40 results about "Digital holographic microscopy" patented technology

The invention discloses a digital holographic depth-of-field extended imaging method and system based on wavefront coding, and the method comprises the steps: adjusting the parameters of all parts in a digital holographic microscopic system according to preset cubic phase parameters, and obtaining a candidate digital holographic microscopic system corresponding to the preset cubic phase parameters; adopting a candidate digital holographic microscopic system to image a preset category of target to obtain a first image; processing the first image by adopting a trained deep neural network corresponding to the candidate digital holographic microscopy system to obtain a second image; and acquiring second images corresponding to all candidate digital holographic microscopic systems, comparing all the second images, selecting the second image of which the image quality is greater than a threshold value, and taking the candidate digital holographic microscopic system corresponding to the second image as a final digital holographic microscopic system so as to image a preset category of target. According to the method, the depth-of-field extension optimization speed can be remarkably improved, and the storage space and computing resource consumption are reduced.

A digital holographic microscope that includes a light source and a photonic integrated circuit. The photonic integrated circuit can include a branching waveguide optically coupled to the light source, and a multi-angle illumination device optically coupled to the branching waveguide. In various examples, the multi-angle illumination device includes an optical phased array that includes a plurality of light emitters. In various examples, the multi-angle illumination device includes a grating coupler.

The invention belongs to the technical field of optical measurement, and particularly relates to a digital holographic microscopy system phase distortion correction method based on adaptive optics, which has the advantage that optical wave complex amplitude information can be acquired in a wide field by means of digital holographic microscopy, and uses a distortion phase image measured by a digital holographic microscopy system as input to correct phase distortion of the digital holographic microscopy system. And iterating the image by using an optimization algorithm until the image evaluation function converges, and obtaining a correction pattern for removing phase distortion. And uploading the correction pattern to a self-adaptive correction device and modulating the wavefront of the light wave to finally realize accurate compensation of phase distortion. The method can provide an in-situ, accurate and rapid phase distortion correction mode and means for the field of optical microscopic imaging, especially the field of quantitative phase imaging.

The invention relates to a dot matrix auxiliary focusing digital holographic microscope system and a holographic reconstruction method, the system comprises a digital holographic microscopy light path part and a dot matrix auxiliary focusing light path part, the digital holographic microscopy light path part adopts polarization modulated narrow-band laser to irradiate an object sample to be measured to become object light; the reference light which is orthogonal with the polarization reflected by the reference mirror is subjected to interference imaging in the polarization camera, so that different phase shift acquisition of a single image is realized; the dot matrix auxiliary focusing light path part calculates the focus position of the object sample to be measured by using the definition of the image, and the optimal inverse diffraction distance required in the digital holographic reconstruction process can be directly obtained. Compared with the prior art, the method has the advantages that the automatic focusing efficiency of the digital holographic microscope is improved, the digital holographic three-dimensional surface reconstruction speed is greatly increased, and the reconstruction efficiency and real-time performance are improved on the premise that the reconstruction measurement precision is guaranteed.

The invention discloses a light off-axis structured light digital holographic microscopy super-resolution imaging method based on a Kramers-Kronig relation. In a light off-axis structured light digital holographic microscopy system, structural illumination patterns with different angle directions and phase shift amounts are loaded on an object light beam to acquire a structural illumination hologram, and an unloaded reference light beam is acquired to acquire a reference light intensity graph; the structure illumination hologram is combined with the reference light intensity graph to calculate complex amplitude by utilizing a KK relation, phase distortion of the complex amplitude is compensated to obtain distortion-removed complex amplitude, a frequency spectrum separation matrix is constructed by combining information during acquisition to perform frequency spectrum separation on high and low frequency components in the complex amplitude, and finally frequency spectrum synthesis is performed to realize super-resolution object light reconstruction. According to the invention, high resolution improvement can be realized, the interference problem of zero-order item frequency spectrum of the hologram under the light off-axis condition is effectively solved, the noise is obviously reduced, the imaging quality is improved, and the method has important application value in the fields of biological tissue observation, microstructure measurement and the like.

The invention relates to a rapid tilt compensation method based on a Zernike polynomial. The method comprises the following steps: acquiring a two-dimensional image matrix output by a digital holographic microscope; the two-dimensional image matrix is preprocessed; the preprocessed image intensity matrix is projected to a Zernike polynomial base # imgabs0 #, Zernike fitting is achieved, and a Zernike model of a related sample to be detected is obtained; calculating tilt term coefficients alpha x and alpha y of a first-order polynomial in the Zernike model; and calculating out-of-focus aberration # imgabs1 #, performing tilt compensation on the preprocessed image intensity matrix by adopting tilt term coefficients alpha x and alpha y, and outputting the compensated image intensity matrix. The invention further discloses the corresponding electronic equipment. According to the method, the shot image can be quickly and effectively compensated and corrected, and the robustness and the calculation speed are considerable.

The invention relates to a method for characterizing microorganisms present in a biological sample, said method comprising acquiring a real-time holographic digital image of the sample, generating a focused image by using a digital model for reconstructing the focused image, and characterizing bacteria based on the focused image. According to the invention, a plurality of calibration objects are provided in the acquisition field of view prior to acquisition of the holographic image, these objects having pre-characterized dimensions and refractive indexes and selected shapes, such that the interference pattern of the objects can be calculated using an image forming model for integrating the optical aberrations of the acquisition device. The optical aberration is limited according to the interference pattern of the object and the calculated interference pattern before the computer generates the focused image, and a digital model used to reconstruct the focused image integrates the quantized optical aberration.

The application relates to a kind of quantitative imaging methods of living cells based on digital holographic microscopic sequential displacement aberration correction, and belongs to the field of optical measurement, comprising: collecting three holograms by sequentially displacing living cells; obtaining three original phase maps by phase demodulation; obtaining total mask map; sequentially displacing phase map in reverse direction; performing difference calculation to obtain global phase system aberration difference data; obtaining local system aberration difference data by using total mask map; performing difference processing on Chebyshev polynomial to obtain local polynomial difference data by using total mask map; fitting global system aberration by calculating corresponding coefficients from difference data; subtracting global system aberration from three original phase maps to obtain phase map of living cells after aberration correction. The application realizes high-precision quantitative phase imaging of living cells while retaining high-frequency information, has excellent displacement distance robustness, does not need to be equipped with high-precision displacement mechanism, and greatly reduces the hardware cost of measurement system.

The invention belongs to the technical field of optical measurement, and relates to an MEMS fatigue evolution law observation device based on off-axis digital holographic microscopy, which comprises a red light super-radiation light-emitting diode light source, a wire grid type beam splitter, an objective lens and a CCD, and is characterized in that a linear polarizer, a half-wave plate and the wire grid type beam splitter are fixedly arranged on a light path emitted by a red light super-radiation light-emitting diode; a half-wave plate, a beam expanding lens group, a plano-convex lens, a beam splitter prism, an objective lens and a sample table are fixedly arranged on an object light path in sequence, a reflector is arranged on a vertical light path, and an optical delay line, the beam expanding lens group and the plano-convex lens are fixedly arranged on a reference light path; after the reference light passes through the reflector and the beam splitter prism, the reference light interferes with the object light reflected by the beam splitter prism on the CCD and is observed. According to the invention, the hologram of the MEMS device under high-frequency vibration can be acquired, and the surface topography of the MEMS device is obtained through computer rapid phase unwrapping, so that the purpose of observing fatigue evolution of the MEMS structure in real time is achieved.

The present invention relates to a digital holographic microscopy device, and particularly to a common-path off-axis digital holographic microscopy device with adjustable shear amount. The present invention provides a common-path off-axis digital holographic microscopy device with adjustable shear amount that can realize the common path of the object beam and the reference beam and can effectively compensate for environmental interference on the two interfering beams. A common-path off-axis digital holographic microscopy device with adjustable shear amount includes a first fixing frame, a semiconductor laser light source, a beam expander and collimator, etc. The upper part of the first fixing frame is connected with the semiconductor laser light source, and the upper part of the first fixing frame is connected with the beam expander and collimator. The light source emitted by the semiconductor laser light source can pass through the beam expander and collimator, and the beam expander and collimator diffuses the light source into two light sources, and people can adjust the refraction angle of the two light sources by manually adjusting the position of the isosceles triangular prism. In this way, the common path of the object beam and the reference beam can be realized, and environmental interference on the two interfering beams can be effectively compensated.

A system includes an illumination system, an optical system, a detector system, and a processor. The illumination system directs a first illumination beam and a second illumination beam toward the target structure, and directs a first reference beam toward the detector system. The optical system directs the first scattered beam and the second scattered beam from the target structure to the detector system. A detector system captures the interference pattern and outputs a measurement signal. The first scattered beam, the second scattered beam, and the first reference beam generate an interference pattern. The processor analyzes the measurement signal to determine a characteristic of the target structure.

The invention discloses an OAPM-based secondary phase distortion compensation digital holographic microscopy system, which comprises a laser, the right side of the laser is provided with a collimation and beam expanding system, the right side of the collimation and beam expanding system is provided with a half slide, the right side of the half slide is provided with a polarization splitting prism body, and the right side of the polarization splitting prism body is provided with an optical fiber. An off-axis planed mirror is arranged on the right side of the polarization splitting prism body, a reflecting mirror is arranged below the polarization splitting prism body, a non-polarization splitting prism is arranged on the right side of the reflecting mirror, and a quarter-wave slide is arranged on the right side of the non-polarization splitting prism; belongs to the technical field of holographic microscopes, and provides a digital holographic microscopy system based on OAPM-secondary phase distortion compensation, which utilizes an off-axis planed mirror to realize secondary phase distortion compensation, integrates compensation and reflection effects in the same optical element, and greatly reduces the size of the digital holographic microscopy system.

This invention discloses a heterodyne digital holographic microscopic phase imaging scheme based on a moving grating. The scheme includes an optical imaging device and a measurement method. The optical imaging device includes a light source system, an amplification system, a heterodyne interferometry system, and an image acquisition system. A light beam emitted from the light source penetrates the object under test, carrying the object's optical phase information. This information is amplified by the amplification system and then passed through a moving grating in the heterodyne microscopy system, splitting the incident light into multiple beams of different frequencies. An aperture is used to select the 0th and +1st order beams, which interfere on the camera's detection surface to generate continuous moving interference fringes. The measurement method mainly includes: optical path adjustment, image data acquisition, image processing, and phase-height calibration. This invention achieves higher reconstruction accuracy compared to traditional single-image reconstruction schemes, and features low cost and good stability, providing a new measurement scheme and approach for digital holographic microscopy.

The invention discloses an organoid in-situ manufacturing, dynamic observation and drug screening platform based on digital microfluidics, holographic feedback and photocuring printing. The platform can be widely applied to the fields of regenerative medicine, drug research and development, disease research and the like. According to the platform, in-situ packaging and dynamic culture of the organoid are achieved through an electro-infiltration chip, the morphology and mechanical properties of the organoid are fed back in real time in combination with a holographic microscopy technology, and high-precision hardness gradient control is achieved through a photocuring printing system; after the organoid is formed, the platform can continue to observe the state of the organoid in situ through the digital holographic microscopy system, and specified drugs are conveyed through digital microfluidics. The platform comprises an electro-infiltration chip module, a digital holographic microscopy system, a photocuring biological three-dimensional printing system, a driving control unit and a data analysis processing unit, and supports parallel manufacturing, targeted drug delivery and high-throughput screening of organoids.

The present invention relates to a cell analysis system based on virtual fluorescence generation technology, and a method therefor. According to the present invention, the system comprises: an input unit that receives a quantitative phase image of a sample including at least one cell through digital holography microscopy; and a cell identification unit that identifies at least one living cell by applying, to the received quantitative phase image, a cell segmentation mask generation model and a nuclei segmentation mask generation model constructed previously, and that masks a position of the nucleus of the living cell to derive an identification result. The system may further comprise a post-processing unit that derives a final result by applying a preset post-processing method to the derived identification result.

Measuring overlay using enhanced overlay targets is described. Multiple dimensional (e.g., x and y components) of an overlay measurement may be acquired in parallel in a digital holographic microscope (for example) system using non-cartesian overlay targets (e.g., overlay targets with structures oriented at angles other than typical ninety degree x and y orientations, but within forty five degrees of a radiation axis). This scheme enables single-shot acquisition of the multiple dimensional components of the overlay measurement (e.g., a full overlay vector). A processor is configured to deconstruct data from the single-shot acquisition (based on the orientation of the overlay targets) into the x and y components of an overlay value. Or the non-cartesian targets may be oriented to correspond to patterned features of interest in a substrate such that the single shot acquisition directly provides an overlay value relative to those features of interest.

The present invention relates to a method of characterizing a microorganism, comprising: A. for each wavelength of a predetermined set of wavelengths comprising at least one wavelength, acquiring a holographic digital image, generating a focused image by a computer device, each pixel of the image comprising an amplitude value and a phase value, and segmenting the focused image to extract a portion corresponding to the microorganism, and B. characterizing the microorganism by a computer device according to the aggregated image portion. According to the invention, before characterization or before segmentation or before generation of aggregated images, the method comprises correcting the optical aberration of the acquisition device by means of a computer device, and characterizing the microorganism comprises applying a digital model to these parts, the amplitude value and / or phase value of each wavelength of the predetermined set of wavelengths as a descriptor.

Embodiments of the present disclosure provide for improved generation and outputting of object identification data indicating object classifications for object representations. Such objects representations may correspond to depictions of objects in images captured using digital holographic microscopy. Some embodiments generate object identification data by comparing object representations in focused image(s) with specially configured annotated focused images, for example using a specially trained neural network or other machine learning model trained based on such annotated focused images. The annotated focused images are generated including a plurality of channels, each associated with a different grayscale focused image at a different target focal length of a range of target focal lengths. In this regard, model(s), algorithm(s), and / or other specially configured implementations may learn the spatial features of particular object representations and associated object identification data. The trained models may be used to perform accurate comparisons with the annotated focused images.

The invention relates to the field of holographic scanning, in particular to a ceramic handicraft digital holographic microscopic imaging equipment scanning detection device which comprises holographic scanning equipment, a connecting assembly, a guide rail assembly, a traction unit and a pressing unit. Wherein the holographic scanning equipment comprises a rack, a rotating device, a driving block, an object placing table, a driving module and a microscopic shooting module, the rotating device is installed on the rack, and the driving block is fixed to the rotating part of the rotating device. By rotating the threaded sleeve, the driving base can be smoothly clamped into the driving block, then the driver can drive the storage table to rotate, convenience is provided for holographic detection of the ceramic artware, the labor amount of workers is greatly reduced through the design, heavy manual carrying work is avoided, and the working efficiency is improved. And the situation that the ceramic handicrafts are possibly damaged in the carrying process is effectively prevented, and the safety and integrity of the ceramic handicrafts are guaranteed.

The present invention relates to a system and method for digital holographic microscopy. According to an aspect of the invention there is provided an off-axis digital holographic microscope comprising: a light emitter configured to provide a divergent light beam; a sensor position to receive light from the light emitter in a first path and a second path, and thereby to detect a holographic image; a reflector positioned partially in the divergent light beam so that light that encounters the reflector extends towards the sensor in the first path, and light that does not encounter the reflector extends towards the sensor in the second path; and a support structure configured to support a sample in the first path or the second path.

The application discloses a fast tilt compensation method based on Zernike polynomials, which comprises the following steps: obtaining a two-dimensional image matrix output by a digital holographic microscope; pre-processing the two-dimensional image matrix; projecting the pre-processed image intensity matrix onto a Zernike polynomial base, realizing Zernike fitting, and obtaining a Zernike model about a sample to be measured; calculating tilt term coefficients alpha x , alpha y of a first-order polynomial in the Zernike model; calculating defocus aberration by using the tilt term coefficients alpha x , alpha y ; performing tilt compensation on the pre-processed image intensity matrix, and outputting a compensated image intensity matrix. Further, corresponding electronic equipment is disclosed. The application can quickly and effectively compensate and correct a photographed image, and is quite considerable in robustness and calculation speed.

This disclosure describes a computing module and method for identifying cellular aggregates in real-time based on digital holographic images that are captured using digital holographic microscopy (DHM) techniques. In particular, the computing module is configured to use artificial intelligence models and data analysis techniques to analyze the captured DHM images. The analyzed DHM images are then classified and quantified to identify cellular patterns which are then statistically analyzed to reveal patterns linking the cellular patterns to associated diseases.

The present application relates to a kind of dot auxiliary focusing digital holographic microscope system and holographic reconstruction method, the system includes digital holographic microscopic optical path part and dot auxiliary focusing optical path part, digital holographic microscopic optical path part is irradiated after the object sample of polarization modulation narrowband laser to be measured with reference mirror reflected polarization orthogonal reference light in polarization camera interference imaging, different phase shift acquisition of single image is realized;Dot auxiliary focusing optical path part utilizes the definition of image to calculate the focus position of the object sample to be measured, can directly obtain the best inverse diffraction distance required in digital holographic reconstruction process.Compared with prior art, the present application has improved the autofocusing efficiency of digital holographic microscope, greatly speed up the speed of digital holographic three-dimensional surface reconstruction, on the premise of guaranteeing the reconstruction measurement precision, improves the efficiency and real-time of reconstruction and the like advantages.

The invention relates to the technical field of optical detection, in particular to a glass defect detection method and system based on a reflective off-axis digital holographic microscopy technology, and the system comprises a light source unit, an object light adjusting unit, a reference light adjusting unit, an image processing unit, a defect positioning unit, a three-dimensional reconstruction unit and a main control unit. Depth information of defects can be obtained through hologram reconstruction, surface and internal defects can be distinguished, the positioning precision can reach the micron order, the interference measurement principle is utilized, high sensitivity is achieved for nanoscale deformation and micron-order defects, invisible cracks which are difficult to find through a traditional method can be detected, and the method is suitable for large-scale popularization and application. According to the invention, defects can be detected, three-dimensional morphology characteristics of the defects can be obtained, more comprehensive data support is provided for quality evaluation, contact with a sample is not needed, potential damage to the glass surface is avoided, the device is suitable for on-line detection application, a reflective off-axis light path design is adopted, a complex interferometer structure is avoided, and industrial field installation and maintenance are facilitated.

The invention discloses an optical synthetic aperture digital holographic microscopy wrapped phase aberration compensation method based on deep learning. The method comprises the following steps: firstly, training a deep learning network model according to a simulation wrapped phase diagram and a corresponding Zernike polynomial coefficient, and then sequentially carrying out comprehensive processing such as multi-direction illumination processing and phase imaging processing on a to-be-detected sample to obtain a sub-aperture wrapped phase diagram; and inputting the sub-aperture wrapped phase diagram into the trained deep learning network model for processing, and comprehensively processing the processing result to obtain the super-resolution sample contour of the to-be-tested sample. According to the method, the phase aberration of the multi-direction sub-aperture complex amplitude can be quickly and accurately compensated, reliable aperture synthesis and resolution isotropic enhancement are realized, subsequent residual aberration compensation is not needed, the aperture synthesis process is greatly simplified while the phase data quality is improved, the time cost is saved, and the method is suitable for large-scale popularization and application. The method has great potential in digital holographic microscopic quantitative measurement application.

The invention relates to a living cell quantitative imaging method based on digital holographic microscopy sequential displacement aberration elimination, which belongs to the field of optical measurement, and comprises the following steps: collecting three holograms for living cell sequential displacement; performing phase demodulation to obtain three original phase diagrams; obtaining a total mask pattern; performing reverse direction sequential displacement on the phase diagram; carrying out differential calculation to obtain system aberration differential data of a global phase; utilizing the total mask pattern to obtain local system aberration differential data; carrying out differential processing on the Chebyshev polynomial, and obtaining local polynomial differential data by utilizing the total mask pattern; calculating a corresponding coefficient through differential data so as to fit a global system aberration; and subtracting global system aberration from the three original phase diagrams to obtain a living cell aberration-eliminated phase diagram. According to the method, high-precision quantitative phase imaging of living cells is realized while high-frequency information is reserved, the method has excellent displacement distance robustness, a high-precision displacement mechanism does not need to be equipped, and the hardware cost of a measurement system is greatly reduced.

The invention discloses a digital holographic microscopic imaging coherent noise suppression network model and method based on deep learning. The network model adopts a double-branch encoder-single decoder structure, and a double-branch encoder extracts local details and global noise features of an image in parallel; the innovative double-branch intensive attention fusion module fuses multi-scale features through an adaptive weighting and enhancement mechanism; and the decoder integrates information through jump connection and reconstructs a clear image. The training method generates a high-fidelity data set based on a physical simulation system. According to the method, speckle noise and parasitic fringes can be efficiently suppressed, the phase details of the object are effectively reserved while the peak signal-to-noise ratio and the structural similarity index are remarkably improved, and the method has excellent generalization ability and calculation efficiency and is suitable for real-time high-quality imaging of a digital holographic microscopy system.

The present invention belongs to the technical field of Brinell hardness measurement of materials, and specifically is a high-precision Brinell hardness measurement method based on digital holographic microscopy, which includes recording a hologram of the Brinell hardness indentation of a hardness test block; using a method of adaptively positioning the holographic positive first-order spectrum at the maximum value of the spectrum phase to obtain the positive first-order spectrum region of the hardness test block; using Fresnel diffraction method to numerically reproduce and holographically reconstruct the three-dimensional microscopic morphology of the Brinell hardness indentation of the hardness test block; using super-resolution fuzzy clustering and sub-pixel methods to achieve high-precision extraction and measurement of Brinell hardness indentation morphological features, and obtain the circular diameters of all Brinell hardness indentations in the current field of view; and calculating the Brinell hardness values of all Brinell hardness indentation areas in the current field of view based on the Brinell hardness measurement principle and calculation formula. The method described in the present invention can achieve high-resolution, high-precision holographic microscopic detection of Brinell hardness indentation morphologies in different shapes and surface conditions.

The application discloses a kind of based on topological structure's image reconstruction method and system, belong to image reconstruction field.It includes: the establishment digital holographic microscopy model;Three-dimensional space topological data is converted into multi-layer graph structure by adaptive focusing algorithm with different focal length imaging, and hierarchical graph model is formed;According to the topological data of hierarchical graph model, the deflection angle of object is calculated;According to the deflection angle, angle correction is carried out to hierarchical graph model, and the corrected hierarchical graph model is obtained;The best imaging focal point position in the corrected hierarchical graph model of different angles is calculated, and surface topological reconstruction is carried out according to the best imaging focal point position, to obtain the reconstructed image after angle adjustment.In traditional digital holographic microscopy, due to the limitation of light scattering angle, the side edge of object and large-angle inclined part often cannot be recorded completely, resulting in edge distortion or information loss of reconstructed image.The application solves the imaging limitation when processing complex curved surface object.