Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

858 results about "Mirror reflection" patented technology

Systematic geometric demarcation method for reflection three-dimensional measurement of stripe

The invention discloses a systematic geometric demarcation method for reflection three-dimensional measurement of a stripe, and relates to systematic geometric demarcation during the three-dimensional appearance measurement of an object with a mirror reflection characteristic. As a stripe display device appears in a viewing field range of a video camera indirectly, the conventional systematic geometric demarcation process is fulfilled by adopting a method of sticking a marking point on a plane mirror. However, the physical coordinates of the marking point are required to be pre-measured through other precision measurement means. To solve the problem, the systematic geometric demarcation method adopts the scheme that the operation of sticking the marking point on the plane mirror is eliminated, the stripe on the stripe display device is reflected three times by the plane mirror, and analysis and linear calculation are conducted on the coordinates of the characteristic point and the imaging point of the stripe, so that the original value evaluation of the systematic geometric demarcation process is fulfilled; and then the evaluation result is optimized by adopting bundle adjustment, so as to obtain the final systematic geometric demarcation result. The systematic geometric demarcation method has the advantages of simplicity and flexibility; and only a plane mirror with a proper size is required for fulfilling the systematic geometric demarcation of the reflection three-dimensional measurement of the stripe. The systematic geometric demarcation method provides an efficient systematic demarcation way for phase position measurement deflection methods, stripe reflection photogrammetric survey and like which are based on stripe reflection three-dimensional measuring methods, thereby having a wide application prospect.
Owner:SICHUAN UNIV

Planar structured light three dimension measuring device and method for high-reflectivity part

A planar structured light three dimension measuring device and method for a high-reflectivity part relate to the field of three dimension optical measurement and aim to solve the problems of large size and slow measuring speed due to the complex structure of the existing device. The planar structured light three dimension measuring device comprises a blue laser source system, a structured light pattern generation system, a synchronous control circuit, an image collection system and a computer. The device has the advantages of small size, light weight, fast projecting speed and the like. The phenomena of local mirror reflection, mutual reflection and direction reflection and the like at the part surface are effectively inhibited by the projecting random or pseudo random coding patterns and two groups of periodically, forwardly and reversely changed black and white strip patterns, the sub pixel point match of two images shot by left and right cameras are fast realized, and the efficient measurement of the high-reflectivity part is finished. The planar structured light three dimension measuring device and method for the high-reflectivity part is suitable for the planar structured light three dimension measurement of the high-reflectivity part.
Owner:南京禺疆电子技术有限公司

Lidar three-dimensional imaging system based on virtual instrument

A lidar three-dimensional imaging system based on a virtual instrument comprises a three-dimensional scene modeling module, a lidar testing system simulation environment modeling module, a full-waveform signal processing module and a three-dimensional reconstruction module. The three-dimensional scene modeling module comprises a three-dimensional model loading element used for setting background colors, visual angle control, illumination, a projection mode, a display model and other basic scene projects. The lidar testing system simulation environment modeling module comprises four modeling sub-modules which are a laser pulse model, an atmospheric transmission model, an object interaction model and a receiving unit model. The laser pulse model is used for simulating a laser source according to the wavelength, pulse width, energy and other characteristics of a laser. The atmospheric transmission model is used for simulating a tested atmospheric environment, so that a noise model is generated for acting on the laser. The object interaction model is used for simulating effects of the laser and a detected object, and the effects comprise mirror reflection, diffuse reflection, surface reflection and speckles. The receiving unit model is used for simulating detector noise and amplifier noise which are generated after sensing.
Owner:NANJING UNIV

Face recognition method for identifying counterfeit photo deception

InactiveCN106650669ANot vulnerable to targeted attacksImprove robustnessSpoof detectionColor imageMirror reflection
The invention discloses a face recognition method for identifying counterfeit photo deception, and belongs to the field of digital image processing and pattern recognition. The recognition method identifies the face counterfeit photo deception by analyzing an imaging difference between real and fake face images, and adopting image color distribution, reflectance ratio and ambiguity features. The method comprises the following steps: firstly, converting a color image to an HSV color space and then extracting color distribution characteristics; secondly, converting the color image to a YUV color space image, and then extracting mirror reflection characteristics; thirdly, using a gray-level co-occurrence matrix to extract ambiguity characteristics; and finally, combining the color distribution characteristics, the mirror reflection characteristics and the ambiguity characteristics as discrimination information of true and false face images, and using a support vector machine algorithm to classify and obtain the judgment of the true and false face images. The face recognition method for identifying the counterfeit photo deception provided by the invention can used as an independent module and integrated into the existing face recognition algorithm, so as to improve the security and reliability of a face recognition system.
Owner:CHONGQING UNIV OF POSTS & TELECOMM

Measuring equipment and measuring method for eccentricity ratios of large-diameter preform

ActiveCN102878955AStrong adaptability to specification changesSimple structureUsing optical meansData displayMirror reflection
The invention discloses measuring equipment and a measuring method for eccentricity ratios of a large-diameter preform, belongs to the field of manufacture of optical fiber preforms, and relates to equipment and methods for measuring eccentricity ratios of preforms by mirror reflection measurement. The measuring equipment comprises a measuring table, a sliding table, a measuring table back plate, a detected data display screen, a data output display screen, a laser transmitting and receiving instrument support, an adjusting knob, a laser transmitting and receiving instrument, a rear linear guide rail, a left fixed roller bracket, a left support roller, a front linear guide rail, a graduated scale, a rotating motor, a moving bracket, a preform supporting rotating roller, a right fixed roller bracket, a right support roller, a left-right moving motor and a left-right moving lead screw. The measuring method includes steps of placing the preform on the left support roller and the right support roller on the left fixed roller bracket and the right fixed roller bracket, testing the surface of a body of the preform by the laser transmitting and receiving instrument in real time, recording data, collecting data of eccentricity ratios of various circumferential points around a first measuring point, computing an eccentricity ratio of the first measuring point by an eccentricity ratio computational formula; and measuring eccentricity ratio of a second measuring point.
Owner:ZHONGTIAN TECH ADVANCED MATERIALS CO LTD +2
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products