The invention relates to the field of industrial defect detection, in particular to an industrial defect detection self-supervised segmentation method for iterative pseudo
label refinement, which comprises the following steps of: constructing a
system comprising a strategy model, a refinement model, a reward model and a meta-learning training module; inputting the multi-
modal data into the strategy model, and outputting a rough defect
mask; based on the rough defect
mask, prompting refinement is carried out through a refinement model, and a refinement
mask is output; based on the refinement mask, the to-be-detected
product image, the standard template image, the depth image and the
infrared image, calculating a comprehensive
quality score through a reward model, and screening high-quality samples with qualified scores; and updating a preset training
data set based on the high-quality sample, performing
supervised training on the strategy model by using the updated training
data set, and repeating the steps to form an iterative loop. By constructing a self-supervised
closed loop, a
system can be driven to autonomously learn defect features from an unlabeled
production line multi-
modal image only by a small amount of initial reference data.