2948 results about "Microscope objective" patented technology

The invention discloses a high-power microscope intelligent scanning method for a bone marrow smear, which comprises the following steps: S1, automatically dividing a scanning area: acquiring a bone marrow smear image by adopting a front camera, and selecting an optimal scanning area through a multi-dimensional quality evaluation model; s2, intelligent partitioning and focusing point distribution: dividing an optimal scanning area into N * M sub-areas, determining P focusing sampling points by adopting a layered sampling strategy, and establishing a three-dimensional coordinate mapping table; s3, multi-point focusing data acquisition: according to a preset coordinate mapping table, driving an objective table and an objective lens assembly to move to each sampling point in sequence, and constructing an N * M * P-dimensional focusing data matrix; s4, performing focal plane fitting by a least square method: performing three-dimensional plane fitting on the acquired data; and S5, intelligent scanning imaging: calculating the theoretical optimal focal length of each position in the scanning path according to the fitting function, and driving the objective lens assembly to adjust the focal length in real time for scanning imaging. According to the invention, the scanning area identification accuracy and the image definition uniformity are automatically improved in the whole process.

The invention discloses a method for clearly imaging a mask under an optical objective, and relates to the technical field of optical detection and image processing, and the method comprises the following steps: S1, constructing a light intensity distribution model based on the boundary condition of the field of view of the optical objective in combination with the reflection characteristic and incident angle change rule of a metal edge material, and determining the coverage range of metal edge reflection crosstalk, generating a mask boundary interference prediction map; s2, according to the mask boundary interference prediction map, performing region division on the micro-reflectivity image, extracting brightness gradient characteristics of reflectivity lifting in an interference region, and generating a brightness gradient parameter set required by image filtering; the method is based on light intensity modeling, fusion direction filtering, pixel stripping, gradient reconstruction and credibility weighted fusion, realizes closed-loop control from interference prediction to pixel restoration, has high resolution and adaptivity, can accurately strip edge reflection artifacts and restore a real image structure, remarkably reduces misjudgment and rework rate, and is suitable for large-scale popularization and application. And the mask yield and the stability of the detection system are improved.

The invention discloses a deep ultraviolet spherical catadioptric detection objective lens, and relates to the technical field of optics, the deep ultraviolet spherical catadioptric detection objective lens comprises a first lens group, a second lens group and a diaphragm, one side of the first lens group is arranged to be an object plane, the first lens group is located between the second lens group and the object plane, the first lens group is used for converging light and correcting residual aberration of the second lens group, and the diaphragm is arranged between the second lens group and the object plane. The diaphragm is arranged in the middle of the second lens group, and the second lens group and the diaphragm are used for correcting vertical axis aberrations such as coma of the system. The objective lens adopts a spherical catadioptric structure, can realize deep ultraviolet band application, has a large numerical aperture, the numerical aperture can reach 0.8, the smaller wavelength and the larger numerical aperture have higher resolution, so that smaller defects can be detected, the working distance can be greater than 10mm, and the detection precision is improved on the basis of realizing the large NA design. The length of the system is reduced, the number of original parts is reduced, only five lenses are needed, the structure is simple, and installation and detection are convenient.

The invention relates to the technical field of quantum sensing and ocean detection, and discloses an ocean magnetic field sensor based on an NV color center and an ocean magnetic field measuring method.The sensor comprises a cylindrical pressure-resistant cabin, an optical platform arranged in the pressure-resistant cabin and a main control panel; a laser, a beam shaping unit, a dichroscope, a beam shaping lens group, an objective lens, a diamond NV color center chip, a plano-convex lens I, a band-pass filter and a photoelectric detector are mounted on the optical platform; two microstrip loop antennas are mounted on the outer side of the diamond NV color center chip; an FPGA + ARM dual-core processor, a digital lock-in amplifier and two microwave signal generators are installed on the main control board, and the microwave signal generators are connected with the microstrip loop antenna and achieve electromagnetic coupling with the diamond NV color center chip. The invention has the advantages of high sensitivity, good long-term stability and strong anti-interference capability, and provides a new generation of quantum sensing solution for applications such as ocean geomagnetic monitoring and underwater target identification.

The invention discloses a scanning electron microscope. The scanning electron microscope comprises a scanning electron microscope main body and a sample table located in a sample cavity, the scanning electron microscope main body is fixedly connected with the upper cover of the sample cavity, so that a closed space is formed in the sample cavity; a closed-loop groove is formed in an upper cover of the sample cavity; wherein the groove is located outside the connection position of the upper cover of the sample cavity and the scanning electron microscope main body, and the bottom of the groove is not higher than the supporting surface of the sample table; a magnetic shielding layer is arranged in the groove; wherein the length of the magnetic shielding layer is not less than the distance from the objective lens of the scanning electron microscope main body to the supporting surface of the sample stage.

A flying-over beam pattern scanning hologram microscope device includes: a scan beam generation unit which converts a first beam and a second beam to a first spherical wave and a second spherical wave, and then allows the first and second spherical waves to interfere with each other to form a scan beam; a scanning unit, which comprises a scan mirror for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit for detecting a beam that has passed through the objective lens again after fluorescing or being reflected from an object.

The invention discloses a fiber bragg grating femtosecond laser direct writing system and method based on light field regulation and control. The system comprises a femtosecond laser source, a polarization control module, a light beam expanding module, a light field modulation module, a 4f filtering imaging module, an oil immersed objective lens, a precision positioning and optical fiber clamping module, an observation module and a computer control module. The method comprises the following steps: firstly, fixing a standard single-mode optical fiber to be processed on a three-dimensional precision displacement platform; then programmable wavefront modulation is carried out on the femtosecond laser through a light field modulation module, and a multi-focus array is generated; then focusing the multi-focus array into the fiber core through an oil-immersed objective lens to realize one-time parallel inscribing of a plurality of refractive index modulation RIM regions; and finally, the computer control module controls the three-dimensional precision displacement platform to move at a constant speed in the axial direction of the optical fiber, and parallel integrated inscribing of a plurality of FBG structures is completed. According to the invention, the inscribing precision and inscribing efficiency of fiber bragg grating femtosecond laser direct writing are improved.

The invention provides a defect detection system and a defect detection method, the defect detection system comprises an objective table, an illumination channel and a plurality of detection channels, the illumination channel comprises a light source, and the light source is used for providing detection light spots for a detection area of a to-be-detected object. The detection channel comprises an objective lens and a detector, the objective lens is used for collecting scattered light generated by the detection light spot in the detection area, and the detector is used for determining the signal intensity of the scattered light so as to determine defect information of the detection area based on the signal intensity. The incident plane is perpendicular to a second plane where the optical axes of the detection channels are located, deviation angles exist between the optical axes of the detection channels and the normal direction of the surface of the to-be-detected object, and at least two deviation angles in all the deviation angles meet the angle difference condition. According to the device, scattered light of different types of defects can be efficiently collected, concave defects and convex defects can be accurately detected through a plurality of detection channels, missing detection can be avoided, and the two types of defects existing on the surface of an object to be detected can be accurately detected.

The application discloses a multi-marked endoscopic imaging lens for digestive tract, and belongs to the field of biomedical microscopic endoscopic imaging. The endoscopic imaging lens comprises a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens and a seventh lens; the first lens focuses laser; the second lens is matched with the first lens to limit a light beam in an effective light aperture of the lens; the third lens corrects chromatic aberration; the fourth lens and the fifth lens are combined to correct aberration; the sixth lens adopts an aspheric lens to correct spherical aberration caused in a collimating and focusing system; and the seventh lens is matched with the sixth lens to correct chromatic aberration. The working spectral range of the microscopic objective lens group is 488-860 nm, the effective light aperture is less than 1.8 mm, the mechanical outer diameter is not greater than 2.6 mm, the numerical aperture at the object side or the tissue is 0.55, the imaging field of view is 450 microns, the magnification is 2.14 times, and the working distance is 84 microns. The effect of matching excitation and fluorescence spectrum of a clinically available fluorescence contrast agent is realized.

The invention provides a tip Raman-based metal oxide nanoparticle in-situ detection method, which comprises: S1, dispersing metal oxide nanoparticles in a nanoparticle dispersion liquid, focusing laser to the tip of a nanometer tip through an objective lens, capturing a single nanoparticle by using an optical tweezers technology, and attaching the single nanoparticle to the nanometer tip; s2, focusing Raman laser on a nano needle tip-particle interface, generating a local high-temperature field through a photo-thermal near-field coupling effect, triggering a thermal chemical reaction of nano particles, and synchronously collecting a Raman spectrum; and S3, carrying out pretreatment and characteristic peak analysis on the collected Raman signal of the Raman spectrum, and determining the reaction critical temperature and the dynamic process in combination with temperature calibration data. According to the invention, capture and accurate heating of the nanoparticles are realized through photo-thermal coupling of the optical tweezers and the needle tip, and thermal chemical reaction monitoring of the nanoparticles is realized.

The invention relates to a secondary harmonic characterization system based on spatial light regulation and control. The secondary harmonic characterization system comprises an incident light path unit, a detection light path unit and a sample table, the incident light path unit sequentially comprises a laser, a polarizer, a half-wave plate, a light modulator, a long-pass optical filter and an incident objective lens in the light beam incident direction; a wafer is carried on the sample table; the detection light path unit sequentially comprises an adjustable detection objective lens, a light path adjuster, a polarization analyzer, a short-pass optical filter and a detector in the light beam reflection direction; according to the SHG signal representation detected by the detector, all control parameters of the light modulator, the adjustable detection objective lens, the light path adjuster and the sample table are regulated and controlled, and the SHG signal receiving efficiency of the detector is improved. According to the invention, it is ensured that the detector efficiently receives the SHG signal, and the SHG characterization precision is improved.

The invention provides a long-exit-pupil-distance broadband common-aperture composite simulation optical system, and belongs to the technical field of target scene composite analog simulation. A broadband objective lens group A, a space beam combiner group B and a long-wave infrared projection lens group D are sequentially arranged in the optical system from left to right along light, a visible light projection lens group C is located on the upper side of the space beam combiner group B, and a long-wave infrared projection lens group C is located on the lower side of the space beam combiner group B; a visible light image plane is positioned on the right side of the visible light projection lens group C; the medium-wave infrared projection lens group E is located on the lower side of the space beam combiner lens group B, the medium-wave infrared image surface is located on the lower side of the medium-wave infrared projection lens group E, the long-wave infrared image surface is located on the right side of the medium-wave infrared image surface, and the exit pupil position is located on the left side of the broadband objective lens group A; the problem that a single-channel target modulo system only adapts to simulation of imaging guidance equipment of a specific wave band and is not suitable for semi-physical simulation tests of three-mode composite imaging guidance equipment and two-mode composite imaging guidance equipment is solved.

The invention relates to the technical field of laser shaping, in particular to a light spot shaping method and system based on a spatial light modulator, and the method comprises the steps: providing and expanding an incident laser beam in Gaussian distribution, and obtaining a collimated and expanded beam; irradiating an incident laser beam to a spatial light modulator, loading a preset phase modulation pattern to modulate a wavefront phase, and outputting a phase modulation beam; the phase modulation light beam is input into a 4f imaging system, a spatial light modulator is located on the front focal plane of a first lens, and the light beam forms a light field with target intensity distribution on the rear focal plane of a second lens after passing through the system; and the light field is focused on the surface of a workpiece to be processed through an objective lens to form a flat-topped light spot. According to the scheme, uniform light intensity distribution can be flexibly generated without replacing optical elements, the uniformity and utilization efficiency of laser energy in a machining area are remarkably improved, and the problem of material damage or insufficient edge machining caused by too strong center energy is effectively solved.

The invention relates to the technical field of quantum sensing, and discloses a quantum magnetometer device based on diamond NV color center photoelectric detection magnetic resonance. Wherein the optical path module performs optical excitation and imaging positioning on a diamond sample through a laser and an objective lens. The circuit module integrates a microwave source, a lock-in amplifier, a low-noise current amplifier and a programmable power supply, applies a microwave field and bias voltage to a microwave antenna and an interdigital electrode on the surface of a sample respectively, and collects sample dependency photocurrent signals. And the operation module realizes automatic control and data processing of the system. According to the device, NV color center spin state information is converted into a photocurrent signal through a photoelectric detection magnetic resonance mechanism, an amplitude or frequency modulated signal is demodulated by using a lock-in amplification technology, information of a detection magnetic field is obtained through a high signal-to-noise ratio photoelectric detection magnetic resonance spectrum, and the sensitivity of the magnetic field is evaluated. Magnetic resonance signals are detected in an all-electricity mode, a complex optical system of traditional fluorescence detection is simplified, and the device has the advantages of being compact in structure, easy to integrate, high in measurement sensitivity and the like.

The utility model relates to a 3D electronic endoscope which comprises a hard tube and a front end base arranged at the front end of the hard tube, an inclined face is arranged at the front end of the front end base, a lens light window is arranged in the middle of the inclined face, and light source light windows are arranged on the upper side and the lower side of the lens light window respectively. An imaging module and an optical fiber module are arranged in the front-end base, the imaging module comprises two objective lenses which are distributed left and right and have parallel main optical axes, and the lens ends of the two objective lenses directly face a lens light window; the pair of optical fiber modules is distributed on the upper side and the lower side of the imaging module, and the optical fiber end faces of the pair of optical fiber modules are tightly attached to the light source light window. According to the utility model, the structure design is reasonable, the independent imaging module is matched with the two optical fiber modules, the binocular focusing precision is improved, the stray light is reduced, and the image quality is improved, so that the undesirable phenomenon that people are dizzy due to the binocular focusing precision and the stray light directly or indirectly is reduced or eliminated.

The invention relates to the technical field of semiconductor detection, in particular to a wafer bright field illumination and imaging system, a wafer defect detection device and a wafer defect detection method, the system comprises an illumination module, a beam combining module, an objective lens module and an acquisition imaging module; wherein the illumination module generates an illumination light beam adaptive to a wafer detection view field; the beam combining module realizes non-interference separated transmission of an illumination light path and an acquisition light path through a reflection area and a transmission area which work independently; the objective lens module converges the light beams reflected by the reflection area to the surface of the wafer, and controls the light beams to form illumination only at the edge of an entrance pupil so as to realize off-axis illumination; meanwhile, the reflected light beams on the surface of the wafer are collimated and then transmitted to the transmission area; and the acquisition imaging module receives the parallel light beams, converts optical signals into electric signals, and generates a wafer surface image. According to the invention, the problems of high energy loss, high cost, low detection rate and insufficient resolution of a traditional bright field detection system are effectively solved.

The invention provides a light source multiplexing diamond NV color center wide field detection system and an illumination detection method. The system comprises a diamond containing an NV color center, an exciting light module, a first double-color sheet, an objective lens, a second double-color sheet, a wide field imaging module, an illumination imaging module and a microwave module, exciting light generated by the exciting light module irradiates the first double-color piece, is guided to the objective lens, and irradiates the diamond after being transmitted by the objective lens so as to excite the NV color center of the diamond to generate fluorescent light; the objective lens is of an infinity type; the exciting light is irradiated to a sample to be detected after being transmitted by the diamond; fluorescent light and exciting light from a sample to be detected are collected by the objective lens, then transmitted to the first double-color piece and guided to the second double-color piece through the first double-color piece, the second double-color piece guides the fluorescent light to the wide-field imaging module for imaging, and the exciting light in the second double-color piece is guided to the illumination imaging module for imaging. Illumination can be achieved in the exciting light working state, exciting light switching operation in the prior art is avoided, and efficiency can be remarkably improved.

The invention belongs to the technical field of telescope manufacturing, and discloses a large-view-field telescope optical system which is characterized in that a first objective lens, a second objective lens, a third objective lens, a focusing lens, a semi-pentaprism, a roof prism, a first eyepiece lens, a second eyepiece lens and a third eyepiece lens are sequentially designed from the object side to the image side in the optical axis direction. According to the optical system, only the ten lenses have diopters, the requirement for the field of view of 6.7 degrees under the 8-fold condition is met, and the exit pupil distance reaches 22.6 mm.

The present invention relates to a microscope comprising a light source, an illumination beam path for guiding excitation light to a sample, a detector for detecting emission light emitted by a sample, a detection beam path with a microscope objective for guiding the emission light to the detector, a mechanical drive for setting a relative lateral position between the sample and the microscope objective, and a control unit.The microscope is characterized in that the control unit is configured to perform a setting step, wherein the mechanical drive is sequentially adjusted to at least three different relative lateral positions; a detection step, wherein measurement data from the detector are acquired for at least a subset of points in the sample within a field of view of the detection beam path, wherein for each point of the subset measurement data are acquired for at least two different lateral positions of the mechanical drive; and an evaluation step, wherein field inhomogeneity in the field of view and microscopic sample information are extracted from the measurement data. In further aspects, the invention relates to a method for determining field inhomogeneity in a field of view of a microscope and to a microscopy method.

The invention relates to the field of wafer defect detection, in particular to a rapid zooming wafer detection microscope based on MEMS and a detection method. The microscope comprises an illumination part, a sample stage, a spectroscope, a microscope objective, an MEMS micromirror array zoom module, a CMOS image sensor, a laser interference distance measuring sensor and a synchronous control and processing module based on an FPGA. The MEMS micro-mirror array zoom module composed of a plurality of micro-mirror units is introduced into a light path, the deflection state of each micro-mirror unit is adjusted, a dynamic reflecting surface with a controllable equivalent curvature is formed, focusing regulation and control of imaging light beams are achieved, electronic focusing without mechanical movement is completed, the response speed is superior to that of traditional mechanical adjustment, and the imaging quality is improved. And the method is suitable for high-speed online detection.

The invention discloses a non-consistency multi-focus unit modification system for laser slicing of transparent materials. The non-consistency multi-focus unit modification system comprises an ultra-short pulse laser, a light beam regulation and control system, a light beam shaping system, a focusing objective lens, a visual positioning system and a high-precision three-dimensional motion platform, a transparent material sample wafer to be sliced is placed on the high-precision three-dimensional motion platform; the ultrashort pulse laser provides picosecond laser beams for the whole system, the laser beams generated by the ultrashort pulse laser are transmitted to the light beam shaping system through the light beam regulation and control system to generate multiple inconsistent laser beams, and the multiple inconsistent laser beams are focused and shrunk through the focusing objective lens to obtain multiple inconsistent focuses. The focus is focused in a transparent material sample wafer on a high-precision three-dimensional motion platform for slicing; wherein the high-precision three-dimensional motion platform realizes the movement of a transparent material sample wafer in x, y and z directions; and the visual positioning system is used for identifying and positioning the transparent material sample. On the premise that the slicing quality is guaranteed, the processing efficiency is remarkably improved.

The utility model relates to a 4K fluorescent endoscope optical system, which comprises an objective lens system, a relay lens system and an eyepiece system which are sequentially arranged along the light propagation direction, and is characterized in that the objective lens system is of a reverse long-distance structure; the system comprises a sapphire protection lens, a negative focal power lens, a prism or a steering prism, a positive focal power plano-convex cemented lens, a positive focal power triple cemented lens and a first positive focal power double cemented lens which are arranged along a light propagation direction, the relay lens system comprises n relay lens groups, and each relay lens group is of a double telecentric structure. And the eyepiece system is arranged in the light transmission direction and is formed by symmetrically arranging two doublet rod lenses, n is an odd number, the eyepiece system is of an object space telecentric structure, and the eyepiece system comprises a second positive-focal-power doublet lens, a positive-focal-power lens and a sapphire lens which are glued into a whole in the light transmission direction. The structure of an optical system can be simplified, production and processing cost can be reduced, and 4K ultra-high-definition fluorescent laparoscopic imaging can be realized at the same time.

The invention relates to a spectral confocal three-dimensional shape reduction method and system based on a super-surface spectral imaging chip. The method comprises the following steps: a continuous spectrum light source device emits a continuous spectrum light beam to a dispersion objective lens, the continuous spectrum light beam is subjected to spatial separation along an optical axis direction through the dispersion objective lens and then is irradiated to the surface of a to-be-measured three-dimensional topography object, and the continuous spectrum light beam is reflected on the surface of the object; a part of the reflected light beam penetrates through a light hole of the shading plate, then irradiates a focusing lens, is focused by the focusing lens and then enters a super-surface spectral imaging chip, and the super-surface spectral imaging chip collects wavelength information; wavelength information collected by the super-surface spectral imaging chip is converted into height information, and the three-dimensional shape of the surface of the object is fitted according to the height information and the pixel position corresponding to the height information. According to the invention, the reduction of the three-dimensional morphology can be realized through one-time photographing of the simple optical system, the morphology reduction efficiency is high, and the cost is low.

The invention discloses a PINN-based large numerical aperture photoetching objective lens vector diffraction field calculation method, which comprises the following steps: obtaining a three-dimensional vector diffraction light field of a large NA photoetching objective lens through simulation, reconstructing the three-dimensional vector diffraction light field at a sampling point position, and generating corresponding complex electric field distribution matrix data; performing physical purification on the complex electric field distribution matrix data to construct a corresponding data set; constructing a corresponding Helmholtz equation as a constraint equation based on the light field tight focusing characteristic of the large NA photoetching objective lens; constructing an initial model, and training the initial model by using the data set in combination with the constraint equation to obtain a PINN model for predicting complex electric field data; and inputting space coordinates of a to-be-predicted target into the PINN model to obtain complex electric field data. According to the method provided by the invention, the calculation efficiency of the vector diffraction field can be remarkably improved on the premise of keeping relatively high simulation precision, and the method is suitable for rapid modeling and analysis of the three-dimensional vector light field of the large-numerical-aperture photoetching object mirror.

The invention provides an objective lens system and optical observation equipment. The objective lens system comprises a fourth lens with positive focal power, a third lens with positive focal power, a second lens with negative focal power and a first lens with positive focal power which are sequentially arranged on the same optical axis from the object side; the first lens and the third lens are biconvex lenses, the second lens is a biconcave lens, the fourth lens is a balsaming lens, and the image side surface of the fourth lens is a convex surface; the focal length f of the objective lens system and the focal length f1 of the first lens satisfy the relationship. According to the invention, during assembly, the tolerance requirement is low, installation and adjustment are more facilitated, the field of view is larger, the vignetting is smaller, the number of lenses is smaller, and the cost performance is higher.

This invention relates to an in-situ detection system for a rotating microliquid film reactor (MFR) for monitoring the nucleation behavior of nanomaterials. The reactor comprises a rotor and a stator, with a stator base angle of 70-85°, a rotational speed of 500-5000 rpm, and a slit width of 10-500 μm to ensure that fluid passing through the slit does not undergo backmixing and to create a strong shear field. A micro-negative pressure sampler is fabricated to capture nucleating particles within the high-speed shear field and bring them into the visible observation area. A high-speed camera and microscope objective are connected in situ, thereby acquiring instantaneous images of the nucleation process at the nanoscale and capturing the transient evolution behavior of crystal nuclei. The construction of this rotating MFR in-situ detection system solves the problems of poor micro-mixing effects and uncontrollable nucleation and growth in traditional stirred tank reactors, leading to poor quality in large-scale preparations, and the inability to observe phase transitions and instantaneous nucleation processes in a closed reactor. The obtained hydrotalcite nucleation results enrich non-classical nucleation theories and provide guidance for the large-scale preparation of nanomaterials.

The invention provides an imaging device and method based on a diamond NV color center, and the device comprises a diamond containing the NV color center, an objective lens assembly, an optical detection module, a displacement platform, and a microwave module. The objective lens assembly comprises an objective lens turntable, and an objective lens and a suction tube which are mounted on the objective lens turntable, the objective lens turntable can switch the objective lens or the suction tube to a working position, and the suction tube is used for introducing negative pressure; the displacement platform is located below the objective lens assembly, and the upper surface of the displacement platform is used for placing a to-be-tested piece and can regulate and control the position of the to-be-tested piece; the diamond is used for being placed on a to-be-tested piece and located below the working position of the objective lens assembly, when the suction pipe is switched to the working position, an opening in the lower end of the suction pipe faces the diamond, and the diamond can be adsorbed or released through negative pressure in the control pipe. And the implementation mode is simple and convenient, the use of other auxiliary equipment is reduced, the occupied space is simplified, and accurate and efficient operation of adsorbing and releasing the diamond can be ensured. By using the device, multiple times of imaging scanning of a large-size to-be-measured piece can be realized.

The utility model relates to bright field and fluorescent light integrated scanning equipment, which comprises an equipment rack, a bright field light path assembly used for forming a bright field light path and a fluorescent light path assembly used for forming a fluorescent light path, the bright field light path assembly comprises a bright field camera, a light path pipe diameter, objective lens equipment, a slide holder for bearing a sample and a bright field light source module; the fluorescent light path assembly comprises a fluorescent camera, a light path pipe diameter shared by the fluorescent camera and the bright field light path, a fluorescent turntable, objective lens equipment, a slide holder and a fluorescent light source module; the bright field and fluorescence integrated scanning equipment is provided with a camera switching device; the objective lens equipment comprises a plurality of objective lenses with different multiplying powers, and the bright field light source module is provided with a diaphragm switching device for switching diaphragms based on the multiplying powers of the objective lenses; the slide holder is provided with a scanning motion module for moving the slide holder. According to the utility model, integration of bright field fluorescence is realized, the cost is reduced, and the system has the characteristics of better imaging effect and higher efficiency.

The embodiment of the utility model provides an objective lens damping device which comprises an objective lens damper, a flexible hinge structure is adopted in the objective lens damper, and the flexible hinge structure provides elastic support when external vibration or temperature changes so as to buffer vibration transmission and reduce stress caused by a thermal expansion effect; the upper layer of the objective lens damper is an objective lens contact end; the lower layer is a frame contact end and is provided with an interface connected with a frame; the middle layer is of a flexible hinge structure, necessary flexible supporting is provided, and therefore vibration isolation and thermal stress buffering are achieved. According to the utility model, the objective lens damper is arranged between the objective lens and the frame, so that the objective lens and the frame are flexibly connected through the scalability of the flexible hinge instead of being rigidly connected through a screw, a better protection effect on the objective lens is achieved, and the designed objective lens damper belongs to passive vibration reduction, so that the service life of the objective lens damper is prolonged. Only through mechanical design, the vibration isolator is easy to achieve, and vibration isolation and thermal decoupling are well achieved.

A super-resolution single-objective light-sheet optical microscopy system and method, and a related imaging system, are configured to generate two light sheets that are guided to a single objective. The single objective is configured to allow the two light sheets to transmit through same and interfere with each other to generate structured light fringe regions. The single objective is further configured to receive a fluorescence signal that is recorded by a fluorescence detection module.