This invention relates to the field of
microscopic observation technology, specifically to an extended depth-of-focus
microscopic imaging system incorporating
optical tweezers functionality. The
system includes a beam generation and combining module, a
signal acquisition module, a
signal separation module, an image reconstruction module, and an
optical tweezers analysis module. The
system generates a phase-modulated extended depth-of-focus illumination beam and an
optical tweezers manipulation beam, which are then spatially coaxially combined to form a combined beam, which is then guided into the
microscope objective to act on the sample region. The acquired optical
signal is divided into independent detection channels through
beam splitting processing. The imaging channel, combined with a depth-of-field extension
point spread function model, optimizes the fusion
algorithm to reconstruct the three-dimensional structure of the sample. The optical
tweezers monitoring channel analyzes the
optical path signal, calculates the three-dimensional position of particles,
trapping stiffness, and
optical force, and visualizes the three-dimensional relative relationship between these two parameters by combining the imaging results. This scheme achieves
integrated design of the imaging
optical path and the optical
tweezers optical path, optimizes image reconstruction quality under large
depth of field, and enables synchronous and collaborative operation of
microscopic imaging and optical manipulation.