Particle size measurement and material discrimination can be performed simultaneously with a less expensive configuration. A particle measuring apparatus includes: a
first light source and a second
light source that irradiate a sample containing particles of a predetermined material with parallel light; an imaging unit that captures a
scattered light image of the particles by the parallel light emitted from the
first light source, and a shadow image of the particles by the parallel light emitted from the second
light source; and an
image processing unit that performs material discrimination of the particles based on correspondence between
scattered light intensity of the particles specified based on the
scattered light image and a shadow size of the particles specified based on the shadow image, and a theoretical
correlation curve showing a theoretical value of the correspondence of the particles, and calculates a particle size of the particles.