4 results about "Measurement point" patented technology

To provide a measurement point generating device, a measurement point generation method, and a program, which automatically generates a pair of measurement points at facing positions.SOLUTION: A measurement point generating device 10 for generating measurement points for an object to be measured comprises: a measurement target surface determination section 110 that determines a measurement target surface by causing an operator to designate a measurement target size as the designation of the measurement target surface related to the measurement target size; a measurement point generation section 120 that generates a pair of measurement points at facing positions on the measurement target surface; and an output section 130 that outputs position coordinates of the pair of measurement points generated by the measurement point generation means. The measurement point generation section 120 includes: a projected surface generation section 121 that generates a projected surface to which a shape of the measurement target surface is projected; a measurement area determination section 122 that determines a measurement area on the projected surface on the basis of the shape of the measurement target surface which is projected to the projected surface; a virtual straight line generation section 123 that generates a virtual straight line passing through the measurement area; and an intersection point acquisition section 124 that acquires two intersection points between the virtual straight line and the measurement target surface to generate the acquired two intersection points as a pair of measurement points.SELECTED DRAWING: Figure 2

The invention discloses a method and a device for determining a measurement value of a measurement point location, electronic equipment and a storage medium. The method comprises the steps of obtaining a first point location set, a second point location set and a third point location set of a target product, and obtaining a mapping relation between the second point location set and the third point location set; the second point location set is a subset of the first point location set; the third point location set is a complementary set of the second point location set relative to the first point location set; the mapping relationship comprises a mapping relationship between each measurement point location in the third point location set and at least one measurement point location in the second point location set; and determining the measurement value of each measurement point location in the third point location set according to the measurement value of each measurement point location in the second point location set and the mapping relationship between the second point location set and the third point location set. According to the scheme, the problem of low detection efficiency caused by excessive product measurement point positions is solved, the number of the measurement point positions is simplified based on the incidence relation between the measurement point positions, and the point position measurement efficiency is improved on the basis of ensuring normal completion of the measurement task.