2 results about "Polyatomic ion" patented technology

This invention relates to the field of analytical chemistry, and discloses an isotope dilution-bismuth reagent-LA-ICP-MS method for the determination of noble metals. The method involves adding geochemical samples to bismuth reagent kits... 194 Pt isotope diluent was mixed with a silver carrier, and then melted and blown to obtain silver alloy particles. The silver alloy particles were annealed and pressed into silver sheets. The content of Pt in the silver sheets was determined by LA-ICP-MS. 105 Pd, 195 Pt and 197 The mass spectrometry intensity of Au was determined by adding platinum isotope diluent. 194 Pt was used as an internal standard for signal correction; the contents of gold, platinum, and palladium in the sample were calculated based on the measurement results. This invention utilizes solid-state injection of prepared Ag sheets and multi-point ablation by LA-ICP-MS, improving the analysis speed and avoiding interference from polyatomic ions and dilution effects in the solution; the added platinum isotope diluent... 194 Pt, as an internal standard, is consistent with the distribution trend of the element to be measured, thus solving the problem of uneven element distribution in Ag tablets. Ag tablets prepared with standard substances serve as a standard series with consistent matrix. The standard curve is plotted using the empirical coefficient method, showing good linearity.

The application discloses a method for determining silicon element in glass by ICP-MS CRC technology, which comprises four steps of sample pretreatment, instrument condition optimization, interference elimination verification and quantitative analysis: the glass sample is treated by a microwave digestion method or a melting method to avoid the introduction of interference by a chlorine-containing reagent; ICP-MS CRC reaction cell conditions are optimized, O2 or H2 is selected as a reaction gas, the flow rate is set to 0.3-0.7 ml / min, the cell pressure is set to 1.0-1.5 mbar, and 29Si+ is selected as a monitoring ion; the interference elimination effect is verified by a full scanning mode and a standard solution; and a standard curve is drawn and the silicon concentration is calculated. By using the method, the interference of polyatomic ions is effectively eliminated, the silicon detection limit is as low as 0.1 ppb, the detection accuracy is improved by more than 90%, and the method has the advantages of wide applicability, simple operation and reliable data, and can be used for accurate detection of trace silicon in glass and semiconductor material complex matrix samples.