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970 results about "Scanning electron microscope" patented technology

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using an Everhart-Thornley detector. The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. SEM can achieve resolution better than 1 nanometer.

Method and system for testing reliability of small general engine

The invention relates to the technical field of engine testing, and discloses a reliability test method and system for a small general engine, and the method comprises the steps: collecting an engine vibration signal through a superconducting quantum interferometer, and collecting a temperature distribution parameter through a quantum dot temperature sensor; performing combined testing of cold and hot shock, high-load operation and random working conditions, and synchronously monitoring dynamic response characteristic data; constructing a Weibull probability model, and determining key influence factors through a global sensitivity analysis method; acquiring a surface roughness parameter by adopting a field emission scanning electron microscope, obtaining a material component parameter through energy spectrum analysis, and establishing a parameter mapping relation; establishing a vibration and temperature early warning system, executing a graded sweep frequency excitation and abrasive particle acceleration test, and recording a parameter degradation process; and generating a three-dimensional parameter cloud picture, and outputting a reliability test report. According to the method, the reliability of the small general engine can be comprehensively and efficiently evaluated, and a scientific basis is provided for design, maintenance and improvement of the engine.
Owner:HARBIN FORESTRY MASCH RES INST STATE FORESTRY & GRASSLAND ADMINISTRATION

Method for measuring particle size of metal powder by using scanning electron microscope

The invention discloses a method for measuring the particle size of metal powder by using a scanning electron microscope, which comprises the following steps: step 1, sample treatment: adhering a small conductive adhesive tape on a sample table, sprinkling metal powder on the adhered conductive adhesive tape, and purging to obtain the conductive adhesive tape adhered with the metal powder; step 2, parameter setting: setting acceleration voltage, working distance, diaphragm, image contrast, brightness, magnification times and scanning speed of a scanning electron microscope to observe the conductive adhesive tape adhered with the metal powder obtained in the step 1 to obtain an electronic image of metal powder particles; and processing and calculating the electronic image of the metal powder particles by using software to obtain the average particle size of the metal powder particles. According to the method disclosed by the invention, a solvent is not needed to disperse the sample, pollution of the solvent to the sample is effectively avoided, and the result is more accurate than that of directly measuring the particle size by using length software.
Owner:ANGANG STEEL CO LTD

Fiber composite material skin isogeometric simulation modeling method considering micro pores

The invention provides a composite material skin isogeometric modeling method considering micro-pores, which comprises the following steps: obtaining internal characteristics of a composite material skin through an SEM scanning electron microscope, and establishing parameterized unit cell microstructure units according to the characteristics; determining a skin deformation area, constructing a constitutive matrix based on different components in the composite material, obtaining and endowing defined material attributes, and obtaining different unit mass matrixes and local stiffness matrixes in the area; and filling into the macroscopic overall matrix through an isogeometric mapping strategy, carrying out inverse mapping fitting on a skin appearance structure, and carrying out applied load calculation. According to the method provided by the invention, through an isogeometric analysis method, three-dimensional curved surface dimension reduction processing is realized, and the calculation cost is reduced; meanwhile, a parameterized microscopic unit is considered to ensure the accuracy of modeling; and the mechanical property of the composite material skin is really simulated. The method is suitable for the structure elasticoplastic deformation state that the skin bears large load, large deformation and the like, and calculation operation is easy and convenient.
Owner:NANJING FORESTRY UNIV

Method and device for identifying organic matter pores in shale electron microscope scanning image

The invention discloses a method and device for identifying organic matter pores in a shale electron microscope scanning image, and the method comprises the steps: obtaining a shale scanning electron microscope original image, carrying out the manual marking, and generating an original image and mask image data set; performing synchronous data enhancement on the data set and dividing a training set and a verification set; constructing an improved U-Net model containing a multi-scale feature fusion input module, a residual attention module and a wavelet domain feature enhancement center module; training the model by adopting a dynamic mixed loss function and an AdamW optimizer; and verifying the model through an average intersection-to-union ratio, a pore Dice coefficient and a pore error, and identifying the pores of the image to be processed after reaching the standard. The device correspondingly comprises an image acquisition annotation module, a data preprocessing module, a model construction module, a training module, a verification module and a pore recognition module. According to the method, full-automatic identification is realized, the multi-scale pore segmentation precision and the low-porosity sample adaptability are improved, and the efficient characterization requirement of the shale gas reservoir is met.
Owner:CHINA UNIV OF GEOSCIENCES (BEIJING)

Detection method, device and equipment for inclusions in steel and storage medium

The invention is suitable for the technical field of steel detection, and provides a method, device and equipment for detecting inclusions in steel and a storage medium. The method comprises the following steps: performing ultrasonic detection on to-be-detected steel to obtain first ultrasonic reflection information; inputting the first ultrasonic reflection information into a trained detection model to obtain the position, shape and size of the target inclusion in the to-be-detected steel output by the detection model; the detection model is obtained through training according to ultrasonic reflection information obtained through ultrasonic detection on the steel, the position, obtained based on the ultrasonic reflection information, of the target inclusion in the steel and the shape and size, obtained through scanning electron microscope detection on the steel and matched with the ultrasonic reflection information, of the target inclusion in the steel. According to the method, the distribution condition and the morphology characteristics of the target inclusions in the to-be-detected steel can be obtained only based on the ultrasonic reflection information, and the efficiency, the accuracy and the comprehensiveness of detection of the target inclusions in the steel are improved.
Owner:河钢数字技术股份有限公司 +1

Scanning electron microscope image edge detection method

The invention provides a scanning electron microscope image edge detection method, which comprises the following steps: carrying out anisotropic diffusion filtering on a scanning electron microscope image to suppress noise and reserve edges to obtain a filtered image; an original scale gradient and a down-sampling scale gradient of the filtered image are calculated, a plurality of pixel regions in the original scale gradient and the down-sampling scale gradient are fused based on a plurality of adaptive weights to obtain a gradient map, the adaptive weights are determined based on the complexity of the texture of the filtered image, and each pixel region corresponds to one adaptive weight; multi-dimensional features are extracted from the gradient map, the multi-dimensional features are input into a machine learning model for threshold prediction, a continuous pixel-level threshold map is generated based on a predicted threshold, and a gradient threshold included in the continuous pixel-level threshold map is a critical value for distinguishing different types of pixels in the gradient map; and comparing the gradient map with the continuous pixel-level threshold map to obtain a target edge pixel, and generating an edge detection result map based on the target edge pixel.
Owner:INST OF OPTICS & ELECTRONICS CHINESE ACAD OF SCI

Method and device for determining porosity through logging interpretation and image recognition

The invention provides a method and device for determining porosity through logging interpretation and image recognition, and relates to the technical field of oil exploration and development, and the method comprises the steps: obtaining the structure parameters of a shale sample through logging interpretation and image recognition; the structure parameters comprise TOC content, mineral content and porosity data; determining a first linear relationship based on a first type of structural parameters obtained by logging interpretation, and determining a second linear relationship based on a second type of structural parameters obtained by image recognition; the first linear relationship and the second linear relationship respectively represent mapping relationships between the porosity data and the TOC content and between the porosity data and the mineral content under the macroscopic level and the microscopic level; and combining the first linear relationship and the second linear relationship by using the Bayesian theorem to obtain a target linear relationship corresponding to the porosity data. By acquiring the logging data and the scanning electron microscope image, the porosity characteristics of the shale are comprehensively analyzed from the macroscopic level and the microcosmic level, and the accuracy and comprehensiveness of porosity calculation are improved.
Owner:CHINA UNIV OF GEOSCIENCES (WUHAN)

Machine vision-based automatic identification and calculation method for pore change of rock section under SEM (scanning electron microscope)

The invention discloses a machine vision-based automatic identification and calculation method for pore change of a rock section under an SEM (scanning electron microscope), and the method comprises the steps: obtaining original image data of the rock section through a scanning electron microscope, transmitting the original image data to a machine vision SEM pore intelligent quantification cloud platform, and dividing the original image data into a plurality of image sub-regions which are not overlapped with each other; calling a special threshold inversion model to analyze the gray information of each sub-region, and determining a dual-phase pore segmentation threshold; carrying out edge extraction on the sub-regions after threshold processing by adopting a pore edge gradient enhancement algorithm; performing topological structure analysis on the intermediate image data by using a biphase pore topological inversion model, constructing and optimizing a pore space topological network, and eliminating false pore structure data; and according to the optimized pore space topology network, integrating calculation results of all the sub-regions to obtain a pore change identification calculation result of the whole rock section. The method improves the pore identification precision and processing efficiency, and adapts to different types of rock samples.
Owner:HOHAI UNIV

Microscopic fracture dynamic in-situ characterization method

The invention discloses a microscopic crack dynamic in-situ characterization method, and relates to the technical field of crack in-situ detection. According to the method, a plurality of hardened cement paste bodies are soaked in a sulfate solution, the porosity development trend of the hardened cement paste bodies is obtained through a nuclear magnetic resonance test and a mercury injection test in the soaking process, a test sample and a test sample are prepared after soaking is finished, and the crack propagation length of the test sample is measured through a scanning electron microscope. According to the distance gradient between the sampling angle of the test sample and the exposed surface, space coordinates of crack cracking are converted into a time process along the center axis of the test sample, a delay microscope is established on the microscale, and the test sample is scanned by using X-ray computed tomography equipment in a matched mode; a crack propagation animation image is formed based on a crack form between adjacent X-ray tomography slices, and a crack development process is obtained by continuously capturing high-resolution images, so that omission of time information is avoided, and in-situ detection of microscopic cracks in a hardened cement paste sample is realized.
Owner:SHANDONG UNIV OF SCI & TECH

In-situ real-time monitoring method and system for rock microscopic fracture mechanism and stress evolution

The invention provides an in-situ real-time monitoring method and system for a rock microscopic fracture mechanism and stress evolution. The method comprises the following steps: S1, standardized preparation and pretreatment of a rock sample; s2, in-situ loading and multi-modal data synchronous acquisition are carried out; s3, crack dynamic tracking and stress-strain field joint calculation; s4, constructing a microscopic-macroscopic quantitative correlation and damage model; and S5, performing multi-dimensional dynamic visualization and engineering output. The in-situ scanning electron microscope and the mechanical loading device are integrated, so that cross-scale synchronous monitoring and quantitative analysis of micro crack evolution and macroscopic stress-strain response are realized. A low-disturbance clamping device and a conductive anti-charge sample are treated, and in-situ testing is ensured; combining DIC and deep learning to quantify a crack propagation path, a local strain field and energy characteristics; through DIC strain inversion and finite element calculation, a non-contact stress cloud picture is generated in real time, and finally quantitative correlation between a microscopic fracture mechanism and macromechanical response is established.
Owner:POWERCHINA HUADONG ENG CORP LTD +3

Contour measurement method, electronic equipment and storage medium

The invention provides a contour measurement method, electronic equipment and a storage medium. The method comprises the following steps: acquiring a standard image, a contour of the standard image and an SEM image of a to-be-measured product acquired by a critical dimension scanning electron microscope CD-SEM; adopting a target physical threshold model to extract a target contour of the SEM image; and determining a target edge placement error between the contour of the standard image and the target contour of the SEM image, and generating and outputting a contour measurement result of the to-be-measured product according to the target edge placement error, so as to improve the precision of contour extraction and the accuracy and efficiency of contour measurement.
Owner:QUANYI MASK PHOTOELECTRIC TECH (JINAN) CO LTD

Clamping device, scanning electron microscope sample observation table and scanning electron microscope system

The invention discloses a clamping device, a scanning electron microscope sample observation table and a scanning electron microscope system.The clamping device comprises two clamping blocks and a pressing assembly, the two clamping blocks are each provided with a clamping face, and the clamping faces of the two clamping blocks are oppositely arranged; each clamping surface is provided with at least one clamping part, the number of the clamping parts on the two clamping surfaces is consistent, the clamping parts are in one-to-one correspondence, and the two corresponding clamping parts are used for combining and fixing a micro dropper; at least one clamping block is provided with a pressing assembly which is used for enabling the clamping part of the clamping block to slide towards the corresponding clamping part of the other clamping block in the clamping direction until the micro dropper is clamped after the micro dropper is placed between the two corresponding clamping parts; according to the device, the detection efficiency is effectively improved in the process of using the scanning electron microscope sample observation table, the nondestructive detection of the micro dropper is ensured, and the accuracy of a detection result is improved.
Owner:CHINA INST FOR FOOD & DRUG CONTROL (MEDICAL DEVICE STANDARDS MANAGEMENT CENT OF THE STATE FOOD & DRUG ADMINISTRATION CHINA GENERAL INST FOR MEDICAL PROD INSPECTION)

Method for measuring and calculating article position of continuous silver ore with particle size of more than 0.037 mm

The invention provides a method for measuring and calculating the article position of continuous silver ore with the particle size of 0.037 mm or above, and belongs to the technical field of mineral grade detection. The silver grade in the sample is measured and calculated through screening; leaching and measuring the content of silver monomers and continuous silver minerals, and reselecting to obtain a heavy sand product; carrying out fluorescent dyeing on the heavy sand product, and selecting monomer silver minerals; analyzing the color of the silver mineral through point scanning data of a scanning electron microscope, melting the monomer silver mineral to obtain the volume of the monomer silver mineral, and calculating the content of the monomer silver mineral; and carrying out conversion to obtain the continuous silver ore article position with the size of more than 0.037 mm. According to the method, the target mineral is rapidly and accurately obtained by adopting density medium reselection and fluorescent dye tracing; introducing a scanning electron microscope to measure and calculate the actual density of the silver mineral to replace the theoretical density, smelting the silver mineral in a mold, and carrying out volume measurement and calculation to obtain the actual metal amount closer to the actual silver mineral; measuring and calculating errors caused by impurities and irregular shapes of mineral particles are reduced; and the calculated grade of the silver mineral is more accurate.
Owner:CHANGCHUN GOLD RES INST

Scanning electron microscope resolving power evaluation method and device, computer equipment and storage medium

The embodiment of the invention provides a scanning electron microscope resolving power evaluation method, computer equipment and a storage medium. The method comprises the following steps: acquiring a scanning image of a to-be-evaluated scanning electron microscope on a sample; performing image enhancement processing on the scanning image by using an image enhancement model to obtain an enhanced scanning image; and evaluating the resolving power of the scanning electron microscope to be evaluated through the enhanced scanning image. According to the method, on one hand, a sample is adopted as a scanning object of the scanning electron microscope to be evaluated, and the accuracy of an evaluation result is improved by utilizing the material property of a mesoporous molecular sieve, and on the other hand, the resolution of the scanning electron microscope to be evaluated is evaluated through an enhanced scanning image. Compared with the scanning image before enhancement, the enhanced scanning image has higher image quality, so that the accuracy of the evaluation result can be obviously improved by evaluating the resolving power of the scanning electron microscope to be evaluated through the enhanced scanning image.
Owner:HEFEI GUOJING INSTR TECH CO LTD

Positive electrode material, positive electrode plate, secondary battery and electronic device

The invention provides a positive electrode material, a positive electrode plate, a secondary battery and an electronic device, the positive electrode material comprises lithium manganese iron phosphate, in a scanning electron microscope diagram in which the amplification factor of the lithium manganese iron phosphate is 10000 times and the range of 10 [mu] m * 8 [mu] m, the total number of primary particles of the lithium manganese iron phosphate is N, the number of primary particles of the lithium manganese iron phosphate with the particle size of phi 1 nm is N1, and the number of the primary particles of the lithium manganese iron phosphate with the particle size of phi 1 nm is N; the number of primary particles of the lithium manganese iron phosphate with the particle size phi of 2nm is N2, and N is greater than or equal to 200; 50 < phi < = 100, 10% < = N1 / N < = 30%; 100 < phi 2 < = 150, 15% < = N2 / N < = 35%. The positive electrode material meets the characteristics, and the processing performance, the dynamic performance and the cycle performance of the positive electrode material can be improved.
Owner:XIAMEN AMPACE TECH LTD

Integrated circuit scanning electron microscope image noise reduction method

The invention discloses an integrated circuit scanning electron microscope image noise reduction method, which can avoid photoresist shrinkage and make image imaging clearer compared with the traditional multi-frame superposition technology in the industry. The method specifically comprises the following steps: acquiring a wafer with consistent key feature size on a semiconductor manufacturing production line; obtaining SEM images of the target point in different core particles; searching one image from the SEM images as a reference image, and taking the rest images as to-be-compared images; acquiring all overlapped regions between the reference image and the to-be-compared image; and calculating the maximum intersection area of all the overlapped areas, and carrying out pixel-level averaging on the maximum intersection area to obtain a noise-reduced SEM image. According to the method, the noise of the SEM image can be reduced, the image quality is improved, and a reliable data source is provided for product quality inspection and photoetching model driving in the semiconductor manufacturing process.
Owner:HANGZHOU DIANZI UNIV

SAM model-based scanning electron microscope mineral identification method and equipment

The invention provides a scanning electron microscope (SAM) mineral identification method and equipment based on an SAM model, and relates to the field of mineral identification, and the method comprises the steps: carrying out the mineral and pore marking of a sample image set, and obtaining a label image set; training the SAM2 model through the sample image set and the label image set to obtain a trained SAM2 model; obtaining a scanning electron microscope image to be recognized, and performing image enhancement processing on the scanning electron microscope image to obtain an enhanced scanning electron microscope image; and inputting the enhanced scanning electron microscope image into the trained SAM2 model to obtain a mineral and pore segmentation result. In the training process of the SAM2 model, the total loss is calculated through the Boundy loss, the cross entropy loss and the IOU loss, and the parameters of the SAM2 model are adjusted through the total loss, so that the SAM2 model realizes good balance in boundary details, category distinguishing and segmentation coverage, the mineral recognition precision and the boundary definition are improved, and the mineral recognition efficiency is improved. And finally, the accuracy of the mineral and pore segmentation result is improved.
Owner:CHINA UNIV OF GEOSCIENCES (WUHAN)

Melted electrostatic spinning polymer / molecular sieve blended composite fiber as well as preparation method and application thereof

The invention discloses a fused electrostatic spinning polymer / molecular sieve blended composite fiber as well as a preparation method and application thereof. The melt electrostatic spinning polymer / molecular sieve blended composite fiber is prepared from the following raw materials in parts by weight: 25-90 parts of a thermoplastic polymer matrix, 5-75 parts of a molecular sieve, 1-10 parts of a compatibilizer and 0-5 parts of a conductive additive. According to the polymer / molecular sieve blended composite fiber material and the preparation technology, no solvent participates in the whole process, and the green manufacturing requirement is met. Moreover, in the fiber material, the molecular sieves can be uniformly distributed on the superfine polymer fibers, scanning electron microscope pictures show that the molecular sieves are uniformly embedded into the material, no aggregate larger than 10 microns exists, and the fiber material has a hierarchical pore structure, a high specific surface area and excellent mechanical properties. Therefore, the fiber material can be applied to the fields of air filtration, catalytic reaction, drying purification, adsorption separation and the like.
Owner:SHENZHEN FANGQIU SPECIAL DESICCANT TECHNOLOGY CO LTD

Production method of ultrathin copper foil with high tensile strength and high elongation

The invention discloses a production method of an ultrathin copper foil with high tensile strength and high elongation, which applies a synergistic effect of chloride ions, a leveling agent, an inhibitor, a brightener and a sulfur-containing additive, so that crystal grains are more compact, and the copper foil is smoother, brighter, finer and more uniform in SEM (scanning electron microscope) observation. And data measured by a tension test can show that the tensile strength and the ductility are remarkably improved through the synergistic effect of several additives. The thickness of the copper foil prepared by the production method disclosed by the invention is 4 # imgabs 0 # and 12 # imgabs 1 # m, the rough surface roughness Ra is (0.04-0.46) # imgabs 2 # m, the Rz is (0.66 # imgabs 3 # 1.63) # imgabs 4 # m, and the tensile strength is 650 # imgabs 5 # 950 MPa.
Owner:TIANJIN POLYTECHNIC UNIV +2

Scanning electron microscope analysis method for inclusions in rare earth steel

The invention discloses a scanning electron microscope analysis method for inclusions in rare earth steel. The scanning electron microscope analysis method comprises the following steps: (1) marking the inclusions under a metallographic microscope by adopting a coordinate method; (2) observing the inclusions in the rare earth steel by a scanning electron microscope; (2.1) analyzing the principle of the rare earth inclusions by a scanning electron microscope; the method comprises the following steps: determining the position of the rare earth inclusion in a back scattering mode, then switching to a secondary electron mode to observe the morphology details, and analyzing the components in combination with an energy spectrum; and (2.2) a scanning electron microscope analysis method, wherein a scanning electron microscope is used to carry out further morphology and component analysis on typical inclusions observed under a metallographic microscope. Typical inclusions in the rare earth steel are marked under a metallographic microscope by adopting a coordinate method, and the target inclusions can be quickly found to carry out corresponding detection analysis by utilizing the working principle of a scanning electron microscope, so that the detection analysis efficiency is greatly improved, and researchers are assisted to quickly and accurately obtain related detection results of the rare earth inclusions.
Owner:BAOTOU IRON & STEEL (GROUP) CO LTD

Preparation method of lead-bismuth reactor nuclear sampler coating and coating

The invention provides a lead-bismuth reactor nuclear sampler coating and a preparation method thereof.The preparation method comprises the steps that S3, according to the thickness of a CrAl coating, the bias voltage and target current of multi-arc ion plating equipment are adjusted, the bonding strength of the coating and a base body is optimized, and the target adhesive force reaches the scratch test critical load or above; s4, according to the bonding strength, the nitrogen flow and the air pressure are adjusted, a compact CrAl coating microstructure with the porosity lower than a porosity threshold value is generated, and the quality of the microstructure is detected and verified through a scanning electron microscope; s7, according to the thickness consistency, a screw rod or a pin shaft is selected as a base body part, a CrAl coating is deposited on the surface of the screw rod or the pin shaft to be matched with the sleeve cap, and the gap between the sleeve cap and the shaft part is controlled to be within a gap threshold value; and S10, according to hardness and wear resistance test results, the deposition time and bias voltage are adjusted, the performance of the CrAl coating and the performance of the TiN coating are optimized, and the requirements for long-term corrosion resistance and wear resistance in the lead-bismuth alloy environment are met. According to the invention, excellent performances of long-term corrosion resistance and wear resistance in a high-temperature lead-bismuth environment are realized, and the service life of parts is remarkably prolonged.
Owner:NANJING HAITONG ELECTRONIC MATERIAL TECH CO LTD

Image processing method and device, medium and computer program product

The invention discloses an image processing method and device, a medium and a computer program product, and relates to the technical field of semiconductor manufacturing. The image processing method comprises the following steps: acquiring target image samples of a plurality of wafer samples through a scanning electron microscope, and obtaining a first contour image label of each target image sample; based on the target image sample, a first contour image result is generated through a generator of a preset image edge model, iteration training is carried out on the preset image edge model through pixel difference loss, adversarial loss and edge supervision loss until a convergence condition is met, and a target image edge model is obtained; the generator of the target image edge model can output an edge contour image based on the target image of the target wafer. Through multi-dimensional constraints of pixel difference loss, edge supervision loss and adversarial loss, the preset image edge model is trained in the direction of generating an actual edge contour, and the accuracy of the edge contour image is improved.
Owner:DONGFANG JINGYUAN ELECTRON LTD

Shale reservoir polymer fracturing fluid retention characteristic analysis method and system

The invention belongs to but is not limited to the technical field of petroleum engineering, and particularly relates to a shale reservoir polymer fracturing fluid retention characteristic analysis method and system, and the method comprises the following steps: S1, carrying out a displacement experiment by using polymer solutions with different molecular weights and concentrations; s2, the retention condition of polymers in the rock core before and after displacement is observed through a micron CT and scanning electron microscope technology; and S3, analyzing the influence of the polymer solutions with different molecular weights and concentrations on the retention characteristics in the shale reservoir. The invention aims to carry out a displacement experiment on the rock core by using polymer solutions with different molecular weights and concentrations, and then observe and compare the polymer solutions of the rock core before and after displacement by using equipment such as a CT scanner and an electron microscope, so as to obtain the retention and migration conditions of the polymer in the hole seam of the rock core. The retention characteristics of fracturing fluid polymer molecules in a microporous structure and a matrix are studied, so that a correct polymer molecular weight range is provided for reservoir transformation, fracturing fluid reservoir damage is reduced, and the fracturing yield increasing effect is finally improved.
Owner:CHINA UNIV OF GEOSCIENCES (WUHAN)

Method, device and equipment for correcting geometric distortion in scanning electron microscope measurement, medium and program product

PendingCN121812442AMeasurement improvementsPrecisely compensates for differences in deflection sensitivityImage enhancementImage analysisImage correctionElectron microscope
The invention relates to the technical field of electron microscopic imaging, in particular to a correction method and device for geometric distortion in scanning electron microscope measurement, computer equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring a scanning electron microscope image of a standard sample; calculating an orthogonal included angle parameter and a length-width ratio parameter of the scanning electron microscope image; iteratively adjusting the angle correction parameter and the gain correction parameter under a fixed scanning rotation angle until a preset local calibration constraint condition is met; verifying the orthogonal included angle parameter and the length-width ratio parameter under each scanning rotation angle; and when the orthogonality included angle parameter and the length-width ratio parameter do not meet a preset global stability constraint condition, adjusting a relative gain coefficient, and re-executing calibration verification under each scanning rotation angle until a full-angle correction requirement is met. By adopting the method, high precision and stability of imaging correction can be kept in a full-angle range.
Owner:WUXI GENXINYUE TECH CO LTD

Scanning electron microscope

The invention relates to the technical field of scanning electron microscopes, in particular to a scanning electron microscope which comprises a mounting frame, an electron microscope body, a vacuumizing mechanism, an adapter, a damping mechanism and a vacuum tube structure, the electron microscope body comprises a lens cone and a sample bin, and the vacuumizing mechanism is used for synchronously vacuumizing the lens cone and the sample bin; the damping mechanism is arranged between the mounting rack and the electron microscope main body; the adapter comprises an adapter tube, a first joint and a second joint, and the first joint and the second joint are arranged on the two sides of the adapter tube; the vacuum tube structure comprises a first flexible tube, a first rigid tube, a second flexible tube and a second rigid tube, and the first flexible tube and the second flexible tube are symmetrically arranged. Due to the fact that the flexible pipes are connected with the vacuumizing mechanism and the rigid pipe is connected with the electron microscope body, the symmetrical flexible pipes can balance pulling force in the vacuumizing process, the influence of the pulling force on the electron microscope body is reduced, the influence on the image quality is reduced, and the detection accuracy of the scanning electron microscope and the definition of images are effectively guaranteed.
Owner:CHOTEST TECH INC

Method for detecting surface defects of aluminum alloy plate with epoxy coating

The invention relates to the technical field of processing, testing or inspection of aircraft parts, and provides a method for detecting surface defects of an aluminum alloy plate with an epoxy coating. The method comprises the following steps: applying an epoxy coating doped with a zinc yellow pigment to an anodic oxide film to construct a coating test piece with a color difference indication function, and placing the coating test piece in a coastal atmospheric environment for exposure sampling. In the detection process, the gloss loss rate, the chromatic aberration, the contact angle, the defect area proportion and the corrosion current density are collected, a dynamic correction coefficient is calculated according to the hydrolysis degree of the zinc yellow pigment, all parameter thresholds are adjusted in a self-adaptive mode, and a threshold set is constructed. And in combination with scanning electron microscope image segmentation and Tafel extrapolation analysis, multi-source indexes are fused to judge whether the coating is invalid. According to the method, the hydrolysis behavior of the zinc yellow pigment can be tracked in real time, the judgment standards of optical, morphology and electrochemical indexes are automatically corrected, and the accuracy and reliability of failure detection of the epoxy coating aluminum alloy plate under the coastal service condition are improved.
Owner:AIR FORCE UNIV PLA

Method for obtaining centrifugal pump blade load distribution curve

The invention relates to the technical field of pump body structure design and optimization, in particular to a method for acquiring a centrifugal pump blade load distribution curve, which comprises the following steps of: recording the stress distribution condition of a blade under the action of alternating load in real time through a high-precision multi-channel strain gauge and a laser interference measurement technology; a scanning electron microscope, a transmission electron microscope and an X-ray diffraction technology are combined to analyze microstructure characteristics of a composite material and metal bonding interface; through comparison of experimental data and finite element analysis results, deviation is quantified, error analysis is carried out, and key microstructure parameters influencing load distribution are identified. According to the analysis result, experimental conditions and a finite element model are optimized, a design scheme for adjusting the interlayer thickness of the composite material and optimizing the metal treatment process is provided, and the load bearing capacity and durability of the blade are improved. The method can be widely applied to design and optimization of high-performance centrifugal pump blades.
Owner:NORTHWESTERN POLYTECHNICAL UNIV MING DE COLLEGE

Corrosion-resistant structured transition metal alloy electrode suitable for hydrogen production from alkaline water and preparation method of corrosion-resistant structured transition metal alloy electrode

The invention belongs to the technical field of new energy and electrochemistry, and particularly relates to a corrosion-resistant structured transition metal alloy electrode suitable for hydrogen production from alkaline water and a preparation method of the corrosion-resistant structured transition metal alloy electrode. The method comprises the following steps: sequentially carrying out sand blasting treatment and electrochemical activation treatment on a nickel net substrate so as to improve the surface roughness and the number of active sites; and then performing constant-current deposition in an electro-deposition solution containing nickel salt and ferric salt and / or cobalt salt, and constructing a nickel-based alloy catalyst layer in a micron array shape to obtain the alloy electrode. Through observation of a scanning electron microscope, the surface of the obtained electrode has a sphere-like microstructure, the arrangement is compact, and the catalytic efficiency and durability can be improved. The prepared structured alloy electrode has the advantages of being high in interface bonding force, high in electro-catalytic performance, high in alkali corrosion resistance and the like, and is suitable for efficient and long-term operation of hydrogen production through alkaline electrolysis of water.
Owner:BEIJING SMART ENERGY RES INST +1

Method and device for generating SEM image

The invention discloses a method and a device for generating an SEM (scanning electron microscope) image, which fully utilize structured information of simulation data and combine with an image processing technology to obtain an SEM image which takes photoetching simulation as a core and is based on layout design data, ensure that the simulation image has high authenticity and flexible adjustability, save time and labor and improve the efficiency of generating the SEM image. And the requirements of high efficiency and automation are met.
Owner:YIXIN TECH (HANGZHOU) CO LTD

Joint analysis method for organic matter types and micropore development characteristics in rock

The invention relates to the technical field of energy exploration analysis, in particular to a conjoint analysis method for organic matter types and micropore development characteristics in rocks, which comprises the following steps: step 1, drying a blocky or granular rock sample, and performing cold inlaying by using epoxy resin mixed with conductive powder to prepare a cylindrical sample; 2, after the cylindrical sample is demolded, first-time mechanical polishing is carried out; 3, marking the surface of the sample by using an etching objective lens when the sample is observed by a microscope; 4, performing secondary mechanical polishing and argon ion polishing on the sample obtained in the step 3; and 5, carrying out rapid positioning observation by using the scanning electron microscope navigation photo and the marked sample photo. The mark etching method is applied to organic matter microscopic observation marking, after the secondary treatment process is completed, various scanning electron microscope analysis can be carried out on the sample, and multi-scale and multi-characteristic analysis technology combination from the micron level to the nanometer level is achieved.
Owner:NAT RESERACH CENT OF GEOANALYSIS