10 results about "Measurement point" patented technology

The invention discloses a decentralized control system FBD element measuring roll checking method and related equipment, and belongs to the field of decentralized control system data checking, and the method comprises the following steps: searching measuring points according to KKS information, and carrying out IO measuring point type matching or global variable measuring point type matching, and in the global variable measuring point type matching, carrying out data processing on the measuring points according to the KKS information; traversing the sub-key measurement point roll and retrieving corresponding sub-key measurement point information, and comparing the sub-key measurement point information with the function block information for verification; performing retrieval according to the redundant measuring point name to obtain corresponding redundant measuring point information, and verifying the redundant measuring point information; and verifying the reference condition of the measuring point corresponding to the KKS information to complete the FBD element measuring point name verification. According to the invention, the problem that wrong roll call may be introduced in the DCS configuration process can be solved.

The invention discloses a standardized mapping method, device and equipment for monitoring measurement points and a storage medium, which are used for improving the mapping efficiency of to-be-standardized measurement point names and standard measurement point names in a standardized dictionary. The method comprises the following steps: acquiring a to-be-standardized measuring point name and at least one standard measuring point name; respectively calculating the similarity between the to-be-standardized measuring point name and each obtained standard measuring point name; and determining a target standard measuring point name meeting a preset condition based on the calculated similarity, and establishing a mapping relationship between the to-be-standardized measuring point name and the target standard measuring point name.

To provide a measurement point generating device, a measurement point generation method, and a program, which automatically generates a pair of measurement points at facing positions.SOLUTION: A measurement point generating device 10 for generating measurement points for an object to be measured comprises: a measurement target surface determination section 110 that determines a measurement target surface by causing an operator to designate a measurement target size as the designation of the measurement target surface related to the measurement target size; a measurement point generation section 120 that generates a pair of measurement points at facing positions on the measurement target surface; and an output section 130 that outputs position coordinates of the pair of measurement points generated by the measurement point generation means. The measurement point generation section 120 includes: a projected surface generation section 121 that generates a projected surface to which a shape of the measurement target surface is projected; a measurement area determination section 122 that determines a measurement area on the projected surface on the basis of the shape of the measurement target surface which is projected to the projected surface; a virtual straight line generation section 123 that generates a virtual straight line passing through the measurement area; and an intersection point acquisition section 124 that acquires two intersection points between the virtual straight line and the measurement target surface to generate the acquired two intersection points as a pair of measurement points.SELECTED DRAWING: Figure 2

To make it possible to grasp a tendency in which direction an error is detected without mistakes by displaying, for only one measurement point, a relation object indicating the magnitude of an error and the direction of the error between a measured value and a dimensional tolerance of a sample produced on the basis of three-dimensional model data, with a dimensional tolerance, which is not a datum reference, being set between two measurement points in the three-dimensional model data.SOLUTION: A control unit 34 displays, on a three-dimensional model, a relation object indicating whether or not a measured value of a sample produced on the basis of three-dimensional model data confirms to a permissible condition of dimensional tolerance, or the magnitude of an error and the direction of the error in the dimensional tolerance with respect to a reference dimension, with the dimensional tolerance, which is not a datum reference, being set between two measurement points in the three-dimensional model data, for only the other measurement point of the two measurement points for which the dimensional tolerance is set, in relation to one measurement point determined in accordance with a preliminarily set condition.SELECTED DRAWING: Figure 4

To provide a measuring apparatus for easily and properly measuring the size of a measurement object.SOLUTION: A measuring apparatus includes: a determination unit configured to determine, on the basis of a determination condition, whether a measurement point whose origin is set at a reference point of a depth sensor is a measurement target point on a measurement object; and a measuring unit configured to measure the size of the measurement object by using depth data of the measurement point determined to be the measurement target point.SELECTED DRAWING: Figure 7

The invention discloses a method and a device for determining a measurement value of a measurement point location, electronic equipment and a storage medium. The method comprises the steps of obtaining a first point location set, a second point location set and a third point location set of a target product, and obtaining a mapping relation between the second point location set and the third point location set; the second point location set is a subset of the first point location set; the third point location set is a complementary set of the second point location set relative to the first point location set; the mapping relationship comprises a mapping relationship between each measurement point location in the third point location set and at least one measurement point location in the second point location set; and determining the measurement value of each measurement point location in the third point location set according to the measurement value of each measurement point location in the second point location set and the mapping relationship between the second point location set and the third point location set. According to the scheme, the problem of low detection efficiency caused by excessive product measurement point positions is solved, the number of the measurement point positions is simplified based on the incidence relation between the measurement point positions, and the point position measurement efficiency is improved on the basis of ensuring normal completion of the measurement task.

The invention provides a method and apparatus for determining a two-point size of a workpiece. One aspect relates to a computer-implemented method for determining a two-point size of a workpiece (30), the method comprising the steps of: receiving a set (50) of measurement points of the workpiece (30); determining a longitudinal axis (L) of the workpiece (30) based on the set (50) of measurement points; projecting at least a portion of the set (50) of measurement points into a projection plane perpendicular to the longitudinal axis (L) to obtain a set of projected points; and determining the two-point size of the workpiece (30) based on the projected points.

Disclosed herein is a method for determining a measurement function of a meter, where the meter is configured for measuring raw data at one or more measurement locations around a system, where the measurement function of the meter defines a characteristic of measurement data derivable from the raw data, and wherein the method comprises identifying a set of different measurement points supported by the meter, identifying a set of different measurement units supported by the meter, and identifying a set of different data types supported by the meter. The method further includes determining different combinations of measurement points, measurement units, and data types selected from a set of different measurement points, a set of different measurement units, and a set of different data types, respectively, and determining a corresponding code and a corresponding measurement type of the metrology specification for each combination of the measurement point, the measurement unit and the data type. The method may allow the functionality of the meter to be defined and mapped to a metrology specification according to different measurement types that the meter can support. The approach may allow the functionality of any meter, such as a meter of any complexity, to be fully specified.