644results about "Ion sources/guns" patented technology

The invention discloses a sampling device for ICP-MS (Inductively Coupled Plasma Mass Spectrometry) in the technical field of instrumental analysis. The sampling device comprises a liquid inlet mechanism and an atomization mechanism, the liquid inlet mechanism is used for inputting a liquid sample into the atomization mechanism, the atomization mechanism comprises a concentric atomizer and an atomization chamber, the concentric atomizer is communicated with the atomization chamber, and the atomization chamber is communicated with a waste liquid barrel and an ICP torch pipe; a self-cleaning mechanism is arranged on a communication path of the concentric atomizer and the atomizing chamber, the self-cleaning mechanism comprises a movable cylinder, the movable cylinder is rotationally connected into a nozzle of the concentric atomizer, contact electrodes are symmetrically arranged in the movable cylinder, and when the movable cylinder is blocked, the contact electrodes form a path; the contact electrode is electrically connected with a torsion mechanism and a reverse blowing mechanism, the torsion mechanism is used for twisting the movable cylinder when the contact electrode forms a path, and the reverse blowing mechanism is used for intercepting carrier gas input into the concentric atomizer and reversely blowing the carrier gas out of a nozzle of the concentric atomizer. According to the invention, self-cleaning can be carried out when blockage occurs in the sample introduction process, and sample analysis interruption caused by blockage is reduced.

The invention relates to the technical field of vacuum equipment, and discloses an ion lens assembly, an ion source, a mass spectrometer and a mass spectrometry system. The ion lens assembly includes a deflection lens assembly and a return lens assembly. The deflection lens assembly is used for focusing an ion beam in the incident particle beam and enabling the ion beam to deflect towards a first direction. And the axis-returning lens assembly is used for receiving the ion beam from the deflection lens assembly, and the axis-returning lens assembly is used for focusing the received ion beam and enabling the ion beam to deflect towards a second direction.

The invention provides a reactor and a dual-light-source mass spectrum device for in-situ detection of gas-phase species in a catalytic reaction. The reactor comprises a control part, a first tube body and a second tube body, the control part comprises a first shell and a switching piece; the first shell is provided with a first channel and a second channel which are arranged in the first direction. The switching piece is arranged between the first channel and the second channel; the first pipe body extends in the first direction and is located on the side, away from the second channel, of the switching piece. The first pipe body is communicated with the first channel; the second pipe body extends in the first direction and is partially located in the second channel. The second pipe body is connected with the first shell and can move in the first direction relative to the first shell. The switching piece moves relative to the first shell to control connection and disconnection of the first channel and the second channel. When the first channel communicates with the second channel, the second pipe body is allowed to partially extend into the second pipe body, and when the first channel is isolated from the second channel, the second pipe body is located on the side, away from the first channel, of the switching piece. The application of the reactor realizes material replacement on the premise of not breaking vacuum.

A system and method for determining a net source rock thickness is disclosed. The method includes obtaining at least one well log, a first and second plurality of core samples from a wellbore, and for each of the first plurality determining a relative abundance of inorganic materials, and for each of the second plurality a set of organic material data. The method further includes determining a validated total organic content and a measured source rock thickness based on the organic material data and relative abundance of inorganic materials and determining a data and a prediction portion of the wellbore, based on the second plurality sample locations. The method still further includes determining a cut-off value for each well log, predicting a source rock thickness from the cut-off values and the net source rock thickness from a sum of the predicted and the measured source rock thicknesses.

This disclosure pertains to compositions comprising an anti-FcRn antibody, M281. The compositions include the full, intact antibody and size variants thereof that not include two antibody heavy chains and to antibody light chains. Thus, a M281 pharmaceutical composition can include: an antibody comprising a heavy chain comprising the amino acid sequence of SEQ ID NO:2 and a light chain comprising the amino acid sequence of SEQ ID NO:1, wherein the composition comprises a major protein component having a molecular weight of 140,000-145,000 Da and a minor protein component of molecular weight 118,000-120,000 Da.

A method of pretreatment of a sample containing a cell for mass spectrometry, including contacting the cell with a first acidic solution containing an organic acid; and extracting a cytoplasmic component of the cell by heating the cell in contact with the first acidic solution.

The invention discloses an ion trap mass spectrometry device and method capable of switching internal and external ion sources, and the device comprises an ion source cavity, the exterior of the ion source cavity is provided with a heating module, the side wall of the ion source cavity is provided with a sample introduction hole, and the sample introduction hole is internally provided with a chromatographic column I; the electron beam generation system is arranged at the front side position of the ion source cavity; the insulation connecting piece is communicated with the ion source cavity, and a lens I, a lens II and a lens III are sequentially arranged in the insulation connecting piece in the sample injection direction; a signal acquisition system; wherein a chromatographic column II is arranged on the ion trap. The two ionization modes inside and outside the trap are integrated, and different detection requirements can be flexibly met by switching the sample introduction path of the chromatographic column and regulating and controlling the voltage parameters of the lens I, the lens II and the lens III.

An inlet for an analytical instrument comprises a transfer tube having an upstream end and a downstream end and a deposition region arranged at or adjacent to the upstream end of the transfer tube. The transfer tube is configured to transfer ions together with a gas flow from the upstream end to the downstream end. The transfer tube and the deposition region are configured such that the gas flow experiences at least one turn in the deposition region, whereupon relatively large particles entrained in the gas flow are deposited in the deposition region. The at least one turn in the gas flow is created by: a change in cross-sectional area of the gas flow in the deposition region, a change in diameter of the gas flow in the deposition region, and / or a change in cross-sectional shape of the gas flow in the deposition region.

Determination of sensitive and accurate feature values from a matrix-assisted laser desorption / ionization (MALDI) spectrum of a sample is provided. A peak shape function of the mass spectrometer is read. A fine structure component is determined for a first range of the mass spectrum by estimating and subtracting a first background from the mass spectrum. A bump structure is determined for the first range by estimating a second background, which is stiffer than the first background, and subtracting it from the first background. A convolution of the fine structure component is computed for the first range of the mass spectrum with the peak shape function. A first plurality of peaks in the first range is determined from the convolution. A feature value indicative of an abundance associated with each of the first plurality of peaks is determined by combining the first plurality of peaks with the bump structure.

A method of adjusting a position of a tip of an electrode relative to an end of a nebulizer nozzle of a mass spectrometry device includes providing a conduit and the electrode connected to the conduit at a first end of the conduit. The electrode tip is disposed at a first position relative to the nebulizer nozzle end. The pressure gauge is connected to a second end of the conduit. A gas ejection is initiated from the nozzle with the electrode tip at the first position. During the gas ejection, the position of the electrode tip is adjusted from the first position towards a second position relative to the nozzle end. Adjusting the position from the first position towards the second position is terminated when the pressure gauge displays a pressure condition. Once adjusting is terminated, the electrode tip is at the second position.

Methods and systems for multi-beam, parallel-beam, deterministic, or super mass spectrometry that include an ion source that produces ions, and two or more ion trapping devices or mass spectrometers, each having an independent sampling inlet. The two or more ion trapping devices or mass spectrometers receive the ions from the ion source via the sampling inlet of each of the ion trapping devices or mass spectrometers such that each sampling inlet provides an ion beam to each corresponding ion trapping device or mass spectrometer.

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

The invention relates to the technical field of analysis instrument ionization sources, in particular to a VUV lamp ionization source device with efficient heat dissipation capacity. The device comprises a VUV lamp, a heat dissipation unit, a VUV lamp driving electrode, a driving circuit and an ion guide focusing unit. The heat dissipation unit carries out cooperative heat dissipation on the VUV lamp and the pulse transformer through a fan, and the problems of signal attenuation and device aging caused by temperature rise are solved. The driving electrode adopts a pairwise pairing structure of upper and lower and left and right electrode pairs to form an inclined electric field to prevent ions from bombarding the lamp wall and the light window; the drive circuit is a half-bridge or full-bridge topology, can adjust the pulse frequency and the power supply voltage, and achieves the switching between a high-voltage low-frequency mode and a low-voltage high-frequency mode. The ion guide focusing unit efficiently leads out and separates ions through cooperation of a conical focusing electric field and a conductive film forward electric field. Through four-dimensional innovation of heat dissipation, electrodes, driving and transmission, the stability, the service life and the detection sensitivity of the device are improved, and the device is suitable for analytical instruments such as ion mobility spectrometry and mass spectrometry.

An embodiment disclosed herein includes a process tool for measuring neutral radical concentration. In one embodiment, the process tool comprises a process chamber and a Neutral Radical Mass Spectroscopy (NRMS) analyzer fluidically coupled to the process chamber. In one embodiment, the NRMS analyzer comprises a first chamber fluidically coupled to the process chamber, the first chamber comprising a modulator, and a second chamber fluidically coupled to the first chamber, the second chamber being a residual gas analyzer or mass spectrometer. In one embodiment, an unobstructed line of sight passes from the process chamber to the second chamber.

The invention relates to the technical field of mass spectrometers, and discloses an analytical instrument based on glow discharge and quadrupole mass spectrometry combination, which comprises an ion source, an ion transmission system and an ion separator, wherein the ion source is a glow discharge ion source; the ion separator is a quadrupole rod mass analyzer, and the quadrupole rod mass analyzer comprises four electrodes which are arranged in parallel. Compared with an existing analytical instrument, the glow discharge ion source can directly analyze a solid sample without being pretreated into a solution, and compared with an inductively coupled plasma source, the glow discharge ion source is small in matrix effect and especially suitable for high-salt and high-carbon samples; the quadrupole rod mass analyzer is simple in structure, small in size, low in cost, especially suitable for commercialized popularization and high in scanning speed.

A coupling tube made of a stretchable elastomeric material. The "stretchy" coupling tubing allows for improved reliability / repeatability of coupling performance. For example, the stretch provided can take up tolerances between positions of imager and reader instruments. In one example, the stretch can take up tolerances between positions of the junction between the rigid portion of tubing inside the IMC unit and the injector to an ionization source. The coupling tube may also be provided with a reduced inner diameter (ID) as compared to standard coupling components. A taper in the inner diameter (ID) can occur before the flow enters the stretchable coupling tube. Barbed ends may also be provided for securing the coupling tube into place.

Systems and methods to provide rapid and autonomous detection of biological and chemical analyte particles in gas and liquid samples. Systems and methods for capturing and identifying biological and chemical aerosol analyte particles using matrix assisted laser desorption mass spectrometry (MALDI-MS) and using time-of-flight mass spectrometry (TOFMS) are disclosed. High specificity for capture and detection of aerosolized fentanyl was demonstrated using a portable sample capture and analysis system.

The application discloses a kind of based on plasma atomization gas auxiliary electric spray ionization method, comprising the following steps: a) sample solution is introduced into electric spray needle;B) open plasma initiation device, make plasma initiation device discharge and generate plasma in plasma atomization gas gas path;C) atomization gas is introduced into plasma atomization gas gas path, and the atomization gas under the action of plasma forms plasma atomization gas;D) open high-voltage power supply, and sample solution is under the action of high-voltage electricity and plasma atomization gas and generates spray and forms sample ion, and the sample ion formed enters mass spectrometer by mass spectrometry inlet channel.This application can improve sensitivity, and under the premise that compound fragmentation dissociation does not occur, it is used for electric spray unfriendly solvent and difficult to detect low polarity compound detection, which can be compatible with normal phase liquid chromatography commonly used solvent, and can also reduce the influence of common complex matrix effect in electric spray ionization.

Embodiments of charged particle beam systems, components, and methods for extracting charged particles from a gas are described. In a first aspect, A charged particle source includes a resonator. The resonator can include a dielectric substrate defining a first side and a second side, the second side opposite the first side. The resonator can include a first conductive layer disposed on the first side. The first conductive layer can be disposed in accordance with a pattern comprising a ring portion. The pattern can define a gap in the ring portion of the first conductive layer. The resonator can also include a second conductive layer disposed on the second side. The charged particle source can also include a source electrode. The source electrode can be disposed proximal to the first side. The source electrode can be offset from the dielectric substrate.

A data-dependent analysis (DDA) mass spectrometry technique involves ionizing a sample to generate sample ions, analyzing the sample ions by performing one or more MS1 mass analysis scans to obtain MS1 ​​data, identifying one or more precursor ions from the MS1 data, and subsequently analyzing the sample ions by performing one or more MS2 mass analysis scans. Each MS2 scan targets one of the one or more precursor ions identified from the MS1 data.The procedure further includes, for each of the one or more precursor ions identified from the MS1 data: determining a value from the MS1 data that is indicative of a collision cross section (CCS) of that precursor ion; and selecting, based on the CCS-indicative value(s), which precursor ion(s) the one or more MS2 bulk analysis scans should target, and / or determining, based on the CCS-indicative value(s), an order in which the one or more MS2 bulk analysis scans should target the precursor ions.

A sample support is a sample support for ionizing a sample. The sample support includes a substrate having a first surface, a second surface opposite to the first surface, and an irregular porous structure opening to at least the first surface. The porous structure is formed of a plurality of large particles connected to each other and a plurality of small particles having a diameter smaller than that of the large particles. At least a part of the plurality of small particles is held between two or more of the large particles constituting the first surface.

A method and system for calculating the arrival time window of a plume at an analyzer is presented. The plume is generated from a tissue or geological sample by laser ablation. In some embodiments, external sensors measure ambient parameters such as temperature and pressure to more accurately calculate the arrival time window. In other embodiments, direct measurements of the plume's arrival time or non-contact measurements of the plume's flow velocity in a pipe are used to determine the arrival time window of the plume at the analyzer.

A flow control device for aerosolised sample delivery in an inductively coupled plasma (ICP) analytical system is provided. The device includes a body that at least in part defines a sample flow separating region, the sample flow separating region having a longitudinal flow direction and having an upstream end through which the aerosolised sample enters and a downstream end through which a modified aerosolised sample exits. The body further includes an injection duct having an opening adjacent to the sample flow separating region, the injection duct configured to direct a stream of gas in an injection direction to the sample flow separating region. The injection direction is angled relative to the longitudinal flow direction such that, upon introduction of the stream of gas through the opening, a vortex flow is generated in the sample flow separating region, the vortex flow having a direction counter to the direction of flow of the aerosolised sample to provide control of droplet size in the modified aerosolised sample.

To provide a sample support that enables highly sensitive mass spectrometry, and a method for manufacturing the sample support.SOLUTION: A sample support is a sample support used to ionize the component of a sample. The sample support 1 includes a substrate 2, a conductive layer 5, and a plurality of particles 71. The substrate 2 has a first main surface 2a and a plurality of holes 2c opening to the first main surface 2a. The conductive layer 5 is provided on the first main surface 2a such that the holes 2c are not blocked. The plurality of particles 71 are provided on the surface 5a of the conductive layer 5. The absorptance of the plurality of particles 71 with respect to the energy rays used for ionization is greater than or equal to the absorptance of the conductive layer 5 with respect to the energy rays.SELECTED DRAWING: Figure 5

The present invention relates to an apparatus for analyzing peak data generated from a mass signal acquired by a mass spectrometry system, comprising: a streaming device including a first network interface and configured to (a) generate peak data from the acquired mass signal or receive peak data generated externally from the acquired mass signal, (b) group the peak data into a plurality of independently processable data packets, the data packets relating to a processing task, and (c) distribute the data packets as a task-specific stream onto a network via the first network interface; and at least one analysis device including a second network interface and configured to (a) retrieve data packets of a task-specific stream from the network via the second network interface, (b) perform a processing task on the retrieved data packets to generate result data, (c) encapsulate the result data in a result data packet, and (d) distribute the result data packet onto the network via the first network interface.

The present disclosure relates to a mass spectrometer (10) comprising a vacuum system (14) and a method of operating a vacuum system (14). A method of operating the vacuum system (14) of the mass spectrometer (10) is used to prevent vapor diffusion from a vacuum pump (41) of the mass spectrometer (10) into an analyzer (12) of the mass spectrometer (10). The mass spectrometer (10) includes an analyzer (12), a vacuum pump (41), and a vacuum conduit (45) extending between the vacuum pump (41) and the analyzer (12). The method comprises: operating the mass spectrometer (10) in a standby mode, wherein a sample is not present in the analyzer (12) for analysis; and inducing a standby fluid flow in the vacuum conduit (45) away from the analyzer (12) towards the vacuum pump (41) when the mass spectrometer (10) is in the standby mode.

The invention discloses a multi-wavelength light-induced photoelectron charge compensation device and method for SIMS analysis, and the device comprises an adjustable wavelength light source which is used for generating light of which the wavelength is adjustable in a range from ultraviolet to visible light; the optical system is used for guiding the light generated by the adjustable wavelength light source to the surface of a sample bombarded by an SIMS primary ion beam, and ensuring that a photon beam spot is accurately overlapped with an ion beam bombarded area; and the control unit is used for dynamically adjusting the wavelength and the light intensity of the adjustable wavelength light source according to the stability of the SIMS secondary ion signal so as to optimize photoelectron emission and realize charge neutralization. The invention has the following beneficial effects: the technical scheme avoids physical damage of the electron gun to the sample and damage to the vacuum environment; the wavelength can be adjusted to cover ultraviolet light to visible light, and the device is suitable for various materials.

Before each sample of a series of batch samples is introduced into a liquid sample delivery device, an ion source device receives aqueous mobile phase solution from the liquid sample delivery device and ionizes its compounds, producing an ion beam. A tandem mass spectrometer performs a neutral loss or precursor ion scan on the ion beam to measure intensities of two or more precursor ions corresponding to a known aqueous mobile phase solution compound. Intensity measurements for each of the two or more different precursor ions are compared to previously stored intensities to determine the threshold times at which these measurements indicate orifice contamination. A threshold time is then predicted for a known compound of interest of the batch samples based on the m / z value of the known compound of interest and the m / z value and the threshold time of each of the two or more different precursor ions.

The application discloses a kind of mass spectrometry nanoliter ion source and the adjusting method of mass spectrometry nanoliter ion source, it is related to mass spectrometry technical field, the mass spectrometry nanoliter ion source includes: ion source cover, vacuum interface cavity is equipped in the ion source cover, the end of the vacuum interface cavity forms conical cover, quadrupole rod and vacuum pump interface are equipped in the vacuum interface cavity, sample inlet hole is equipped on the conical cover;Adjusting mechanism, the adjusting mechanism is fixedly arranged with the relative position of the ion source cover;Nanoliter spray needle, the nanoliter spray needle is equipped on the adjusting mechanism, the nanoliter spray needle is suitable for adjusting the distance and / or attitude between the sample inlet hole by the adjusting mechanism, the nanoliter spray needle is connected with electricity to be configured to make the nanoliter spray needle and the conical cover form the electric field that makes target ion move towards the conical cover.The mass spectrometry nanoliter ion source according to the embodiment of the application has the advantages of high ionization efficiency, short trapping time, good applicability and the like.

A needle for mass spectrometry having a solid shaft and a first end with a tip having a radius of curvature of less than 1500 nm, wherein the tip is distal from a second end of the needle, wherein the second end is configured to accept an electrical potential, and wherein the tip provides an ionization region when the electrical potential is applied. Methods of manufacturing a needle having a radius of curvature of less than 1500 nm. Methods and systems including at least one needle of the present disclosure for qualitative and / or quantitative analysis.