195 results about "Particle source" patented technology

A microfluidic multiple channel particle analysis system (1) which allows particles (2) from a plurality of particle sources (3) to be independently simultaneously entrained in a corresponding plurality of fluid streams (4) for analysis and sorting into particle subpopulations (5) based upon one or more particle characteristics (6).

A particle-optical apparatus comprising a sample holder for receiving a sample, a particle source embodied to produce a primary beam of first electrically charged particles along an optical axis for the purpose of irradiating the sample, first detector embodied to detect second electrically charged particles that emanate from the sample as a result of the irradiation thereof, a detection space that at the least is formed by the sample holder and the first detector, and an immersion lens embodied to produce a magnetic field for the purpose of focusing the primary beam in the vicinity of the sample holder. The first detector are embodied to produce an electric field in the detection space, and the detection space is embodied to comprise a gas.

Apparatuses and methods for manufacturing a solar cell are disclosed. In a particular embodiment, the solar cell may be manufactured by disposing a solar cell in a chamber having a particle source; disposing a patterned assembly comprising an aperture and an assembly segment between the particle source and the solar cell; and selectively implanting first type dopants traveling through the aperture into a first region of the solar cell while minimizing introduction of the first type dopants into a region outside of the first region.

An improved particle beam treatment system optionally includes exchangeable particle beam nozzles. These particle beam nozzles may be automatically moved from a storage location to a particle beam path or between particle beam paths for use in medical applications. Movement may be achieved using a conveyance, gantry, rail system, or the like. The improved particle beam treatment system optionally also includes more than two alternative particle beam paths. These alternative particle beam paths may be directed to a patient from a variety of different angles and in different planes.

The invention provides a test method for field programmable gate array single particle effect, relating to an integrated circuit technology. The invention comprises the following steps: 1) the package of FPGA is removed, and FPGA is arranged on a test circuit board; 2) FPGA is configured, and then SRAM data are read back and recorded; 3) the test circuit board is arranged in a test room and a particle source emits single particles to bombard FPGA; 4) SRAM data are read back and recorded; 5) data of steps 2) and 4) are compared, and reversed digits of SRAM are determined; 6) when the reversal times reach a preset value or after the period of time without reversal reaches a preset time value, the particle source is changed, FPGA is electrified again, the FPGA is confirmed to return to the initial state, and then steps 3) and 5) are repeated; 7) the data are processed: the reversal section of the LET value is calculated and a reversal curve is generated. The method can precisely test the impact of the single particle effect and eliminate external interferences, thus ensuring the correction and reliability of the test results.

A charged particle beam exposure apparatus for transferring a pattern onto a surface of a target, comprising a beam generator comprising a plurality of n changed particle sources, substantially in one plane, each source adapted for generating a charged particle beam, a first aperture array, comprising a plurality of groups of apertures, each group of apertures aligned with one source, for splitting each beam up into a plurality of beamlets m, thus resulting in a total of nxm beamlets, and a deflector array, comprising a plurality of groups of deflectors, each group of deflectors aligned with one source and one group of apertures, each deflector in a group aligned with an aperture of the corresponding group, and each group of deflectors operable for asserting a collimating influence on its corresponding beam.

Various embodiments disclose devices and methods for fabricating microporous particulate filters with regularly space pores wherein sheet membrane substrates are exposed to energetic particle radiation through a mask and the damaged regions removed in a suitable developer. The required depth of field is achieved by using energetic particles to minimize diffraction and an energetic particle source with suitably small diameter.

The electric charged particle beam microscope includes an electric charged particle source; a condenser lens converging electric charged particles emitted from the electric charged particle source on a specimen; a deflector scanning the converged electric charged particles over the specimen; a control unit of the deflector; a specimen stage on which the specimen is mounted; a detector detecting the electric charged particles; a computer forming an image from a control signal from the deflector and an output signal from the detector; and a display part connected with the computer. The control unit of the deflector can change the scan rate of the electric charged particles. A first rate scan image is obtained at a first rate and a second rate scan image is obtained at a second rate slower than the first rate.

Brachytherapy dose attributable to a brachytherapy source is computed for portions of a patient treatment volume corresponding to a pathological target volume and critical structures. Patient image data is accessed to derive a material voxel array. Multiple computation grids are derived. Primary particle fluence is computed for each first grid element using a ray tracing process from which a primary dose and a first scattered particle source are derived. Scattered particle fluence of the first scattered particle source is derived for each second grid element from which a secondary dose is derived. Each first grid element corresponds to a plurality of second grid elements. Primary dose and scattered dose combine to provide total dose at specific volumes. Brachytherapy source models and non-anatomical body surface models may be applied as applicable.

The embodiment of the invention provides a method and apparatus for implementing a dynamic interface. The method comprises steps of generating interface elements and a corresponding animation effect, wherein the interface element includes a background, objects in the background and particle images corresponding to the objects; establishing a particle emitter and setting the attribute of the particle emitter; generating one or more particle sources, and defining particle parameters of the particle sources, wherein the particle parameters includes contents which are particle images of the particles; adding the one or more particle sources in the particle emitter; and implementing the background and the animation effect corresponding to the objects in the background, and displaying a dynamic particle effect of the objects using the particle emitter. According to the method and apparatus for implementing the dynamic interface provided by the embodiment of the invention, a particle dynamic effect can be displayed on the interface, tracks and special effects of motions of the true-life objects can be simulated at high order, and the third dimension effect and the interest of the interface can be improved.

A charged particle system comprises a particle source for generating a beam of charged particles and a particle-optical projection system. The particle-optical projection system comprises a focusing first magnetic lens (403) comprising an outer pole piece (411) having a radial inner end (411′), and an inner pole piece (412) having a lowermost end (412′) disposed closest to the radial inner end of the outer pole piece, a gap being formed by those; a focusing electrostatic lens (450) having at least a first electrode (451) and a second electrode (450) disposed in a region of the gap; and a controller (C) configured to control a focusing power of the first electrostatic lens based on a signal indicative of a distance of a surface of a substrate from a portion of the first magnetic lens disposed closest to the substrate.

A charged particle beam transport system and method for linear accelerators includes a lens stack having two electrodes serially arranged along an acceleration axis between a charged particle source, and a linear accelerator. After producing and extracting a bunch of charged particles (i.e. particle beam) from the particle source, a voltage difference between the two electrodes is ramped in time to longitudinally compress the particle beam to be shorter than the pulsewidth of acceleration pulses produced in the accelerator. Additional electrodes may be provided in the lens stack for performing transverse focusing of the charged particle bunch and controlling a final beam spot size independent of the current and energy of the particle beam. In a traveling wave accelerator embodiment having a plurality of independently switchable pulse-forming lines, beam transport can also be controlled by triggering multiple adjacent lines simultaneously so that the physical size of the accelerating electric field is longer than the charged particle bunch, as well as by controlling trigger timing of the pulse-forming lines to perform alternating phase focusing.

The invention relates to a particle beam system comprising a particle source (1), a mirror corrector (9, 21 to 25), and an objective lens (16). The mirror corrector comprises an electrostatic mirror (9) and a magnetic beam deflector (21, 22, 23, 24, 25), which is arranged between the particle source (1) and the electrostatic mirror (9) as well as between the electrostatic mirror (9) and the objective lens (16). The magnetic beam deflector (21, 22, 23, 24, 25) is free from dispersion for each single pass. The magnetic beam deflector (21, 22, 23, 24, 25) also comprises quadrupoles and / or quadrupole components, which are provided in such a manner that a maximum of two planes, which are conjugated with regard to the diffraction plane (28) of the objective lens (16), occur on the entire path length between the first outlet from the magnetic beam deflector (21, 22, 23, 24, 25) and from the objective lens (16).

The charge state of ions produced by electrospray ionization is reduced in a controlled manner to yield predominantly singly charged ions through reactions with bipolar ions generated using a <210>Po alpha particle source or equivalent. The multiply charged ions generated by the electrospray undergo charge reduction in a charge reduction chamber. The charge-reduced ions are then detected using a commercial orthogonal electrospray TOF mass spectrometer, although the charge reduction chamber can be adapted to virtually any mass analyzer. The results obtained exhibit a signal intensity drop-off with increased oligonucleotide size similar to that observed with MALDI mass spectrometry, yet with the softness of ESI and without the off-line sample purification and pre-separation required by MALDI.

A system to provide enhanced computational efficiency in a simulation of particle transport through a medium, program product, and related methods are provided. The system can include a simulation data administrator server having access to an interaction database including records related to parameters describing interactions of particles in an absorbing medium to provide particle interaction parameters, and a simulated dose calculation computer in communication with the simulation data administrator server through a communications network. The system can also included simulated dose calculation program product stored in memory of the simulated dose calculation computer and including instructions that when executed by a processor causes the processor to perform for each of a plurality of particles deliverable from a particle source the operations of providing parameters for a medium to perform a Monte Carlo simulation to develop a map of simulated absorbed dose in the medium, and artificially adjusting simulation particle fluxes to achieve a substantially constant variance throughout a depth of the medium.

The invention discloses a lithium ion battery cathode material of which nano particles are embedded into a carbon nanosheet and a preparation method of the lithium ion battery cathode material, which belong to the technical field of electrochemistry. According to the method, water-soluble organic matter (glucose, saccharose, fructose, citric acid, sodium citrate and the like) is used as a carbon source, commercial submicron particles (such as metallic tin, stibium, germanium, nonmetallic silicon and the like) are used as a particle source, sodium chloride is used as a template, the carbon source, the submicron particles and the sodium chloride are added into a ball milling tank for ball milling according to a proper proportion, and a mixture is dried and calcined. A simple ball milling method and a pyrolysis method are used for preparing the lithium ion battery cathode material of which the nano particles are uniformly embedded into the carbon nanosheet. According to the lithium ion battery cathode material of which the nano particles are uniformly embedded into the carbon nanosheet, the specific surface area is large, the surface is of a porous structure, the preparation method is simple, and the lithium ion battery cathode material has good circulation and rate performance.

The invention is a fluid system with an internal filter assembly that prevents particulate from moving between portions of the fluid system. The internal filter assembly is located within a fluid path extending between a particle source, such as a textile tensile member, and a portion of the fluid system that may be affected by particulates from the particle source, such as a value. The fluid system, and particularly the internal filter assembly, has applicability to articles of footwear, for example.

A charged particle beam device is provided including a particle source emitting a primary particle beam, a secondary particle beam generated by the impingement of the primary particle beam on the sample, a detection unit for detecting the secondary particle beam, the detector having at least two detector channels, and a distribution deflecting device for deflecting the secondary particle beam in a chronological sequence. Further, a detection assembly for a fast wafer inspection system is provided including a distribution deflecting device for distributing a secondary particle beam in a chronological sequence and a detector for detecting the secondary particle beam, the detector having multiple detector channels. Further, a method of operating a particle beam device with chronological resolution is provided.

A microwave charged particle source is provided according to various embodiments of the invention. The microwave charged particle source can include a coaxial antenna for generating microwaves and a dielectric layer surrounding the antenna. The microwave charged particle source can also include a first gas line outside the dielectric layer for providing sputtering gases and / or a second gas line for providing cooling gas in a space between the antenna and dielectric layer. The microwave charged particle source can further include a containment shield partially surrounding the dielectric layer and an extraction grid disposed on or near an aperture in the containment shield. In use, charged particles can be formed with the generated microwaves from sputtering gases. And the charged particles can be accelerated under an electric field created from a voltage applied to the extraction grid. A method for providing microwave charged particle source is also provided.

An apparatus for a user to conduct an accelerated soft error test (ASER) on a semiconductor sample is provided. The apparatus comprises a first component for holding the radiation source, where the radiation source may be either an alpha-particle or neutron-particle source. The apparatus comprises a second component for holding the semiconductor sample, where the semiconductor sample may be either a silicon wafer or semiconductor chip. The apparatus comprises a connecting assembly for placing the first component and the second component relative to each other at a plurality of positions that subject the semiconductor sample to a radiation stress from the radiation source at a plurality of stress efficiencies. Among the benefits provided are improved repeatability and credibility of ASER tests and reduced radiation exposures to operators of ASER tests.

The invention relates to a method for determining a reconstructed image using a particle-optical apparatus. The particle-optical apparatus comprises a particle source for producing a beam of particles, an object plane on which an object to be imaged may be placed, a condenser system for illuminating the object plane with the beam of particles, a projection system for forming an image of the object plane by imaging particles transmitted through the object on an image plane, and a detector for detecting the image, the detector comprising a semiconductor sensor having an array of pixels for providing a plurality of pixel signals from respective pixels of the array in response to particles incident on the detector.

A detection system, comprises - a particle source (500) for generating a pulsed flux of energetic particles and for directing said flux (140) towards an item (600) to be analyzed, said particles being intended to react with nuclei of material(s) in said item, - a detection unit (400) comprising at least two detector assemblies responsive to particles and / or electromagnetic radiation in respective energy ranges coming from said item and impinging thereon in response to said flux of energetic particles and capable of delivering corresponding time signals, and - a data processing unit (800) connected to the outputs of said detectors, capable of generating a signature from said signals following the application of said pulsed flux to said item, including time-related signal features, and for comparing said signature with stored reference signatures. The present invention also provides a corresponding dection method. Application in particular to airport luggage security clearance, landmine detection, etc.

The invention provides a preparation method of a bacterial cellulose / functional nanometer particle composite film. The preparation method comprises inoculating a solid base with a strain, forming a cellulose membrane on the surface of the solid base after fermentation, adding a nutrient solution and a functional nano-particle source to the surface of the cellulose membrane, carrying out fermentation, repeating the above processes and carrying out culture for several days to obtain the bacterial cellulose / functional nanometer particle composite film with a certain thickness. The preparation method realizes compounding of bacterial cellulose and functional nanometer particles and prepares a large-block composite functional membrane under this premise of no damage to a bacterial cellulose three-dimensional network and a macrostructure. The preparation method has the advantages of simple processes, low cost, environmental friendliness and large scale production, effectively broadens a bacterial cellulose application area and has a wide application prospect.

A particle beam generator comprising particle extraction means disposed adjacent a particle source and operable to extract particles from such a source into an extraction aperture of the extraction means to form a particle beam, particle accelerating means operable to accelerate the extracted particles to increase the energy of the beam, and focussing means operable to focus the particle beam, each of said extraction means, accelerating means and focussing means being arranged in sequence and having apertures therethrough and in alignment to define a passageway through which the particles are constrained to move, characterised in that the extraction means comprises a lens structure comprising at least a pair of electrodes separated by a layer of insulating material allowing the application of different potentials to each of the lens structure electrodes, one of said electrodes comprising an extraction plate having an extraction aperture formed therein, by means of which extraction plate particles may be drawn from the particle source and through the extraction aperture by means of a potential difference between the source and said extraction plate.

Various embodiments disclose devices and methods for fabricating microporous particulate filters with regularly space pores wherein sheet membrane substrates are exposed to energetic particle radiation through a mask and the damaged regions removed in a suitable developer. The required depth of field is achieved by using energetic particles to minimize diffraction and an energetic particle source with suitably small diameter.

The present invention discloses a mobile surveillance car-based single particle aerosol online mass spectrum detection method, which is based on a particle online mass spectrum detection system, the system includes a single particle aerosol online mass spectrometer and a mobile surveillance car, the single particle aerosol online mass spectrometer is arranged on the mobile surveillance car, pollution source particles can be directly detected on line by car- mounted single particle aerosol online flight time mass spectrum to obtain particle number concentration, particle diameter spectrum and particulate online mass spectrometry data; by use of ART-2a approach, particle components are classified to obtain single particle chemical composition data under different time resolution and different particle diameters; mass spectrometry direct analytical technique is used for analysis of particle sources for determination of the particle sources. Single particle diameter and chemical composition information can be detected simultaneously, a sample can be directly and quickly detected without sample preprocessing, high throughput sample analysis can be achieved, and source analysis can be achieved.

In a particle-beam apparatus for irradiating a target, a pattern defined in a pattern definer is projected onto the target through a projection system by a beam of energetic electrically charged particles of, largely, a species of a nominal mass having a nominal kinetic energy. To generate the beam, a particle source, a velocity-dependent deflector and an illumination optics system are provided. The velocity-dependent deflector includes a transversal dipole electrical field and / or a transversal dipole magnetic field, which act upon the particles so as to causing a deviation of the path of the particles with regard to the paths of the nominal species which is dependent on the velocity of the particles. A delimiter is provided as a component of the pattern definer or, preferably, the projection system, serving to remove particles whose paths are deviating from the nominal path.

An example particle accelerator includes a coil to provide a magnetic field to a cavity; a particle source to provide a plasma column to the cavity; a voltage source to provide a radio frequency (RF) voltage to the cavity to accelerate particles from the plasma column, where the magnetic field causes particles accelerated from the plasma column to move orbitally within the cavity; an enclosure containing an extraction channel to receive the particles accelerated from the plasma column and to output the received particles from the cavity; and a structure arranged proximate to the extraction channel to change an energy level of the received particles.

The invention provides a method for performing particle source analysis by using a single-particle aerosol mass spectrometer and relates to the field of atmospheric particle source analysis. Accordingto the method, a KNN (K Nearest Neighbor) classifier and a CMB (Cosmic Microwave Background) source analysis model are combined, single-particle mass spectrometry information of the pollution sourceas well as environmental receptor single-particle mass spectrometry characteristic and particle size information are fully utilized, the contribution of the primary emission source and secondary emission source of the particles on single environmental receptor particle can be rapidly solved, and refined source analysis results with high time resolution and high particle size resolution can be obtained. The method has excellent popularization and application prospects.

A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.