11results about "Energy spectrometers" patented technology

The present invention relates to a gas sampling device (1) with a gas equilibrium membrane inlet for the quantification of dissolved gases in solvent-containing solutions. Furthermore, the invention relates to a method for the quantification of dissolved gases in solvent-containing solutions using the device according to the invention, as well as the use of the device in this method.

Methods and systems for automatically tuning a charged particle system are disclosed. This includes obtaining an initial image of a probe spot, generating a simulated probe spot to fit to the initial image of the probe spot, estimating a value of an aberration parameter based on the simulated probe spot, and tuning the charged particle system based on the value of the aberration parameter.

The invention discloses an ultraviolet light electron spectrometer which comprises a vacuum cavity and a magnetic shielding layer. A barrel lens type electron energy analyzer is arranged in the magnetic shielding layer, and the barrel lens type electron energy analyzer comprises a lens system and an electron multiplication detector; the lens system comprises two coaxially arranged annular lenses, a uniform annular channel is formed between the two annular lenses, and an ultraviolet light beam incidence channel is formed in the middle of the annular lens on the inner side; the electron multiplication detector is arranged on the upper portion of the inner side face of the inner side annular lens. The ultraviolet light source is arranged at the top of the ultraviolet light beam incidence channel; the sample table is arranged at the bottom of the ultraviolet light beam incidence channel and is arranged opposite to the ultraviolet light source emitting end; according to the invention, the ultraviolet light beam is combined with the barrel lens type electron energy analyzer, so that the miniaturization of the ultraviolet light electron energy spectrometer is realized.

Described is an angle-resolving photoelectron spectrometer comprising an electrostatic lens system having a first end and a second end, and arranged to form a beam of electrons emitted from a measurement area on a sample surface, and to transport the electrons to the second end, wherein the first lens element is configured to be arranged at a positive voltage in relation to the sample. The spectrometer comprises at least a first shielding electrode with a limiting aperture, arranged such that the angle between the optical axis and any point on the limiting aperture is larger than 45° and smaller than 70, and at least one compensation electrode which is arranged around the optical axis at a larger distance from the measurement area than the first lens element. The compensation electrode is configured to be arranged at a negative voltage in relation to the sample.

An angle-resolved photoelectron spectrometer and a method for such a spectrometer are described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2) and arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3) and to transfer the electrons to the second end (2), and a first lens element (4) is configured to be arranged at a positive voltage with respect to the sample (3). The spectrometer comprises at least a first shielding electrode (17) having a limiting aperture (18) arranged such that, as viewed from a point on the sample surface (Ss) at the optical axis (6), an angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, and at least one compensation electrode (7) arranged around the optical axis (6) at a greater distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be placed at a negative voltage with respect to the sample (3).

To provide a mass spectroscope comprising an ion detector disposed in a vacuum vessel, the ion detector being replaceable at low operation costs without a lot of effort and time.SOLUTION: A mass spectroscope in one embodiment of the invention comprises a vacuum vessel (7) having an interior to be made into a vacuum atmosphere by evacuation, an analysis unit that is disposed in the interior of the vacuum vessel and includes a mass separator (3) and an ion detector (4), an opening (7C) formed at a predetermined position on a wall face of the vacuum vessel in such a size that the ion detector can pass through, a lid (11) for sealing the opening, and a detector supporting part (10) formed by integrating connections (12 to 14) connecting the lid and the ion director.SELECTED DRAWING: Figure 2

Methods and systems for automatically tuning an EELS spectrometer according to the present disclosure include obtaining an initial measurement of an EELS spectrum, generating an simulated EELS spectrum fit to the initial measurement of the EELS spectrum, and estimating one or more values of one or more aberration parameters based on the simulated EELS spectrum. Then, using the value(s) of the aberration parameter(s) to tune the optical elements of the EELS spectrometer to remove and / or reduce aberrations in the EELS system.

The invention relates to the technical field of fusion devices, in particular to an imaging type neutral particle analyzer light path. The light path comprises a connection window which is installed on the side wall of the Tokamak device in a working state and is arranged right opposite to the scintillator screen of the vacuum inner structure; the front-end objective lens assembly is arranged right opposite to the connecting window; the incident end of the first reflection cylinder is connected with the emergent end of the front-end objective lens assembly, and the first reflection cylinder can make the light rays emitted by the front-end objective lens assembly deviate by a set distance in parallel; the incident end of the relay lens assembly is connected with the emergent end of the first reflection cylinder; the incident end of the second reflection cylinder is connected with the emergent end of the relay lens assembly, and the second reflection cylinder can reflect the light emitted by the relay lens assembly at a set angle; and the imaging camera is connected to the emergent end of the second reflection cylinder and can be used for installing a high-speed camera at a position far away from the Tokamak device.

An angle-resolved photoelectron spectrometer and a method for using such a spectrometer are described. The spectrometer includes an electrostatic lens system (101) having a first end (1) and a second end (2), arranged to form an electron beam emitted from a measurement region (A) on a sample surface (Ss) of a solid sample (3) and to transfer electrons to the second end (2), wherein a first lens element (4) is configured to be arranged with a positive voltage relative to the sample (3). The spectrometer includes at least one first shielding electrode (17) and at least one compensation electrode (7), the first shielding electrode having a limiting aperture (18) arranged such that, viewed from a point on the sample surface (Ss) at the optical axis (6), the angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, the at least one compensation electrode being arranged around the optical axis (6) at a greater distance from the measurement region (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged with a negative voltage relative to the sample (3).

An angle-resolving photoelectron spectrometer and a method for such a spectrometer is described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2), and being arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3), and to transport the electrons to the second end (2), and wherein the first lens element (4) is configured to be arranged at a positive voltage in relation to the sample (3). The spectrometer comprises at least a first shielding electrode (17) with a limiting aperture (18), arranged such that the angle between the optical axis (6) and any point on the limiting aperture (18) is larger than 45° and smaller than 70°, seen from a point on the sample surface (Ss) at the optical axis (6), and at least one compensation electrode (7) which is arranged around the optical axis (6) at a larger distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged at a negative voltage in relation to the sample (3).