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4198 results about "Microscope objective" patented technology

Several objective lenses on a microscope. In optical engineering, the objective is the optical element that gathers light from the object being observed and focuses the light rays to produce a real image. Objectives can be a single lens or mirror, or combinations of several optical elements.

Optical system of color three-dimensional fundus imager

The invention belongs to the technical field of retina imaging and fundus three-dimensional reconstruction, and particularly relates to a color three-dimensional fundus imager optical system. Comprising a large eye objective lens, a dichroscope, a hollow reflector, a focusing lens, a spectroscope, a retina lens, a retina imaging chip, a fixation lens, a sighting mark lamp, an illumination lens, an annular light source, a pupil lens, a pupil imaging chip, an infrared lens, an infrared dodging lens, an infrared light source, a scanning lens, a three-dimensional galvanometer, a collimator, a coupler, a frequency sweeping light source and a dispersion compensator. A polarization controller, a coupler and a photoelectric detector. The system is mainly composed of a visible light imaging light path, an infrared imaging light path and a laser imaging light path, the visible light imaging light path is used for shooting color fundus two-dimensional images, the infrared imaging light path is used for real-time positioning and focusing of human eye pupils, and the laser imaging light path is used for three-dimensional tomography of retinas. The objective of the invention is to solve the problem that existing medical equipment cannot acquire fundus color three-dimensional images.
Owner:INST OF PHYSICS HENAN ACAD OF SCI +1

Bone marrow smear high-power microscope intelligent scanning method

The invention discloses a high-power microscope intelligent scanning method for a bone marrow smear, which comprises the following steps: S1, automatically dividing a scanning area: acquiring a bone marrow smear image by adopting a front camera, and selecting an optimal scanning area through a multi-dimensional quality evaluation model; s2, intelligent partitioning and focusing point distribution: dividing an optimal scanning area into N * M sub-areas, determining P focusing sampling points by adopting a layered sampling strategy, and establishing a three-dimensional coordinate mapping table; s3, multi-point focusing data acquisition: according to a preset coordinate mapping table, driving an objective table and an objective lens assembly to move to each sampling point in sequence, and constructing an N * M * P-dimensional focusing data matrix; s4, performing focal plane fitting by a least square method: performing three-dimensional plane fitting on the acquired data; and S5, intelligent scanning imaging: calculating the theoretical optimal focal length of each position in the scanning path according to the fitting function, and driving the objective lens assembly to adjust the focal length in real time for scanning imaging. According to the invention, the scanning area identification accuracy and the image definition uniformity are automatically improved in the whole process.
Owner:SHANGHAI HONGJUE INFORMATION TECH DEV CO LTD

Three-dimensional automatic focusing method and device based on multi-modal data fusion and Kalman filtering and readable storage medium thereof

ActiveCN120233518AImage enhancementImage analysisAutomated microscopyEngineering
The invention provides a three-dimensional automatic focusing method and device based on multi-modal data fusion and Kalman filtering and a readable storage medium, and high-precision real-time focusing is realized through multiple steps: collecting sample three-dimensional phase information and different focal plane image data by using a phase and image sensor, and calculating phase depth and definition; constructing a multi-plane Kalman filtering cluster, modeling the focus state of each focal plane, and predicting the focus by fusing the neighborhood coupling influence; the focus state is updated and corrected in combination with the image definition and the phase gradient, and the optimal three-dimensional focus position is determined by means of a collaborative optimization decision maker; dynamically adjusting the noise matrix and the coupling coefficient, and controlling the objective lens to complete focusing. According to the method, through multi-modal fusion and multi-plane cooperation, the problems of focus drifting and jumping are effectively solved, the focusing precision and stability of an imaging system in a complex sample and a dynamic environment are remarkably improved, and the method is suitable for equipment such as a biomedical full-automatic microscope and a digital pathological section scanner.
Owner:SHENZHEN SHENGQIANG TECH

Microobjective optimization method and electronic equipment

The invention provides a microscope objective optimization method and electronic equipment, and relates to the technical field of microscopic imaging. The method comprises the following steps: acquiring initial design parameters of a microscope objective; respectively calculating the imaging quality of the microscope objective and the total ghost image intensity of the microscope objective based on the Kohler illumination system according to the initial design parameters of the microscope objective; according to the imaging quality and the total ghost image intensity of the microscope objective, a preset lens evaluation function is constructed, and the target design parameters of each target lens when the imaging quality meets the first preset requirement and the total ghost image intensity meets the second preset requirement are iteratively calculated, so that compared with an existing mode of determining through multiple tests, the optimization efficiency can be improved; and through introduction of the preset lens evaluation function, comprehensive evaluation can be realized, and the optimization effect is ensured.
Owner:GIGA FORCE ELECTRONICS CO LTD

Snapshot type hyperspectral imaging industrial online sorting system

The invention discloses a snapshot type hyperspectral imaging industrial online sorting system which comprises a support assembly, an optical imaging assembly and a motion control assembly. The bracket assembly consists of a bottom plate, and an adjustable bracket and a fixed bracket which are fixed on the bottom plate; the optical imaging assembly comprises a lighting unit, an imaging objective lens and a snapshot type hyperspectral camera, and can synchronously obtain space image information of a measured object and spectral information of a continuous wave band in a single exposure process; the motion control assembly realizes automatic transmission of the measured object through the transmission platform; the data processing module is integrated with an image preprocessing unit, a spectral analysis unit and a spectral database, and is used for end-to-end closed-loop control from original hyperspectral data generation to sorting decision making; the system adopts a metasurface light splitting structure to realize real-time decoding, performs material or category identification by using a pre-trained classification model, and finally automatically generates a sorting decision signal according to an identification result to drive a motion control assembly to complete sorting operation.
Owner:SUZHOU PUXIANG TECHNOLOGY CO LTD

Floating algae flow type microimaging sheath fluid focusing micro-fluidic chip device and floating algae flow type microimaging sheath fluid focusing micro-fluidic chip system

The invention discloses a floating algae flow type microimaging sheath fluid focusing micro-fluidic chip device and system, and belongs to the technical field of micro-fluidic control. According to the device, the three-channel sheath fluid flow chip design is adopted, a large-channel inlet structure is combined to avoid algae cell blockage, and a sheath flow focusing technology is utilized to compress a sample flow to the center of a channel and limit the sample flow within the field depth range of a microscope objective to obtain a clear image. The arc-shaped structure of the sample channel reduces laminar flow disturbance, and a four-side transparent observation area supports panoramic depth imaging. The system comprises a microscopic imaging module, a fluid driving module and a sheath liquid flow chip module, a flow rate ratio of sheath liquid flow to sample flow is accurately controlled through a dual-channel liquid flow driving injection pump, and stable imaging within the depth of field of an objective lens is realized by combining a manual focusing platform. Experimental verification shows that the system can effectively compress sample flow to 21m nuclear flow diameter, imaging of floating algae such as chlorella, scenedesmus quadricauda and the like is clear, and the contradiction between flux and imaging quality of a traditional micro-fluidic chip is solved.
Owner:HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES

In-situ exploration-while-drilling device and method for lunar resources

The invention discloses a lunar resource in-situ exploration-while-drilling device and method. The lunar resource in-situ exploration-while-drilling device is composed of a spiral drilling tool, an illumination light source module, a polarization spectrum detection module and a dual-channel spectrum measurement module. The drilling tool drill rod is of a hollow structure. Light emitted by the illumination light source module is collimated and depolarized to form unpolarized parallel light to irradiate lunar soil on the side wall of the drill hole, and the polarization spectrum measurement probe collects reflected light of the lunar soil; the reflected light is collimated by a front collimator objective of the probe and then sequentially passes through a spectrum modulation unit consisting of an achromatic 1 / 4 wave plate, a multi-stage wave plate, a beam splitter prism and two polaroids of which the light transmission directions are vertical to each other, and two orthogonal light beams are formed, so that polarization information of the reflected light is modulated in a spectrum dimension; demodulating the modulated spectrum to obtain the spectrum and polarization information of the lunar soil reflected light; and the resource distribution and content and the physical characteristics of the original lunar soil are inversed by using the polarization spectrum characteristics of the lunar soil. According to the invention, in-situ exploration of lunar subsurface depth profile mineral resources can be realized.
Owner:DEEP SPACE EXPLORATION LABORATORY

Clear imaging method of mask under optical objective lens

The invention discloses a method for clearly imaging a mask under an optical objective, and relates to the technical field of optical detection and image processing, and the method comprises the following steps: S1, constructing a light intensity distribution model based on the boundary condition of the field of view of the optical objective in combination with the reflection characteristic and incident angle change rule of a metal edge material, and determining the coverage range of metal edge reflection crosstalk, generating a mask boundary interference prediction map; s2, according to the mask boundary interference prediction map, performing region division on the micro-reflectivity image, extracting brightness gradient characteristics of reflectivity lifting in an interference region, and generating a brightness gradient parameter set required by image filtering; the method is based on light intensity modeling, fusion direction filtering, pixel stripping, gradient reconstruction and credibility weighted fusion, realizes closed-loop control from interference prediction to pixel restoration, has high resolution and adaptivity, can accurately strip edge reflection artifacts and restore a real image structure, remarkably reduces misjudgment and rework rate, and is suitable for large-scale popularization and application. And the mask yield and the stability of the detection system are improved.
Owner:ZHONGKEZHUOXIN SEMICON TECH (SUZHOU) CO LTD

Deep ultraviolet spherical catadioptric detection objective lens

The invention discloses a deep ultraviolet spherical catadioptric detection objective lens, and relates to the technical field of optics, the deep ultraviolet spherical catadioptric detection objective lens comprises a first lens group, a second lens group and a diaphragm, one side of the first lens group is arranged to be an object plane, the first lens group is located between the second lens group and the object plane, the first lens group is used for converging light and correcting residual aberration of the second lens group, and the diaphragm is arranged between the second lens group and the object plane. The diaphragm is arranged in the middle of the second lens group, and the second lens group and the diaphragm are used for correcting vertical axis aberrations such as coma of the system. The objective lens adopts a spherical catadioptric structure, can realize deep ultraviolet band application, has a large numerical aperture, the numerical aperture can reach 0.8, the smaller wavelength and the larger numerical aperture have higher resolution, so that smaller defects can be detected, the working distance can be greater than 10mm, and the detection precision is improved on the basis of realizing the large NA design. The length of the system is reduced, the number of original parts is reduced, only five lenses are needed, the structure is simple, and installation and detection are convenient.
Owner:CHANGCHUN ZHIRAN PHOTOELECTRIC TECH CO LTD

Microlens array zoom module zoom method and imaging system

The invention is suitable for the field of imaging, and discloses a micro lens array zoom module zoom method and an imaging system, and the method comprises the steps: obtaining a mapping relation table between a deviation objective lens working distance and a micro lens array state of a micro lens array zoom module; acquiring a laser spot image formed by irradiating the to-be-measured object with laser, and calculating the position of the to-be-measured object to the focal plane of the objective lens; determining an adjustment reference distance of the micro-lens array zoom module based on the position from the object to be measured to the focal plane of the objective lens, and comparing the adjustment reference distance with the mapping relation table to determine the micro-lens array state of the micro-lens array zoom module; and on the basis of the determined state of the microlens array, a focusing instruction is generated so as to realize automatic zooming of the microlens array zooming module, automatic zooming of the microlens array zooming module is realized, and the method has the advantages of extremely high focusing speed and high precision.
Owner:JIHUA LAB

Ocean magnetic field sensor based on NV color center and ocean magnetic field measuring method

The invention relates to the technical field of quantum sensing and ocean detection, and discloses an ocean magnetic field sensor based on an NV color center and an ocean magnetic field measuring method.The sensor comprises a cylindrical pressure-resistant cabin, an optical platform arranged in the pressure-resistant cabin and a main control panel; a laser, a beam shaping unit, a dichroscope, a beam shaping lens group, an objective lens, a diamond NV color center chip, a plano-convex lens I, a band-pass filter and a photoelectric detector are mounted on the optical platform; two microstrip loop antennas are mounted on the outer side of the diamond NV color center chip; an FPGA + ARM dual-core processor, a digital lock-in amplifier and two microwave signal generators are installed on the main control board, and the microwave signal generators are connected with the microstrip loop antenna and achieve electromagnetic coupling with the diamond NV color center chip. The invention has the advantages of high sensitivity, good long-term stability and strong anti-interference capability, and provides a new generation of quantum sensing solution for applications such as ocean geomagnetic monitoring and underwater target identification.
Owner:OCEANOGRAPHIC INSTR RES INST SHANDONG ACAD OF SCI

Objective lens module and photoetching imaging system

The invention provides an objective lens module and a photoetching imaging system, and relates to the technical field of optical imaging, the objective lens module is configured between an object plane and an image plane of the photoetching imaging system, and the objective lens module comprises a first lens group, a second lens group and a microobjective lens group which are sequentially arranged from the object plane to the image plane, the first lens group and the second lens group are both of a double-Gaussian structure or a double-Gaussian derivative structure, and the focal length of the first lens group is larger than that of the second lens group. The objective lens module can reduce the aperture size of the optical lens in the objective lens module, increase the object space working distance and improve the imaging quality on the premise of ensuring a large field of view.
Owner:NEW YIDONG (SHANGHAI) TECH CO LTD

Automatic focusing system, automatic focusing method and surface defect detection method

The invention provides an automatic focusing system, an automatic focusing method and a surface defect detection method, and the method comprises the steps: controlling a plurality of light sources in a light source array to be lightened one by one according to a preset time sequence, and enabling a light beam emitted by each light source to be reflected by a corresponding to-be-detected sub-region on the surface of a to-be-detected device, and one part of the reflected light is detected as a defocus detection light spot by the defocus information acquisition unit, and the other part of the reflected light forms a detection image on the main detection camera. As the position of the defocus detection light spot and the position of the microscope objective have a mapping relation, defocus information corresponding to the defocus detection light spot can be obtained through the mapping relation, and therefore automatic focusing of the microscope objective is achieved. According to the lighting sequence of the light source, automatic focusing and imaging are sequentially carried out on each to-be-detected sub-region, so that the image detection precision can be improved, the light path hardware requirement can be reduced, the height information of the surface of the to-be-detected device can be obtained through defocusing information, surface defect detection on an object with complex three-dimensional morphology characteristics is facilitated, and the detection efficiency is improved. And the detection flexibility and precision are improved.
Owner:WUHAN JINGCE ELECTRONICS GRP CO LTD +2

Stereomicroscope

The invention relates to the technical field of microscopes, in particular to a stereomicroscope which comprises an eyepiece, an interpupillary distance adjusting assembly, an optical hinge set, a prism steering set, a distributed reflection light path assembly and a continuous zoom objective lens set. The distributed back-shooting light path assembly comprises a negative lens group, a positive lens, a negative lens and a positive lens group, the negative lens group is arranged between the prism steering group and the continuous zoom objective lens group, the positive lens is arranged between the optical hinge group and the prism steering group, and the negative lens and the positive lens group are arranged between rectangular prisms in the optical hinge group; a negative lens group, a positive lens group, a negative lens group and a positive lens group are sequentially arranged among all parts of the stereomicroscope, so that the space layout of a mechanical structure is combined, the aperture of a light beam is adjusted, interception of the prism to the light beam is reduced, and off-axis vignetting is reduced; the technical problems of large off-axis vignetting and poor imaging quality caused by the fact that a light path passes through a plurality of groups of prisms in a stereomicroscope in the prior art are solved, and the overall imaging requirement is met.
Owner:YUYAO SHENGDA INSTR CO LTD

Scanning electron microscope

The invention discloses a scanning electron microscope. The scanning electron microscope comprises a scanning electron microscope main body and a sample table located in a sample cavity, the scanning electron microscope main body is fixedly connected with the upper cover of the sample cavity, so that a closed space is formed in the sample cavity; a closed-loop groove is formed in an upper cover of the sample cavity; wherein the groove is located outside the connection position of the upper cover of the sample cavity and the scanning electron microscope main body, and the bottom of the groove is not higher than the supporting surface of the sample table; a magnetic shielding layer is arranged in the groove; wherein the length of the magnetic shielding layer is not less than the distance from the objective lens of the scanning electron microscope main body to the supporting surface of the sample stage.
Owner:SKYVERSE TECH CO LTD

Flying-over beam pattern scanning hologram microscope device using scan mirror and translation stage

A flying-over beam pattern scanning hologram microscope device includes: a scan beam generation unit which converts a first beam and a second beam to a first spherical wave and a second spherical wave, and then allows the first and second spherical waves to interfere with each other to form a scan beam; a scanning unit, which comprises a scan mirror for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit for detecting a beam that has passed through the objective lens again after fluorescing or being reflected from an object.
Owner:CUBIXEL CO LTD

Stray light gray value acquisition method, automatic focusing processing method and system

The invention discloses a stray light gray value acquisition method, an automatic focusing processing method and an automatic focusing processing system, and relates to the field of automatic focusing. The method is applied to the microscopic automatic focusing device, and comprises the following steps: adjusting the distance between a microscope objective and a reflection point corresponding to light passing through the microscope objective, or the reflection angle of the light, so that the adjusted distance or reflection angle exceeds the focusing range of the microscope objective; or an extinction assembly is additionally arranged on the outer side of the microscope objective, so that the light penetrating through the microscope objective is eliminated; theoretical light spot areas formed by stray light on the surface of the first sensor at different axial height positions of the microscope objective are calculated; and gray values corresponding to theoretical light spot areas in the actual light spot images of the microscope objective at different axial height positions are extracted and used for correcting the light spot image of the object to be measured, so that the influence of stray light on a defocusing amount calculation result is reduced. Therefore, the influence of stray light reflected by the surface of the microscope objective on the defocusing amount calculation is reduced, and the accuracy of the defocusing amount calculation is improved.
Owner:HEFEI I TEK OPTOELECTRONICS CO LTD

FBG (Fiber Bragg Grating) femtosecond laser direct writing system and method based on light field regulation and control

The invention discloses a fiber bragg grating femtosecond laser direct writing system and method based on light field regulation and control. The system comprises a femtosecond laser source, a polarization control module, a light beam expanding module, a light field modulation module, a 4f filtering imaging module, an oil immersed objective lens, a precision positioning and optical fiber clamping module, an observation module and a computer control module. The method comprises the following steps: firstly, fixing a standard single-mode optical fiber to be processed on a three-dimensional precision displacement platform; then programmable wavefront modulation is carried out on the femtosecond laser through a light field modulation module, and a multi-focus array is generated; then focusing the multi-focus array into the fiber core through an oil-immersed objective lens to realize one-time parallel inscribing of a plurality of refractive index modulation RIM regions; and finally, the computer control module controls the three-dimensional precision displacement platform to move at a constant speed in the axial direction of the optical fiber, and parallel integrated inscribing of a plurality of FBG structures is completed. According to the invention, the inscribing precision and inscribing efficiency of fiber bragg grating femtosecond laser direct writing are improved.
Owner:NANJING UNIV OF SCI & TECH

Defect detection system and defect detection method

The invention provides a defect detection system and a defect detection method, the defect detection system comprises an objective table, an illumination channel and a plurality of detection channels, the illumination channel comprises a light source, and the light source is used for providing detection light spots for a detection area of a to-be-detected object. The detection channel comprises an objective lens and a detector, the objective lens is used for collecting scattered light generated by the detection light spot in the detection area, and the detector is used for determining the signal intensity of the scattered light so as to determine defect information of the detection area based on the signal intensity. The incident plane is perpendicular to a second plane where the optical axes of the detection channels are located, deviation angles exist between the optical axes of the detection channels and the normal direction of the surface of the to-be-detected object, and at least two deviation angles in all the deviation angles meet the angle difference condition. According to the device, scattered light of different types of defects can be efficiently collected, concave defects and convex defects can be accurately detected through a plurality of detection channels, missing detection can be avoided, and the two types of defects existing on the surface of an object to be detected can be accurately detected.
Owner:SKYVERSE TECH CO LTD

Phase-locked amplification system for enhancing signal-to-noise ratio of ultrafast laser pumping-detection transient imaging

The invention provides a phase-locked amplification system for enhancing the signal-to-noise ratio of ultrafast laser pumping-detection transient imaging. The system comprises a signal input module which is arranged on a pumping light path and a detection light path, wherein the signal input module comprises a light splitting plain film and an imaging objective lens which are arranged in sequence, wherein the centers of the light splitting plain film and the imaging objective lens are located on a first axis; the centers of the first reflector, the filter, the focusing lens and the camera are located on a second axis in sequence, and the camera is used for shooting light reflected by the sample to obtain a first signal; the reference acquisition module comprises a beam splitting piece and a second reflecting mirror, the beam splitting piece is arranged on the pumping light path, and a reference light path is shot through a camera to obtain a second signal; and the phase-sensitive detection module is used for calculating the first signal and the second signal to obtain a carrier distribution condition at a preset moment. According to the invention, low pumping measurement is realized, the service life of a sample is prolonged, and the problem of detecting weak pumping imaging signals submerged in system background noise is solved.
Owner:SUN YAT SEN UNIV

Inspection apparatus for semiconductor device

Provided is an inspecting apparatus for semiconductor device including a chamber, a substrate stage within the chamber and configured to load a test wafer, the test wafer including a plurality of wiring layers, a milling device configured to partially remove the test wafer, and a measuring device including a body portion, a light source configured to irradiate an incident light, an objective lens, a lens assembly having a plurality of optical filter and an optical splitter, wherein the lens assembly is configured to introduce the incident light such that the incident light is emitted on the test wafer; and a polarization camera configured to scan the test wafer by receiving reflected light reflected from the test wafer, wherein the measuring device is configured to measure polarization characteristic of the reflected light and uniformity of the test wafer.
Owner:SAMSUNG ELECTRONICS CO LTD

Dual-light fusion night vision device

The present application provides a dual-light fusion night vision device, comprising a first display lens assembly, a second display lens assembly, and a bridge bracket assembly. The first display lens assembly includes: a first barrel; a first low-light objective group, disposed along a first low-light optical axis on the first barrel; and an infrared lens group, disposed along an infrared optical axis on the first barrel. The second display lens assembly includes: a second barrel; and a second low-light objective group, disposed along a second low-light optical axis on the second barrel. The bridge bracket assembly connects the first display lens assembly and the second display lens assembly in such a way that the first low-light optical axis is parallel to the second low-light optical axis. The first display lens group employs a dual-light fusion solution, achieving the visual effect of fused low-light imaging and infrared imaging.
Owner:YANTAI RAYTRON TECH CO LTD

Multi-marked endoscopic imaging lens for digestive tract

The application discloses a multi-marked endoscopic imaging lens for digestive tract, and belongs to the field of biomedical microscopic endoscopic imaging. The endoscopic imaging lens comprises a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens and a seventh lens; the first lens focuses laser; the second lens is matched with the first lens to limit a light beam in an effective light aperture of the lens; the third lens corrects chromatic aberration; the fourth lens and the fifth lens are combined to correct aberration; the sixth lens adopts an aspheric lens to correct spherical aberration caused in a collimating and focusing system; and the seventh lens is matched with the sixth lens to correct chromatic aberration. The working spectral range of the microscopic objective lens group is 488-860 nm, the effective light aperture is less than 1.8 mm, the mechanical outer diameter is not greater than 2.6 mm, the numerical aperture at the object side or the tissue is 0.55, the imaging field of view is 450 microns, the magnification is 2.14 times, and the working distance is 84 microns. The effect of matching excitation and fluorescence spectrum of a clinically available fluorescence contrast agent is realized.
Owner:HUAZHONG UNIV OF SCI & TECH

Multimodal Microscope and Microscopy Method

A multimodal microscope having a light source for transmitting excitation light, an illumination beam path having a microscope objective for guiding the excitation light onto and / or into a sample, at least one first spatial light modulator being present in the illumination beam path for manipulating the excitation light, a detector for detecting detection light emitted by the sample owing to illumination with the excitation light, a detection beam path, comprising the microscope objective or a further microscope objective, for guiding the detection light onto the detector, and a controller at least for controlling the first spatial light modulator. The multimodal microscope includes a switchable optical functional group, which is switchable at least into a first and a second switching state, and the first spatial light modulator is situated either in or in the vicinity of an intermediate image plane or a pupil plane of the illumination beam path, depending on the switching state.
Owner:CARL ZEISS MICROSCOPY GMBH

Objective lens conversion device for metallographic examination microscope

The invention discloses an objective lens conversion device for a metallographic examination microscope, which belongs to the technical field of experimental equipment and comprises a base, a docking mechanism, an objective lens main body and a positioning mechanism, the top of the base is provided with a microscope main body, one end of the top of the microscope main body is provided with an eyepiece, one end of the bottom of the eyepiece is provided with a switching mechanism, and the switching mechanism is used for switching the eyepiece. Meanwhile, an inner magnetic ring is arranged on the outer side of the adjusting disc, an outer magnetic ring is arranged on the inner side of the fixing disc, the adjusting disc can be kept aligned with the fixing disc, magnetic suspension is adopted, the adjusting disc and the fixing disc can be in non-contact connection, friction force generated between the adjusting disc and the fixing disc in the objective lens conversion process is avoided, and the objective lens conversion efficiency is improved. Therefore, the service life is prevented from being affected by abrasion generated at the joint of the adjusting disc and the fixed disc.
Owner:JIANGSU TUMING INTELLIGENT TECHNOLOGY CO LTD

Optical microscopy method, system and device for positioning magnetic nanoparticles

The invention discloses an optical microscopy method, system and device for positioning magnetic nanoparticles, and the method comprises the steps: obtaining an interference pattern generated when laser passes through a to-be-detected sample, and distributing the magnetic nanoparticles in the to-be-detected sample; the interference pattern is formed by interference of incident laser and scattered light of the magnetic nanoparticles; determining a distribution function of the interference pattern, and determining the central position of the magnetic nanoparticle according to the interference pattern and the distribution function; the device comprises a laser, an amplification objective lens, a focusing lens, an imaging unit and a processor, light emitted by the laser passes through a to-be-detected sample to generate an interference pattern, the interference pattern is amplified by the amplification objective lens and focused by the focusing lens to be imaged in the imaging unit, and magnetic nanoparticles are distributed in the to-be-detected sample. According to the embodiment of the invention, micron-sized space positioning of the magnetic nanoparticles can be realized, and the method can be widely applied to the technical field of optical positioning.
Owner:HUAZHONG UNIV OF SCI & TECH +1

Metal oxide nanoparticle in-situ detection method and device based on tip Raman

The invention provides a tip Raman-based metal oxide nanoparticle in-situ detection method, which comprises: S1, dispersing metal oxide nanoparticles in a nanoparticle dispersion liquid, focusing laser to the tip of a nanometer tip through an objective lens, capturing a single nanoparticle by using an optical tweezers technology, and attaching the single nanoparticle to the nanometer tip; s2, focusing Raman laser on a nano needle tip-particle interface, generating a local high-temperature field through a photo-thermal near-field coupling effect, triggering a thermal chemical reaction of nano particles, and synchronously collecting a Raman spectrum; and S3, carrying out pretreatment and characteristic peak analysis on the collected Raman signal of the Raman spectrum, and determining the reaction critical temperature and the dynamic process in combination with temperature calibration data. According to the invention, capture and accurate heating of the nanoparticles are realized through photo-thermal coupling of the optical tweezers and the needle tip, and thermal chemical reaction monitoring of the nanoparticles is realized.
Owner:WUHAN UNIV

Second harmonic characterization system based on spatial light regulation and control

The invention relates to a secondary harmonic characterization system based on spatial light regulation and control. The secondary harmonic characterization system comprises an incident light path unit, a detection light path unit and a sample table, the incident light path unit sequentially comprises a laser, a polarizer, a half-wave plate, a light modulator, a long-pass optical filter and an incident objective lens in the light beam incident direction; a wafer is carried on the sample table; the detection light path unit sequentially comprises an adjustable detection objective lens, a light path adjuster, a polarization analyzer, a short-pass optical filter and a detector in the light beam reflection direction; according to the SHG signal representation detected by the detector, all control parameters of the light modulator, the adjustable detection objective lens, the light path adjuster and the sample table are regulated and controlled, and the SHG signal receiving efficiency of the detector is improved. According to the invention, it is ensured that the detector efficiently receives the SHG signal, and the SHG characterization precision is improved.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI LTD

Long-exit-pupil-distance broadband common-aperture composite simulation optical system

The invention provides a long-exit-pupil-distance broadband common-aperture composite simulation optical system, and belongs to the technical field of target scene composite analog simulation. A broadband objective lens group A, a space beam combiner group B and a long-wave infrared projection lens group D are sequentially arranged in the optical system from left to right along light, a visible light projection lens group C is located on the upper side of the space beam combiner group B, and a long-wave infrared projection lens group C is located on the lower side of the space beam combiner group B; a visible light image plane is positioned on the right side of the visible light projection lens group C; the medium-wave infrared projection lens group E is located on the lower side of the space beam combiner lens group B, the medium-wave infrared image surface is located on the lower side of the medium-wave infrared projection lens group E, the long-wave infrared image surface is located on the right side of the medium-wave infrared image surface, and the exit pupil position is located on the left side of the broadband objective lens group A; the problem that a single-channel target modulo system only adapts to simulation of imaging guidance equipment of a specific wave band and is not suitable for semi-physical simulation tests of three-mode composite imaging guidance equipment and two-mode composite imaging guidance equipment is solved.
Owner:HARBIN XINGUANG OPTIC-ELECTRONICS TECH CO LTD

Spatial light modulator-based light spot shaping method and system

The invention relates to the technical field of laser shaping, in particular to a light spot shaping method and system based on a spatial light modulator, and the method comprises the steps: providing and expanding an incident laser beam in Gaussian distribution, and obtaining a collimated and expanded beam; irradiating an incident laser beam to a spatial light modulator, loading a preset phase modulation pattern to modulate a wavefront phase, and outputting a phase modulation beam; the phase modulation light beam is input into a 4f imaging system, a spatial light modulator is located on the front focal plane of a first lens, and the light beam forms a light field with target intensity distribution on the rear focal plane of a second lens after passing through the system; and the light field is focused on the surface of a workpiece to be processed through an objective lens to form a flat-topped light spot. According to the scheme, uniform light intensity distribution can be flexibly generated without replacing optical elements, the uniformity and utilization efficiency of laser energy in a machining area are remarkably improved, and the problem of material damage or insufficient edge machining caused by too strong center energy is effectively solved.
Owner:SHENZHEN INTE LASER TECH