33379results about "Image enhancement" patented technology

Disclosed are methods and apparatus for qualifying a photolithographic reticle. A reticle inspection tool is used to acquire images at different imaging configurations from each of a plurality of pattern areas of a test reticle. A reticle near field for each of the pattern areas of the test reticle is recovered based on the acquired images from each pattern area of the test reticle. A lithography model is applied to the reticle near field for the test reticle to simulate a plurality of test wafer images, and the simulated test wafer images are analyzed to determine whether the test reticle will likely result in an unstable or defective wafer.

An image processing apparatus is disclosed. The image processing apparatus of the present invention comprises: an image receiving unit for receiving a first image and a second image of the same object taken at different times; a processor for obtaining transformation information by registering the first image on the basis of the second image, obtaining a first segment image corresponding to an area of the object from the first image, and generating a second segment image corresponding to an area of the object of the second image by transforming the obtained first segment image according to the transformation information; and an output unit for outputting the second segment image.

The invention discloses a sleeve fault diagnosis method and system. The method comprises the following steps: preprocessing an acquired sleeve infrared image to filter out a non-heating part; segmenting the image of which the non-heating part is filtered out to obtain a single sleeve image; diagnosing the sleeve fault according to the segmented single sleeve image. According to the invention, theinfrared image of the transformer sleeve is preprocessed and segmented, therefore, an infrared image of a single sleeve is obtained; the temperature of each part of the sleeve can be conveniently obtained by converting the gray scale of each pixel in the gray scale map of the infrared image of the single sleeve into the corresponding temperature value, the method is simple but very ingenious, thefaulted sleeve and the faulted area can be quickly positioned, the specific fault type can be judged, and convenience and quickness are achieved.