The invention relates to methods and devices for analyzing sample material on a sample carrier, comprising an operating mode as follows: - providing a time-of-flight
mass analyzer comprising an
ion generation unit with a holder for the sample carrier, an
ion receiver, a flight path between the
ion generation unit and the ion
receiver which determines a maximum
flight time, an ion selector along the flight path, and a
clock for repeatedly triggering an ion generation pulse locally at the sample carrier and a subsequent pulse for accelerating ion species directly from the ion generation unit onto the flight path, - defining one or more ranges of
mass-to-charge ratios m / z, each with an upper m / z limit corresponding to a
flight time that is shorter than the maximum
flight time, - selecting a timing of ion generation pulses such thatthat the time interval between two successive ion generation pulses is shorter than the longest flight time and longer than the
acceleration time of ion species from the ion generation unit, - Analyzing the sample material using the time-of-flight
mass analyzer, the selected timing of ion generation pulses, and the ion selector.