structure and the second connecting structure respectively, and at least part of the supporting column is an elastic section. The first damping assembly is arranged, the first damping assembly is combined with the corrugated pipe and is provided with the elastic section and the supporting column, the elastic section absorbs high-frequency vibration energy through elastic deformation of the elastic section, and the corrugated pipe compensates axial and radial displacement and isolates low-frequency vibration through a flexible structure of the corrugated pipe; vibration transmitted from a molecular pump to a sample chamber of the scanning electron microscope can be dissipated, so that zigzag artifacts of an image are effectively eliminated, and the scanning electron microscope has relatively high imaging resolution and definition under high magnification.