The application discloses an atomic
matter wave wavelength measuring device, which comprises a vacuum cavity. First split beam light and second split beam light obtained by splitting test
laser light both pass through the vacuum cavity in a direction parallel to the height direction of the vacuum cavity, are combined, and are detected by a first photoelectric
detector. The vacuum cavity is also irradiated with probe
laser light. The shape of the middle light path is rectangular from the splitting of the test
laser light to the combination of the first split beam light and the second split beam light to obtain combined beam light. The application also discloses an atomic
matter wave wavelength measuring method. The test
laser light is adjusted to be slit light to measure the actual
flight time of the measured object. The test
laser light is adjusted to be continuous
laser light to measure the actual
flight distance of the measured object, so that the actual
flight speed of the measured object and the
matter wave wavelength are obtained. Since the application is not affected by the initial position change of the measured object, the
flight speed of the measured object can be measured, and the precise measurement of the matter wave wavelength can be realized.