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259results about "Time-of-flight spectrometers" patented technology

Orthogonal acceleration time-of-flight mass spectrometer

An orthogonal acceleration time-of-flight mass spectrometer includes: a first vacuum chamber and a second vacuum chamber; an insulating spacer member; a former-stage-side ring electrode; subsequent-stage-side ring electrodes; a first fixation member including a first displacement member to displace a central axis of the former-stage-side ring electrode and the subsequent-stage-side ring electrodes in a predetermined direction orthogonal to the central axis by thermal expansion; and a second fixation member including a second displacement member to displace the central axis in the predetermined direction orthogonal to the central axis by thermal expansion, a difference between a thermal expansion amount of the first displacement member per unit temperature and a thermal expansion amount of the second displacement member per unit temperature being 30% or less of the thermal expansion amount of the first displacement member.
Owner:SHIMADZU CORP

Multi-pass mass spectrometer

Improved multi-pass time-of-flight mass spectrometers MPTOF, either multi-reflecting (MR) or multi-turn (MT) TOF are proposed with elongated pulsed converters—either orthogonal accelerator or radially ejecting ion trap. The converter 35 is displaced from the MPTOF s-surface of isochronous ion motion in the orthogonal Y-direction. Long ion packets 38 are pulsed deflected in the transverse Y-direction and brought onto said isochronous trajectory s-surface, this way bypassing said converter. Ion packets are isochronously focused in the drift Z-direction within or immediately after the accelerator, either by isochronous trans-axial lens / wedge 68 or Fresnel lens. The accelerator is improved by the ion beam confinement within an RF quadrupolar field or within spatially alternated DC quadrupolar field. The accelerator improves the duty cycle and / or space charge capacity of MPTOF by an order of magnitude.
Owner:MICROMASS UK LTD

A high-energy non-elastic spectrometer four-chopper linkage control method and control system

The application belongs to the technical field of neutron scattering large science device, and relates to a high-energy inelastic spectrometer four-chopper linkage control method and system; the method provides four core choppers, establishes a control model based on neutron kinematics, converts incident energy into a speed and time representation, and calculates neutron flight time; a "phase angle modulo" strategy is used to accurately calculate the optimal opening phase delay of the choppers; in a multi-monochromatic incident mode, a "neutron flight time slicing" algorithm is applied to pre-calculate a time window and cut data flow; the application significantly improves the efficiency of spectrometer lattice dynamics characterization, shortens the experimental period, and reduces the cost of machine time; the application overcomes the problem of low energy resolution at high Ei, guarantees accurate research on the microscopic structure of matter, realizes one-key switching of experimental modes at the software level, expands the application range, and improves the resource utilization rate.
Owner:CHINA SPALLATION NEUTRON SOURCE SCI CENT +1

Ion detectors and mass spectrometers

The present invention provides an ion detector that can suppress variations in ion detection time for ions with the same mass-to-charge ratio, and a mass spectrometer that can improve the resolution of mass spectrometry. [Solution] The ion detector 1A includes a conversion unit 2A that emits electrons e to the other side of direction D when ions i are incident from one side in direction D, and an output unit 3 that outputs an electrical signal in response to the incidence of electrons e emitted from the conversion unit 2A. The conversion unit 2A includes a support having a support surface perpendicular to direction D, and an electron generation layer disposed on the support surface that generates electrons e in response to the incidence of ions i. The support has a plurality of passages through which ions i or electrons e pass. The plurality of passages are arranged two-dimensionally along the support surface.
Owner:HAMAMATSU PHOTONICS KK

Systems and methods of rapid and autonomous detection of aerosol particles

Systems and methods to provide rapid and autonomous detection of biological and chemical analyte particles in gas and liquid samples. Systems and methods for capturing and identifying biological and chemical aerosol analyte particles using matrix assisted laser desorption mass spectrometry (MALDI-MS) and using time-of-flight mass spectrometry (TOFMS) are disclosed. High specificity for capture and detection of aerosolized fentanyl was demonstrated using a portable sample capture and analysis system.
Owner:ZETEO TECH INC

Mass spectrometer and RF choke for use within an RF choke

A radio frequency (RF) choke for use within a mass spectrometer comprises a bobbin having a hollow channel, a plurality of wire windings wound around the bobbin, each of the wire windings presenting a lattice winding pattern having a number of crossovers per turn of from about 1 to about 4, and a magnetic core disposed within the hollow channel of the bobbin. The RF choke exhibits an impedance in the range of from about 15 M ohms to about 150 M ohms with respect to an RF frequency generated by an RF voltage source within the range of from about 500 KHz to about 3 MHz, and a power dissipation equal to, or less than, about 3 W with respect to a peak-to-peak RF voltage of an RF voltage source of at least about 1 kV.
Owner:DH TECH DEVMENT PTE

Mass spectrometry with data-dependent acquisition

A data-dependent analysis (DDA) mass spectrometry technique involves ionizing a sample to generate sample ions, analyzing the sample ions by performing one or more MS1 mass analysis scans to obtain MS1 ​​data, identifying one or more precursor ions from the MS1 data, and subsequently analyzing the sample ions by performing one or more MS2 mass analysis scans. Each MS2 scan targets one of the one or more precursor ions identified from the MS1 data.The procedure further includes, for each of the one or more precursor ions identified from the MS1 data: determining a value from the MS1 data that is indicative of a collision cross section (CCS) of that precursor ion; and selecting, based on the CCS-indicative value(s), which precursor ion(s) the one or more MS2 bulk analysis scans should target, and / or determining, based on the CCS-indicative value(s), an order in which the one or more MS2 bulk analysis scans should target the precursor ions.
Owner:THERMO FISHER SCI BREMEN

Determination of plume arrival time in laser ablation

A method and system for calculating the arrival time window of a plume at an analyzer is presented. The plume is generated from a tissue or geological sample by laser ablation. In some embodiments, external sensors measure ambient parameters such as temperature and pressure to more accurately calculate the arrival time window. In other embodiments, direct measurements of the plume's arrival time or non-contact measurements of the plume's flow velocity in a pipe are used to determine the arrival time window of the plume at the analyzer.
Owner:STANDARD BIOTOOLS CANADA INC

Devices used for analyzing mass spectrometry data

The present invention relates to an apparatus for analyzing peak data generated from a mass signal acquired by a mass spectrometry system, comprising: a streaming device including a first network interface and configured to (a) generate peak data from the acquired mass signal or receive peak data generated externally from the acquired mass signal, (b) group the peak data into a plurality of independently processable data packets, the data packets relating to a processing task, and (c) distribute the data packets as a task-specific stream onto a network via the first network interface; and at least one analysis device including a second network interface and configured to (a) retrieve data packets of a task-specific stream from the network via the second network interface, (b) perform a processing task on the retrieved data packets to generate result data, (c) encapsulate the result data in a result data packet, and (d) distribute the result data packet onto the network via the first network interface.
Owner:BRUKER DALTONIK GMBH & CO KG

Time-of-flight secondary ion mass spectrometry focusing offset measurement and calibration method and application

The invention relates to a time-of-flight secondary ion mass spectrometry focusing offset measurement and calibration method and application. Preparing a verification workpiece based on a micro-nano machining technology; the method comprises the following steps: placing a verification workpiece in a time-of-flight secondary ion mass spectrometry (ToF-SIMS) system, and acquiring an optical image and a secondary ion image SI of a charge-coupled device (CCD) of each dot-matrix array; the CCD optical image of each dot-matrix array is used as a reference image, image superposition comparison is carried out on the reference image and the corresponding SI image, a plurality of feature points are selected, the two-dimensional position deviation of each feature point in the SI image relative to the corresponding feature point in the CCD optical image is measured, the average value of the two-dimensional position deviation of all the feature points in each dot-matrix array is calculated, and the two-dimensional position deviation of all the feature points in each dot-matrix array is calculated. The focusing offset of the dot matrix array corresponding to each feature size is obtained; focusing offset data measured in the dot-matrix arrays are summarized, and a function relation between the feature size and the focusing offset is constructed and used for offset calibration or parameter adjustment of the time-of-flight secondary ion mass spectrometry system.
Owner:INSTITUTE OF PHYSICS CHINESE ACADEMY OF SCIENCES

Gate for loading and unloading sample receiving element into and out of mass spectrometer

The present invention describes a gate for loading and unloading a sample receiving element into and out of a mass spectrometer. In addition, a holder for a sample receiving element is described. Furthermore, a kit is described, comprising a holder for a sample-receiving element and a sample-receiving element that can be held by the holder. In addition, a mass spectrometer, in particular a MALDI-TOF mass spectrometer, is also described.
Owner:BRUKER DALTONIK GMBH & CO KG

Data processing device, mass spectrometry system, and mass spectrometry data processing method

In order to enable highly accurate mass spectrometry, this mass spectrometry system comprises: a plot processing unit (212) that plots quadrupole RF voltage acquired as a result of measuring a plurality of calibration ions, for which m / z is known, using a mass spectrometer (100) and m / z of each of the calibration ions as calibration points at coordinates having quadrupole RF voltage and m / z as coordinate axes; a correction processing unit (213) that corrects the calibration points by correcting an outlier if there is an outlier with respect to the calibration points; and a measurement processing unit (213) that measures the calibration ions using the mass spectrometer (100) in a scan range centered on the quadrupole RF voltage calculated using the corrected calibration points.
Owner:HITACHI HIGH TECH CORP

SYSTEMS AND METHODS FOR RECOVERING ORGANIC CONTAMINANTS FROM SEMICONDUCTIVE WAFERS

Systems and procedures for the integrated decomposition of a semiconducting wafer and its scanning for organic and inorganic contaminants are described.In one aspect, a method comprises, but is not limited to, positioning a nozzle above the surface of a semiconducting wafer, the semiconducting wafer being supported adjacent to or within the interior of a chamber body; supplying a first scan fluid comprising one or more organic fluids to an inlet port of the nozzle; directing a portion of the first scan fluid onto the surface of the semiconducting wafer to permit interaction between the scan fluid and one or more organic contaminants present on the surface of the semiconducting wafer; and removing the first scan fluid, containing at least a portion of the one or more organic contaminants, from the surface of the semiconducting wafer via the nozzle.
Owner:ELEMENTAL SCI

Mass spectrometer calibration

In one aspect, a system and method for calibrating a hybrid mass spectrometer is provided. The calibration may include an accurate mass calibration and, for example, a nominal mass calibration performed over multiple transmission widths and scan rates, ideally applied to each reference standard, where each reference standard represents a different m / z, to generate a matrix of correction factors corresponding to each of the transmission width and scan rate pairs at m / z values ​​for the reference standard being evaluated. Multi-parameter interpolation may be applied to identify correction factors to be used for subsequent analysis transmission width and scan rate pairs that differ from the multiple transmission widths and scan rates used to generate the correction factors.
Owner:DH TECH DEVMENT PTE

Miniaturized portable mass spectrometer based on vacuum ultraviolet photoionization source and analysis method thereof

This invention discloses a miniaturized portable mass spectrometer based on a vacuum ultraviolet photoionization source and its analytical method, relating to the field of mass spectrometry analysis technology. The mass spectrometer includes: a sample introduction and pre-screening module, consisting of a sample introduction system and an intelligent sample pre-screening unit. The sample introduction system enables gas-liquid sample switching. The pre-screening unit collects data through physical and chemical characteristic detection subunits, and outputs target compound type and parameter adjustment instructions after processing by a data analysis subunit. This invention, through the intelligent sample pre-screening unit in the sample introduction and pre-screening module, utilizes physical and chemical characteristic detection subunits to quickly acquire physicochemical characteristic data such as the color spectrum, volatile components, and pH value of the sample. The compound type recognition model built into the data analysis subunit can automatically compare with the sample characteristic database, quickly identify the target compound type, and generate ionization source parameter adjustment instructions, greatly simplifying the operation process and reducing detection time.
Owner:CHINA JILIANG UNIV

Multi-reflection mass spectrometer

A multi-reflection mass analyser comprises a pair of opposed ion-optical mirrors 111 & 112 elongated linearly along a longitudinal axis, either one or both of said ion mirrors comprising a series of e
Owner:THERMO FISHER SCI BREMEN

ion spectrometer

The present application provides a kind of ion spectrometer, it is related to the technical field of low energy ion detection in space, the ion spectrometer includes: energy spectrum screening device, by applying first electric field to multiple ion beams to be measured with different energy, so that multiple ion beams to be measured are deflected and allow target ions with predetermined energy range to exit, energy spectrum screening device includes: first shell;First pole plate is configured as arc and is installed to first shell, first pole plate and first shell are grounded;Second pole plate is electrically insulated and installed in first shell, is configured as arc concentric with first pole plate, by adjusting the voltage applied to second pole plate, variable first electric field is formed between second pole plate and first pole plate;Mass spectrum testing device, second electric field is applied to target ions, so that target ions are accelerated and keep uniform speed flight, to obtain the mass-to-charge ratio of multiple different ions based on the different flight time of multiple different ions in target ions, multiple different ions are separated.
Owner:UNIV OF SCI & TECH OF CHINA

Method for correcting mass spectrometry data

A method for correcting mass spectrometry data obtained from a sample is provided. The mass spectrometry data is time-of-flight mass spectrometry data. The method includes receiving the mass spectrometry data obtained from the sample, the mass spectrometry data indicative of ion abundances. The method includes applying a correction function to the mass spectrometry data based on the ion abundances indicated by the mass spectrometry data and based on one or more trapping parameters associated with the mass spectrometry data, the correction function defining a correction value for the mass spectrometry data for a range of ion abundances and a range of trapping parameters. A method for determining a correction function for mass spectrometry data is also provided.
Owner:THERMO FISHER SCI BREMEN

Multi-reflecting tof mass spectrometry

A mass spectrometer comprising: an ion accumulation device (14) for accumulating and pulsing out ions (8); a time of flight mass analyser comprising: ion mirrors (2a, 2b) for reflecting ions; an ion accelerator (4) arranged and configured to receive ions from the ion accumulation device and pulse them into one of the ion mirrors such that ions are reflected back and forth between the mirrors in a first dimension as the ions drift in a drift dimension; reflectors (12a, 12b) for reflecting the ions in the drift dimension; an ion detector (6) for detecting ions; and control circuitry configured to activate the reflectors so as to cause the ions to make multiple passes along the drift dimension and then deactivate one of the reflectors so as to allow ions to pass to the ion detector and be detected, wherein the timings at which the reflectors are activated and deactivated is such that only ions within a first range of mass to charge ratios are capable of having undergone the same number of passes in the drift dimension at the time that they are detected by the ion detector; and wherein control circuitry of the mass spectrometer synchronises the time that ions are pulsed out of the ion accumulation device with the time that ions are pulsed by the ion accelerator such that only ions having mass to charge ratios within said first range are pulsed by the ion accelerator into said one of the ion mirrors.
Owner:MICROMASS UK LTD

Trapped wave signal generator and quadrupole rod trapped wave system

The invention provides a notch signal generator, which comprises an FPGA (Field Programmable Gate Array) module for calculating corresponding resonant frequency parameters according to mass-to-charge ratios of a plurality of target mass number ions and generating amplitude and phase information required by each frequency; the plurality of DDS modules output digital waveform signals of a plurality of frequencies according to the resonant frequency parameters; the multi-frequency mixing module is used for superposing the plurality of digital waveform signals into a composite notch waveform according to a preset amplitude proportion and a phase relation; the digital-to-analog conversion module and the power amplification module are used for converting the composite notch waveform into a composite notch signal and carrying out power amplification so as to meet the amplitude requirement under a radio frequency driving condition; and the control module is used for dynamically adjusting the composite notch signal, so that different frequency components generate resonance interference on the target mass number ions in a proper time window. According to the invention, the quadrupole rod structure does not need to be changed, and frequency control can be applied to multiple target mass number ions and synchronous elimination can be realized.
Owner:GUANGDONG MAX SCI INSTR INNOVATION RES INST

Collision cross section measurement in Time-of-Flight mass analyser

A time-of-flight (ToF) mass analyser is operated in a first mode of operation and a second mode of operation to obtain a first set of data and a second set of data respectively. The ion path has a dif
Owner:THERMO FISHER SCI BREMEN

Mass spectrometry interface structure and mass spectrometer

The application provides a mass spectrum interface structure and a mass spectrum analyzer, the mass spectrum interface structure comprises a metal electrode, an electrospray ionization needle, a metal plate and an analyzer, the metal electrode is connected to the tail end of the electrospray ionization needle, the head end of the electrospray ionization needle is provided with a nozzle and faces the metal plate, the metal electrode and the metal plate have a positive voltage difference, so that the ions in the electrospray ionization needle are sprayed from the nozzle and generate a blocking current pulse, the electrospray ionization needle is electrically connected with the analyzer, so that the analyzer analyzes the blocking current pulse and obtains the size of the ions. The mass spectrum interface structure and the mass spectrum analyzer provided by the application, the ions in the electrospray ionization needle are sprayed from the nozzle under the action of the voltage, when the ions with a size corresponding to the size of the nozzle are sprayed, a blocking current pulse is generated, the length and the width of the ions can be calculated through the signal amplitude and the blocking time of the blocking current pulse, so that the specific size of the ions is obtained.
Owner:KUNSHAN INNOWAVE COMMUNICATION TECHNOLOGY CO LTD

Systems and methods of rapid and autonomous detection of aerosol particles

Systems and methods to provide rapid and autonomous detection of biological and chemical analyte particles in gas and liquid samples. Systems and methods for capturing and identifying biological and chemical aerosol analyte particles using matrix assisted laser desorption mass spectrometry (MALDI-MS) and using time-of-flight mass spectrometry (TOFMS) are disclosed. High specificity for capture and detection of aerosolized fentanyl was demonstrated using a portable sample capture and analysis system.
Owner:ZETEO TECH INC

A method of broadening the injection mass range of a linear ion trap / time-of-flight mass spectrometer

The application discloses a method for widening the injection mass range of a linear ion trap / time-of-flight mass spectrometer, and discloses a linear ion trap / time-of-flight mass spectrometer, which widens the external ion injection mass range of the linear ion trap / time-of-flight mass spectrometer through a segmented multi-stage rod, a bias voltage and a step trapping voltage strategy; when external ions are injected, only ions within a certain mass range can reach a mass spectrometer detector due to the difference in the movement speed of light ions and heavy ions, and the limited mass range seriously limits the analysis performance of the linear ion trap / time-of-flight mass spectrometer; the segmented multi-stage rod, the bias voltage and the step trapping voltage strategy can widen the mass range of the linear ion trap / time-of-flight mass spectrometer to which external ions are injected.
Owner:DALIAN INSTITUTE OF CHEMICAL PHYSICS CHINESE ACADEMY OF SCIENCES

Time-of-flight mass spectrometer and tuning method for the same

In a TOFMS measurement unit, an ion acceleration section accelerates ions to send them into a flight space, within which a flight-field creation section creates, an electric field for causing ions to fly. A controller unit operates the measurement unit so as to repeat a measurement for a predetermined sample while varying a voltage applied to an electrode in the measurement unit, and calculates mass-resolving power based on each measurement result. An approximate function calculator unit finds an approximate function representing a relationship between the voltage and the mass-resolving power, based on data of combinations of the voltage and the mass-resolving power obtained under the control of the controller unit. A voltage determiner unit determines a voltage value corresponding to a target value of the mass-resolving power by the approximate function, and determines the voltage value as a voltage to be applied to the electrode in the TOFMS concerned.
Owner:SHIMADZU CORP

Crystalline graphite substrate and measuring device using crystalline graphite substrate

A crystalline graphite substrate having a carbon purity of 95% or more, in which a surface roughness Ra is from 1 μm to 8 μm inclusive, and a FWHM for a peak in X-ray diffraction corresponding to a layer interval at which hexagonal mesh structures in which six-membered rings of carbon atoms are continuous are stacked is from 3.5 degrees to 9 degrees inclusive.
Owner:PANASONIC HOLDINGS CORP

Apparatus for analyzing mass spectral data

An apparatus for analysing peak data generated from mass signals acquired by a mass spectrometer comprises a streaming device 200 and at least one analysing device 300. The streaming device comprises
Owner:BRUKER DALTONIK GMBH & CO KG

Multiple reflection TOF mass analysis

The mass spectrometer includes a storage device and an analyzer. The analyzer includes a mirror, an accelerator that receives ions from the storage device and pulses them onto one of the mirrors, causing the ions to reflect back and forth in a first dimension between the mirrors as the ions drift in the drift dimension, a reflector that reflects the ions in the drift dimension, a detector, and control circuitry that activates the reflector to make multiple passes along the drift dimension and deactivates one of the reflectors so that the ions pass to the detector and can be detected, the timing of the reflector activation and deactivation being such that only ions within a first range of mass-to-charge ratios undergo the same number of passes in the drift dimension at any one time that they are detected by the detector. The control circuitry synchronizes the time of pulses from the storage device with the time of pulses from the ion accelerator so that only ions having a mass-to-charge ratio within the first range are pulsed onto one of the mirrors by the accelerator.
Owner:MICROMASS UK LTD

Pulse type alpha particle time flight spectrometer

A pulse type alpha particle time flight spectrometer is characterized in that a fixing ring, an aluminum foil, a scintillator, a light guide and a light guide optical fiber connector are integrated together and then are connected with an adapter flange, an optical fiber is fixed at the other end of the light guide optical fiber connector, and the optical fiber, a high-voltage power supply, an oscilloscope and a signal generator are connected to PMT corresponding ports of an MCP-PMT8; according to the invention, the scintillator detector is combined with the gated micro-channel photomultiplier tube, the interference of a complex environment on the detection of nuclear reaction products is effectively inhibited by using the time difference between electrons and gamma light and charged particles and using a gating technology, and the detection in a strong electromagnetic environment is realized; the influence of strong electromagnetic interference generated in a strong laser environment on an experiment result can be avoided; the detector can be applied to detection of particle beams with extremely narrow pulse width and extremely high instantaneous intensity, and has the advantages of simple structure and capability of quickly giving a measurement result.
Owner:XI AN JIAOTONG UNIV