Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Systematic geometric demarcation method for reflection three-dimensional measurement of stripe

A technology of three-dimensional measurement and geometric calibration, which can be used in measurement devices, instruments, optical devices, etc., and can solve the problems of increasing measurement time and measurement cost.

Inactive Publication Date: 2012-07-11
SICHUAN UNIV
View PDF3 Cites 39 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is obvious that taking measurements on marker points increases measurement time and measurement cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Systematic geometric demarcation method for reflection three-dimensional measurement of stripe
  • Systematic geometric demarcation method for reflection three-dimensional measurement of stripe
  • Systematic geometric demarcation method for reflection three-dimensional measurement of stripe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0007] The present invention will be further described below in conjunction with the accompanying drawings and examples. figure 1 A reflection projection imaging model for 3D measurement of fringe reflections is described. The coordinate system of the stripe display device (taking LCD as an example) and the camera is defined as and . The geometric calibration of the fringe reflection three-dimensional measurement system is determined and The geometric relationship between, generally through the rotation matrix and translation vector express. The reflective projection imaging model can be briefly described as follows: first, the LCD is converted to the camera coordinate system; then the LCD is mirrored on the plane mirror; finally, its mirror image is formed on the camera imaging plane. Feature points on LCD About the Mirror Point of a Plane Mirror The homogeneous coordinate mathematical expression of is

[0008] (1)

[0009] is the normal direction o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a systematic geometric demarcation method for reflection three-dimensional measurement of a stripe, and relates to systematic geometric demarcation during the three-dimensional appearance measurement of an object with a mirror reflection characteristic. As a stripe display device appears in a viewing field range of a video camera indirectly, the conventional systematic geometric demarcation process is fulfilled by adopting a method of sticking a marking point on a plane mirror. However, the physical coordinates of the marking point are required to be pre-measured through other precision measurement means. To solve the problem, the systematic geometric demarcation method adopts the scheme that the operation of sticking the marking point on the plane mirror is eliminated, the stripe on the stripe display device is reflected three times by the plane mirror, and analysis and linear calculation are conducted on the coordinates of the characteristic point and the imaging point of the stripe, so that the original value evaluation of the systematic geometric demarcation process is fulfilled; and then the evaluation result is optimized by adopting bundle adjustment, so as to obtain the final systematic geometric demarcation result. The systematic geometric demarcation method has the advantages of simplicity and flexibility; and only a plane mirror with a proper size is required for fulfilling the systematic geometric demarcation of the reflection three-dimensional measurement of the stripe. The systematic geometric demarcation method provides an efficient systematic demarcation way for phase position measurement deflection methods, stripe reflection photogrammetric survey and like which are based on stripe reflection three-dimensional measuring methods, thereby having a wide application prospect.

Description

technical field [0001] The invention relates to the three-dimensional shape measurement of objects with specular reflection characteristics, in particular to the system geometry calibration for the three-dimensional measurement of stripe reflection, and belongs to the technical field of advanced optical manufacturing and detection. Background technique [0002] Structured light projection has the advantages of fast full-field measurement and high measurement accuracy to obtain the three-dimensional surface shape of objects, and has been widely used in the three-dimensional measurement of diffuse reflective surfaces. For the three-dimensional measurement of specular reflective surfaces, according to the fringe reflective properties, G. Hausler (M. C.Knauer, J. Kaminski, and G. Hausler. Phase measuring deflectometery: a new approach to measure specular freeform surfaces, Proc. SPIE, 2004, 5457: 366~376) proposed the use of phase measurement deflection and gradient integration ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/25
Inventor 苏显渝肖永亮陈文静刘元坤张启灿向立群曹益平
Owner SICHUAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com