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6 results about "Fluence" patented technology

In radiometry, radiant exposure or fluence is the radiant energy received by a surface per unit area, or equivalently the irradiance of a surface, integrated over time of irradiation, and spectral exposure or is the radiant exposure per unit frequency or wavelength, depending on whether the spectrum is taken as a function of frequency or of wavelength. The SI unit of radiant exposure is the joule per square metre (J/m²), while that of spectral exposure in frequency is the joule per square metre per hertz (J⋅m⁻²⋅Hz⁻¹) and that of spectral exposure in wavelength is the joule per square metre per metre (J/m³)—commonly the joule per square metre per nanometre (J⋅m⁻²⋅nm⁻¹).

Wet-area device

PCT designated stageWO2026115789A1Domestic plumbingBathroom accessoriesOptical radiationFluence
This wet-area device is characterized by comprising an irradiation device that radiates light, and a sterilization unit that is sterilized by light radiated from the irradiation device. The sterilization unit has a direct irradiation unit that is irradiated with direct light radiated from the irradiation device, and an indirect irradiation unit that is irradiated with reflected light radiated from the irradiation device and reflected by the direct irradiation unit. The direct light has a peak wavelength of 350-450 nm in at least a spectrum. The ratio of the short-wavelength radiant flux to the total radiant flux of the reflected light is smaller than the ratio of the short-wavelength radiant flux to the total radiant flux of the direct light.
Owner:TOTO LTD

A blackbody temperature control and calibration method, device, equipment, medium and product

PendingCN122360704AThermal energyFluence
This application discloses a method, apparatus, equipment, medium, and product for blackbody temperature control and calibration, relating to the interdisciplinary technical fields of precision thermal control and radiometry. The method includes: constructing a generalized end-to-end optical-thermal energy transfer model; based on the generalized end-to-end optical-thermal energy transfer model, performing inversion based on the required entrance pupil radiant flux or equivalent image grayscale value, and obtaining the corrected blackbody setpoint temperature through numerical iterative calculation; and using a piecewise active disturbance rejection control system and a temperature-adaptive thermodynamic piecewise control strategy, tracking and controlling the corrected blackbody setpoint temperature. This application can achieve accurate inversion of blackbody temperature and rapid, accurate, overshoot-free closed-loop control of blackbody temperature.
Owner:NAVAL AVIATION UNIV

X-ray irradiation apparatus, including a spectrally shaping X-ray optic and a spectral filter aperture device, for X-ray imaging

ActiveUS12646634B2Material analysis using wave/particle radiationHandling using diffraction/refraction/reflectionSpectral bandsFluorescence
An X-ray irradiation apparatus (100) comprises an X-ray source device (110) for creating X-rays (2) with a polychromatic spectrum and an X-ray optic device (120) with a beam axis (3) that is longitudinal, wherein the X-ray optic device (120) comprises a reflector device (121) that is polycrystalline having a reflector geometry, a reflector mosaicity and a reflector thickness and the reflector device (121) is arranged for receiving a portion of the X-rays (2) within an acceptance angle of the reflector device (121) and for creating an X-ray beam (4) by Bragg reflection, which is directed along the beam axis (3) towards a focal position thereof and has a spectral distribution determined by the polychromatic spectrum of the X-rays (2), the reflector geometry, the reflector mosaicity and the reflector thickness, and wherein the X-ray irradiation apparatus (100) further comprises a spectral filter aperture device (122) that is arranged downstream from the reflector device (121) for creating a filter gap (123) transmitting a first spectral portion (4A) of the spectral distribution of the X-ray beam (4) and blocking a second spectral portion (4B) and a third spectral portion (4C) of this spectral distribution, wherein the first spectral portion (4A) has higher energies than the second spectral portion (4B) and lower energies than the third spectral portion (4C), wherein the reflector device (121) has an acceptance solid-angle of at least 100 micro-steradian, and wherein the reflector geometry, the reflector mosaicity, the reflector thickness and the acceptance angle of the reflector device (121) are selected such that simultaneously a radiation flux in the first spectral portion (4A) is at least 1% of an incoming flux of the same spectral portion of the X-rays (2) received by the reflector device (121) with a peak reflectivity of at least 1%, the first spectral portion (4A) has a spectral bandwidth of at most 15%, the second and third spectral portions (4B, 4C) have a flux reduced by at least three orders of magnitude compared with the flux in the first spectral portion (4A), and the X-ray beam (4) has a focal spot size of less than 1.5 mm in both transverse dimensions relative to the longitudinal beam axis. Furthermore, an X-ray fluorescence imaging apparatus (200) and a method of using the X-ray irradiation apparatus (100) are described.
Owner:UNIV OF HAMBURG

Circadian lighting for moderate light levels

The invention provides a light generating system (1000) comprising (i) a light generating device (100) configured to generate device light (101) having a controllable radiant flux and a controllable spectral power distribution, and (ii) a control system (300) configured to control the radiant flux and the spectral power distribution of the device light (101); wherein: (A) a ratio B / Y of the device light (101) is defined as a ratio of a radiant flux of the device light (101) in the 450-500 nm wavelength range and of a radiant flux of the device light (101) in the 550-600 nm wavelength range; (B) in a first operational mode of the light generating system (1000) the control system (300) is configured to change from a first device light setting to a second device light setting, different from the first device light setting; (C) the first device light setting and the second device light setting are selected from: (a) a high radiant flux first setting (S1) wherein the device light (101) is first light with a first radiant flux I1 and a first B / Y ratio R1; and (b) a low radiant flux second setting (S2) wherein the device light (101) is second light with a second radiant flux I2 and a second B / Y ratio R2; and (D) I2<I1, and R1<R2.
Owner:SIGNIFY HOLDING BV

Calibration method and calibration device of high irradiance broadband radiometer

ActiveCN122062796BRadiometerFluence
The application discloses a calibration method and device of a wide-band irradiance meter with high irradiance. The method comprises the following steps: calibrating a spectral radiometric device to obtain a spectral correction coefficient; measuring spectral radiant flux of a fiber type wide-band light source and correcting the spectral radiant flux by using the spectral correction coefficient to obtain corrected spectral radiant flux; calculating radiant flux of a predetermined wave band according to the corrected spectral radiant flux; calculating a radiant illuminance value of a fiber output port as a standard value according to the radiant flux of the predetermined wave band; measuring a reading of a measured irradiance meter at the same fiber output port, comparing the reading with the standard value, and obtaining a calibration result. The application solves the problem that the existing light track method cannot be adapted to the fiber type irradiance meter by combining an integrating sphere with a standard fiber and introducing a fiber output light source into the integrating sphere to homogenize light. The radiant illuminance is accurately calculated by using a standard lamp calibration and a fiber end surface area, near distance measurement error is avoided, and accurate calibration of high irradiance is realized.
Owner:SUZHOU METROLOGY & TESTING INSTITUTE CO LTD